Crystallography Open Database

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2300645 CIF
HKL
O96 Si48C m c m18.11; 20.53; 7.528
90; 90; 90
2798.9Cichocka, Magdalena Ola; Ångström, Jonas; Wang, Bin; Zou, Xiaodong; Smeets, Stef
High-throughput continuous rotation electron diffraction data acquisition <i>via</i> software automation
Journal of Applied Crystallography, 2018, 51
2300646 CIF
HKL
C6 H8 O6P 1 21 16.4213; 6.3622; 17.1606
90; 99.355; 90
691.75McMonagle, Charles James; Probert, Michael Richard
Reducing the background of ultra-low-temperature X-ray diffraction data through new methods and advanced materials
Journal of Applied Crystallography, 2019, 52, 445-450
2300647 CIF
HKL
C6 H8 O6P 1 21 16.4196; 6.3619; 17.1568
90; 99.356; 90
691.38McMonagle, Charles James; Probert, Michael Richard
Reducing the background of ultra-low-temperature X-ray diffraction data through new methods and advanced materials
Journal of Applied Crystallography, 2019, 52, 445-450
2300648 CIF
HKL
C6 H8 O6P 1 21 16.4259; 6.3637; 17.168
90; 99.368; 90
692.7McMonagle, Charles James; Probert, Michael Richard
Reducing the background of ultra-low-temperature X-ray diffraction data through new methods and advanced materials
Journal of Applied Crystallography, 2019, 52, 445-450
2300649 CIF
HKL
Paper
Al6.24 K1.03 Mg2.18 O88.58 Si29.76I m m m7.509; 14.1395; 19.2362
90; 90; 90
2042.37Giacobbe, Carlotta; Wright, Jonathan; Dejoie, Catherine; Tafforeau, Paul; Berruyer, Camille; Vigliaturo, Ruggero; Gieré, Reto; Gualtieri, Alessandro F.
Depicting the crystal structure of fibrous ferrierite from British Columbia using a combined synchrotron techniques approach
Journal of Applied Crystallography, 2019, 52
2300650 CIF
Paper
C5 H4P 1 21/a 18.084; 5.9051; 8.5731
90; 123.484; 90
341.33Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300651 CIF
Paper
C5 H4P 1 21/a 17.3886; 5.6145; 8.2776
90; 125.706; 90
278.83Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300652 CIF
Paper
C5 H4P 1 21/a 17.4494; 5.6208; 8.2917
90; 125.494; 90
282.67Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300653 CIF
Paper
C5 H4P 1 21/a 17.6472; 5.684; 8.389
90; 125.028; 90
298.6Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300654 CIF
Paper
C5 H4P 1 21/a 17.8031; 5.7597; 8.4596
90; 124.507; 90
313.31Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300655 CIF
Paper
C5 H4P 1 21/a 17.5578; 5.6554; 8.3443
90; 125.212; 90
291.4Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300656 CIF
Paper
C5 H4P 1 21/a 18.2592; 5.98351; 8.6755
90; 122.651; 90
360.98Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300657 CIF
Paper
C5 H4P 1 21/a 17.7152; 5.7097; 8.4166
90; 124.816; 90
304.39Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300658 CIF
Paper
C5 H4P 1 21/a 17.9917; 5.8564; 8.5502
90; 123.777; 90
332.63Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300659 CIF
Paper
C5 H4P 1 21/a 17.8713; 5.788; 8.4908
90; 124.076; 90
320.41Likhacheva, Anna Y.; Rashchenko, Sergey V.; Litasov, Konstantin D.
