Crystallography Open Database
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Searching journal of publication like 'Journal of Materials Science'
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 1537679 | CIF | Pt0 Ta4 | F m -3 m | 3.898; 3.898; 3.898 90; 90; 90 | 59.228 | Baba, K.; Miyagawa, U.; Flanagan, T.B.; Watanabe, K.; Sakamoto, Y. Electrical resistivity changes due to interstitial hydrogen in palladium-rich substitutional alloys Journal of Materials Science, 1990, 25, 3910-3916 |
| 1537682 | CIF | Pd3.6 Ti0.4 | F m -3 m | 3.887; 3.887; 3.887 90; 90; 90 | 58.728 | Baba, K.; Miyagawa, U.; Watanabe, K.; Sakamoto, Y.; Flanagan, T.B. Electrical resistivity changes due to interstitial hydrogen in palladium-rich substitutional alloys Journal of Materials Science, 1990, 25, 3910-3916 |
| 1537684 | CIF | Pd3.6 V0.4 | F m -3 m | 3.874; 3.874; 3.874 90; 90; 90 | 58.141 | Baba, K.; Miyagawa, U.; Watanabe, K.; Flanagan, T.B.; Sakamoto, Y. Electrical resistivity changes due to interstitial hydrogen in palladium-rich substitutional alloys Journal of Materials Science, 1990, 25, 3910-3916 |
| 1537685 | CIF | Pd3.6 Zr0.4 | F m -3 m | 3.927; 3.927; 3.927 90; 90; 90 | 60.56 | Baba, K.; Miyagawa, U.; Watanabe, K.; Sakamoto, Y.; Flanagan, T.B. Electrical resistivity changes due to interstitial hydrogen in palladium-rich substitutional alloys Journal of Materials Science, 1990, 25, 3910-3916 |
| 1537688 | CIF | Nb0.4 Pd3.6 | F m -3 m | 3.897; 3.897; 3.897 90; 90; 90 | 59.182 | Baba, K.; Miyagawa, U.; Watanabe, K.; Sakamoto, Y.; Flanagan, T.B. Electrical resistivity changes due to interstitial hydrogen in palladium-rich substitutional alloys Journal of Materials Science, 1990, 25, 3910-3916 |
| 1538215 | CIF | Mn Te | F m -3 m | 5.98; 5.98; 5.98 90; 90; 90 | 213.847 | Griffiths, C.H. Cubic manganous telluride Journal of Materials Science, 1978, 13, 513-518 |
| 1538747 | CIF | Hg Te | F -4 3 m | 6.47; 6.47; 6.47 90; 90; 90 | 270.84 | Niculescu, D.; Nistor, N.; Popa, M.; Ionescu, R.; Vantza, M. Galvanomagnetic and thermoelectric properties of Hg Sx Te1-x solid solutions Journal of Materials Science, 1970, 5, 385-388 |
| 1539831 | CIF | O2 Zr | P 42/n m c :2 | 3.5916; 3.5916; 5.179 90; 90; 90 | 66.807 | Bondars, B.Ya.; Frey, F.; Heidemane, G.; Grabis, J.; Schneider, J.; Laschke, K.; Boysen, H. Powder diffraction investigations of plasma sprayed zirconia Journal of Materials Science, 1995, 30, 1621-1625 |
| 1540094 | CIF | Cu12.32 In18.04 Se32 | P -4 3 m | 11.534; 11.534; 11.534 90; 90; 90 | 1534.4 | Hoenle, W.; Kuehn, G.; Boehnke, U.C. The crystal structure of a quenched Cu-rich beta phase with the composition Cu14 In16.7 Se32 Journal of Materials Science, 1989, 24, 2483-2487 |
| 1543664 | CIF | C Fe2 | P n n m | 4.722; 4.271; 2.835 90; 90; 90 | 57.175 | Oila, Adrian; Lung, Chi; Bull, Steve Elastic properties of eta carbide (η-Fe2C) from ab initio calculations: application to cryogenically treated gear steel Journal of Materials Science, 2013, 49, 2383 |
| 1548806 | CIF | Se2 Sn | P -3 m 1 | 3.807; 3.807; 6.128 90; 90; 120 | 76.92 | Al-Alamy, F. A. S.; Balchin, A. A.; White, M. The expansivities and the thermal degradation of some layer compounds Journal of Materials Science, 1977, 12, 2037-2042 |
| 1557391 | CIF | C4 Al4 Si | P 63 m c | 3.2771; 3.2771; 21.676 90; 90; 120 | 201.6 | Inoue, Z.; Inomata, Y.; Tanaka, H.; Kawabata, H. X-ray crystallographic data on aluminum silicon carbide, alpha-Al4SiC4 and Al4Si2C5 Journal of Materials Science, 1980, 15, 575-580 |
| 1557392 | CIF | C5 Al4 Si2 | R -3 m :H | 3.2512; 3.2512; 40.1078 90; 90; 120 | 367.15 | Inoue, Z.; Inomata, Y.; Tanaka, H.; Kawabata, H. X-ray crystallographic data on aluminum silicon carbide, alpha-Al4SiC4 and Al4Si2C5 Journal of Materials Science, 1980, 15, 575-580 |
