Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 45

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2300365 CIF
HKL
Ge O2P 31 2 14.989; 4.989; 5.6527
90; 90; 120
121.847Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300366 CIFGe0.97 O2 Si0.03P 32 2 14.983; 4.983; 5.6339
90; 90; 120
121.149Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300367 CIFGe0.96 O2 Si0.04P 31 2 14.9805; 4.9805; 5.627
90; 90; 120
120.88Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300368 CIF
HKL
Ge0.9 O2 Si0.1P 32 2 14.97517; 4.97517; 5.60565
90; 90; 120
120.163Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300369 CIF
HKL
Ge0.83 O2 Si0.17P 31 2 14.9707; 4.9707; 5.5873
90; 90; 120
119.555Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300370 CIFO2 SiP 32 2 14.91636; 4.91636; 5.4084
90; 90; 120
113.211Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300371 CIF
HKL
Paper
C9 H13 N3 O5P 21 21 215.0784; 13.9046; 14.6992
90; 90; 90
1037.96Coome, J. A.; Goeta, A. E.; Howard, J. A. K.; Probert, M. R.
<i>Masquerade</i>: removing non-sample scattering from integrated reflection intensities
Journal of Applied Crystallography, 2012, 45, 292-298
2300372 CIF
HKL
Paper
C17 H14 OP b c a15.4307; 10.2659; 16.4124
90; 90; 90
2599.9Rajasekar, M.; Muthu, K.; Bhagavannarayana, G.; Meenakshisundaram, S. P.
Synthesis, structure, growth and characterization of an organic crystal: 1,5-diphenylpenta-2,4-dien-1-one
Journal of Applied Crystallography, 2012, 45, 914-920
2300373 CIF
Paper
H18 O12 SI 1 2 17.44247; 7.445; 26.1168
90; 125.043; 90
1184.78Maynard-Casely, Helen E.; Brand, Helen E. A.; Wallwork, Kia S.
Structure and thermal expansion of sulfuric acid octahydrate
Journal of Applied Crystallography, 2012, 45, 1198-1207
2300374 CIF
Paper
C25 H30 N4 O3P 21 21 2135.9422; 12.91819; 4.99532
90; 90; 90
2319.37Bushmarinov, Ivan S.; Dmitrienko, Artem O.; Korlyukov, Alexander A.; Antipin, Mikhail Yu.
Rietveld refinement and structure verification using `Morse' restraints
Journal of Applied Crystallography, 2012, 45, 1187-1197

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