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Information card for entry 4308674
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Coordinates | 4308674.cif |
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Original paper (by DOI) | HTML |
Common name | (2a) (Cd(DMP)3(N(Si(CH3)3)2)(py)3) |
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Formula | C45 H60 Cd2 N4 O3 Si2 |
Calculated formula | C45 H60 Cd2 N4 O3 Si2 |
SMILES | [Cd]1(N([Si](C)(C)C)[Si](C)(C)C)([n]2ccccc2)[O]([Cd]([n]2ccccc2)([n]2ccccc2)([O]1c1c(C)cccc1C)Oc1c(C)cccc1C)c1c(C)cccc1C |
Title of publication | Cadmium Amido Alkoxide and Alkoxide Precursors for the Synthesis of Nanocrystalline CdE (E = S, Se, Te) |
Authors of publication | Timothy J. Boyle; Scott D. Bunge; Todd M. Alam; Gregory P. Holland; Thomas J. Headley; Gabriel Avilucea |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 1309 - 1318 |
a | 9.9973 ± 0.0004 Å |
b | 13.6501 ± 0.0006 Å |
c | 17.4569 ± 0.0008 Å |
α | 90° |
β | 94.797 ± 0.001° |
γ | 90° |
Cell volume | 2373.9 ± 0.18 Å3 |
Cell temperature | 203 ± 2 K |
Ambient diffraction temperature | 203 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0314 |
Residual factor for significantly intense reflections | 0.0283 |
Weighted residual factors for significantly intense reflections | 0.0588 |
Weighted residual factors for all reflections included in the refinement | 0.0612 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4308674.html
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