Crystallography Open Database
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Searching journal of publication like 'Journal of applied crystallography'
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 2300445 | CIF | C12 H24 B2 F8 Fe N24 | P 1 21/n 1 | 17.207; 10.214; 18.406 90; 113.912; 90 | 2957.2 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2 Journal of Applied Crystallography, 2001, 34, 229 |
| 2300446 | CIF Paper | Al18.5 Co7.75 Ni0 | P n m m :2 | 23.201; 32.31; 4.103 90; 90; 90 | 3075.7 | Singh, Devinder; Yun, Yifeng; Wan, Wei; Grushko, Benjamin; Zou, Xiaodong; Hovmöller, Sven A complex pseudo-decagonal quasicrystal approximant, Al~37~(Co,Ni)~15.5~, solved by rotation electron diffraction Journal of Applied Crystallography, 2014, 47, 215-221 |
| 2300447 | CIF | Li1.99 Mn1.01 O3 | C 1 2/m 1 | 4.9246; 8.5216; 5.0245 90; 109.398; 90 | 198.886 | Massarotti, V.; Bini, M.; Capsoni, D.; Altomare, A.; Moliterni, A. G. G. Ab initio structure determination of Li~2~MnO~3~ from X-ray powder diffraction data Journal of Applied Crystallography, 1997, 30, 123-127 |
| 2300448 | CIF HKL Paper | Al2 O3 | R -3 c :H | 4.758152; 4.758152; 12.9897 90; 90; 120 | 254.687 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300449 | CIF HKL Paper | Ca F2 | F m -3 m | 5.463209; 5.463209; 5.463209 90; 90; 90 | 163.059 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300450 | CIF HKL Paper | O Zn | P 63 m c | 3.249308; 3.249308; 5.205709 90; 90; 120 | 47.5984 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300451 | CIF Paper | C12 H18 N2 O3 S | P n a 21 | 20.31875; 7.84999; 9.10539 90; 90; 90 | 1452.33 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300452 | CIF Paper | C12 H18 N2 O3 S | P 1 c 1 | 9.16849; 17.181; 18.1517 90; 96.6067; 90 | 2840.3 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300453 | CIF HKL Paper | C12 H18 N2 O3 S | P 1 21/n 1 | 11.80943; 9.06147; 13.99082 90; 104.584; 90 | 1448.93 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300454 | CIF HKL Paper | C2 H5 N O2 | P 1 21/c 1 | 5.10422; 11.97177; 5.93652 90; 121.264; 90 | 310.081 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300455 | CIF Paper | C8 H9 N O2 | P 1 21/n 1 | 11.71439; 9.38544; 7.10166 90; 82.5879; 90 | 774.27 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300456 | CIF HKL Paper | C12 H24 O12 | P 1 21 1 | 7.77208; 21.58192; 4.8172 90; 74.0609; 90 | 776.95 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
| 2300457 | CIF Paper | Ba0.41 Mo O4 Sr0.59 | I 41/a :2 | 5.50729; 5.50729; 12.4789 90; 90; 90 | 378.488 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
| 2300458 | CIF Paper | Ba0.73 Mo O4 Sr0.27 | I 41/a :2 | 5.54906; 5.54906; 12.66803 90; 90; 90 | 390.075 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
| 2300459 | CIF Paper | Ba Mo O4 | I 41/a :2 | 5.584828; 5.584828; 12.82922 90; 90; 90 | 400.147 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
| 2300460 | CIF Paper | Mo O4 Sr | I 41/a :2 | 5.402647; 5.402647; 12.04112 90; 90; 90 | 351.463 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
| 2300461 | CIF Paper | Ba0.19 Mo O4 Sr0.81 | I 41/a :2 | 5.45711; 5.45711; 12.25476 90; 90; 90 | 364.947 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
| 2300462 | CIF HKL | Ag5 Mg33 | P b c m | 8.87; 16.48; 19.48 90; 90; 90 | 2847.54 | Samuha, Shmuel; Krimer, Yaakov; Meshi, Louisa Strategies for full structure solution of intermetallic compounds using precession electron diffraction zonal data Journal of Applied Crystallography, 2014, 47, 1032-1041 |
| 2300463 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.947; 5.5093; 12.4564 90; 91.712; 90 | 819.51 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300464 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.9525; 5.5111; 12.4566 90; 91.699; 90 | 820.17 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300465 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.9359; 5.5005; 12.4375 90; 91.776; 90 | 816.17 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300466 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.9533; 5.5087; 12.4688 90; 91.699; 90 | 820.67 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300467 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.613; 8.5301; 31.4348 90; 90; 90 | 1505.08 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300468 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.6011; 8.5219; 31.4741 90; 90; 90 | 1502.32 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300469 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.6104; 8.5238; 31.496 90; 90; 90 | 1506.2 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300470 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.6112; 8.5333; 31.4392 90; 90; 90 | 1505.37 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300471 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0024; 8.9753; 12.3386 90; 98.041; 90 | 2522.3 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300472 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0151; 8.9752; 12.3404 90; 98.108; 90 | 2523.62 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300473 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0144; 8.9745; 12.3423 90; 98.069; 90 | 2524 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300474 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0253; 