Crystallography Open Database
Search results
Result: there are 754 entries in the selection
Switch to the old layout of the pageDownload all results as: list of COD numbers | list of CIF URLs | data in CSV format | archive of CIF files (ZIP)
Searching journal of publication like 'Journal of Applied Crystallography'
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 9009660 | CIF | Al3.2 Ca0.78 H7.5 K1.22 Na0.41 O21.13 Si4.8 | P 1 21/m 1 | 9.8881; 14.404; 8.6848 90; 124.271; 90 | 1022.2 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Vallerano, Rome, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009661 | CIF | Al3.48 Ca1.74 H70 O42.15 Si8.52 | R -3 m :R | 9.39692; 9.39692; 9.39692 93.866; 93.866; 93.866 | 823.834 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009662 | CIF | Al K O8 Si3 | C 1 2/m 1 | 8.53573; 13.03129; 7.17536 90; 115.985; 90 | 717.44 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Latera, Viterbo, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009663 | CIF | Al1.02 Ca0.02 Na0.98 O8 Si2.98 | C -1 | 8.14588; 12.7973; 7.15775 94.2451; 116.6; 87.8 | 665.342 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009664 | CIF | Ca Fe0.25 Mg0.74 O6 Si2 | C 1 2/c 1 | 9.7504; 8.9015; 5.27444 90; 106.016; 90 | 440.016 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009665 | CIF | Al4 K O12 Si2 | C 1 2/c 1 | 5.2226; 9.0183; 20.143 90; 95.665; 90 | 944.081 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009666 | CIF | O2 Si | P 31 2 1 | 4.9158; 4.9158; 5.4091 90; 90; 120 | 113.199 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009667 | CIF | C Ca O3 | R -3 c :H | 4.991; 4.991; 17.068 90; 90; 120 | 368.204 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: March model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9009668 | CIF | C Ca O3 | R -3 c :H | 4.992; 4.992; 17.069 90; 90; 120 | 368.373 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: GSH model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9009669 | CIF | Mo O3 | P b n m | 3.9616; 13.856; 3.6978 90; 90; 90 | 202.979 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: GSH model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9009670 | CIF | Mo O3 | P b n m | 3.9621; 13.855; 3.6986 90; 90; 90 | 203.034 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: March model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9011997 | CIF | C | F d -3 m :1 | 3.566986; 3.566986; 3.55986 90; 90; 90 | 45.293 | Hom, T.; Kiszenick, W.; Post, B. Accurate lattice constants from multiple reflection mesurements II. lattice constants of germanium, silicon and diamond Sample: at T = 25 C Journal of Applied Crystallography, 1975, 8, 457-458 |
| 9011998 | CIF | Si | F d -3 m :1 | 5.430941; 5.430941; 5.430941 90; 90; 90 | 160.186 | Hom, T.; Kiszenick, W.; Post, B. Accurate lattice constants from multiple reflection mesurements II. lattice constants of germanium, silicon and diamond Sample: at T = 25 C Journal of Applied Crystallography, 1975, 8, 457-458 |
| 9011999 | CIF | Ge | F d -3 m :1 | 5.65782; 5.65782; 5.65782 90; 90; 90 | 181.112 | Hom, T.; Kiszenick, W.; Post, B. Accurate lattice constants from multiple reflection mesurements II. lattice constants of germanium, silicon and diamond Sample: at T = 25 C Journal of Applied Crystallography, 1975, 8, 457-458 |
| 9012000 | CIF | Cl3 Fe | R -3 :H | 6.065; 6.065; 17.42 90; 90; 120 | 554.933 | Hashimoto, S.; Forster, K.; Moss, S. C. Structure refinement of an FeCl3 crystal using a thin plate sample Journal of Applied Crystallography, 1988, 22, 173-180 |
| 9014016 | CIF | Ge O2 | P 32 2 1 | 4.9113; 4.9113; 5.6099 90; 90; 120 | 117.187 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 1.69 GPa T = 293 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9014140 | CIF | Ge O2 | P 32 2 1 | 4.9097; 4.9097; 5.6249 90; 90; 120 | 117.424 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 2.9 GPa T = 493 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9014264 | CIF | Ge O2 | P 32 2 1 | 4.8546; 4.8546; 5.5943 90; 90; 120 | 114.178 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 3.55 GPa T = 293 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9014297 | CIF | Mg2 O4 Si | P n m a | 10.20141; 5.98348; 4.75534 90; 90; 90 | 290.266 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9014320 | CIF | Mn2 O4 Si | P n m a | 10.60016; 6.25753; 4.90338 90; 90; 90 | 325.245 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
Back to the search form
Your own data is not in the COD? Deposit it, thanks!