Crystallography Open Database
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Searching journal of publication like 'Journal of applied crystallography'
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 5000219 | CIF | As | R -3 m :H | 3.7597; 3.7597; 10.4412 90; 90; 120 | 127.8 | Schiferl, D; Barrett, C S The Crystal Structure of Arsenic at 4.2, 78 and 299K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 6000209 | CIF | C12 H16 Mo5 N2 O16 | C 1 2/c 1 | 28.691; 5.6865; 14.368 90; 113.22; 90 | 2154.28 | Lasocha, W.; Schenk, H. Crystal structure of anilinium pentamolybdate from powder diffraction data. The solution of the crystal structure by direct methods package powsim Journal of Applied Crystallography, 1997, 30, 909-913 |
| 6000256 | CIF | C7 H5 Na O3 | P 1 21 1 | 16.0608; 5.3829; 3.6383 90; 92.869; 90 | 314.15 | Dinnebier, R. E.; von Dreele, R.; Stephens, P. W.; Jelonek, S.; Sieler, J. Structure of sodium para-hydroxybenzoate, NaO2C-C6H4OH by powder diffraction: application of a phenomenological model of anisotropic peak width Journal of Applied Crystallography, 1999, 32, 761-769 |
| 6000278 | CIF | C9 H9 N3 O2 S | P 1 21/n 1 | 14.3296; 15.2733; 10.4428 90; 91.052; 90 | 2285.13 | Chan, F. C.; Anwar, J.; Cernik, R.; Barnes, P.; Wilson, R. M. Ab initio structure determination of sulfathiazole polymorph v from synchrotron X-ray powder diffraction data Journal of Applied Crystallography, 1999, 32, 436-441 |
| 6000344 | CIF | C56 H50 O9 S3 | P 1 21/c 1 | 9.702; 18.623; 13.676 90; 91.18; 90 | 2470.46 | Kaduk, J. A.; Cahill, P. J.; Venkateshwaran, L. N. Crystal structures of a solvated and unsolvated sulfone cyclic oligomer Journal of Applied Crystallography, 1999, 32, 15-20 |
| 6000345 | CIF | C54 H44 O8 S2 | P 1 21/c 1 | 9.5703; 18.7582; 13.3945 90; 92.684; 90 | 2401.96 | Kaduk, J. A.; Cahill, P. J.; Venkateshwaran, L. N. Crystal structures of a solvated and unsolvated sulfone cyclic oligomer Journal of Applied Crystallography, 1999, 32, 15-20 |
| 6000386 | CIF | O4 S Sr | P n m a | 8.35929; 5.35083; 6.86939 90; 90; 90 | 307.24 | Burger, K.; Cox, D.; Papoular, R.; Prandl, W. The application of resonant scattering techniques to ab initio structure solution from powder data using SrSO4 as a test case Journal of Applied Crystallography, 1998, 31, 789-797 |
| 6000566 | CIF | D2 Mg O2 | P -3 m 1 | 3.1455; 3.1455; 4.7646 90; 90; 120 | 40.83 | Partin, D. E.; Okeeffe, M.; Vondreele, R. B. Crystal-structure and profile fitting of Mg(OD)2 by time-of-flight neutron-diffraction Journal of Applied Crystallography, 1994, 27, 581-584 |
| 6000665 | CIF | B2 H3 Li O5 | P n n a | 9.7984; 8.2759; 9.6138 90; 90; 90 | 779.59 | Louer, D.; Louer, M.; Touboul, M. Crystal-structure determination of lithium diborate hydrate, LIB2O3(OH).H2O, from X-ray-powder diffraction data collected with a curved position-sensitive detector Journal of Applied Crystallography, 1992, 25, 617-623 |
| 6000679 | CIF | H8 O9 S Zr | P 1 21/c 1 | 8.3645; 15.1694; 5.4427 90; 103.145; 90 | 672.5 | Gascoigne, D.; Tarling, S. E.; Barnes, P.; Pygall, C. F.; Benard, P.; Louer, D. Ab-initio structure determination of ZR(OH)2SO4.3H2O using conventional monochromatic X-ray-powder diffraction Journal of Applied Crystallography, 1994, 27, 399-405 |
| 9009650 | CIF | As | R 3 m :H | 3.7597; 3.7597; 10.4412 90; 90; 120 | 127.817 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 4.2 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009651 | CIF | As | R -3 m :H | 3.7595; 3.7595; 10.4573 90; 90; 120 | 128 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 78 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009652 | CIF | As | R -3 m :H | 3.7598; 3.7598; 10.5475 90; 90; 120 | 129.125 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 299 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009653 | CIF | Sb | R -3 m :H | 4.3007; 4.3007; 11.222 90; 90; 120 | 179.754 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 4.2 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009654 | CIF | Sb | R -3 m :H | 4.3012; 4.3012; 11.232 90; 90; 120 | 179.956 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 78 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009655 | CIF | Sb | R -3 m :H | 4.3084; 4.3084; 11.274 90; 90; 120 | 181.234 