8.9728; 12.3325 90; 98.12; 90 | 2522.4 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300475 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5966; 16.1294; 20.4387 90; 108.891; 90 | 4864.7 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300476 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5993; 16.1284; 20.4476 90; 108.849; 90 | 4868.6 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300477 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5742; 16.1161; 20.4181 90; 108.879; 90 | 4849.2 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300478 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5844; 16.112; 20.4375 90; 108.872; 90 | 4855.9 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300479 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.3641; 13.8966; 14.2315 90; 100.132; 90 | 1044.31 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300480 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.346; 13.8593; 14.1995 90; 100.138; 90 | 1035.64 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300481 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.3522; 13.8783; 14.2186 90; 100.048; 90 | 1039.95 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300482 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.3522; 13.8826; 14.2217 90; 100.075; 90 | 1040.41 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
| 2300483 | CIF HKL Paper | C34 H34 Cl2 F12 N4 O3 | P 42/n :2 | 24.5663; 24.5663; 6.38601 90; 90; 90 | 3853.98 | Mendes do Prado, Vânia; Cardoso Seiceira, Rafael; Pitaluga Jr, Altivo; Andrade-Filho, Tarciso; Andrade Alves, Wendel; Reily Rocha, Alexandre; Furlan Ferreira, Fabio Elucidating the crystal structure of the antimalarial drug (±)-mefloquine hydrochloride: a tetragonal hydrated species Journal of Applied Crystallography, 2014, 47, 1380-1386 |
| 2300484 | CIF HKL Paper | F3 Na Ni | C m c m | 3.0294; 10.0534; 7.3938 90; 90; 90 | 225.18 | Lindsay-Scott, Alex; Dobson, David; Nestola, Fabrizio; Alvaro, Matteo; Casati, Nicola; Liebske, Christian; Knight, Kevin S.; Smith, Ronald I.; Wood, Ian G. Time-of-flight neutron powder diffraction with milligram samples: the crystal structures of NaCoF~3~ and NaNiF~3~ post-perovskites Journal of Applied Crystallography, 2014, 47, 1939-1947 |
| 2300485 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.462; 16.147; 3.988 90; 90; 90 | 416.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300486 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.447; 16.121; 3.982 90; 90; 90 | 413.9 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300487 | CIF HKL Paper | Br0.09 Cl0.91 Cu6 O8 Pb | F m -3 m | 9.216; 9.216; 9.216 90; 90; 90 | 782.8 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300488 | CIF Paper | Br0.1 Cl0.9 Cu6 O8 Pb | F m -3 m | 9.2164; 9.2164; 9.2164 90; 90; 90 | 782.86 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300489 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.439; 10.559; 13.807 90; 90; 90 | 1230.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300490 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.442; 10.569; 13.816 90; 90; 90 | 1232.7 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300491 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.394; 4.374; 11.995 90; 90; 90 | 178.07 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300492 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.398; 4.377; 12.003 90; 90; 90 | 178.52 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300493 | CIF HKL Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.601; 8.377; 17.201 90; 97.35; 90 | 1372.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300494 | CIF Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.599; 8.378; 17.194 90; 97.32; 90 | 1371.5 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300495 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.568; 9.504; 21.378 90; 102.95; 90 | 3676.6 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300496 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.588; 9.518; 21.403 90; 102.95; 90 | 3690.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
| 2300497 | CIF HKL | Bi1.09 Ge2.37 Te4 | F m -3 m | 6.055; 6.055; 6.055 90; 90; 90 | 221.99 | Urban, Philipp; Simonov, Arkadiy; Weber, Thomas; Oeckler, Oliver Real structure of Ge4Bi2Te7: refinement on diffuse scattering data with the 3D-ΔPDF method Journal of Applied Crystallography, 2015, 48, 200 |
| 2300498 | CIF Paper | K0.5 Na0.5 Nb O3 | R 3 m :H | 5.6085; 5.6085; 6.9183 90; 90; 120 | 188.46 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
| 2300499 | CIF Paper | K0.5 Na0.5 Nb O3 | A m m 2 | 3.9443; 5.6425; 5.6763 90; 90; 90 | 126.33 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
| 2300500 | CIF HKL Paper | C10 H16 N6 S | C 1 2/c 1 | 82.904; 4.85; 18.76 90; 74.34; 90 | 7263 | Arakcheeva, Alla; Pattison, Philip; Bauer-Brandl, Annette; Birkedal, Henrik; Chapuis, Gervais Cimetidine, C~10~H~16~N~6~S, form C: crystal structure and modelling of polytypes using the superspace approach Journal of Applied Crystallography, 2013, 46, 99-107 |
| 2300501 | CIF HKL | C7 H10 N2 O2 | C 1 2/c 1 | 17.822; 4.85; 19.783 90; 102.37; 90 | 1670.3 | Graiff, Claudia; Pontiroli, Daniele; Bergamonti, Laura; Cavallari, Chiara; Lottici, Pier Paolo; Predieri, Giovanni Structural investigation of <i>N</i>,<i>N</i>'-methylenebisacrylamide <i>via</i> X-ray diffraction assisted by crystal structure prediction Journal of Applied Crystallography, 2015, 48, 550-557 |
