Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 53

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2300663 CIF
HKL
Fe4 Mn Si3P 63/m c m6.7705; 6.7705; 4.7044
90; 90; 120
186.76Grzechnik, Andrzej; Meven, Martin; Paulmann, Carsten; Friese, Karen
Combined X-ray and neutron single-crystal diffraction in diamond anvil cells
Journal of Applied Crystallography, 2020, 53, 9-14
2300664 CIF
HKL
Fe4 Mn Si3P 63/m c m6.7705; 6.7705; 4.7044
90; 90; 120
186.76Grzechnik, Andrzej; Meven, Martin; Paulmann, Carsten; Friese, Karen
Combined X-ray and neutron single-crystal diffraction in diamond anvil cells
Journal of Applied Crystallography, 2020, 53, 9-14
2300665 CIFLi Nb O3R 3 c :H5.1505; 5.1505; 13.8742
90; 90; 120
318.741Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C.
X-ray diffraction using focused-ion-beam-prepared single crystals
Journal of Applied Crystallography, 2020, 53, 614
2300666 CIFLi Nb O3R 3 c :H5.1513; 5.1513; 13.8687
90; 90; 120
318.713Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C.
X-ray diffraction using focused-ion-beam-prepared single crystals
Journal of Applied Crystallography, 2020, 53, 614
2300667 CIFLi Nb O3R 3 c :H5.1516; 5.1516; 13.869
90; 90; 120
318.757Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C.
X-ray diffraction using focused-ion-beam-prepared single crystals
Journal of Applied Crystallography, 2020, 53, 614

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