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 299 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009656 | CIF | Bi | R -3 m :H | 4.533; 4.533; 11.797 90; 90; 120 | 209.93 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 4.2 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009657 | CIF | Bi | R -3 m :H | 4.535; 4.535; 11.814 90; 90; 120 | 210.418 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 78 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009658 | CIF | Bi | R -3 m :H | 4.546; 4.546; 11.862 90; 90; 120 | 212.299 | Schiferl, D.; Barrett CS The crystal structure of arsenic at 4.2, 78 and 299 K Sample: T = 298 K Journal of Applied Crystallography, 1969, 2, 30-36 |
| 9009659 | CIF | N Na O3 | R -3 c :H | 5.0718; 5.0718; 16.8336 90; 90; 120 | 375.001 | Ahtee, M.; Nurmela, M.; Suortti, P.; Jarvinen, M. Correction for preferred orientation in Rietveld refinement Sample: II, refined with correction for texture Note: Synthetic sample Journal of Applied Crystallography, 1989, 22, 261-268 |
| 9009660 | CIF | Al3.2 Ca0.78 H7.5 K1.22 Na0.41 O21.13 Si4.8 | P 1 21/m 1 | 9.8881; 14.404; 8.6848 90; 124.271; 90 | 1022.2 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Vallerano, Rome, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009661 | CIF | Al3.48 Ca1.74 H70 O42.15 Si8.52 | R -3 m :R | 9.39692; 9.39692; 9.39692 93.866; 93.866; 93.866 | 823.834 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009662 | CIF | Al K O8 Si3 | C 1 2/m 1 | 8.53573; 13.03129; 7.17536 90; 115.985; 90 | 717.44 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Locality: Latera, Viterbo, Italy Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009663 | CIF | Al1.02 Ca0.02 Na0.98 O8 Si2.98 | C -1 | 8.14588; 12.7973; 7.15775 94.2451; 116.6; 87.8 | 665.342 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009664 | CIF | Ca Fe0.25 Mg0.74 O6 Si2 | C 1 2/c 1 | 9.7504; 8.9015; 5.27444 90; 106.016; 90 | 440.016 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009665 | CIF | Al4 K O12 Si2 | C 1 2/c 1 | 5.2226; 9.0183; 20.143 90; 95.665; 90 | 944.081 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009666 | CIF | O2 Si | P 31 2 1 | 4.9158; 4.9158; 5.4091 90; 90; 120 | 113.199 | Gualtieri, A. F. Accuracy of XRPD QPA using the combined Rietveld-RIR method Journal of Applied Crystallography, 2000, 33, 267-278 |
| 9009667 | CIF | C Ca O3 | R -3 c :H | 4.991; 4.991; 17.068 90; 90; 120 | 368.204 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: March model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9009668 | CIF | C Ca O3 | R -3 c :H | 4.992; 4.992; 17.069 90; 90; 120 | 368.373 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: GSH model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9009669 | CIF | Mo O3 | P b n m | 3.9616; 13.856; 3.6978 90; 90; 90 | 202.979 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: GSH model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9009670 | CIF | Mo O3 | P b n m | 3.9621; 13.855; 3.6986 90; 90; 90 | 203.034 | Sitepu, H.; O'Connor B H; Li, D. Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders Note: March model Journal of Applied Crystallography, 2005, 38, 158-167 |
| 9011997 | CIF | C | F d -3 m :1 | 3.566986; 3.566986; 3.55986 90; 90; 90 | 45.293 | Hom, T.; Kiszenick, W.; Post, B. Accurate lattice constants from multiple reflection mesurements II. lattice constants of germanium, silicon and diamond Sample: at T = 25 C Journal of Applied Crystallography, 1975, 8, 457-458 |
| 9011998 | CIF | Si | F d -3 m :1 | 5.430941; 5.430941; 5.430941 90; 90; 90 | 160.186 | Hom, T.; Kiszenick, W.; Post, B. Accurate lattice constants from multiple reflection mesurements II. lattice constants of germanium, silicon and diamond Sample: at T = 25 C Journal of Applied Crystallography, 1975, 8, 457-458 |
| 9011999 | CIF | Ge | F d -3 m :1 | 5.65782; 5.65782; 5.65782 90; 90; 90 | 181.112 | Hom, T.; Kiszenick, W.; Post, B. Accurate lattice constants from multiple reflection mesurements II. lattice constants of germanium, silicon and diamond Sample: at T = 25 C Journal of Applied Crystallography, 1975, 8, 457-458 |
| 9012000 | CIF | Cl3 Fe | R -3 :H | 6.065; 6.065; 17.42 90; 90; 120 | 554.933 | Hashimoto, S.; Forster, K.; Moss, S. C. Structure refinement of an FeCl3 crystal using a thin plate sample Journal of Applied Crystallography, 1988, 22, 173-180 |