| 2300502 | CIF | C13 H15 Co N2 O7 | P 1 21/c 1 | 12.6105; 7.6858; 15.9256 90; 106.541; 90 | 1479.66 | Cox, Jordan M.; Walton, Ian M.; Benson, Cassidy A.; Chen, Yu-Sheng; Benedict, Jason B. A versatile environmental control cell for <i>in situ</i> guest exchange single-crystal diffraction Journal of Applied Crystallography, 2015, 48, 578-581 |
| 2300503 | CIF HKL | C42 H80 Br2 N2 O3 | C 1 2/c 1 | 54.695; 9.8891; 16.877 90; 92.628; 90 | 9118.9 | Chen, Qibin; Yao, Junyao; Hu, Xin; Shen, Jincheng; Sheng, Yujie; Liu, Honglai Monolayer effect of a gemini surfactant with a rigid biphenyl spacer on its self-crystallization at the air/liquid interface Journal of Applied Crystallography, 2015, 48 |
| 2300504 | CIF HKL | Mg Mo O4 | C 1 2/m 1 | 10.157; 9.246; 7.03 90; 105.9; 90 | 634.94 | Gemmi, Mauro; La Placa, Maria G. I.; Galanis, Athanassios S.; Rauch, Edgar F.; Nicolopoulos, Stavros Fast electron diffraction tomography Journal of Applied Crystallography, 2015, 48 |
| 2300505 | CIF HKL | C28 H26 N2 O4 | P 1 21/n 1 | 5.9038; 10.7455; 19.4895 90; 90.263; 90 | 1236.39 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300506 | CIF HKL | C24 H22 Cl6 N2 O4 | P 1 21/n 1 | 6.8524; 11.9655; 17.3274 90; 99.678; 90 | 1400.5 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300507 | CIF HKL | C26 H28 N2 O5 | P 1 21/c 1 | 13.2363; 11.765; 17.6353 90; 103.281; 90 | 2672.8 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300508 | CIF HKL | C32 H28 N4 O4 | P 1 2/c 1 | 12.8209; 7.0395; 14.7623 90; 96.82; 90 | 1322.91 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
| 2300509 | CIF HKL | C6 H9 N3 O6 | P n a 21 | 9.0136; 21.5; 4.7005 90; 90; 90 | 910.9 | Prasad, A. Aditya; Meenakshisundaram, S. P. Hydrogen-bonded supramolecular architecture in nonlinear optical ammonium 2,4-dinitrophenolate hydrate Journal of Applied Crystallography, 2015, 48 |
| 2300510 | CIF | F2 O2 Os | C 1 2/c 1 | 9.42; 4.491; 8.6 90; 117.5; 90 | 322.717 | Burbank, R.D. X-Ray Study of an Osmium Oxyfluoride of Unknown Composition Journal of Applied Crystallography, 1974, 7, 41-44 |
| 2300511 | CIF | K2.92 Li2 O30 Pb2.41 Ta10 | P 4/m b m | 12.5488; 12.5488; 3.9129 90; 90; 90 | 616.174 | Hornebecq, V.; Weill, F.; Elissalde, C.; Villesuzanne, A.; Menetrier, M.; Ravez, J. Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach Journal of Applied Crystallography, 2000, 33, 1037-1045 |
| 2300512 | CIF | K1.46 Li O30 Pb3.67 Ta10 | P 4/m b m | 12.5159; 12.5159; 3.8947 90; 90; 90 | 610.096 | Hornebecq, V.; Elissalde, C.; Weill, F.; Villesuzanne, A.; Menetrier, M.; Ravez, J. Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach Journal of Applied Crystallography, 2000, 33, 1037-1045 |
| 2300513 | CIF HKL | C32 H39 N O2 | P 1 21/c 1 | 16.589; 10.9575; 16.6795 90; 113.623; 90 | 2777.8 | Sharma, Ranjana; Prasher, Dixit; Tiwari, R. K. Crystal structure analysis of ebastine [4-(4-benzhydryloxy-1-piperidyl)-1-(4-<i>tert</i>-butylphenyl) butan-1-one]: an oral histamine antagonist Journal of Applied Crystallography, 2015, 48 |
| 2300514 | CIF | Te U | P m -3 m | 3.765; 3.765; 3.765 90; 90; 90 | 53.37 | Gerward, L.; Olsen, J.S.; Dabos-Seignon, S.; Benedict, U.; Steenstrup, S. The pressure-induced transformation B1 to B2 in actinide compounds Journal of Applied Crystallography, 1990, 23, 515-519 |
| 2300515 | CIF | Ir0.94 Mo3.06 | P m -3 n | 4.958; 4.958; 4.958 90; 90; 90 | 121.876 | Koksbang, R.; Rasmussen, S.E.; Hazell, R.G. Critical temperatures of superconductivity and neutron diffraction studies at 293 and at 10 K of Mo-Ir single crystal of A15 structure Journal of Applied Crystallography, 1989, 22, 23-25 |
| 2300516 | CIF | D15 Th4 | I -4 3 d | 9.11; 9.11; 9.11 90; 90; 90 | 756.058 | Mueller, M.H.; Caton, R.; Beyerlein, R.A.; Brun, T.O.; Jorgensen, J.D.; Satterthwaite, C.B. Structure of Th4 D15 from measurement at the argonne ZING-P pulsed neutron source Journal of Applied Crystallography, 1977, 10, 79-83 |
| 2300517 | CIF | Tl | F m -3 m | 4.33; 4.33; 4.33 90; 90; 90 | 81.183 | Olsen, J.S.; Steenstrup, S.; Geward, L.; Johnson, E. A high-pressure study of thallium Journal of Applied Crystallography, 1994, 27, 1002-1005 |
| 2300518 | CIF | Tl | P 63/m m c | 3.463; 3.463; 5.539 90; 90; 120 | 57.526 | Olsen, J.S.; Johnson, E.; Geward, L.; Steenstrup, S. A high-pressure study of thallium Journal of Applied Crystallography, 1994, 27, 1002-1005 |
| 2300519 | CIF | Ag0.842 Al0.158 | F m -3 m | 4.0692; 4.0692; 4.0692 90; 90; 90 | 67.379 | Pradhan, S.K.; De, M. An X-ray determination of the thermal expansion of alpha-phase Ag-Al alloys at high temperatures Journal of Applied Crystallography, 1986, 19, 484-485 |
| 2300520 | CIF | Os2 Pu | F d -3 m :1 | 7.53; 7.53; 7.53 90; 90; 90 | 426.958 | Roof, R.B.jr. Crystal data of two polymorphic forms of Pu Os2 Journal of Applied Crystallography, 1975, 8, 687-688 |
| 2300521 | CIF | Cu2 Mn Sn | F m -3 m | 6.176; 6.176; 6.176 90; 90; 90 | 235.571 | Meyers, M.A.; Ruud, C.O.; Barrett, C.S. Observations on the ferromagnetic beta-phase of the Cu - Mn - Sn system Journal of Applied Crystallography, 1973, 6, 39-41 |