High-pressure structural properties of naphthalene up to 6 GPa
Journal of Applied Crystallography, 2014, 47, 984
2300660 CIF
Paper
C15 H15 N OP n a 219.5277; 11.1555; 11.7848
90; 90; 90
1252.56Goel, Sahil; Yadav, Harsh; Sinha, Nidhi; Singh, Budhendra; Bdikin, Igor; Rao, Devarapalli Chenna; Gopalaiah, Kovuru; Kumar, Binay
An insight into the synthesis, crystal structure, geometrical modelling of crystal morphology, Hirshfeld surface analysis and characterization ofN-(4-methylbenzyl)benzamide single crystals
Journal of Applied Crystallography, 2017, 50, 1498
2300661 CIF
Paper
C6 Fe14P b c a4.5251; 13.7555; 23.9096
90; 90; 90
1488.3Gromilov, Sergey; Chepurov, Anatoly; Sonin, Valeri; Zhimulev, Egor; Sukhikh, Aleksandr; Chepurov, Aleksei; Shcheglov, Dmitry
Formation of two crystal modifications of Fe7C3−x at 5.5 GPa
Journal of Applied Crystallography, 2019, 52, 1378
2300662 CIF
Paper
C6 Fe14P b c a11.9698; 4.524; 13.7658
90; 90; 90
745.44Gromilov, Sergey; Chepurov, Anatoly; Sonin, Valeri; Zhimulev, Egor; Sukhikh, Aleksandr; Chepurov, Aleksei; Shcheglov, Dmitry
Formation of two crystal modifications of Fe7C3−x at 5.5 GPa
Journal of Applied Crystallography, 2019, 52, 1378
2300663 CIF
HKL
Fe4 Mn Si3P 63/m c m6.7705; 6.7705; 4.7044
90; 90; 120
186.76Grzechnik, Andrzej; Meven, Martin; Paulmann, Carsten; Friese, Karen
Combined X-ray and neutron single-crystal diffraction in diamond anvil cells
Journal of Applied Crystallography, 2020, 53, 9-14
2300664 CIF
HKL
Fe4 Mn Si3P 63/m c m6.7705; 6.7705; 4.7044
90; 90; 120
186.76Grzechnik, Andrzej; Meven, Martin; Paulmann, Carsten; Friese, Karen
Combined X-ray and neutron single-crystal diffraction in diamond anvil cells
Journal of Applied Crystallography, 2020, 53, 9-14
2300665 CIFLi Nb O3R 3 c :H5.1505; 5.1505; 13.8742
90; 90; 120
318.741Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C.
X-ray diffraction using focused-ion-beam-prepared single crystals
Journal of Applied Crystallography, 2020, 53, 614
2300666 CIFLi Nb O3R 3 c :H5.1513; 5.1513; 13.8687
90; 90; 120
318.713Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C.
X-ray diffraction using focused-ion-beam-prepared single crystals
Journal of Applied Crystallography, 2020, 53, 614
2300667 CIFLi Nb O3R 3 c :H5.1516; 5.1516; 13.869
90; 90; 120
318.757Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C.
X-ray diffraction using focused-ion-beam-prepared single crystals
Journal of Applied Crystallography, 2020, 53, 614
2300668 CIF
HKL
O24 Si12P n m a20.022; 19.899; 13.383
90; 90; 90
5332Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong
<i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction
Journal of Applied Crystallography, 2020, 53, 1217-1224
2300669 CIF
HKL
O24 Si12P n m a20.022; 19.899; 13.383
90; 90; 90
5332Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong
<i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction
Journal of Applied Crystallography, 2020, 53, 1217-1224
2300670 CIF
HKL
C42 H28C m c e26.7958; 7.1586; 14.1598
90; 90; 90
2716.1Krause, Lennard; Tolborg, Kasper; Grønbech, Thomas Bjørn Egede; Sugimoto, Kunihisa; Iversen, Bo Brummerstedt; Overgaard, Jacob
Accurate high-resolution single-crystal diffraction data from a Pilatus3 X CdTe detector
Journal of Applied Crystallography, 2020, 53, 635
2300671 CIF
HKL
C40 H29 Cl Cu N6 O14P -110.6656; 12.4599; 14.7567
98.635; 101.65; 97.962
1869.79Pinto, Camila B.; Dos Santos, Leonardo H. R.; Rodrigues, Bernardo L.
On the Hirshfeld surface for copper(II) atoms in different coordination environments
Journal of Applied Crystallography, 2020, 53, 1321-1333
2300672 CIF
HKL
C6 D12 N4I -4 3 m7.0195; 7.0195; 7.0195
90; 90; 90
345.874McMonagle, Charles J.; Allan, David R.; Warren, Mark R.; Kamenev, Konstantin V.; Turner, Gemma F.; Moggach, Stephen A.
