Crystallography Open Database
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Result: there are 233 entries in the selection
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Searching journal of publication like 'Acta Crystallographica, Section B: Structural Science' volume of publication is 55
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 2107359 | CIF | K2.35 Nb5 O15 Pb3.65 | C m 2 m | 17.779; 18.015; 3.9209 90; 90; 90 | 1255.82 | Sciau, P.; Calvarin, G.; Ravez, J. Structures des phases paraelectriques et ferroelectriques de Pb2 K Nb5 O15 Acta Crystallographica B (39,1983-), 1999, 55, 459-466 |
| 2107401 | CIF | Cu8 Ge S6 | P m n 21 | 7.0445; 6.9661; 9.8699 90; 90; 90 | 484.343 | Onoda, M.; Sato, A.; Chen, X.-A.; Wada, H.; Kato, K. Structure refinement of Cu8 GeS 6 using x-ray diffraction data from a multiple-twinned crystal Acta Crystallographica B (39,1983-), 1999, 55, 721-725 |
| 6000193 | CIF Paper | C13 H36 Si4 | F m -3 m | 12.8902; 12.8902; 12.8902 90; 90; 90 | 2141.8 | Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~ Acta Crystallographica Section B, 1999, 55, 1014-1029 |
| 6000194 | CIF Paper | C12 H36 Si5 | F m -3 m | 13.5218; 13.5218; 13.5218 90; 90; 90 | 2472.31 | Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~ Acta Crystallographica Section B, 1999, 55, 1014-1029 |
| 6000195 | CIF Paper | C12 H36 Si5 | P 21 3 | 13.17158; 13.17158; 13.17158 90; 90; 90 | 2285.14 | Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~ Acta Crystallographica Section B, 1999, 55, 1014-1029 |
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