| 2300522 | CIF | Nb Te4 | P 4/m c c | 6.3616; 6.3616; 6.837 90; 90; 90 | 276.693 | Dusek, M.; Petricek, V.; Dinnebier, R.E.; Wunschel, M.; van Smaalen, S. Refinement of modulated structures against X-ray powder diffraction data with JANA2000 Journal of Applied Crystallography, 2001, 34, 398-404 |
| 2300523 | CIF | Ti0.04 U0.96 | C m c m | 2.861; 5.8234; 4.9736 90; 90; 90 | 82.864 | Choi, C.S.; Prask, H.J. Neutron difraction studies of two uranium-0.75 wt.% titanium alloys Journal of Applied Crystallography, 1985, 18, 141-144 |
| 2300524 | CIF | Cl O4 P Sn2 | A m a 2 | 13.52; 8.673; 4.74 90; 90; 90 | 555.807 | Berndt, A.F.; Sylvester, J.M. Crystal data on tin(II) phosphate chloride, Sn2 P O4 Cl Journal of Applied Crystallography, 1972, 5, 248-249 |
| 2300525 | CIF | Ni2.62 O4 Ti0.69 | F d -3 m :2 | 8.3416; 8.3416; 8.3416 90; 90; 90 | 580.428 | Lager, G.A.; Armbruster, T.; Rotella, F.J.; Ross, F.K.; Jorgensen, J.D. Neutron poeder diffraction study of defect spinel structures: Tetrahedrally coordinated Ti4+ in Ni2.62 Ti0.69 O4 and Ni2.42 Ti0.74 Si0.05 O4 Journal of Applied Crystallography, 1981, 14, 261-264 |
| 2300526 | CIF | Ni2.42 O4 Si0.05 Ti0.65 | F d -3 m :2 | 8.3222; 8.3222; 8.3222 90; 90; 90 | 576.387 | Lager, G.A.; Rotella, F.J.; Ross, F.K.; Armbruster, T.; Jorgensen, J.D. Neutron powder diffraction study of defect spinel structures: Tetrahedrally coordinated Ti4+ in Ni2.62 Ti0.69 O4 and Ni2.42 Ti0.74 Si0.05 O4 Journal of Applied Crystallography, 1981, 14, 261-264 |
| 2300527 | CIF | Fe0.9 O8 P2 Zn2.1 | P 1 21/n 1 | 7.558; 8.536; 5.042 90; 95.4; 90 | 323.841 | Nord, A.G. Use of the Rietveld technique for estimating cation distributions Journal of Applied Crystallography, 1984, 17, 55-60 |
| 2300528 | CIF | C Ag N S | P m n n | 4.083; 7.043; 11.219 90; 90; 90 | 322.62 | Smith, D.L.; Maskasky, J.E.; Spaulding, L.R. Polymorphism in silver thiocyanate. Preparation of a new phase and its characterization by X-ray powder diffraction Journal of Applied Crystallography, 1982, 15, 488-492 |
| 2300529 | CIF | N2 O Si2 | C m c 21 | 8.847; 5.452; 4.824 90; 90; 90 | 232.68 | Srinivasa, S.R.; Jorgensen, J.D.; Cartz, L.; Worlton, T.G.; Beyerlein, R.A.; Billy, M. High-pressure neutron diffraction study of Si2 N2 O Journal of Applied Crystallography, 1977, 10, 167-171 |
| 2300530 | CIF | P3 Ta5 | P n m a | 25.321; 3.4013; 11.4614 90; 90; 90 | 987.105 | Thomas, J.O.; Ersson, N.O.; Andersson, Y. An X-Ray film powder profile refinement of the crystal structure of Ta5 P3 Journal of Applied Crystallography, 1980, 13, 605-607 |
| 2300531 | CIF | Er2 O3 | I a -3 | 10.54504; 10.54504; 10.54504 90; 90; 90 | 1172.59 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
| 2300532 | CIF | Er1.6 Gd0.4 O3 | I a -3 | 10.6511; 10.6511; 10.6511 90; 90; 90 | 1208.32 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
| 2300533 | CIF | Er Gd O3 | I a -3 | 10.73652; 10.73652; 10.73652 90; 90; 90 | 1237.63 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
| 2300534 | CIF | Er0.4 Gd1.6 O3 | I a -3 | 10.7911; 10.7911; 10.7911 90; 90; 90 | 1256.6 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
| 2300535 | CIF | Li2 O3 Zr | C 1 2/c 1 | 5.4089; 9.0309; 5.4144 90; 112.498; 90 | 244.35 | Heiba, Z.K.; El Sayed, K. Structural and anisotropic thermal expansion correlation of Li2 Zr O3 at different temperatures Journal of Applied Crystallography, 2002, 35, 634-636 |
| 2300536 | CIF | Eu2 O3 | I a -3 | 10.86831; 10.86831; 10.86831 90; 90; 90 | 1283.77 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
| 2300537 | CIF | Eu1.8 O3 Yb0.2 | I a -3 | 10.81718; 10.81718; 10.81718 90; 90; 90 | 1265.73 | Heiba, Z.K.; Akin, Y.; Hascicek, Y.S.; Sigmund, W. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
| 2300538 | CIF | Eu1.6 O3 Yb0.4 | I a -3 | 10.76778; 10.76778; 10.76778 90; 90; 90 | 1248.47 | Heiba, Z.K.; Akin, Y.; Hascicek, Y.S.; Sigmund, W. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
| 2300539 | CIF | Eu O3 Yb | I a -3 | 10.62842; 10.62842; 10.62842 90; 90; 90 | 1200.62 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
| 2300540 | CIF | Eu0.4 O3 Yb1.6 | I a -3 | 10.49964; 10.49964; 10.49964 90; 90; 90 | 1157.51 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
| 2300541 | CIF | Eu0.2 O3 Yb1.8 | I a -3 | 10.46596; 10.46596; 10.46596 90; 90; 90 | 1146.4 | Heiba, Z.K.; Hascicek, Y.S.; Akin, Y.; Sigmund, W. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
| 2300542 | CIF | O3 Yb2 | I a -3 | 10.42828; 10.42828; 10.42828 90; 90; 90 | 1134.06 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
| 2300543 | CIF | Bi2 O9 Sr Ta2 | A 21 a m | 5.5186; 5.52; 25.0485 90; 90; 90 | 763.044 | Muller, C.; Jacob, F.; Gagou, Y.; Elkaim, E. Cationic disorder, microstructure and dielectric response of ferroelectric SBT ceramics Journal of Applied Crystallography, 2003, 36, 880-889 |
| 2300544 | CIF | O2 Zr | P 1 21/c 1 | 5.1487; 5.2023; 5.3231 90; 99.164; 90 | 140.76 | Winterer, M.; Delaplane, R.; McGreevy, R. X-ray diffraction, neutron scattering and EXAFS spectroscopy of monoclinic zirconia: analysis by Rietveld refinement and reverse Monte Carlo simulations Journal of Applied Crystallography, 2002, 35, 434-442 |
| 2300545 | CIF | Al Ca O5 Ta | C 1 2/c 1 | 6.69648; 8.97659; 7.36705 90; 114.139; 90 | 404.121 | Malcherek, T.; Borowski, M.; Bosenick, A. Structure and phase transition of Ca Ta O Al O4 Journal of Applied Crystallography, 2004, 37, 117-122 |