High-pressure sapphire capillary cell for synchrotron single-crystal X-ray diffraction measurements to 1500 bar
Journal of Applied Crystallography, 2020, 53, 1519-1523
2300673 CIF
HKL
Paper
Cu K0.67 O5.33 S1.33C 1 2/c 113.6088; 11.9627; 17.0791
90; 112.45; 90
2569.72Borisov, Artem S.; Siidra, Oleg I.; Kovrugin, Vadim M.; Golov, Andrey A.; Depmeier, Wulf; Nazarchuk, Evgeny V.; Holzheid, Astrid
Expanding the family of mineral-like anhydrous alkali copper sulfate framework structures: new phases, topological analysis and evaluation of ion migration potentialities
Journal of Applied Crystallography, 2021, 54, 237-250
2300674 CIF
HKL
Cu K Na O8 S2C 1 2/c 115.9721; 9.4576; 9.0679
90; 93.635; 90
1367.02Borisov, Artem S.; Siidra, Oleg I.; Kovrugin, Vadim M.; Golov, Andrey A.; Depmeier, Wulf; Nazarchuk, Evgeny V.; Holzheid, Astrid
Expanding the family of mineral-like anhydrous alkali copper sulfate framework structures: new phases, topological analysis and evaluation of ion migration potentialities
Journal of Applied Crystallography, 2021, 54, 237-250
2300675 CIFC13 H11 N O5P 21 21 215.3386; 9.9878; 22.3493
90; 90; 90
1191.68Malaspina, Lorraine A.; Genoni, Alessandro; Jayatilaka, Dylan; Turner, Michael J.; Sugimoto, Kunihisa; Nishibori, Eiji; Grabowsky, Simon
The advanced treatment of hydrogen bonding in quantum crystallography
Journal of Applied Crystallography, 2021, 54
2300676 CIFC8 H18 Mg O14P 1 21/c 110.195; 11.759; 6.6206
90; 103.67; 90
771.2Malaspina, Lorraine A.; Genoni, Alessandro; Jayatilaka, Dylan; Turner, Michael J.; Sugimoto, Kunihisa; Nishibori, Eiji; Grabowsky, Simon
The advanced treatment of hydrogen bonding in quantum crystallography
Journal of Applied Crystallography, 2021, 54
2300677 CIFC8 H17 N3 O5P 1 21 110.224; 4.804; 11.987
90; 101.419; 90
577.1Malaspina, Lorraine A.; Genoni, Alessandro; Jayatilaka, Dylan; Turner, Michael J.; Sugimoto, Kunihisa; Nishibori, Eiji; Grabowsky, Simon
The advanced treatment of hydrogen bonding in quantum crystallography
Journal of Applied Crystallography, 2021, 54
2300678 CIFC5 H12 O5P 21 21 218.264; 8.901; 8.9223
90; 90; 90
656.3Malaspina, Lorraine A.; Genoni, Alessandro; Jayatilaka, Dylan; Turner, Michael J.; Sugimoto, Kunihisa; Nishibori, Eiji; Grabowsky, Simon
The advanced treatment of hydrogen bonding in quantum crystallography
Journal of Applied Crystallography, 2021, 54
2300679 CIFAl6.31 B4.94R -3 :H18.3464; 18.3464; 8.9241
90; 90; 120
2601.3Malkin, Alexander I.; Chernyshev, Vladimir V.; Ryazantseva, Alena A.; Vasiliev, Alexander L.; Nickolsky, Maximilian S.; Shiryaev, Andrei A.
Formation and characterization of an Al-rich metastable phase in the Al‒B phase diagram
Journal of Applied Crystallography, 2021, 54
2300680 CIF
HKL
Paper
C14 H10 N2 O4P 1 21/n 13.8006; 11.2125; 27.4464
90; 92.272; 90
1168.69Saunders, Lucy K.; Yeung, Hamish H.-M.; Warren, Mark R.; Smith, Peter; Gurney, Stuart; Dodsworth, Stephen F.; Vitorica-Yrezabal, Inigo J.; Wilcox, Adrian; Hathaway, Paul V.; Preece, Geoff; Roberts, Paul; Barnett, Sarah A.; Allan, David R.
An electric field cell for performing <i>in situ</i> single-crystal synchrotron X-ray diffraction
Journal of Applied Crystallography, 2021, 54, 1349-1359
2300681 CIF
HKL
C14 H10 N2 O4P 1 21/n 13.8006; 11.2165; 27.4621
90; 92.271; 90
1169.77Saunders, Lucy K.; Yeung, Hamish H.-M.; Warren, Mark R.; Smith, Peter; Gurney, Stuart; Dodsworth, Stephen F.; Vitorica-Yrezabal, Inigo J.; Wilcox, Adrian; Hathaway, Paul V.; Preece, Geoff; Roberts, Paul; Barnett, Sarah A.; Allan, David R.
An electric field cell for performing <i>in situ</i> single-crystal synchrotron X-ray diffraction
Journal of Applied Crystallography, 2021, 54, 1349-1359
2300682 CIF
HKL
C14 H10 N2 O4P 1 21/n 13.7999; 11.2238; 27.4932
90; 92.277; 90
1171.64Saunders, Lucy K.; Yeung, Hamish H.-M.; Warren, Mark R.; Smith, Peter; Gurney, Stuart; Dodsworth, Stephen F.; Vitorica-Yrezabal, Inigo J.; Wilcox, Adrian; Hathaway, Paul V.; Preece, Geoff; Roberts, Paul; Barnett, Sarah A.; Allan, David R.
