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Information card for entry 4342610
Preview
Coordinates | 4342610.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H70 F6 N4 O6 S2 Si8 U2 |
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Calculated formula | C26 H70 F6 N4 O6 S2 Si8 U2 |
SMILES | C[Si](C)(C)N1[U]23(N([Si](C)(C)C)[Si](C)(C)C)[O]=S(O[U](C[Si]1(C)C)(N([Si](C2)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[O]=S(O3)(=O)C(F)(F)F)(=O)C(F)(F)F |
Title of publication | U(III)-CN versus U(IV)-NC Coordination in Tris(silylamide) Complexes. |
Authors of publication | Hervé, Alexandre; Bouzidi, Yamina; Berthet, Jean-Claude; Belkhiri, Lotfi; Thuéry, Pierre; Boucekkine, Abdou; Ephritikhine, Michel |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 5 |
Pages of publication | 2474 |
a | 11.2771 ± 0.0006 Å |
b | 11.4316 ± 0.0005 Å |
c | 11.6871 ± 0.0007 Å |
α | 80.495 ± 0.003° |
β | 88.841 ± 0.002° |
γ | 62.631 ± 0.003° |
Cell volume | 1316.96 ± 0.13 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0418 |
Residual factor for significantly intense reflections | 0.0311 |
Weighted residual factors for significantly intense reflections | 0.0642 |
Weighted residual factors for all reflections included in the refinement | 0.0666 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.984 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4342610.html
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Users of the data should acknowledge the original authors of the
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