Crystallography Open Database

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Searching journal of publication like 'Materials Research Society Symposia Proceedings' volume of publication is 646

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1532195 CIFSi2 WI 4/m m m3.2138; 3.2138; 7.8299
90; 90; 90		80.871Tanaka, K.; Yamaguchi, M.; Nawata, K.; Inui, H.; Koiwa, M.
Refinement of crystallographic parameters in refractory metal disilicides
Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5
1532198 CIFSi2 VP 64 2 24.5726; 4.5726; 6.3744
90; 90; 120		115.424Tanaka, K.; Nawata, K.; Yamaguchi, M.; Inui, H.; Koiwa, M.
Refinement of crystallographic parameters in refractory metal disilicides
Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5
1532201 CIFCr Si2P 64 2 24.4283; 4.4283; 6.368
90; 90; 120		108.145Tanaka, K.; Nawata, K.; Koiwa, M.; Yamaguchi, M.; Inui, H.
Refinement of crystallographic parameters in refractory metal disilicides
Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5
1532204 CIFNb Si2P 62 2 24.7974; 4.7974; 6.5923
90; 90; 120		131.395Tanaka, K.; Nawata, K.; Koiwa, M.; Inui, H.; Yamaguchi, M.
Refinement of crystallographic parameters in refractory metal disilicides
Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5
1532207 CIFSi2 TaP 64 2 24.7839; 4.7839; 6.57
90; 90; 120		130.215Tanaka, K.; Nawata, K.; Koiwa, M.; Inui, H.; Yamaguchi, M.
Refinement of crystallographic parameters in refractory metal disilicides
Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5
1532210 CIFSi2 TiF d d d :18.268; 4.8002; 8.5521
90; 90; 90		339.416Tanaka, K.; Nawata, K.; Koiwa, M.; Yamaguchi, M.; Inui, H.
Refinement of crystallographic parameters in refractory metal disilicides
Materials Research Society Symposia Proceedings, 2001, 646, N4.3.1-N4.3.5

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