Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 48

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2300485 CIF
HKL
Paper
Pt7 Sc4 Si2P b a m6.462; 16.147; 3.988
90; 90; 90
416.1Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300486 CIF
HKL
Paper
Pt7 Sc4 Si2P b a m6.447; 16.121; 3.982
90; 90; 90
413.9Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300487 CIF
HKL
Paper
Br0.09 Cl0.91 Cu6 O8 PbF m -3 m9.216; 9.216; 9.216
90; 90; 90
782.8Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300488 CIF
Paper
Br0.1 Cl0.9 Cu6 O8 PbF m -3 m9.2164; 9.2164; 9.2164
90; 90; 90
782.86Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300489 CIF
HKL
Paper
H4 Na2 O6 WP b c a8.439; 10.559; 13.807
90; 90; 90
1230.3Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300490 CIF
HKL
Paper
H4 Na2 O6 WP b c a8.442; 10.569; 13.816
90; 90; 90
1232.7Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300491 CIF
HKL
Paper
C4 Co Sc3I m m m3.394; 4.374; 11.995
90; 90; 90
178.07Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300492 CIF
HKL
Paper
C4 Co Sc3I m m m3.398; 4.377; 12.003
90; 90; 90
178.52Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300493 CIF
HKL
Paper
C16 H13 Br2 NP 1 21/n 19.601; 8.377; 17.201
90; 97.35; 90
1372.1Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300494 CIF
Paper
C16 H13 Br2 NP 1 21/n 19.599; 8.378; 17.194
90; 97.32; 90
1371.5Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300495 CIF
HKL
Paper
C30 H46 Br2 Cl2 Co N4 Si2P 1 21/n 118.568; 9.504; 21.378
90; 102.95; 90
3676.6Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300496 CIF
HKL
Paper
C30 H46 Br2 Cl2 Co N4 Si2P 1 21/n 118.588; 9.518; 21.403
90; 102.95; 90
3690.3Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300497 CIF
HKL
Bi1.09 Ge2.37 Te4F m -3 m6.055; 6.055; 6.055
90; 90; 90
221.99Urban, Philipp; Simonov, Arkadiy; Weber, Thomas; Oeckler, Oliver
Real structure of Ge4Bi2Te7: refinement on diffuse scattering data with the 3D-ΔPDF method
Journal of Applied Crystallography, 2015, 48, 200
2300498 CIF
Paper
K0.5 Na0.5 Nb O3R 3 m :H5.6085; 5.6085; 6.9183
90; 90; 120
188.46Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M.
Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~
Journal of Applied Crystallography, 2015, 48
2300499 CIF
Paper
K0.5 Na0.5 Nb O3A m m 23.9443; 5.6425; 5.6763
90; 90; 90
126.33Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M.
Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~
Journal of Applied Crystallography, 2015, 48
2300501 CIF
HKL
C7 H10 N2 O2C 1 2/c 117.822; 4.85; 19.783
90; 102.37; 90
1670.3Graiff, Claudia; Pontiroli, Daniele; Bergamonti, Laura; Cavallari, Chiara; Lottici, Pier Paolo; Predieri, Giovanni
Structural investigation of <i>N</i>,<i>N</i>'-methylenebisacrylamide <i>via</i> X-ray diffraction assisted by crystal structure prediction
Journal of Applied Crystallography, 2015, 48, 550-557
2300502 CIFC13 H15 Co N2 O7P 1 21/c 112.6105; 7.6858; 15.9256
90; 106.541; 90
1479.66Cox, Jordan M.; Walton, Ian M.; Benson, Cassidy A.; Chen, Yu-Sheng; Benedict, Jason B.
A versatile environmental control cell for <i>in situ</i> guest exchange single-crystal diffraction
Journal of Applied Crystallography, 2015, 48, 578-581
2300503 CIF
HKL
C42 H80 Br2 N2 O3C 1 2/c 154.695; 9.8891; 16.877
90; 92.628; 90
9118.9Chen, Qibin; Yao, Junyao; Hu, Xin; Shen, Jincheng; Sheng, Yujie; Liu, Honglai
Monolayer effect of a gemini surfactant with a rigid biphenyl spacer on its self-crystallization at the air/liquid interface
Journal of Applied Crystallography, 2015, 48
2300504 CIF
HKL
Mg Mo O4C 1 2/m 110.157; 9.246; 7.03
90; 105.9; 90
634.94Gemmi, Mauro; La Placa, Maria G. I.; Galanis, Athanassios S.; Rauch, Edgar F.; Nicolopoulos, Stavros
Fast electron diffraction tomography
Journal of Applied Crystallography, 2015, 48
2300505 CIF
HKL
C28 H26 N2 O4P 1 21/n 15.9038; 10.7455; 19.4895
90; 90.263; 90
1236.39Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng
Supramolecular organic frameworks of a Schiff base showing selective guest adsorption
Journal of Applied Crystallography, 2015, 48

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