| 2300546 | CIF | N0.81 V | P 42/n m c :1 | 8.115; 8.115; 8.115 90; 90; 90 | 534.399 | Onozuka, T. Vacancy Ordering in V N1-x Journal of Applied Crystallography, 1978, 11, 132-136 |
| 2300547 | CIF Paper | C10 H16 N6 S | P 1 2/c 1 (a,2*b,c) | 13.817; 4.85; 18.76 90; 74.34; 90 | 1210.5 | Arakcheeva, Alla; Pattison, Philip; Bauer-Brandl, Annette; Birkedal, Henrik; Chapuis, Gervais Cimetidine, C10H16N6S, form C: crystal structure and modelling of polytypes using the superspace approach Journal of Applied Crystallography, 2013, 46, 99 |
| 2300548 | CIF | As0.8 Pb0.2 Pd | P 63/m m c | 3.803; 3.803; 5.651 90; 90; 120 | 70.78 | Ellner, M.; Kattner, U.; Predel, B. Kristallstrukturdaten von Pd Pb0.2 As0.8 (m). Journal of Applied Crystallography, 1983, 16, 277-278 |
| 2300549 | CIF | Pu Sb | F m -3 m | 6.2375; 6.2375; 6.2375 90; 90; 90 | 242.679 | Gerward, L.; Olsen, J.S.; Steenstrup, S.; Benedict, U.; Dabos-Seignon, S. The pressure-induced transformation B1 to B2 in actinide compounds Journal of Applied Crystallography, 1990, 23, 515-519 |
| 2300550 | CIF | Pu Te | P m -3 m | 3.74; 3.74; 3.74 90; 90; 90 | 52.314 | Gerward, L.; Olsen, J.S.; Dabos-Seignon, S.; Steenstrup, S.; Benedict, U. The pressure-induced transformation B1 to B2 in actinide compounds Journal of Applied Crystallography, 1990, 23, 515-519 |
| 2300551 | CIF | Se U | F m -3 m | 5.757; 5.757; 5.757 90; 90; 90 | 190.805 | Gerward, L.; Dabos-Seignon, S.; Olsen, J.S.; Steenstrup, S.; Benedict, U. The pressure-induced transformation B1 to B2 in actinide compounds Journal of Applied Crystallography, 1990, 23, 515-519 |
| 2300552 | CIF | Hg In | R -3 m :H | 3.592; 3.592; 13.072 90; 90; 120 | 146.065 | Mascarenhas, Y.P. X-ray diffraction studies of the Hg-In alloy system Journal of Applied Crystallography, 1970, 3, 294-296 |
| 2300553 | CIF | P Th | F m -3 m | 5.827; 5.827; 5.827 90; 90; 90 | 197.85 | Staun Olsen, J.; Gerward, L.; Benedict, U.; Vogt, O.; Luo, H. Crystal structure and the equation of state of thorium monophosphide for pressures up to 50 GPa Journal of Applied Crystallography, 1989, 22, 61-63 |
| 2300554 | CIF | Hg4 Pt | I 4 3 2 | 6.2001; 6.2001; 6.2001 90; 90; 90 | 238.34 | Lahiri, S.K.; Angilello, J.; Natan, M. Precise lattice parameter determination of Pt Hg4 Journal of Applied Crystallography, 1982, 15, 100-101 |
| 2300555 | CIF | Si V3 | P m -3 n | 4.732; 4.732; 4.732 90; 90; 90 | 105.958 | Kitchingman, W.J.; Birch, A.; Tjong, S.C. The structure and properties of the vanadium-chromium-silicon alloys in the composition range V3 Si to Cr3 Si Journal of Applied Crystallography, 1979, 12, 473-475 |
| 2300556 | CIF | Cl H Ni O | R -3 m :H | 3.26061; 3.26061; 17.00619 90; 90; 120 | 156.58 | Bette, Sebastian; Dinnebier, Robert E.; Freyer, Daniela Structure solution and refinement of stacking-faulted NiCl(OH) Journal of Applied Crystallography, 2015, 48 |
| 2300557 | CIF HKL | C12 H22 O11 | P 1 21 1 | 7.763; 8.7109; 10.8701 90; 102.937; 90 | 716.407 | Dmitrienko, Artem O.; Bushmarinov, Ivan S. Reliable structural data from Rietveld refinements <i>via</i> restraint consistency Journal of Applied Crystallography, 2015, 48 |
| 2300558 | CIF | Ni Si | P n m a | 5.1731; 3.3381; 5.6049 90; 90; 90 | 96.79 | Lord, Oliver T.; Thomson, Andrew R.; Wann, Elizabeth T. H.; Wood, Ian G.; Dobson, David P.; Vocadlo, Lidunka The equation of state of the <i>Pmmn</i> phase of NiSi Journal of Applied Crystallography, 2015, 48, 1914-1920 |
| 2300559 | CIF HKL Paper | C28 H18 N2 | C 1 2/c 1 | 13.5559; 12.2134; 12.6643 90; 118.834; 90 | 1836.8 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300560 | CIF HKL Paper | C28 H18 N2 | C 1 2/c 1 | 13.5537; 12.2132; 12.6619 90; 118.836; 90 | 1836.1 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300561 | CIF HKL Paper | C28 H18 N2 | C 1 2/c 1 | 13.5559; 12.2134; 12.6643 90; 118.834; 90 | 1836.8 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300562 | CIF HKL Paper | C12 H4 N4 | C 1 2/c 1 | 8.896; 6.913; 16.439 90; 98.29; 90 | 1000.4 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300563 | CIF HKL Paper | C12 H4 N4 | C 1 2/c 1 | 8.884; 6.9036; 16.421 90; 98.241; 90 | 996.7 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300564 | CIF HKL Paper | C12 H4 N4 | C 1 2/c 1 | 8.896; 6.913; 16.439 90; 98.29; 90 | 1000.4 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300565 | CIF HKL Paper | C18 H17 Cu O6 | C 1 2/c 1 | 9.7935; 19.0055; 18.2997 90; 94.7996; 90 | 3394.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300566 | CIF HKL Paper | C18 H17 Cu O6 | C 1 2/c 1 | 9.7936; 18.9973; 18.2982 90; 94.84; 90 | 3392.3 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300567 | CIF HKL Paper | C18 H17 Cu O6 | C 1 2/c 1 | 9.7935; 19.0055; 18.2997 90; 94.7996; 90 | 3394.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300568 | CIF HKL Paper | C34 H26 Mg N4 O4 | P 1 21/n 1 | 11.3068; 14.9595; 16.7252 90; 93.05; 90 | 2825 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300569 | CIF HKL Paper | C34 H26 Mg N4 O4 | P 1 21/n 1 | 11.3182; 14.9745; 16.744 90; 93.044; 90 | 2833.8 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300570 | CIF HKL Paper | C34 H26 Mg N4 O4 | P 1 21/n 1 | 11.3068; 14.9595; 16.7252 90; 93.05; 90 | 2825 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300571 | CIF HKL Paper | C11 H10 O2 S | P 21 21 21 | 5.9633; 9.0417; 18.4007 90; 90; 90 | 992.14 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300572 | CIF HKL Paper | C11 H10 O2 S | P 21 21 21 | 5.9641; 9.0419; 18.4027 90; 90; 90 | 992.4 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300573 | CIF HKL Paper | C11 H10 O2 S | P 21 21 21 | 5.9633; 9.0417; 18.4007 90; 90; 90 | 992.14 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300574 | CIF Paper | C26 H19 P S | P -1 | 10.215; 12.322; 17.351 101.57; 91.25; 112.02 | 1972.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300575 | CIF Paper | C26 H19 P S | P -1 | 10.215; 12.322; 17.351 101.57; 91.25; 112.02 | 1972.2 | Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar An empirical correction for the influence of low-energy contamination Journal of Applied Crystallography, 2015, 48, 1907-1913 |
