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Information card for entry 4516601
Preview
Coordinates | 4516601.cif |
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Original paper (by DOI) | HTML |
Formula | C9 H6 O7 Sr |
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Calculated formula | C9 H6 O7 Sr |
SMILES | C(=O)(c1c(C(=O)[O-])cc(cc1)C(=O)O)[O-].O.[Sr+2] |
Title of publication | Semiconductor Behavior of a Three-Dimensional Strontium-Based Metal-Organic Framework. |
Authors of publication | Usman, Muhammad; Mendiratta, Shruti; Batjargal, Sainbileg; Haider, Golam; Hayashi, Michitoshi; Rao Gade, Narsinga; Chen, Jenq-Wei; Chen, Yang-Fang; Lu, Kuang-Lieh |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2015 |
Journal volume | 7 |
Journal issue | 41 |
Pages of publication | 22767 - 22774 |
a | 6.8546 ± 0.0006 Å |
b | 7.0142 ± 0.0006 Å |
c | 10.762 ± 0.0008 Å |
α | 87.65 ± 0.005° |
β | 82.614 ± 0.005° |
γ | 72.056 ± 0.005° |
Cell volume | 488.18 ± 0.07 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0713 |
Residual factor for significantly intense reflections | 0.0689 |
Weighted residual factors for significantly intense reflections | 0.1818 |
Weighted residual factors for all reflections included in the refinement | 0.1829 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4516601.html
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Users of the data should acknowledge the original authors of the
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