An electric field cell for performing <i>in situ</i> single-crystal synchrotron X-ray diffraction
Journal of Applied Crystallography, 2021, 54, 1349-1359
2300683 CIF
HKL
C8 H5 K0.992 O4P c a 219.6017; 13.3049; 6.4665
90; 90; 90
826.09Petrenko, Arsen; Novikova, Nataliya; Blagov, Alexander; Kulikov, Anton; Pisarevskii, Yury; Verin, Igor; Kovalchuk, Michail
Lateral deformations of a crystal of potassium acid phthalate in an external electric field
Journal of Applied Crystallography, 2021, 54, 1317-1326
2300684 CIFC2 H5 N O2P 1 21 15.311; 6.454; 5.694
90; 112.86; 90
179.84Jha, Kunal Kumar; Gruza, Barbara; Chodkiewicz, Michał Leszek; Jelsch, Christian; Dominiak, Paulina Maria
Refinements on electron diffraction data of β-glycine in MoPro: a quest for an improved structure model
Journal of Applied Crystallography, 2021, 54, 1234-1243
2300685 CIFC2 H5 N O2P 1 21 15.311; 6.454; 5.694
90; 112.86; 90
179.84Jha, Kunal Kumar; Gruza, Barbara; Chodkiewicz, Michał Leszek; Jelsch, Christian; Dominiak, Paulina Maria
Refinements on electron diffraction data of β-glycine in MoPro: a quest for an improved structure model
Journal of Applied Crystallography, 2021, 54, 1234-1243
2300686 CIFC2 H5 N O2P 1 21 15.311; 6.454; 5.694
90; 112.86; 90
179.84Jha, Kunal Kumar; Gruza, Barbara; Chodkiewicz, Michał Leszek; Jelsch, Christian; Dominiak, Paulina Maria
Refinements on electron diffraction data of β-glycine in MoPro: a quest for an improved structure model
Journal of Applied Crystallography, 2021, 54, 1234-1243
2300687 CIFC2 H5 N O2P 1 21 15.311; 6.454; 5.694
90; 112.86; 90
179.84Jha, Kunal Kumar; Gruza, Barbara; Chodkiewicz, Michał Leszek; Jelsch, Christian; Dominiak, Paulina Maria
Refinements on electron diffraction data of β-glycine in MoPro: a quest for an improved structure model
Journal of Applied Crystallography, 2021, 54, 1234-1243
2300688 CIFC2 H5 N O2P 1 21 15.311; 6.454; 5.694
90; 112.86; 90
179.84Jha, Kunal Kumar; Gruza, Barbara; Chodkiewicz, Michał Leszek; Jelsch, Christian; Dominiak, Paulina Maria
Refinements on electron diffraction data of β-glycine in MoPro: a quest for an improved structure model
Journal of Applied Crystallography, 2021, 54, 1234-1243
2300689 CIF
HKL
Al63.643 Cr10 Cu18.381P 6310.9995; 10.9995; 12.698
90; 90; 120
1330.5Samuha, Shmuel; Tamari, Rimon; Grushko, Benjamin; Meshi, Louisa
Structure solution of the Al~69.2~Cu~20~Cr~10.8~ {πhi} phase
Journal of Applied Crystallography, 2022, 55, 74-79
2300690 CIFCa2.86 H7.67 O10.92 Si2.2P 1200; 3.675; 100
90; 90; 90
73500Mesecke, Karsten; Warr, Laurence N.; Malorny, Winfried
Structure modeling and quantitative X-ray diffraction of C-(A)-S-H
Journal of Applied Crystallography, 2022, 55
2300691 CIFC48 H60 N24 O8 Zn6P 116.85; 16.85; 8.425
90; 90; 90
2392.05Metz, Peter C.; Purdy, Stephen C.; Ryder, Matthew R.; Ganesan, Arvind; Nair, Sankar; Page, Katharine
Detailed total scattering analysis of disorder in ZIF-8
Journal of Applied Crystallography, 2021, 54, 759-767
2300692 CIF
HKL
Paper
C42 H93 F21 N18 O32 Pr4C 1 2/c 127.6254; 12.7853; 23.5496
90; 98.4791; 90
8226.8Tsymbarenko, Dmitry; Grebenyuk, Dimitry; Burlakova, Maria; Zobel, Mirijam
Quick and robust PDF data acquisition using a laboratory single-crystal X-ray diffractometer for study of polynuclear lanthanide complexes in solid form and in solution
Journal of Applied Crystallography, 2022, 55, 890-900
2300693 CIF
HKL
Paper
C4 Co Sc3C 1 2/m 15.53; 11.9606; 5.535