| 2300576 | CIF HKL | Mo4 O23.12 Sr11 | I 41/a :2 | 11.6416; 11.6416; 16.4524 90; 90; 90 | 2229.74 | López, Carlos A.; Pedregosa, José C.; Fernández-Díaz, María T.; Alonso, José A. High-temperature dynamic octahedral tilting in the ionic conductor Sr~11~Mo~4~O~23~ Journal of Applied Crystallography, 2016, 49, 78-84 |
| 2300577 | CIF HKL | Mo4 O23.16 Sr11 | I 41/a :2 | 11.6696; 11.6696; 16.4869 90; 90; 90 | 2245.18 | López, Carlos A.; Pedregosa, José C.; Fernández-Díaz, María T.; Alonso, José A. High-temperature dynamic octahedral tilting in the ionic conductor Sr~11~Mo~4~O~23~ Journal of Applied Crystallography, 2016, 49, 78-84 |
| 2300578 | CIF HKL | Mo4 O21.84 Sr11 | I 41/a :2 | 11.7075; 11.7075; 16.5548 90; 90; 90 | 2269.09 | López, Carlos A.; Pedregosa, José C.; Fernández-Díaz, María T.; Alonso, José A. High-temperature dynamic octahedral tilting in the ionic conductor Sr~11~Mo~4~O~23~ Journal of Applied Crystallography, 2016, 49, 78-84 |
| 2300579 | CIF HKL | Mo4 O21.92 Sr11 | I 41/a :2 | 11.7466; 11.7466; 16.6088 90; 90; 90 | 2291.73 | López, Carlos A.; Pedregosa, José C.; Fernández-Díaz, María T.; Alonso, José A. High-temperature dynamic octahedral tilting in the ionic conductor Sr~11~Mo~4~O~23~ Journal of Applied Crystallography, 2016, 49, 78-84 |
| 2300580 | CIF | D V2 | C 1 m 1 | 4.46; 3; 4.46 90; 95.5; 90 | 59.4 | Westlake, D.G.; Mueller, M.H.; Knott, H.W. Structural transitions at low temperature in vanadium deuterides of the Ti-V-H system Journal of Applied Crystallography, 1973, 6, 206-216 |
| 2300581 | CIF | D0.96 V2 | I m -3 m | 3.14; 3.14; 3.14 90; 90; 90 | 30.959 | Westlake, D.G.; Mueller, M.H.; Knott, H.W. Structural transitions at low temperature in vanadium deuterides of the Ti-V-H system Journal of Applied Crystallography, 1973, 6, 206-216 |
| 2300582 | CIF | Cd3 H5 N O8 | P m m n :2 | 3.4203; 10.0292; 11.0295 90; 90; 90 | 378.344 | Plevert, J.; Louer, D.; Louer, M. The Ab Initio Structure Determination of Cd3 (O H)5 N O3 from X-ray Powder Diffraction Data Journal of Applied Crystallography, 1989, 22, 470-475 |
| 2300583 | CIF | Fe2 Mn0.4 O4 Zn0.6 | F d -3 m :1 | 8.4794; 8.4794; 8.4794 90; 90; 90 | 609.671 | Koenig, U.; Chol, G. Roentgenbeugungs- und Neutronenbeugungsuntersuchungen an Ferriten der Reihe Mnx Zn1-x Fe2 O4 Journal of Applied Crystallography, 1968, 1, 124-126 |
| 2300584 | CIF | Fe2 Mn0.6 O4 Zn0.4 | F d -3 m :1 | 8.4975; 8.4975; 8.4975 90; 90; 90 | 613.583 | Koenig, U.; Chol, G. Roentgenbeugungs- und Neutronenbeugungsuntersuchungen an Ferriten der Reihe Mnx Zn1-x Fe2 O4 Journal of Applied Crystallography, 1968, 1, 124-126 |
| 2300585 | CIF | Fe2 Mn O4 | F d -3 m :1 | 8.511; 8.511; 8.511 90; 90; 90 | 616.512 | Koenig, U.; Chol, G. Roentgenbeugungs- und Neutronenbeugungsuntersuchungen an Ferriten der Reihe Mnx Zn1-x Fe2 O4 Journal of Applied Crystallography, 1968, 1, 124-126 |
| 2300586 | CIF | O6 Pb2 Sc Ta | R 3 :R | 8.15231; 8.15231; 8.15231 89.8488; 89.8488; 89.8488 | 541.798 | Woodward, P.M.; Baba-Kishi, K.Z. Crystal structures of the relaxor oxide Pb2 (Sc Ta) O6 in the paraelectric and ferroelectric states Journal of Applied Crystallography, 2002, 35, 233-242 |
| 2300587 | CIF | Ca9.2 O22.2 | P 63/m | 9.3653; 9.3653; 6.8816 90; 90; 120 | 522.713 | Young, R.A.; Mackie, P.E.; von Dreele, R.B. Application of the Pattern-Fitting Structure-Refinement Method to X-ray Powder Diffractometer Patterns Journal of Applied Crystallography, 1977, 10, 262-269 |
| 2300588 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300589 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300590 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300591 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6769; 10.6769; 24.6539 90; 90; 120 | 2433.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300592 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6712; 10.6712; 24.6546 90; 90; 120 | 2431.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300593 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6712; 10.6712; 24.6546 90; 90; 120 | 2431.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300594 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6712; 10.6712; 24.6546 90; 90; 120 | 2431.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300595 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6712; 10.6712; 24.6546 90; 90; 120 | 2431.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300596 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6434; 10.6434; 24.6108 90; 90; 120 | 2414.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300597 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6434; 10.6434; 24.6108 90; 90; 120 | 2414.