Crystallography Open Database
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Result: there are 6 entries in the selection
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Searching journal of publication like 'Materials Research Society Symposia Proceedings' volume of publication is 646
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
---|---|---|---|---|---|---|
1532195 | CIF | Si2 W | I 4/m m m | 3.2138; 3.2138; 7.8299 90; 90; 90 | 80.871 | Tanaka, K.; Yamaguchi, M.; Nawata, K.; Inui, H.; Koiwa, M. Refinement of crystallographic parameters in refractory metal disilicides Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5 |
1532198 | CIF | Si2 V | P 64 2 2 | 4.5726; 4.5726; 6.3744 90; 90; 120 | 115.424 | Tanaka, K.; Nawata, K.; Yamaguchi, M.; Inui, H.; Koiwa, M. Refinement of crystallographic parameters in refractory metal disilicides Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5 |
1532201 | CIF | Cr Si2 | P 64 2 2 | 4.4283; 4.4283; 6.368 90; 90; 120 | 108.145 | Tanaka, K.; Nawata, K.; Koiwa, M.; Yamaguchi, M.; Inui, H. Refinement of crystallographic parameters in refractory metal disilicides Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5 |
1532204 | CIF | Nb Si2 | P 62 2 2 | 4.7974; 4.7974; 6.5923 90; 90; 120 | 131.395 | Tanaka, K.; Nawata, K.; Koiwa, M.; Inui, H.; Yamaguchi, M. Refinement of crystallographic parameters in refractory metal disilicides Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5 |
1532207 | CIF | Si2 Ta | P 64 2 2 | 4.7839; 4.7839; 6.57 90; 90; 120 | 130.215 | Tanaka, K.; Nawata, K.; Koiwa, M.; Inui, H.; Yamaguchi, M. Refinement of crystallographic parameters in refractory metal disilicides Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5 |
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