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Information card for entry 1502788
Preview
Coordinates | 1502788.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H64 B2 Ge O4 |
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Calculated formula | C40 H64 B2 Ge O4 |
SMILES | [Ge]1(c2cc(B3OC(C(O3)(C)C)(C)C)ccc2c2c1cc(B1OC(C(O1)(C)C)(C)C)cc2)(CCCCCCCC)CCCCCCCC |
Title of publication | Germafluorenes: New Heterocycles for Plastic Electronics |
Authors of publication | Allard, Nicolas; Aïch, Réda Badrou; Gendron, David; Boudreault, Pierre-Luc T.; Tessier, Christian; Alem, Salima; Tse, Shing-Chi; Tao, Ye; Leclerc, Mario |
Journal of publication | Macromolecules |
Year of publication | 2010 |
Journal volume | 43 |
Journal issue | 5 |
Pages of publication | 2328 |
a | 19.72 ± 0.012 Å |
b | 19.029 ± 0.011 Å |
c | 10.873 ± 0.007 Å |
α | 90° |
β | 94.88 ± 0.009° |
γ | 90° |
Cell volume | 4065 ± 4 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1845 |
Residual factor for significantly intense reflections | 0.0647 |
Weighted residual factors for significantly intense reflections | 0.1134 |
Weighted residual factors for all reflections included in the refinement | 0.1539 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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