90; 104.508; 90
354.42Fischer, Andreas; Langmann, Jan; Vöst, Marcel; Eickerling, Georg; Scherer, Wolfgang
HTD2: a single-crystal X-ray diffractometer for combined high-pressure/low-temperature experiments at laboratory scale
Journal of Applied Crystallography, 2022, 55
2300694 CIF
HKL
Paper
C4 Co Sc3C 1 2/m 15.5124; 11.9341; 5.5167
90; 104.413; 90
351.5Fischer, Andreas; Langmann, Jan; Vöst, Marcel; Eickerling, Georg; Scherer, Wolfgang
HTD2: a single-crystal X-ray diffractometer for combined high-pressure/low-temperature experiments at laboratory scale
Journal of Applied Crystallography, 2022, 55
2300695 CIF
HKL
C6 H10 O5P 21 21 216.676; 7.531; 13.279
90; 90; 90
667.6Lu, Guihua; Zhou, Hengwei; Wei, Lai; Zhao, Xingyu; Li, Zhipeng; Huang, Yineng
Growth and characterization of large centimetre-size levoglucosan single crystals
Journal of Applied Crystallography, 2023, 56, 468-476
2300696 CIF
HKL
C6 H10 O5P 21 21 216.6601; 7.5006; 13.26
90; 90; 90
662.4Lu, Guihua; Zhou, Hengwei; Wei, Lai; Zhao, Xingyu; Li, Zhipeng; Huang, Yineng
Growth and characterization of large centimetre-size levoglucosan single crystals
Journal of Applied Crystallography, 2023, 56, 468-476
2300697 CIF
HKL
C6 H10 O5P 21 21 216.6457; 7.476; 13.26
90; 90; 90
658.8Lu, Guihua; Zhou, Hengwei; Wei, Lai; Zhao, Xingyu; Li, Zhipeng; Huang, Yineng
Growth and characterization of large centimetre-size levoglucosan single crystals
Journal of Applied Crystallography, 2023, 56, 468-476
2300698 CIF
HKL
B Bi4 Cl O7I m m m3.9277; 13.0981; 3.8808
90; 90; 90
199.649Volkov, Sergey; Arsent'ev, Maxim; Ugolkov, Valery; Povolotskiy, Alexey; Savchenko, Yevgeny; Krzhizhanovskaya, Maria; Bubnova, Rimma; Aksenov, Sergey
When the difference between incommensurate and commensurate structures becomes elusive: the case of Bi4BO7 X (X = Cl, Br) oxyhalides
Journal of Applied Crystallography, 2023, 56, 589-596
2300699 CIF
HKL
B Bi4 Br O7I m m m3.9345; 13.2499; 3.9182
90; 90; 90
204.263Volkov, Sergey; Arsent'ev, Maxim; Ugolkov, Valery; Povolotskiy, Alexey; Savchenko, Yevgeny; Krzhizhanovskaya, Maria; Bubnova, Rimma; Aksenov, Sergey
When the difference between incommensurate and commensurate structures becomes elusive: the case of Bi4BO7 X (X = Cl, Br) oxyhalides
Journal of Applied Crystallography, 2023, 56, 589-596
2300700 CIFC2 Ba N4 ZnP b c a12.0252; 11.9873; 6.8715
90; 90; 90
990.52Houben, Andreas; Meinerzhagen, Yannick; Nachtigall, Noah; Jacobs, Philipp; Dronskowski, Richard
POWTEX visits POWGEN.
Journal of applied crystallography, 2023, 56, 633-642
2300701 CIFC2 Ba N4 ZnP b c a11.9532; 11.9452; 6.8555
90; 90; 90
978.85Houben, Andreas; Meinerzhagen, Yannick; Nachtigall, Noah; Jacobs, Philipp; Dronskowski, Richard
POWTEX visits POWGEN.
Journal of applied crystallography, 2023, 56, 633-642
2300702 CIFCF d -3 m :23.566636; 3.566636; 3.566636
90; 90; 90
45.3708Houben, Andreas; Meinerzhagen, Yannick; Nachtigall, Noah; Jacobs, Philipp; Dronskowski, Richard
POWTEX visits POWGEN.
Journal of applied crystallography, 2023, 56, 633-642
2300703 CIFCF d -3 m :23.571622; 3.571622; 3.571622
90; 90; 90
45.5613Houben, Andreas; Meinerzhagen, Yannick; Nachtigall, Noah; Jacobs, Philipp; Dronskowski, Richard
POWTEX visits POWGEN.
Journal of applied crystallography, 2023, 56, 633-642
2300704 CIFMn TeP 63/m m c4.193; 4.193; 6.752
90; 90; 120
102.805Hamilton, Parker K.; Moya, Jaime M.; Hallas, Alannah M.; Morosan, E.; Baral, Raju; Frandsen, Benjamin A.
