Crystallography Open Database
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Result: there are 68 entries in the selection
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 48
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
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2300485 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.462; 16.147; 3.988 90; 90; 90 | 416.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300486 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.447; 16.121; 3.982 90; 90; 90 | 413.9 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300487 | CIF HKL Paper | Br0.09 Cl0.91 Cu6 O8 Pb | F m -3 m | 9.216; 9.216; 9.216 90; 90; 90 | 782.8 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300488 | CIF Paper | Br0.1 Cl0.9 Cu6 O8 Pb | F m -3 m | 9.2164; 9.2164; 9.2164 90; 90; 90 | 782.86 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300489 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.439; 10.559; 13.807 90; 90; 90 | 1230.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300490 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.442; 10.569; 13.816 90; 90; 90 | 1232.7 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300491 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.394; 4.374; 11.995 90; 90; 90 | 178.07 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300492 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.398; 4.377; 12.003 90; 90; 90 | 178.52 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300493 | CIF HKL Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.601; 8.377; 17.201 90; 97.35; 90 | 1372.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300494 | CIF Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.599; 8.378; 17.194 90; 97.32; 90 | 1371.5 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300495 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.568; 9.504; 21.378 90; 102.95; 90 | 3676.6 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300496 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.588; 9.518; 21.403 90; 102.95; 90 | 3690.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300497 | CIF HKL | Bi1.09 Ge2.37 Te4 | F m -3 m | 6.055; 6.055; 6.055 90; 90; 90 | 221.99 | Urban, Philipp; Simonov, Arkadiy; Weber, Thomas; Oeckler, Oliver Real structure of Ge4Bi2Te7: refinement on diffuse scattering data with the 3D-ΔPDF method Journal of Applied Crystallography, 2015, 48, 200 |
2300498 | CIF Paper | K0.5 Na0.5 Nb O3 | R 3 m :H | 5.6085; 5.6085; 6.9183 90; 90; 120 | 188.46 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
2300499 | CIF Paper | K0.5 Na0.5 Nb O3 | A m m 2 | 3.9443; 5.6425; 5.6763 90; 90; 90 | 126.33 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
2300501 | CIF HKL | C7 H10 N2 O2 | C 1 2/c 1 | 17.822; 4.85; 19.783 90; 102.37; 90 | 1670.3 | Graiff, Claudia; Pontiroli, Daniele; Bergamonti, Laura; Cavallari, Chiara; Lottici, Pier Paolo; Predieri, Giovanni Structural investigation of <i>N</i>,<i>N</i>'-methylenebisacrylamide <i>via</i> X-ray diffraction assisted by crystal structure prediction Journal of Applied Crystallography, 2015, 48, 550-557 |
2300502 | CIF | C13 H15 Co N2 O7 | P 1 21/c 1 | 12.6105; 7.6858; 15.9256 90; 106.541; 90 | 1479.66 | Cox, Jordan M.; Walton, Ian M.; Benson, Cassidy A.; Chen, Yu-Sheng; Benedict, Jason B. A versatile environmental control cell for <i>in situ</i> guest exchange single-crystal diffraction Journal of Applied Crystallography, 2015, 48, 578-581 |
2300503 | CIF HKL | C42 H80 Br2 N2 O3 | C 1 2/c 1 | 54.695; 9.8891; 16.877 90; 92.628; 90 | 9118.9 | Chen, Qibin; Yao, Junyao; Hu, Xin; Shen, Jincheng; Sheng, Yujie; Liu, Honglai Monolayer effect of a gemini surfactant with a rigid biphenyl spacer on its self-crystallization at the air/liquid interface Journal of Applied Crystallography, 2015, 48 |
2300504 | CIF HKL | Mg Mo O4 | C 1 2/m 1 | 10.157; 9.246; 7.03 90; 105.9; 90 | 634.94 | Gemmi, Mauro; La Placa, Maria G. I.; Galanis, Athanassios S.; Rauch, Edgar F.; Nicolopoulos, Stavros Fast electron diffraction tomography Journal of Applied Crystallography, 2015, 48 |
2300505 | CIF HKL | C28 H26 N2 O4 | P 1 21/n 1 | 5.9038; 10.7455; 19.4895 90; 90.263; 90 | 1236.39 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
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