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300598 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6434; 10.6434; 24.6108 90; 90; 120 | 2414.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300599 | CIF HKL | C96 H126 Mg3 N36 | R -3 :H | 10.6434; 10.6434; 24.6108 90; 90; 120 | 2414.4 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300600 | CIF HKL | C26 H19 P S | P -1 | 10.225; 12.336; 17.371 101.58; 91.21; 111.99 | 1979.1 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300601 | CIF HKL | C26 H19 P S | P -1 | 10.225; 12.336; 17.371 101.58; 91.21; 111.99 | 1979.1 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300602 | CIF HKL | C26 H19 P S | P -1 | 10.225; 12.336; 17.371 101.58; 91.21; 111.99 | 1979.1 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300603 | CIF HKL | C26 H19 P S | P -1 | 10.225; 12.336; 17.371 101.58; 91.21; 111.99 | 1979.1 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300604 | CIF HKL | C26 H19 P S | P -1 | 10.223; 12.326; 17.357 101.55; 91.23; 112.05 | 1974.8 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300605 | CIF HKL | C26 H19 P S | P -1 | 10.223; 12.326; 17.357 101.55; 91.23; 112.05 | 1974.8 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300606 | CIF HKL | C26 H19 P S | P -1 | 10.223; 12.326; 17.357 101.55; 91.23; 112.05 | 1974.8 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300607 | CIF HKL | C26 H19 P S | P -1 | 10.223; 12.326; 17.357 101.55; 91.23; 112.05 | 1974.8 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300608 | CIF HKL | C26 H19 P S | P -1 | 10.213; 12.29; 17.335 101.62; 91.37; 112.09 | 1962.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300609 | CIF HKL | C26 H19 P S | P -1 | 10.213; 12.29; 17.335 101.62; 91.37; 112.09 | 1962.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300610 | CIF HKL | C26 H19 P S | P -1 | 10.213; 12.29; 17.335 101.62; 91.37; 112.09 | 1962.9 | Niepötter, Benedikt; Herbst-Irmer, Regine; Stalke, Dietmar Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering Journal of Applied Crystallography, 2015, 48, 1485-1497 |
| 2300611 | CIF | Ce0.12 O2 Zr0.82 | P 42/n m c :1 | 3.64195; 3.64195; 5.24403 90; 90; 90 | 69.556 | Lutterotti, L.; Scardi, P. Simultaneous Structure and Size-Strain Refinement by the Rietveld Method Journal of Applied Crystallography, 1990, 23, 246-252 |
| 2300612 | CIF | O2 Zr | P 42/n m c :1 | 3.5961; 3.5961; 5.177 90; 90; 90 | 66.949 | Lutterotti, L.; Scardi, P. Simultaneous Structure and Size-Strain Refinement by the Rietveld Method Journal of Applied Crystallography, 1990, 23, 246-252 |
| 2300613 | CIF HKL | B6 Br K3 O10 | R 3 m :H | 10.1252; 10.1252; 8.8687 90; 90; 120 | 787.4 | Xia, Mingjun; Xu, Bo; Liu, Lijuan; Wang, Xiaoyang; Li, Rukang; Chen, Chuangtian Thermo-physical properties of nonlinear optical crystal K~3~B~6~O~10~Br Journal of Applied Crystallography, 2016, 49, 539-543 |
| 2300614 | CIF HKL | Ba2 Co Ge2 O7 | P -4 21 m | 8.392; 8.392; 5.561 90; 90; 90 | 391.64 | Sazonov, Andrew; Meven, Martin; Roth, Georg; Georgii, Robert; Kézsmárki, István; Kocsis, Vilmos; Tokunaga, Yusuke; Taguchi, Yasujiro; Tokura, Yoshinori; Hutanu, Vladimir Origin of forbidden reflections in multiferroic Ba~2~CoGe~2~O~7~ by neutron diffraction: symmetry lowering or Renninger effect? Journal of Applied Crystallography, 2016, 49, 556-560 |
| 2300615 | CIF HKL Paper | Fe2 O4 Zn | F d -3 m :2 | 8.391; 8.391; 8.391 90; 90; 90 | 590.8 | Solano, Eduardo; Frontera, Carlos; Puig, Teresa; Obradors, Xavier; Ricart, Susagna; Ros, Josep Neutron and X-ray diffraction study of ferrite nanocrystals obtained by microwave-assisted growth. A structural comparison with the thermal synthetic route Journal of Applied Crystallography, 2014, 47, 414-420 |
| 2300616 | CIF HKL Paper | Fe3 O4 | F d -3 m :2 | 8.3582; 8.3582; 8.3582 90; 90; 90 | 583.9 | Solano, Eduardo; Frontera, Carlos; Puig, Teresa; Obradors, Xavier; Ricart, Susagna; Ros, Josep Neutron and X-ray diffraction study of ferrite nanocrystals obtained by microwave-assisted growth. A structural comparison with the thermal synthetic route Journal of Applied Crystallography, 2014, 47, 414-420 |
| 2300617 | CIF Paper | Fe2 O3 | P 43 3 2 | 8.3364; 8.3364; 8.3364 90; 90; 90 | 579.34 | Solano, Eduardo; Frontera, Carlos; Puig, Teresa; Obradors, Xavier; Ricart, Susagna; Ros, Josep Neutron and X-ray diffraction study of ferrite nanocrystals obtained by microwave-assisted growth. A structural comparison with the thermal synthetic route Journal of Applied Crystallography, 2014, 47, 414-420 |
| 2300618 | CIF HKL Paper | Fe2 Mn O4 | F d -3 m :2 | 8.3711; 8.3711; 8.3711 90; 90; 90 | 586.61 | Solano, Eduardo; Frontera, Carlos; Puig, Teresa; Obradors, Xavier; Ricart, Susagna; Ros, Josep Neutron and X-ray diffraction study of ferrite nanocrystals obtained by microwave-assisted growth. A structural comparison with the thermal synthetic route Journal of Applied Crystallography, 2014, 47, 414-420 |
| 2300619 | CIF HKL | Mn Si | P 21 3 | 4.5622; 4.5622; 4.5622 90; 90; 90 | 94.956 | Dyadkin, Vadim; Wright, Jon; Pattison, Philip; Chernyshov, Dmitry Probing structural chirality with high-energy synchrotron radiation Journal of Applied Crystallography, 2016, 49, 918-922 |