Symmetry-mode analysis for local structure investigations using pair distribution function data
Journal of Applied Crystallography, 2023, 56
2300705 CIFH8 Mg6 O18 Si4C 1 c 15.3418; 9.1166; 14.697
90; 93.91; 90
714.06Levin, Aleksandr; Khrapova, Ekaterina; Kozlov, Daniil; Krasilin, Andrei; Gusarov, Victor
Structure refinement, microstrains and crystallite sizes of Mg-Ni-phyllosilicate nanoscroll powders
Journal of Applied Crystallography, 2022, 55, 484-502
2300706 CIFH8 Mg4 Ni2 O18 Si4C 1 c 15.3444; 9.1074; 14.7086
90; 94.18; 90
714.02Levin, Aleksandr; Khrapova, Ekaterina; Kozlov, Daniil; Krasilin, Andrei; Gusarov, Victor
Structure refinement, microstrains and crystallite sizes of Mg-Ni-phyllosilicate nanoscroll powders
Journal of Applied Crystallography, 2022, 55, 484-502
2300707 CIFH8 Mg3 Ni3 O18 Si4C 1 c 15.3406; 9.0991; 14.7019
90; 94.44; 90
712.29Levin, Aleksandr; Khrapova, Ekaterina; Kozlov, Daniil; Krasilin, Andrei; Gusarov, Victor
Structure refinement, microstrains and crystallite sizes of Mg-Ni-phyllosilicate nanoscroll powders
Journal of Applied Crystallography, 2022, 55, 484-502
2300708 CIFH8 Mg2 Ni4 O18 Si4C 1 c 15.3415; 9.1095; 14.6976
90; 94.31; 90
713.14Levin, Aleksandr; Khrapova, Ekaterina; Kozlov, Daniil; Krasilin, Andrei; Gusarov, Victor
Structure refinement, microstrains and crystallite sizes of Mg-Ni-phyllosilicate nanoscroll powders
Journal of Applied Crystallography, 2022, 55, 484-502
2300709 CIFH8 Ni6 O18 Si4C 1 c 15.3411; 9.0924; 14.6494
90; 94.86; 90
708.87Levin, Aleksandr; Khrapova, Ekaterina; Kozlov, Daniil; Krasilin, Andrei; Gusarov, Victor
Structure refinement, microstrains and crystallite sizes of Mg-Ni-phyllosilicate nanoscroll powders
Journal of Applied Crystallography, 2022, 55, 484-502
2300710 CIF
HKL
C20 H14 N16 O20P -14.9325; 6.8773; 22.462
84.728; 84.78; 86.014
754.2Wang, Zhiqiang; Xu, Jinjiang; Zhao, Zhi; Zhang, Zhenqi; Tong, Yi
A novel energetic cocrystal of DATNBI/TNT with low sensitivity and an unexpected polymorphic transition
Journal of Applied Crystallography, 2023, 56
2300711 CIF
Paper
C11 H10 O2 SP 21 21 215.86; 8.933; 18.341
90; 90; 90
960.1Graw, Nico; Ruth, Paul Niklas; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: the long way to a successful charge-density investigation.
Journal of applied crystallography, 2023, 56, 1315-1321
2300712 CIF
HKL
Paper
C4 Co Sc3I m m m3.383; 4.373; 11.991
90; 90; 90
177.39Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300713 CIF
HKL
C4 Co Sc3I m m m3.383; 4.37; 11.982
90; 90; 90
177.14Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300714 CIF
HKL
Pt9 Sc2 Si3C 1 2/c 112.976; 7.521; 9.702
90; 116.4; 90
848.1Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300715 CIF
HKL
Pt9 Sc2 Si3C 1 2/c 112.958; 7.52; 9.711
90; 116.47; 90
847.1Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300716 CIF
HKL
H4 Na2 O6 WP b c a8.441; 10.569; 13.799
90; 90; 90
1231Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300717 CIF
HKL
H4 Na2 O6 WP b c a8.434; 10.553; 13.792
90; 90; 90
1227.5Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300718 CIF
HKL
C3 H7 N O2P 21 21 215.789; 5.958; 12.286
90; 90; 90
423.8Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300719 CIF
HKL
C3 H7 N O2P 21 21 215.784; 5.953; 12.272
90; 90; 90
422.6Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300720 CIF
HKL
C11 H10 O2 SP 21 21 215.854; 8.929; 18.328
90; 90; 90
958Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300721 CIF
HKL
C11 H10 O2 SP 21 21 215.86; 8.933; 18.341
90; 90; 90
960.1Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300722 CIF
HKL
C11 H10 O2 SP 21 21 215.85; 8.924; 18.321
90; 90; 90
956.5Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300723 CIF
HKL
C11 H10 O2 SP 21 21 215.854; 8.929; 18.328
90; 90; 90
958Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300724 CIF
HKL
C11 H10 O2 SP 21 21 215.86; 8.933; 18.341
90; 90; 90
960.1Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300725 CIF
HKL
C11 H10 O2 SP 21 21 215.85; 8.924; 18.321
90; 90; 90
956.5Ruth, Paul Niklas; Graw, Nico; Ernemann, Tobias; Herbst-Irmer, Regine; Stalke, Dietmar
Indium <i>K</i>α radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectors.
