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Information card for entry 4133605
Preview
Coordinates | 4133605.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H58 Al2 Br6 Ge N4 O Si2 |
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Calculated formula | C45 H58 Al2 Br6 Ge N4 O Si2 |
SMILES | [Ge]1([Si]2([N](C(C)(C)C)=C(N2C(C)(C)C)c2ccccc2)c2cccc3c2Oc2c([Si]41[N](=C(N4C(C)(C)C)c1ccccc1)C(C)(C)C)cccc2C3(C)C)([Al](Br)(Br)Br)[Al](Br)(Br)Br |
Title of publication | An Isolable Bis(silylene)-Stabilized Germylone and Its Reactivity. |
Authors of publication | Wang, Yuwen; Karni, Miriam; Yao, Shenglai; Apeloig, Yitzhak; Driess, Matthias |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 4 |
Pages of publication | 1655 - 1664 |
a | 11.4436 ± 0.0003 Å |
b | 22.3224 ± 0.0006 Å |
c | 13.7102 ± 0.0004 Å |
α | 90° |
β | 102.777 ± 0.003° |
γ | 90° |
Cell volume | 3415.53 ± 0.17 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 8 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.12 |
Residual factor for significantly intense reflections | 0.0993 |
Weighted residual factors for significantly intense reflections | 0.2472 |
Weighted residual factors for all reflections included in the refinement | 0.2788 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4133605.html
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