Crystallography Open Database
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 10
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
---|---|---|---|---|---|---|
1100041 | CIF | N0.61 Ti | I 41/a m d :1 | 4.198; 4.198; 8.591 90; 90; 90 | 151.4 | Nagakura, S; Kusunoki, T Structure of Ti Nx studied by electron diffraction and microscopy Journal of Applied Crystallography, 1977, 10, 52-56 |
2300516 | CIF | D15 Th4 | I -4 3 d | 9.11; 9.11; 9.11 90; 90; 90 | 756.058 | Mueller, M.H.; Caton, R.; Beyerlein, R.A.; Brun, T.O.; Jorgensen, J.D.; Satterthwaite, C.B. Structure of Th4 D15 from measurement at the argonne ZING-P pulsed neutron source Journal of Applied Crystallography, 1977, 10, 79-83 |
2300529 | CIF | N2 O Si2 | C m c 21 | 8.847; 5.452; 4.824 90; 90; 90 | 232.68 | Srinivasa, S.R.; Jorgensen, J.D.; Cartz, L.; Worlton, T.G.; Beyerlein, R.A.; Billy, M. High-pressure neutron diffraction study of Si2 N2 O Journal of Applied Crystallography, 1977, 10, 167-171 |
2300587 | CIF | Ca9.2 O22.2 | P 63/m | 9.3653; 9.3653; 6.8816 90; 90; 120 | 522.713 | Young, R.A.; Mackie, P.E.; von Dreele, R.B. Application of the Pattern-Fitting Structure-Refinement Method to X-ray Powder Diffractometer Patterns Journal of Applied Crystallography, 1977, 10, 262-269 |
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