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Information card for entry 7715664
Preview
Coordinates | 7715664.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H38 O2 Si2 W |
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Calculated formula | C25 H38 O2 Si2 W |
SMILES | [W]1234(=[Si](C)c5c(cc(cc5C)C)C)([Si](C)(C)C)(C#[O])(C#[O])[c]5([c]4([c]3([c]2([c]15C)C)C)C)C |
Title of publication | Reactions of (mesityl)<sub><i>n</i></sub>(methyl)<sub>2-<i>n</i></sub>silylene complexes with pyridine-<i>N</i>-oxide (<i>n</i> = 1 and 0): formation of silanone complexes and a disiloxanyloxy complex. |
Authors of publication | Muraoka, Takako; Ishita, Taichi; Kawachi, Kosuke; Nishio, Takuya; Ishihara, Hiroto; Ueno, Keiji |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2024 |
Journal volume | 53 |
Journal issue | 16 |
Pages of publication | 7105 - 7114 |
a | 15.2435 ± 0.0014 Å |
b | 16.7605 ± 0.0014 Å |
c | 20.4763 ± 0.0016 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5231.5 ± 0.8 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P c a b |
Hall space group symbol | -P 2bc 2ac |
Residual factor for all reflections | 0.0295 |
Residual factor for significantly intense reflections | 0.0256 |
Weighted residual factors for significantly intense reflections | 0.0646 |
Weighted residual factors for all reflections included in the refinement | 0.0661 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.986 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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