Crystallography Open Database

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Searching journal of publication like 'Acta Crystallographica, Section B' volume of publication is 55

COD ID	Links	Formula	Space group	Cell parameters	Cell volume	Bibliography
2107359	CIF	K2.35 Nb5 O15 Pb3.65	C m 2 m	17.779; 18.015; 3.9209 90; 90; 90	1255.82	Sciau, P.; Calvarin, G.; Ravez, J. Structures des phases paraelectriques et ferroelectriques de Pb2 K Nb5 O15 Acta Crystallographica B (39,1983-), 1999, 55, 459-466
2107401	CIF	Cu8 Ge S6	P m n 21	7.0445; 6.9661; 9.8699 90; 90; 90	484.343	Onoda, M.; Sato, A.; Chen, X.-A.; Wada, H.; Kato, K. Structure refinement of Cu8 GeS 6 using x-ray diffraction data from a multiple-twinned crystal Acta Crystallographica B (39,1983-), 1999, 55, 721-725
6000193	CIF Paper	C13 H36 Si4	F m -3 m	12.8902; 12.8902; 12.8902 90; 90; 90	2141.8	Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~ Acta Crystallographica Section B, 1999, 55, 1014-1029
6000194	CIF Paper	C12 H36 Si5	F m -3 m	13.5218; 13.5218; 13.5218 90; 90; 90	2472.31	Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~ Acta Crystallographica Section B, 1999, 55, 1014-1029
6000195	CIF Paper	C12 H36 Si5	P 21 3	13.17158; 13.17158; 13.17158 90; 90; 90	2285.14	Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~ Acta Crystallographica Section B, 1999, 55, 1014-1029

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