Journal of applied crystallography, 2023, 56, 1322-1329
2300726 CIF
HKL
Fe2 Mn3 Si3P 63/m c m6.8534; 6.8534; 4.7556
90; 90; 120
193.441Ait Haddouch, Mohammed; Abboushi, Nour; Sharma, Neetika; Eich, Andreas; Grzechnik, Andrzej; Li, Cheng; Tolkiehn, Martin; Alsamamra, Husain; Voigt, Jörg; Friese, Karen
Site dependence of the magnetocaloric effect in Mn<sub>5-<i>x</i></sub> Fe <sub><i>x</i></sub> Si<sub>3</sub>.
Journal of applied crystallography, 2022, 55, 1164-1172
2300727 CIF
HKL
C16 H10 Br2 OP n a 218.226; 13.408; 12.222
90; 90; 90
1348Dyk, Konrad; Kinzhybalo, Vasyl; Horak, Yuriy; Butenko, Serhii; Siczek, Miłosz; Kamiński, Daniel M.
Bending the bonds: unveiling halogen interactions in the elastic polymorph of 2,5-bis(3-bromophenyl)furan
Journal of Applied Crystallography, 2024, 57
2300728 CIF
HKL
C16 H10 Br2 OP n m a6.217; 30.11; 7.18
90; 90; 90
1344.1Dyk, Konrad; Kinzhybalo, Vasyl; Horak, Yuriy; Butenko, Serhii; Siczek, Miłosz; Kamiński, Daniel M.
Bending the bonds: unveiling halogen interactions in the elastic polymorph of 2,5-bis(3-bromophenyl)furan
Journal of Applied Crystallography, 2024, 57
2300729 CIF
HKL
C16 H10 Br2 OP 21 21 213.9774; 10.7746; 31.2387
90; 90; 90
1338.73Dyk, Konrad; Kinzhybalo, Vasyl; Horak, Yuriy; Butenko, Serhii; Siczek, Miłosz; Kamiński, Daniel M.
Bending the bonds: unveiling halogen interactions in the elastic polymorph of 2,5-bis(3-bromophenyl)furan
Journal of Applied Crystallography, 2024, 57
2300730 CIFC8 H11 F2 N3 OP n a 2115.0815; 24.6147; 5.0146
90; 90; 90
1861.55Kleemiss, Florian; Peyerimhoff, Norbert; Bodensteiner, Michael
Refinement of X-ray and electron diffraction crystal structures using analytical Fourier transforms of Slater-type atomic wavefunctions in <i>Olex2</i>.
Journal of applied crystallography, 2024, 57, 161-174
2300731 CIFC16 H16 Co F6 N4 O4 S2P -17.9999; 9.3718; 14.7362
82.625; 81.527; 81.726
1074.89Kleemiss, Florian; Peyerimhoff, Norbert; Bodensteiner, Michael
Refinement of X-ray and electron diffraction crystal structures using analytical Fourier transforms of Slater-type atomic wavefunctions in <i>Olex2</i>.
Journal of applied crystallography, 2024, 57, 161-174
2300732 CIFC4 H12 Ca O10P 21 21 219.1718; 9.5882; 10.5502
90; 90; 90
927.8Kleemiss, Florian; Peyerimhoff, Norbert; Bodensteiner, Michael
Refinement of X-ray and electron diffraction crystal structures using analytical Fourier transforms of Slater-type atomic wavefunctions in <i>Olex2</i>.
Journal of applied crystallography, 2024, 57, 161-174
2300733 CIFC24 H44 Os P2P 1 21/n 110.8918; 13.7619; 17.0714
90; 98.563; 90
2530.34Kleemiss, Florian; Peyerimhoff, Norbert; Bodensteiner, Michael
Refinement of X-ray and electron diffraction crystal structures using analytical Fourier transforms of Slater-type atomic wavefunctions in <i>Olex2</i>.