| 2300620 | CIF HKL | Mn Si | P 21 3 | 4.5662; 4.5662; 4.5662 90; 90; 90 | 95.206 | Dyadkin, Vadim; Wright, Jon; Pattison, Philip; Chernyshov, Dmitry Probing structural chirality with high-energy synchrotron radiation Journal of Applied Crystallography, 2016, 49, 918-922 |
| 2300621 | CIF HKL | Co0.3 Fe0.7 Si | P 21 3 | 4.4732; 4.4732; 4.4732 90; 90; 90 | 89.507 | Dyadkin, Vadim; Wright, Jon; Pattison, Philip; Chernyshov, Dmitry Probing structural chirality with high-energy synchrotron radiation Journal of Applied Crystallography, 2016, 49, 918-922 |
| 2300622 | CIF HKL | Mn1.52 Ni2 Sn0.48 | P m m a | 8.6068; 5.6226; 4.3728 90; 90; 90 | 211.611 | Lin, Chunqing; Yan, Haile; Zhang, Yudong; Esling, Claude; Zhao, Xiang; Zuo, Liang Crystal structure of modulated martensite and crystallographic correlations between martensite variants of Ni~50~Mn~38~Sn~12~ alloy Journal of Applied Crystallography, 2016, 49, 1276-1283 |
| 2300623 | CIF HKL Paper | C6 H16 Br N | P 21 21 21 | 7.9986; 8.2984; 13.55 90; 90; 90 | 899.39 | Yadav, Harsh; Sinha, Nidhi; Goel, Sahil; Hussain, Abid; Kumar, Binay Growth and structural and physical properties of diisopropylammonium bromide molecular single crystals Journal of Applied Crystallography, 2016, 49, 2053-2062 |
| 2300624 | CIF HKL Paper | C32 H39 Cl N2 O6 | C 1 c 1 | 11.6771; 29.1114; 9.36146 90; 109.21; 90 | 3005.11 | Rohlíček, Jan; Skořepová, Eliška; Babor, Martin; Čejka, Jan <i>CrystalCMP</i>: an easy-to-use tool for fast comparison of molecular packing Journal of Applied Crystallography, 2016, 49, 2172-2183 |
| 2300625 | CIF HKL Paper | C32 H36 Cl N O5 | P 1 21/c 1 | 15.64921; 19.57407; 9.67099 90; 102.129; 90 | 2896.28 | Rohlíček, Jan; Skořepová, Eliška; Babor, Martin; Čejka, Jan <i>CrystalCMP</i>: an easy-to-use tool for fast comparison of molecular packing Journal of Applied Crystallography, 2016, 49, 2172-2183 |
| 2300626 | CIF HKL Paper | C28 H36 Cl N O4 | P 1 21/n 1 | 14.912; 9.4993; 19.407 90; 112.594; 90 | 2538.1 | Rohlíček, Jan; Skořepová, Eliška; Babor, Martin; Čejka, Jan <i>CrystalCMP</i>: an easy-to-use tool for fast comparison of molecular packing Journal of Applied Crystallography, 2016, 49, 2172-2183 |
| 2300627 | CIF HKL Paper | C32 H36 N2 O7 S | P 1 21/c 1 | 14.2061; 12.6581; 17.5097 90; 113.36; 90 | 2890.55 | Rohlíček, Jan; Skořepová, Eliška; Babor, Martin; Čejka, Jan <i>CrystalCMP</i>: an easy-to-use tool for fast comparison of molecular packing Journal of Applied Crystallography, 2016, 49, 2172-2183 |
| 2300628 | CIF HKL Paper | C32 H36 N2 O7 S | P 1 21/c 1 | 13.2637; 12.7583; 17.5667 90; 107.448; 90 | 2835.9 | Rohlíček, Jan; Skořepová, Eliška; Babor, Martin; Čejka, Jan <i>CrystalCMP</i>: an easy-to-use tool for fast comparison of molecular packing Journal of Applied Crystallography, 2016, 49, 2172-2183 |
| 2300629 | CIF HKL Paper | C2 H10 N2 O4 Se | P 43 21 2 | 6.1352; 6.1352; 18.1726 90; 90; 90 | 684.03 | Martin, Alexander T.; Nichols, Shane M.; Li, Sichao; Tan, Melissa; Kahr, Bart Double cone of eigendirections in optically active ethylenediammonium selenate crystals Journal of Applied Crystallography, 2017, 50, 1117-1124 |
| 2300630 | CIF | Se2 Sn | P -3 m 1 | 3.8108; 3.8108; 6.141 90; 90; 120 | 77.233 | Palosz, B.; Salje, E. Lattice parameters and spontaneous strain in A X2 polytypes: Cd I2, Pb I2, Sn, S2 and SnSe2 Journal of Applied Crystallography, 1989, 22, 622-623 |
| 2300631 | CIF HKL Paper | B H4 Li | P n m a | 7.1374; 4.4172; 6.7029 90; 90; 90 | 211.32 | Solar, Michael; Trapp, Nils μCHILL: a lightweight, modular system for handling crystalline samples at low temperatures under inert conditions Journal of Applied Crystallography, 2018, 51 |
| 2300632 | CIF HKL | B H4 Li | P n m a | 7.1431; 4.4159; 6.7027 90; 90; 90 | 211.42 | Solar, Michael; Trapp, Nils μCHILL: a lightweight, modular system for handling crystalline samples at low temperatures under inert conditions Journal of Applied Crystallography, 2018, 51 |
| 2300633 | CIF HKL Paper | Fe4 Mn Si3 | P 63/m c m | 6.8; 6.8; 4.75 90; 90; 120 | 190.2 | Grzechnik, Andrzej; Meven, Martin; Friese, Karen Single-crystal neutron diffraction in diamond anvil cells with hot neutrons Journal of Applied Crystallography, 2018, 51, 351-356 |
| 2300634 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300635 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300636 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300637 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300638 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300639 | CIF HKL | F Fe O3 Se | P 1 21/n 1 | 4.956; 5.202; 12.04 90; 97.87; 90 | 307.48 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300640 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300641 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300642 | CIF HKL | O192 Si96 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300643 | CIF HKL | O24 Si12 | P n m a | 20.022; 19.899; 13.383 90; 90; 90 | 5332 | Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds Journal of Applied Crystallography, 2018, 51 |
| 2300644 | CIF HKL | O96 Si48 | C m c m | 18.11; 20.53; 7.528 90; 90; 90 | 2798.9 | Cichocka, Magdalena Ola; Ångström, Jonas; Wang, Bin; Zou, Xiaodong; Smeets, Stef High-throughput continuous rotation electron diffraction data acquisition <i>via</i> software automation Journal of Applied Crystallography, 2018, 51 |
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