| 1559831 | CIF | B4 K3 Lu3 O12 | P 1 21/c 1 | 10.4282; 17.3029; 13.7515 90; 110.286; 90 | 2327.39 | Chen, Pengyun; Murshed, M. Mangir; Gesing, Thorsten M. Synthesis and crystal structures of novel alkali rare-earth orthoborates K3RE3(BO3)4 (RE = Pr, Nd, Sm‒Lu) Journal of Materials Science, 2020, 56, 3639-3652 |
| 1559832 | CIF | B4 K3 O12 Yb3 | P 1 21/c 1 | 10.4601; 17.355; 13.7625 90; 110.336; 90 | 2342.65 | Chen, Pengyun; Murshed, M. Mangir; Gesing, Thorsten M. Synthesis and crystal structures of novel alkali rare-earth orthoborates K3RE3(BO3)4 (RE = Pr, Nd, Sm‒Lu) Journal of Materials Science, 2020, 56, 3639-3652 |
| 1559833 | CIF | B4 K3 O12 Tm3 | P 1 21/c 1 | 10.49; 17.3785; 13.7941 90; 110.495; 90 | 2355.5 | Chen, Pengyun; Murshed, M. Mangir; Gesing, Thorsten M. Synthesis and crystal structures of novel alkali rare-earth orthoborates K3RE3(BO3)4 (RE = Pr, Nd, Sm‒Lu) Journal of Materials Science, 2021, 56, 3639-3652 |
| 1559834 | CIF | B4 Er3 K3 O12 | P 1 21/c 1 | 10.5189; 17.4322; 13.8305 90; 110.521; 90 | 2375.14 | Chen, Pengyun; Murshed, M. Mangir; Gesing, Thorsten M. Synthesis and crystal structures of novel alkali rare-earth orthoborates K3RE3(BO3)4 (RE = Pr, Nd, Sm‒Lu) Journal of Materials Science, 2021, 56, 3639-3652 |
| 1559835 | CIF | B4 K3 O12 Pr3 | P -1 | 10.8167; 9.0776; 14.1014 90.051; 110.257; 89.901 | 1299 | Chen, Pengyun; Murshed, M. Mangir; Gesing, Thorsten M. Synthesis and crystal structures of novel alkali rare-earth orthoborates K3RE3(BO3)4 (RE = Pr, Nd, Sm‒Lu) Journal of Materials Science, 2021, 56, 3639-3652 |
| 6000111 | CIF | Ba2 La0.66 O8 V2 | R -3 m | 5.7527; 5.7527; 21.0473 90; 90; 120 | 603.22 | Skakle, J. M. S.; Coats, A. M.; Marr, J. The crystal structures of Ba2R2/3V2O8 (R = La, Nd) and Sr2La2/3V2O8; palmierite derivatives Journal of Materials Science, 2000, 35, 3251-3256 |
| 6000235 | CIF | Al14 O25 Sr4 | P m m a | 24.7451; 8.4735; 4.8808 90; 90; 90 | 1023.39 | Wang, D.; Wang, M. Q.; Lu, G. L. Synthesis, crystal structure and X-ray powder diffraction data of the phosphor matrix 4SrO . 7Al(2)O(3) Journal of Materials Science, 1999, 34, 4959-4964 |
| 9013008 | CIF | Sb | P m -3 m | 3.16; 3.16; 3.16 90; 90; 90 | 31.554 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Note: liquid-quenched specimen Journal of Materials Science, 1979, 14, 988-994 |
| 9013009 | CIF | Sb | F m -3 m | 4.61; 4.61; 4.61 90; 90; 90 | 97.972 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Locality: synthetic Note: liquid-quenched specimen Journal of Materials Science, 1979, 14, 988-994 |
| 9013010 | CIF | Sb | I 4/m m m | 3.01; 3.01; 4.96 90; 90; 90 | 44.938 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Note: liquid-quenched specimen Journal of Materials Science, 1979, 14, 988-994 |
| 9013011 | CIF | Sb | P 63/m m c | 3.33; 3.33; 5.23 90; 90; 120 | 50.225 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Locality: synthetic Note: liquid-quenched specimen Note: HCP structure resulted from electron beam heating of the tetragonal, FCC and SC structures Journal of Materials Science, 1979, 14, 988-994 |
| 9013014 | CIF | Cu | F m -3 m | 3.613; 3.613; 3.613 90; 90; 90 | 47.163 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 293 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013015 | CIF | Cu | F m -3 m | 3.63; 3.63; 3.63 90; 90; 90 | 47.832 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 577 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013016 | CIF | Cu | F m -3 m | 3.636; 3.636; 3.636 90; 90; 90 | 48.07 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 680 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013017 | CIF | Cu | F m -3 m | 3.644; 3.644; 3.644 90; 90; 90 | 48.388 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 777 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013018 | CIF | Cu | F m -3 m | 3.65; 3.65; 3.65 90; 90; 90 | 48.627 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 874 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013019 | CIF | Cu | F m -3 m | 3.658; 3.658; 3.658 90; 90; 90 | 48.948 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 979 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013020 | CIF | Cu | F m -3 m | 3.667; 3.667; 3.667 90; 90; 90 | 49.31 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1076 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013021 | CIF | Cu | F m -3 m | 3.672; 3.672; 3.672 90; 90; 90 | 49.512 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1179 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013022 | CIF | Cu | F m -3 m | 3.684; 3.684; 3.684 90; 90; 90 | 49.999 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1275 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013023 | CIF | Cu | F m -3 m | 3.692; 3.692; 3.692 90; 90; 90 | 50.325 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1343 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013024 | CIF | Ni | F m -3 m | 3.524; 3.524; 3.524 90; 90; 90 | 43.763 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 293 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013025 | CIF | Ni | F m -3 m | 3.538; 3.538; 3.538 90; 90; 90 | 44.287 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 578 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013026 | CIF | Ni | F m -3 m | 3.544; 3.544; 3.544 90; 90; 90 | 44.512 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 676 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013027 | CIF | Ni | F m -3 m | 3.552; 3.552; 3.552 90; 90; 90 | 44.815 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 825 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013028 | CIF | Ni | F m -3 m | 3.563; 3.563; 3.563 90; 90; 90 | 45.232 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1007 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013029 | CIF | Ni | F m -3 m | 3.571; 3.571; 3.571 90; 90; 90 | 45.538 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1123 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013030 | CIF | Ni | F m -3 m | 3.581; 3.581; 3.581 90; 90; 90 | 45.921 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1256 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013031 | CIF | Ni | F m -3 m | 3.587; 3.587; 3.587 90; 90; 90 | 46.152 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1345 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013032 | CIF | Ni | F m -3 m | 3.595; 3.595; 3.595 90; 90; 90 | 46.462 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1433 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013033 | CIF | Ni | F m -3 m | 3.603; 3.603; 3.603 90; 90; 90 | 46.773 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1553 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013034 | CIF | Ni | F m -3 m | 3.615; 3.615; 3.615 90; 90; 90 | 47.242 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1676 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013035 | CIF | Au | F m -3 m | 4.072; 4.072; 4.072 90; 90; 90 | 67.519 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 293 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013036 | CIF | Au | F m -3 m | 4.091; 4.091; 4.091 90; 90; 90 | 68.468 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 574 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013037 | CIF | Au | F m -3 m | 4.097; 4.097; 4.097 90; 90; 90 | 68.77 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 676 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013038 | CIF | Au | F m -3 m | 4.103; 4.103; 4.103 90; 90; 90 | 69.072 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 777 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013039 | CIF | Au | F m -3 m | 4.11; 4.11; 4.11 90; 90; 90 | 69.427 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 875 K Journal of Materials Science, 1988, 23, 757-760 |
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