Crystallography Open Database
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Result: there are 9 entries in the selection
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 33
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 2300511 | CIF | K2.92 Li2 O30 Pb2.41 Ta10 | P 4/m b m | 12.5488; 12.5488; 3.9129 90; 90; 90 | 616.174 | Hornebecq, V.; Weill, F.; Elissalde, C.; Villesuzanne, A.; Menetrier, M.; Ravez, J. Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach Journal of Applied Crystallography, 2000, 33, 1037-1045 |
| 2300512 | CIF | K1.46 Li O30 Pb3.67 Ta10 | P 4/m b m | 12.5159; 12.5159; 3.8947 90; 90; 90 | 610.096 | Hornebecq, V.; Elissalde, C.; Weill, F.; Villesuzanne, A.; Menetrier, M.; Ravez, J. Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach Journal of Applied Crystallography, 2000, 33, 1037-1045 |
| 9009660 | CIF | Al3.2 Ca0.78 H7.5 K1.22 Na0.41 O21.13 Si4.8 | P 1 21/m 1 | 9.8881; 14.404; 8.6848 90; 124.271; 90 | 1022.2 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Vallerano, Rome, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009661 | CIF | Al3.48 Ca1.74 H70 O42.15 Si8.52 | R -3 m :R | 9.39692; 9.39692; 9.39692 93.866; 93.866; 93.866 | 823.834 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009662 | CIF | Al K O8 Si3 | C 1 2/m 1 | 8.53573; 13.03129; 7.17536 90; 115.985; 90 | 717.44 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Latera, Viterbo, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009663 | CIF | Al1.02 Ca0.02 Na0.98 O8 Si2.98 | C -1 | 8.14588; 12.7973; 7.15775 94.2451; 116.6; 87.8 | 665.342 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009664 | CIF | Ca Fe0.25 Mg0.74 O6 Si2 | C 1 2/c 1 | 9.7504; 8.9015; 5.27444 90; 106.016; 90 | 440.016 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009665 | CIF | Al4 K O12 Si2 | C 1 2/c 1 | 5.2226; 9.0183; 20.143 90; 95.665; 90 | 944.081 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009666 | CIF | O2 Si | P 31 2 1 | 4.9158; 4.9158; 5.4091 90; 90; 120 | 113.199 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
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