| 9014016 | CIF | Ge O2 | P 32 2 1 | 4.9113; 4.9113; 5.6099 90; 90; 120 | 117.187 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 1.69 GPa T = 293 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9014140 | CIF | Ge O2 | P 32 2 1 | 4.9097; 4.9097; 5.6249 90; 90; 120 | 117.424 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 2.9 GPa T = 493 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9014264 | CIF | Ge O2 | P 32 2 1 | 4.8546; 4.8546; 5.5943 90; 90; 120 | 114.178 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 3.55 GPa T = 293 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9014297 | CIF | Mg2 O4 Si | P n m a | 10.20141; 5.98348; 4.75534 90; 90; 90 | 290.266 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9014320 | CIF | Mn2 O4 Si | P n m a | 10.60016; 6.25753; 4.90338 90; 90; 90 | 325.245 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9014327 | CIF | Ge O2 | P 32 2 1 | 4.831; 4.831; 5.568 90; 90; 120 | 112.539 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 4.58 GPa T = 293 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9014652 | CIF | Ge O2 | P 32 2 1 | 4.9858; 4.9858; 5.6473 90; 90; 120 | 121.574 | Yamanaka, T.; Ogata, K. Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction Note: P = 0.0001 GPa T = 293 K Note: quartz structure Journal of Applied Crystallography, 1991, 24, 111-118 |
| 9015074 | CIF | Mg Mn O4 Si | P n m a | 10.451; 6.12446; 4.80757 90; 90; 90 | 307.717 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9015142 | CIF | C H7 Cl Mg2 O7 | R 3 c :H | 23.14422; 23.14422; 7.22333 90; 90; 120 | 3350.84 | Sugimoto, K.; Dinnebier, R. E.; Schlecht, T. Chlorartinite, a volcanic exhalation product also found in industrial magnesia screed Note: this is the hydrated chlorartinite Journal of Applied Crystallography, 2006, 39, 739-744 |
| 9015192 | CIF | Mg Mn O4 Si | P n m a | 10.451; 6.12446; 4.80757 90; 90; 90 | 307.717 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9015658 | CIF | Mg2 O4 Si | P n m a | 10.20141; 5.98348; 4.75534 90; 90; 90 | 290.266 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9015849 | CIF | Mn2 O4 Si | P n m a | 10.60016; 6.25753; 4.90338 90; 90; 90 | 325.245 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9016116 | CIF | Mg0.6 Mn1.4 O4 Si | P n m a | 10.52411; 6.17903; 4.83927 90; 90; 90 | 314.692 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9016435 | CIF | Mg0.6 Mn1.4 O4 Si | P n m a | 10.52411; 6.17903; 4.83927 90; 90; 90 | 314.692 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
| 9017489 | CIF | Fe2.668 O4 | P 43 3 2 | 8.3474; 8.3474; 8.3474 90; 90; 90 | 581.639 | Shmakov, A. N.; Kryukova, G. N.; Tsybulya, S. V.; Chuvilin, A. L.; Solovyeva, L. P. Vacancy ordering in gamma-Fe2O3: synchrotron x-ray powder diffraction and high- resolution electron microscopy studies Journal of Applied Crystallography, 1995, 28, 141-145 |
| 9017490 | CIF | Fe0.23 Mg1.77 O4 Si | P b n m | 4.764; 10.229; 5.996 90; 90; 90 | 292.191 | Heuer, M. The determination of site occupancies using a new strategy in Rietveld refinements Note: for calculation of powder patterns Journal of Applied Crystallography, 2001, 34, 271-279 |
| 9017491 | CIF | Fe0.23 Mg1.77 O4 Si | P b n m | 4.7645; 10.23467; 5.99727 90; 90; 90 | 292.445 | Heuer, M. The determination of site occupancies using a new strategy in Rietveld refinements Note: results of the conventional Rietveld refinement on the whole data set Journal of Applied Crystallography, 2001, 34, 271-279 |
| 9017492 | CIF | Fe0.23 Mg1.77 O4 Si | P b n m | 4.762; 10.235; 5.998 90; 90; 90 | 292.337 | Heuer, M. The determination of site occupancies using a new strategy in Rietveld refinements Note: results of the conventional refinement on single-crystal data Journal of Applied Crystallography, 2001, 34, 271-279 |
| 9017493 | CIF | Fe2.645 O3.99 | P 43 3 2 | 8.3364; 8.3364; 8.3364 90; 90; 90 | 579.343 | Solano, E.; Frontera, C.; Puig, T.; Obradors, X.; Ricart, S.; Ros, J. Neutron and X-ray diffraction study of ferrite nanocrystals obtained by microwave-assisted growth. A structural comparison with the thermal synthetic route Journal of Applied Crystallography, 2014, 47, 414-420 |
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