Crystallography Open Database
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Result: there are 12 entries in the selection
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Searching journal of publication like 'Thin Solid Films'
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
---|---|---|---|---|---|---|
1525998 | CIF | Cu In1.93 Se3.5 | P -4 2 c | 5.7626; 5.7626; 11.536 90; 90; 90 | 383.082 | Merino, J.M.; Mahanty, S.; Leon, M.; Martin de Vidales, J.L.; Diaz, R.; Rueda, F. Structural characterization of Cu In2 Se3.5, Cu In3 Se5 and Cu In5 Se8 compounds Thin Solid Films, 2000, 361, 70-73 |
1526000 | CIF | Cu0.79 In2.33 Se3.6 | P -4 2 c | 5.7555; 5.7555; 11.5303 90; 90; 90 | 381.95 | Merino, J.M.; Rueda, F.; Mahanty, S.; Martin de Vidales, J.L.; Diaz, R.; Leon, M. Structural characterization of Cu In2 Se3.5, Cu In3 Se5 and Cu In5 Se8 compounds Thin Solid Films, 2000, 361, 70-73 |
1532334 | CIF | Cu La O S | P 4/n m m :2 | 3.99625; 3.99625; 8.51743 90; 90; 90 | 136.023 | Ueda, K.; Hosono, H. Crystal structure of La Cu O S1-x Sex oxychalcogenides Thin Solid Films, 2002, 411, 115-118 |
1532336 | CIF | Cu La O S0.75 Se0.25 | P 4/n m m :2 | 4.01575; 4.01575; 8.5867 90; 90; 90 | 138.471 | Ueda, K.; Hosono, H. Crystal structure of La Cu O S1-x Sex oxychalcogenides Thin Solid Films, 2002, 411, 115-118 |
1532339 | CIF | Cu La O S0.5 Se0.5 | P 4/n m m :2 | 4.0347; 4.0347; 8.661 90; 90; 90 | 140.991 | Ueda, K.; Hosono, H. Crystal structure of La Cu O S1-x Sex oxychalcogenides Thin Solid Films, 2002, 411, 115-118 |
1532341 | CIF | Cu La O S0.25 Se0.75 | P 4/n m m :2 | 4.05233; 4.05233; 8.7332 90; 90; 90 | 143.411 | Ueda, K.; Hosono, H. Crystal structure of La Cu O S1-x Sex oxychalcogenides Thin Solid Films, 2002, 411, 115-118 |
1532344 | CIF | Cu La O Se | P 4/n m m :2 | 4.06712; 4.06712; 8.7975 90; 90; 90 | 145.524 | Ueda, K.; Hosono, H. Crystal structure of La Cu O S1-x Sex oxychalcogenides Thin Solid Films, 2002, 411, 115-118 |
1537623 | CIF | Pb | P 63/m m c | 3.48; 3.48; 5.59 90; 90; 120 | 58.627 | Akhtar, D.; Vankar, V.D.; Goel, T.C.; Chopra, K.L. Metastable structures of splat-cooled and vapour- depodited lead and antimony films Thin Solid Films, 1979, 58, 327-332 |
1538810 | CIF | Sc Si2 | P 6/m m m | 3.66; 3.66; 3.87 90; 90; 120 | 44.896 | Koleshko, V.M.; Belitsky, V.F.; Khodin, A.A. Thin films of rare earth metal silicides Thin Solid Films, 1986, 141, 277-285 |
1538812 | CIF | Ho Si2 | P 6/m m m | 3.816; 3.816; 4.107 90; 90; 120 | 51.793 | Koleshko, V.M.; Belitsky, V.F.; Khodin, A.A. Thin films of rare earth metal silicides Thin Solid Films, 1986, 141, 277-285 |
1539389 | CIF | Al Cd In S4 | R -3 m :H | 3.867; 3.867; 36.978 90; 90; 120 | 478.875 | Abdullaev, A.G.; Kyazumov, M.G. An electron diffraction study of the Cdx Iny Alz S4 (0.9 <= x 1, 1 <= y <= 1.3, 0.7 <= z <= 1) crystal structure Thin Solid Films, 1990, 190, 303-307 |
1540298 | CIF | Si2 Yb | P 6/m m m | 3.771; 3.771; 4.098 90; 90; 120 | 50.468 | Koleshko, V.M.; Belitsky, V.F.; Khodin, A.A. Thin films of rare earth metal silicides Thin Solid Films, 1986, 141, 277-285 |
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