Crystallography Open Database
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Result: there are 10 entries in the selection
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 53
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 2300663 | CIF HKL | Fe4 Mn Si3 | P 63/m c m | 6.7705; 6.7705; 4.7044 90; 90; 120 | 186.76 | Grzechnik, Andrzej; Meven, Martin; Paulmann, Carsten; Friese, Karen Combined X-ray and neutron single-crystal diffraction in diamond anvil cells Journal of Applied Crystallography, 2020, 53, 9-14 |
| 2300664 | CIF HKL | Fe4 Mn Si3 | P 63/m c m | 6.7705; 6.7705; 4.7044 90; 90; 120 | 186.76 | Grzechnik, Andrzej; Meven, Martin; Paulmann, Carsten; Friese, Karen Combined X-ray and neutron single-crystal diffraction in diamond anvil cells Journal of Applied Crystallography, 2020, 53, 9-14 |
| 2300665 | CIF | Li Nb O3 | R 3 c :H | 5.1505; 5.1505; 13.8742 90; 90; 120 | 318.741 | Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C. X-ray diffraction using focused-ion-beam-prepared single crystals Journal of Applied Crystallography, 2020, 53, 614 |
| 2300666 | CIF | Li Nb O3 | R 3 c :H | 5.1513; 5.1513; 13.8687 90; 90; 120 | 318.713 | Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C. X-ray diffraction using focused-ion-beam-prepared single crystals Journal of Applied Crystallography, 2020, 53, 614 |
| 2300667 | CIF | Li Nb O3 | R 3 c :H | 5.1516; 5.1516; 13.869 90; 90; 120 | 318.757 | Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C. X-ray diffraction using focused-ion-beam-prepared single crystals Journal of Applied Crystallography, 2020, 53, 614 |
| 2300668 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong <i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction Journal of Applied Crystallography, 2020, 53, 1217-1224 |
| 2300669 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong <i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction Journal of Applied Crystallography, 2020, 53, 1217-1224 |
| 2300670 | CIF HKL | C42 H28 | C m c e | 26.7958; 7.1586; 14.1598 90; 90; 90 | 2716.1 | Krause, Lennard; Tolborg, Kasper; Grønbech, Thomas Bjørn Egede; Sugimoto, Kunihisa; Iversen, Bo Brummerstedt; Overgaard, Jacob Accurate high-resolution single-crystal diffraction data from a Pilatus3 X CdTe detector Journal of Applied Crystallography, 2020, 53, 635 |
| 2300671 | CIF HKL | C40 H29 Cl Cu N6 O14 | P -1 | 10.6656; 12.4599; 14.7567 98.635; 101.65; 97.962 | 1869.79 | Pinto, Camila B.; Dos Santos, Leonardo H. R.; Rodrigues, Bernardo L. On the Hirshfeld surface for copper(II) atoms in different coordination environments Journal of Applied Crystallography, 2020, 53, 1321-1333 |
| 2300672 | CIF HKL | C6 D12 N4 | I -4 3 m | 7.0195; 7.0195; 7.0195 90; 90; 90 | 345.874 | McMonagle, Charles J.; Allan, David R.; Warren, Mark R.; Kamenev, Konstantin V.; Turner, Gemma F.; Moggach, Stephen A. High-pressure sapphire capillary cell for synchrotron single-crystal X-ray diffraction measurements to 1500 bar Journal of Applied Crystallography, 2020, 53, 1519-1523 |
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