Crystallography Open Database
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Result: there are 15 entries in the selection
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 51
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 2300631 | CIF HKL Paper | B H4 Li | P n m a | 7.1374; 4.4172; 6.7029 90; 90; 90 | 211.32 | Solar, Michael; Trapp, Nils μCHILL: a lightweight, modular system for handling crystalline samples at low temperatures under inert conditions Journal of Applied Crystallography, 2018, 51 |
| 2300632 | CIF HKL | B H4 Li | P n m a | 7.1431; 4.4159; 6.7027 90; 90; 90 | 211.42 | Solar, Michael; Trapp, Nils μCHILL: a lightweight, modular system for handling crystalline samples at low temperatures under inert conditions Journal of Applied Crystallography, 2018, 51 |
| 2300633 | CIF HKL Paper | Fe4 Mn Si3 | P 63/m c m | 6.8; 6.8; 4.75 90; 90; 120 | 190.2 | Grzechnik, Andrzej; Meven, Martin; Friese, Karen Single-crystal neutron diffraction in diamond anvil cells with hot neutrons Journal of Applied Crystallography, 2018, 51, 351-356 |
| 2300634 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300635 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300636 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300637 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300638 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300639 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300640 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300641 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300642 | CIF HKL | O192 Si96 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300643 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300644 | CIF HKL | O96 Si48 | C m c m | 18.11; 20.53; 7.528 90; 90; 90 | 2798.9 | Cichocka, Magdalena Ola; Ångström, Jonas; Wang, Bin; Zou, Xiaodong; Smeets, Stef High-throughput continuous rotation electron diffraction data acquisition <i>via</i> software automation Journal of Applied Crystallography, 2018, 51 |
| 2300645 | CIF HKL | O96 Si48 | C m c m | 18.11; 20.53; 7.528 90; 90; 90 | 2798.9 | Cichocka, Magdalena Ola; Ångström, Jonas; Wang, Bin; Zou, Xiaodong; Smeets, Stef High-throughput continuous rotation electron diffraction data acquisition <i>via</i> software automation Journal of Applied Crystallography, 2018, 51 |
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