Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4342902
Preview
Coordinates | 4342902.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H16 Cl3 F3 O5 S Te |
---|---|
Calculated formula | C20 H16 Cl3 F3 O5 S Te |
SMILES | [Te]1(OS(=O)(C(F)(F)F)=O)(C(=CC=C1c1ccccc1)c1ccccc1)OC(=O)C.ClC(Cl)Cl |
Title of publication | Te(II)/Te(IV) Mediated C-N Bond Formation on 2,5-Diphenyltellurophene and a Reassignment of the Product from the Reaction of PhI(OAc)2 with 2 TMS-OTf. |
Authors of publication | Aprile, Antonino; Iversen, Kalon J.; Wilson, David J. D.; Dutton, Jason L. |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 10 |
Pages of publication | 4934 - 4939 |
a | 10.84 ± 0.002 Å |
b | 11.056 ± 0.002 Å |
c | 12.188 ± 0.002 Å |
α | 71.11 ± 0.03° |
β | 75.36 ± 0.03° |
γ | 62.77 ± 0.03° |
Cell volume | 1219.3 ± 0.5 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0648 |
Residual factor for significantly intense reflections | 0.0449 |
Weighted residual factors for significantly intense reflections | 0.0916 |
Weighted residual factors for all reflections included in the refinement | 0.1067 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.095 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4342902.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.