Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4516601
Preview
| Coordinates | 4516601.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C9 H6 O7 Sr |
|---|---|
| Calculated formula | C9 H6 O7 Sr |
| SMILES | C(=O)(c1c(C(=O)[O-])cc(cc1)C(=O)O)[O-].O.[Sr+2] |
| Title of publication | Semiconductor Behavior of a Three-Dimensional Strontium-Based Metal-Organic Framework. |
| Authors of publication | Usman, Muhammad; Mendiratta, Shruti; Batjargal, Sainbileg; Haider, Golam; Hayashi, Michitoshi; Rao Gade, Narsinga; Chen, Jenq-Wei; Chen, Yang-Fang; Lu, Kuang-Lieh |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2015 |
| Journal volume | 7 |
| Journal issue | 41 |
| Pages of publication | 22767 - 22774 |
| a | 6.8546 ± 0.0006 Å |
| b | 7.0142 ± 0.0006 Å |
| c | 10.762 ± 0.0008 Å |
| α | 87.65 ± 0.005° |
| β | 82.614 ± 0.005° |
| γ | 72.056 ± 0.005° |
| Cell volume | 488.18 ± 0.07 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0713 |
| Residual factor for significantly intense reflections | 0.0689 |
| Weighted residual factors for significantly intense reflections | 0.1818 |
| Weighted residual factors for all reflections included in the refinement | 0.1829 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4516601.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.