Information card for entry 4114037

Structure parameters

• Formula: C34 H76 N2 O2 Si4 Sn
• Calculated formula: C34 H76 N2 O2 Si4 Sn
• SMILES: C[Si](C1([Sn](ON2C(CCCC2(C)C)(C)C)(C(CC1)([Si](C)(C)C)[Si](C)(C)C)ON1C(CCCC1(C)C)(C)C)[Si](C)(C)C)(C)C
• Title of publication: Addition of Stable Nitroxide Radical to Stable Divalent Compounds of Heavier Group 14 Elements
• Authors of publication: Takeaki Iwamoto; Hidenori Masuda; Shintaro Ishida; Chizuko Kabuto; Mitsuo Kira
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2003
• Journal volume: 125
• Pages of publication: 9300 - 9301
• a: 20.219 ± 0.001 Å
• b: 10.9777 ± 0.0005 Å
• c: 20.4742 ± 0.0005 Å
• α: 90°
• β: 114.605 ± 0.0002°
• γ: 90°
• Cell volume: 4131.8 ± 0.3 ų
• Cell temperature: 173.2 K
• Number of distinct elements: 6
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for significantly intense reflections: 0.0228
• Weighted residual factors for all reflections included in the refinement: 0.0587
• Goodness-of-fit parameter for all reflections included in the refinement: 0.998
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No