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Information card for entry 4315528
Preview
Coordinates | 4315528.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H106 Ge2 O P4 Si8 |
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Calculated formula | C56 H106 Ge2 O P4 Si8 |
SMILES | [Ge]1(P(C([Si](C)(C)C)[Si](C)(C)C)c2ccccc2)[P]([Ge](P(C([Si](C)(C)C)[Si](C)(C)C)c2ccccc2)[P]1(C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1)(C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1.O(CC)CC |
Title of publication | Germanium(II) and Tin(II) Complexes of a Sterically Demanding Phosphanide Ligand |
Authors of publication | Keith Izod; John Stewart; Ewan R. Clark; William Clegg; Ross W. Harrington |
Journal of publication | Inorganic Chemistry |
Year of publication | 2010 |
Journal volume | 49 |
Pages of publication | 4698 - 4707 |
a | 21.4695 ± 0.0013 Å |
b | 22.5652 ± 0.0013 Å |
c | 29.9365 ± 0.0018 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 14503.1 ± 1.5 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0931 |
Residual factor for significantly intense reflections | 0.0507 |
Weighted residual factors for significantly intense reflections | 0.1014 |
Weighted residual factors for all reflections included in the refinement | 0.1208 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.14 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4315528.html
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