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Information card for entry 7712339
Preview
| Coordinates | 7712339.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H62 B N8 O2 Si3 Y |
|---|---|
| Calculated formula | C40 H62 B N8 O2 Si3 Y |
| SMILES | [Y]12345(N([Si](C)(C)C)[Si]([CH]5=[C]1(N4[SiH2]c1ccccc1)Cc1ccc(OC)cc1)(C)C)([O]1CCCC1)[n]1n(c(cc1C)C)[BH](n1[n]3c(cc1C)C)n1[n]2c(cc1C)C |
| Title of publication | Selective Si−C(sp3) Bond Cleavage of Silyl−Bridged Amido Alkyl Ligand in an Yttrium Complex |
| Authors of publication | Cai, Jiamin; Zhang, Jie; Zhou, Xigeng |
| Journal of publication | Dalton Transactions |
| Year of publication | 2023 |
| a | 9.7543 ± 0.0003 Å |
| b | 10.6068 ± 0.0003 Å |
| c | 22.019 ± 0.0007 Å |
| α | 98.825 ± 0.001° |
| β | 92.423 ± 0.001° |
| γ | 96.481 ± 0.001° |
| Cell volume | 2232.65 ± 0.12 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0579 |
| Residual factor for significantly intense reflections | 0.0499 |
| Weighted residual factors for significantly intense reflections | 0.1362 |
| Weighted residual factors for all reflections included in the refinement | 0.1429 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.08 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.34138 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7712339.html
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structural data.