Crystallography Open Database
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Result: there are 40 entries in the selection
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Searching journal of publication like 'Journal of Materials Science' volume of publication is 23
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
---|---|---|---|---|---|---|
9013014 | CIF | Cu | F m -3 m | 3.613; 3.613; 3.613 90; 90; 90 | 47.163 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 293 K Journal of Materials Science, 1988, 23, 757-760 |
9013015 | CIF | Cu | F m -3 m | 3.63; 3.63; 3.63 90; 90; 90 | 47.832 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 577 K Journal of Materials Science, 1988, 23, 757-760 |
9013016 | CIF | Cu | F m -3 m | 3.636; 3.636; 3.636 90; 90; 90 | 48.07 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 680 K Journal of Materials Science, 1988, 23, 757-760 |
9013017 | CIF | Cu | F m -3 m | 3.644; 3.644; 3.644 90; 90; 90 | 48.388 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 777 K Journal of Materials Science, 1988, 23, 757-760 |
9013018 | CIF | Cu | F m -3 m | 3.65; 3.65; 3.65 90; 90; 90 | 48.627 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 874 K Journal of Materials Science, 1988, 23, 757-760 |
9013019 | CIF | Cu | F m -3 m | 3.658; 3.658; 3.658 90; 90; 90 | 48.948 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 979 K Journal of Materials Science, 1988, 23, 757-760 |
9013020 | CIF | Cu | F m -3 m | 3.667; 3.667; 3.667 90; 90; 90 | 49.31 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1076 K Journal of Materials Science, 1988, 23, 757-760 |
9013021 | CIF | Cu | F m -3 m | 3.672; 3.672; 3.672 90; 90; 90 | 49.512 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1179 K Journal of Materials Science, 1988, 23, 757-760 |
9013022 | CIF | Cu | F m -3 m | 3.684; 3.684; 3.684 90; 90; 90 | 49.999 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1275 K Journal of Materials Science, 1988, 23, 757-760 |
9013023 | CIF | Cu | F m -3 m | 3.692; 3.692; 3.692 90; 90; 90 | 50.325 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1343 K Journal of Materials Science, 1988, 23, 757-760 |
9013024 | CIF | Ni | F m -3 m | 3.524; 3.524; 3.524 90; 90; 90 | 43.763 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 293 K Journal of Materials Science, 1988, 23, 757-760 |
9013025 | CIF | Ni | F m -3 m | 3.538; 3.538; 3.538 90; 90; 90 | 44.287 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 578 K Journal of Materials Science, 1988, 23, 757-760 |
9013026 | CIF | Ni | F m -3 m | 3.544; 3.544; 3.544 90; 90; 90 | 44.512 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 676 K Journal of Materials Science, 1988, 23, 757-760 |
9013027 | CIF | Ni | F m -3 m | 3.552; 3.552; 3.552 90; 90; 90 | 44.815 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 825 K Journal of Materials Science, 1988, 23, 757-760 |
9013028 | CIF | Ni | F m -3 m | 3.563; 3.563; 3.563 90; 90; 90 | 45.232 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1007 K Journal of Materials Science, 1988, 23, 757-760 |
9013029 | CIF | Ni | F m -3 m | 3.571; 3.571; 3.571 90; 90; 90 | 45.538 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1123 K Journal of Materials Science, 1988, 23, 757-760 |
9013030 | CIF | Ni | F m -3 m | 3.581; 3.581; 3.581 90; 90; 90 | 45.921 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1256 K Journal of Materials Science, 1988, 23, 757-760 |
9013031 | CIF | Ni | F m -3 m | 3.587; 3.587; 3.587 90; 90; 90 | 46.152 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1345 K Journal of Materials Science, 1988, 23, 757-760 |
9013032 | CIF | Ni | F m -3 m | 3.595; 3.595; 3.595 90; 90; 90 | 46.462 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1433 K Journal of Materials Science, 1988, 23, 757-760 |
9013033 | CIF | Ni | F m -3 m | 3.603; 3.603; 3.603 90; 90; 90 | 46.773 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1553 K Journal of Materials Science, 1988, 23, 757-760 |
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