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Information card for entry 4322026
Preview
Coordinates | 4322026.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | Cs F10 O6 Re3 |
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Calculated formula | Cs F10 O6 Re3 |
Title of publication | Lewis Acid Behavior of ReO2F3: Synthesis of (ReO2F3)\ιnfty, ReO2F4-, Re2O4F7-, Re3O6F10-, and ReO2F3(CH3CN) and Study by NMR Spectroscopy, Raman Spectroscopy, and Density Functional Theory Calculations; and X-ray Structures of [Li][ReO2F4], [K][Re2O4F7], [K][Re2O4F7].2ReO2F3, [Cs][Re3O6F10], and ReO3F(CH3CN)2.CH3CN |
Authors of publication | William J. Casteel; David A. Dixon; Nicolas LeBlond; Philippa E. Lock; Hélène P. A. Mercier; Gary J. Schrobilgen |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 2340 - 2358 |
a | 7.011 ± 0.001 Å |
b | 9.773 ± 0.002 Å |
c | 10.331 ± 0.001 Å |
α | 113.73 ± 0.01° |
β | 91.05 ± 0.02° |
γ | 92.42 ± 0.02° |
Cell volume | 646.96 ± 0.18 Å3 |
Cell temperature | 155 ± 2 K |
Ambient diffraction temperature | 155 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0694 |
Residual factor for significantly intense reflections | 0.0533 |
Weighted residual factors for all reflections | 0.1511 |
Weighted residual factors for significantly intense reflections | 0.1395 |
Goodness-of-fit parameter for all reflections | 1.035 |
Goodness-of-fit parameter for significantly intense reflections | 1.073 |
Diffraction radiation wavelength | 0.56086 Å |
Diffraction radiation type | AgKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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