Crystallography Open Database
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Result: there are 766 entries in the selection
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Searching journal of publication like 'Journal of Applied Crystallography'
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 6000566 | CIF | D2 Mg O2 | P -3 m 1 | 3.1455; 3.1455; 4.7646 90; 90; 120 | 40.83 | Partin, D. E.; Okeeffe, M.; Vondreele, R. B. Crystal-structure and profile fitting of Mg(OD)2 by time-of-flight neutron-diffraction Journal of Applied Crystallography, 1994, 27, 581-584 |
| 6000665 | CIF | B2 H3 Li O5 | P n n a | 9.7984; 8.2759; 9.6138 90; 90; 90 | 779.59 | Louer, D.; Louer, M.; Touboul, M. Crystal-structure determination of lithium diborate hydrate, LIB2O3(OH).H2O, from X-ray-powder diffraction data collected with a curved position-sensitive detector Journal of Applied Crystallography, 1992, 25, 617-623 |
| 6000679 | CIF | H8 O9 S Zr | P 1 21/c 1 | 8.3645; 15.1694; 5.4427 90; 103.145; 90 | 672.5 | Gascoigne, D.; Tarling, S. E.; Barnes, P.; Pygall, C. F.; Benard, P.; Louer, D. Ab-initio structure determination of ZR(OH)2SO4.3H2O using conventional monochromatic X-ray-powder diffraction Journal of Applied Crystallography, 1994, 27, 399-405 |
| 9009651 | CIF | As | R -3 m :H | 3.7595; 3.7595; 10.4573 90; 90; 120 | 128 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 78 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009652 | CIF | As | R -3 m :H | 3.7598; 3.7598; 10.5475 90; 90; 120 | 129.125 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 299 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009653 | CIF | Sb | R -3 m :H | 4.3007; 4.3007; 11.222 90; 90; 120 | 179.754 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 4.2 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009654 | CIF | Sb | R -3 m :H | 4.3012; 4.3012; 11.232 90; 90; 120 | 179.956 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 78 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009655 | CIF | Sb | R -3 m :H | 4.3084; 4.3084; 11.274 90; 90; 120 | 181.234 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 299 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009656 | CIF | Bi | R -3 m :H | 4.533; 4.533; 11.797 90; 90; 120 | 209.93 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 4.2 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009657 | CIF | Bi | R -3 m :H | 4.535; 4.535; 11.814 90; 90; 120 | 210.418 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 78 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009658 | CIF | Bi | R -3 m :H | 4.546; 4.546; 11.862 90; 90; 120 | 212.299 | Schiferl, D.; Barrett, C. S. The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 298 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009659 | CIF | N Na O3 | R -3 c :H | 5.0718; 5.0718; 16.8336 90; 90; 120 | 375.001 | Ahtee, M.; Nurmela, M.; Suortti, P.; Jarvinen, M. Correction for preferred orientation in Rietveld refinement Sample: II, refined with correction for texture Note: Synthetic sample Journal of Applied Crystallography, 1989, 22, 261-268 |
| 9009660 | CIF | Al3.2 Ca0.78 H7.5 K1.22 Na0.41 O21.13 Si4.8 | P 1 21/m 1 | 9.8881; 14.404; 8.6848 90; 124.271; 90 | 1022.2 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Vallerano, Rome, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009661 | CIF | Al3.48 Ca1.74 H70 O42.15 Si8.52 | R -3 m :R | 9.39692; 9.39692; 9.39692 93.866; 93.866; 93.866 | 823.834 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009662 | CIF | Al K O8 Si3 | C 1 2/m 1 | 8.53573; 13.03129; 7.17536 90; 115.985; 90 | 717.44 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Latera, Viterbo, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009663 | CIF | Al1.02 Ca0.02 Na0.98 O8 Si2.98 | C -1 | 8.14588; 12.7973; 7.15775 94.2451; 116.6; 87.8 | 665.342 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009664 | CIF | Ca Fe0.25 Mg0.74 O6 Si2 | C 1 2/c 1 | 9.7504; 8.9015; 5.27444 90; 106.016; 90 | 440.016 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009665 | CIF | Al4 K O12 Si2 | C 1 2/c 1 | 5.2226; 9.0183; 20.143 90; 95.665; 90 | 944.081 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009666 | CIF | O2 Si | P 31 2 1 | 4.9158; 4.9158; 5.4091 90; 90; 120 | 113.199 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009667 | CIF | C Ca O3 | R -3 c :H | 4.991; 4.991; 17.068 90; 90; 120 | 368.204 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: March model Journal of Applied Crystallography, 2005, 38, 158-167 |
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