Crystallography Open Database

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Searching journal of publication like 'Advanced Materials'

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1521371 CIFCu0.978 In Se1.988I -4 2 d5.7955; 5.7955; 11.6464
90; 90; 90
391.177Kaplan, L.; Leitus, G.; Lyakhovitskaya, V.; Frolow, F.; Hallak, H.; Kvick, A.; Cahen, D.
Synchrotron X-ray diffraction evidence for native defects in the photovoltaic semiconductor Cu In Se2
Advanced Materials, 2000, 12, 366-370
1521373 CIFCu0.974 In Se1.989I -4 2 d5.7877; 5.7877; 11.6274
90; 90; 90
389.488Kaplan, L.; Leitus, G.; Lyakhovitskaya, V.; Frolow, F.; Hallak, H.; Kvick, A.; Cahen, D.
Synchrotron X-ray diffraction evidence for native defects in the photovoltaic semiconductor Cu In Se2
Advanced Materials, 2000, 12, 366-370
1541072 CIFBa2 Cu2 Eu2 O11 Ti2P 4/m m m3.8889; 3.8889; 15.726
90; 90; 90
237.833Palacin, M. R.; Fuertes, A.; Casan-Pastor, N.; Gomez-Romero, P.
Induction of bidimensionality in mixed Cu‒Ti perovskites
Advanced Materials, 1994, 6, 54-57
1558867 CIFCl6 Cs5 Cu3 I2C m c m16.896; 9.1399; 14.033
90; 90; 90
2167.1Jiangwei Li, Takeshi Inoshita, Tianping Ying, Atsushi Ooishi, Junghwan Kim, Hideo Hosono
A Highly Efficient and Stable Blue-Emitting Cs5Cu3Cl6I2 with a 1D Chain Structure
Advanced Materials, 2020, 2002945

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