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Information card for entry 7008998
Preview
| Coordinates | 7008998.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H42 N4 O2 Si2 W |
|---|---|
| Calculated formula | C24 H42 N4 O2 Si2 W |
| SMILES | [W]12(=O)(=O)(N([Si](C)(C)C(C)(C)C)c3[n]1c(ccc3)C)N([Si](C)(C)C(C)(C)C)c1[n]2c(ccc1)C |
| Title of publication | Synthesis and structures of dioxo-Mo(VI) and -W(VI) amides |
| Authors of publication | Kay Lee, Hung; Wong, Yee-Lok; Zhou, Zhong-Yuan; Zhang, Ze-Ying; Ng, Dennis K. P.; Mak, Thomas C. W. |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2000 |
| Journal issue | 4 |
| Pages of publication | 539 |
| a | 16.299 ± 0.003 Å |
| b | 16.059 ± 0.003 Å |
| c | 22.341 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5848 ± 2 Å3 |
| Cell temperature | 294 ± 2 K |
| Ambient diffraction temperature | 294 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0688 |
| Residual factor for significantly intense reflections | 0.0609 |
| Weighted residual factors for all reflections | 0.1812 |
| Weighted residual factors for significantly intense reflections | 0.1751 |
| Goodness-of-fit parameter for all reflections | 1.106 |
| Goodness-of-fit parameter for significantly intense reflections | 1.125 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7008998.html
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