Information card for entry 7041044
| Formula |
C16 H28 N2 O2 Zn |
| Calculated formula |
C16 H28 N2 O2 Zn |
| Title of publication |
Systematic molecular engineering of Zn-ketoiminates for application as precursors in atomic layer depositions of zinc oxide. |
| Authors of publication |
O' Donoghue, Richard; Peeters, Daniel; Rogalla, Detlef; Becker, Hans-Werner; Rechmann, Julian; Henke, Sebastian; Winter, Manuela; Devi, Anjana |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2016 |
| Journal volume |
45 |
| Journal issue |
47 |
| Pages of publication |
19012 - 19023 |
| a |
21.5697 ± 0.0005 Å |
| b |
5.67097 ± 0.00008 Å |
| c |
17.9276 ± 0.0004 Å |
| α |
90° |
| β |
127.823 ± 0.004° |
| γ |
90° |
| Cell volume |
1732.21 ± 0.11 Å3 |
| Cell temperature |
110 ± 2 K |
| Ambient diffraction temperature |
110 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
5 |
| Hermann-Mauguin space group symbol |
C 1 2 1 |
| Hall space group symbol |
C 2y |
| Residual factor for all reflections |
0.0369 |
| Residual factor for significantly intense reflections |
0.0366 |
| Weighted residual factors for significantly intense reflections |
0.0994 |
| Weighted residual factors for all reflections included in the refinement |
0.0997 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.047 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/7041044.html
