Crystallography Open Database

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Searching journal of publication like 'Acta Crystallographica, Section B: Structural Science' volume of publication is 55

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2105678 CIF
Paper
C2 H2 Br Li O2P 1 21/c 19.7165; 4.861; 9.0228
90; 93.946; 90
425.15Ehrenberg, H.; Hasse, B.; Schwarz, K.; Epple, M.
Structure determination of lithium chloroacetate, lithium bromoacetate and lithium iodoacetate by powder diffraction
Acta Crystallographica Section B, 1999, 55, 517-524
2105679 CIF
Paper
C2 H2 I Li O2P 1 21/c 110.1812; 4.8922; 9.0468
90; 93.251; 90
449.88Ehrenberg, H.; Hasse, B.; Schwarz, K.; Epple, M.
Structure determination of lithium chloroacetate, lithium bromoacetate and lithium iodoacetate by powder diffraction
Acta Crystallographica Section B, 1999, 55, 517-524
2105681 CIF
Paper
O1.879 Y0.242 Zr0.758F m -3 m5.15463; 5.15463; 5.15463
90; 90; 90
136.96Ishizawa, N.; Matsushima, Y.; Hayashi, M.; Ueki, M.
Synchrotron radiation study of yttria-stabilized zirconia, Zr~0.758~Y~0.242~O~1.879~
Acta Crystallographica Section B, 1999, 55, 726-735
2105682 CIF
Paper
O1.879 Y0.242 Zr0.758F m -3 m5.15463; 5.15463; 5.15463
90; 90; 90
136.96Ishizawa, N.; Matsushima, Y.; Hayashi, M.; Ueki, M.
Synchrotron radiation study of yttria-stabilized zirconia, Zr~0.758~Y~0.242~O~1.879~
Acta Crystallographica Section B, 1999, 55, 726-735
2107334 CIFO1.7096 Y0.242 Zr0.7576F m -3 m5.15463; 5.15463; 5.15463
90; 90; 90
136.96Ishizawa, N.; Hayashi, M.; Matsushima, Y.; Ueki, M.
Synchrotron radiation study of yttria-stabilized zirconia, Zr0.758 Y0.242 O1.879
Acta Crystallographica B (39,1983-), 1999, 55, 726-735
2107359 CIFK2.35 Nb5 O15 Pb3.65C m 2 m17.779; 18.015; 3.9209
90; 90; 90
1255.82Sciau, P.; Calvarin, G.; Ravez, J.
Structures des phases paraelectriques et ferroelectriques de Pb2 K Nb5 O15
Acta Crystallographica B (39,1983-), 1999, 55, 459-466
2107401 CIFCu8 Ge S6P m n 217.0445; 6.9661; 9.8699
90; 90; 90
484.343Onoda, M.; Sato, A.; Chen, X.-A.; Wada, H.; Kato, K.
Structure refinement of Cu8 GeS 6 using x-ray diffraction data from a multiple-twinned crystal
Acta Crystallographica B (39,1983-), 1999, 55, 721-725
6000193 CIF
Paper
C13 H36 Si4F m -3 m12.8902; 12.8902; 12.8902
90; 90; 90
2141.8Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000194 CIF
Paper
C12 H36 Si5F m -3 m13.5218; 13.5218; 13.5218
90; 90; 90
2472.31Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000195 CIF
Paper
C12 H36 Si5P 21 313.17158; 13.17158; 13.17158
90; 90; 90
2285.14Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000196 CIF
Paper
C13 H36 Si4P 21 312.609; 12.609; 12.609
90; 90; 90
2004.7Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000197 CIF
Paper
C13 H36 Si4P a -312.7876; 12.7876; 12.7876
90; 90; 90
2091.06Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000198 CIF
Paper
C15 H25 N O2 SP 1 21/c 116.96; 8.1382; 11.781
90; 104.777; 90
1572.28Tremayne, Maryjane; MacLean, Elizabeth J.; Tang, Chiu C.; Glidewell, Christopher
2,4,6-Triisopropylbenzenesulfonamide: Monte Carlo structure solution from X-ray powder diffraction data for a molecular system containing four independent asymmetric rotors
Acta Crystallographica Section B, 1999, 55, 1068-1074

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