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Information card for entry 7712778
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Coordinates | 7712778.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | [Bu4N][Ni(Me-thiazSedt)2] |
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Formula | C24 H42 N3 Ni S6 Se2 |
Calculated formula | C24 H42 N3 Ni S6 Se2 |
Title of publication | A highly conducting mixed-valence nickel bis(dithiolene) salt [Et4N][Ni(Me-thiazSe-dt)2]2 with selone substitution |
Authors of publication | Hachem, Hadi; Jeannin, olivier; Cui, Hengbo; Kato, Reizo; Fourmigué, Marc; Lorcy, Dominique |
Journal of publication | Dalton Transactions |
Year of publication | 2023 |
a | 8.5113 ± 0.0002 Å |
b | 13.2483 ± 0.0004 Å |
c | 15.9417 ± 0.0004 Å |
α | 78.77 ± 0.003° |
β | 79.406 ± 0.002° |
γ | 73.437 ± 0.003° |
Cell volume | 1674.19 ± 0.08 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1431 |
Residual factor for significantly intense reflections | 0.0703 |
Weighted residual factors for significantly intense reflections | 0.1832 |
Weighted residual factors for all reflections included in the refinement | 0.2156 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/7712778.html
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