Information card for entry 7715665

Structure parameters

• Formula: C18 H52 Eu N4 Si4
• Calculated formula: C18 H52 Eu N4 Si4
• Title of publication: Formation of <i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine <i>via</i> coupling of the two charge reversed C-N bonds of Me₃NO in the presence of an Eu(II) bis(trimethylsilyl)amide complex.
• Authors of publication: Li, Yangjuan; Gong, Yu
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2024
• Journal volume: 53
• Journal issue: 12
• Pages of publication: 5342 - 5345
• a: 8.6046 ± 0.0002 Å
• b: 17.8193 ± 0.0004 Å
• c: 20.3916 ± 0.0004 Å
• α: 90°
• β: 101.988 ± 0.002°
• γ: 90°
• Cell volume: 3058.41 ± 0.12 ų
• Cell temperature: 180 ± 2 K
• Ambient diffraction temperature: 180 ± 2 K
• Number of distinct elements: 5
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0216
• Residual factor for significantly intense reflections: 0.018
• Weighted residual factors for significantly intense reflections: 0.0424
• Weighted residual factors for all reflections included in the refinement: 0.0447
• Goodness-of-fit parameter for all reflections included in the refinement: 1.069
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No