Journal of applied crystallography, 2024, 57, 161-174
2300734 CIFGa H O2P n m a9.78216; 2.97127; 4.51938
90; 90; 90
131.358Ding, Ning; Shi, Honglong; Zhang, Zeqian; Luo, Minting; Hu, Zhenfei
Dehydroxylation and structural transition in α-GaOOH investigated by in situ X-ray diffraction
Journal of Applied Crystallography, 2024, 57
2300735 CIFGa2 O3R -3 c :H4.99945; 4.99945; 13.50095
90; 90; 120
292.24Ding, Ning; Shi, Honglong; Zhang, Zeqian; Luo, Minting; Hu, Zhenfei
Dehydroxylation and structural transition in α-GaOOH investigated by in situ X-ray diffraction
Journal of Applied Crystallography, 2024, 57
2300736 CIF
HKL
Paper
Ga NdC m c m4.4329; 11.246; 4.1735
90; 90; 90
208.06Shtender, Vitalii; Cedervall, Johan; Ek, Gustav; Zlotea, Claudia; Andersson, Mikael S.; Manuel, Pascal; Sahlberg, Martin; Häussermann, Ulrich
Revisiting the hydrogenation behavior of NdGa and its hydride phases.
Journal of applied crystallography, 2024, 57, 248-257
2300737 CIF
HKL
Paper
Ga NdC m c m4.1855; 11.9137; 4.1857
90; 90; 90
208.72Shtender, Vitalii; Cedervall, Johan; Ek, Gustav; Zlotea, Claudia; Andersson, Mikael S.; Manuel, Pascal; Sahlberg, Martin; Häussermann, Ulrich
Revisiting the hydrogenation behavior of NdGa and its hydride phases.
Journal of applied crystallography, 2024, 57, 248-257
2300738 CIF
HKL
Paper
Ga NdC m c m4.16; 12.0374; 4.1825
90; 90; 90
209.44Shtender, Vitalii; Cedervall, Johan; Ek, Gustav; Zlotea, Claudia; Andersson, Mikael S.; Manuel, Pascal; Sahlberg, Martin; Häussermann, Ulrich
Revisiting the hydrogenation behavior of NdGa and its hydride phases.
Journal of applied crystallography, 2024, 57, 248-257
2300739 CIF
HKL
Paper
Ga NdC m c m12.338; 12.271; 4.1691
90; 90; 90
631.2Shtender, Vitalii; Cedervall, Johan; Ek, Gustav; Zlotea, Claudia; Andersson, Mikael S.; Manuel, Pascal; Sahlberg, Martin; Häussermann, Ulrich
Revisiting the hydrogenation behavior of NdGa and its hydride phases.
Journal of applied crystallography, 2024, 57, 248-257
2300740 CIF
HKL
Paper
Ga3 Nd3C m c m12.332; 12.264; 4.1782
90; 90; 90
631.91Shtender, Vitalii; Cedervall, Johan; Ek, Gustav; Zlotea, Claudia; Andersson, Mikael S.; Manuel, Pascal; Sahlberg, Martin; Häussermann, Ulrich
Revisiting the hydrogenation behavior of NdGa and its hydride phases.
Journal of applied crystallography, 2024, 57, 248-257
2300741 CIFC4 Ca3 K2 O12P n m a7.5371; 16.1777; 8.7793
90; 90; 90
1070.49Rashchenko, Sergey V.; Ignatov, Mark A.; Shatskiy, Anton F.; Arefiev, Anton V.; Litasov, Konstantin D.
Coupling between cation and anion disorder in β-K2Ca3(CO3)4
Journal of Applied Crystallography, 2024, 57
2300742 CIFC4 Ca2.818824 K2 Mg0.181176 O12P n m a7.5404; 16.0962; 8.7321
90; 90; 90
1059.83Rashchenko, Sergey V.; Ignatov, Mark A.; Shatskiy, Anton F.; Arefiev, Anton V.; Litasov, Konstantin D.
Coupling between cation and anion disorder in β-K2Ca3(CO3)4
Journal of Applied Crystallography, 2024, 57
2300743 CIFCa0.45 O3 Pb0.55 TiP n a 217.777666; 5.518537; 5.527827
90; 90; 90
237.262Estrada, Flávia Regina; Moreno-Gobbi, Ariel; Damjanovic, Dragan; Garcia, Ducinei
Polar orientation and extension in a novel crystallographic model for PbTiO3-based perovskites explaining the experimental ferroelectric thermal anomalies
Journal of Applied Crystallography, 2024, 57, 808-817
2300744 CIFC Bi2 O5I 4/m m m3.867; 3.867; 13.689
90; 90; 90
204.701Nomine, A. V.; Ghanbaja, J.; Redjaimia, A.; Belmonte, T.
Structural characteristics of Bi2O2CO3 nanosheets synthesized by nano-pulsed discharges in water
Journal of Applied Crystallography, 2024, 57

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