Crystallography Open Database
Search results
Result: there are 755 entries in the selection
Switch to the old layout of the pageDownload all results as: list of COD numbers | list of CIF URLs | data in CSV format | archive of CIF files (ZIP)
Searching journal of publication like 'Journal of applied crystallography'
COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 2300192 | CIF | Al2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35 | C 1 2/m 1 | 5.167; 8.983; 10.01 90; 100.5; 90 | 456.8 | Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon Structural characterization of the clay mineral illite-1M Journal of Applied Crystallography, 2008, 41, 402-415 |
| 2300193 | CIF Paper | C50 H64 O16 | I 1 2 1 | 21.1388; 9.1628; 24.5916 90; 98.1462; 90 | 4715.1 | Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto <i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method Journal of Applied Crystallography, 2008, 41, 292-301 |
| 2300194 | CIF Paper | C50 H64 O16 | I 1 2 1 | 21.0262; 9.1138; 24.3796 90; 98.3396; 90 | 4622.43 | Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto <i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method Journal of Applied Crystallography, 2008, 41, 292-301 |
| 2300195 | CIF Paper | C50 H64 O16 | I 1 2 1 | 20.9107; 9.0536; 24.2008 90; 98.9412; 90 | 4525.95 | Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto <i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method Journal of Applied Crystallography, 2008, 41, 292-301 |
| 2300196 | CIF HKL Paper | Na O8 W2 Y0.95 Yb0.05 | I 41/a :2 | 5.2039; 5.2039; 11.2838 90; 90; 90 | 305.57 | Fan, Jiandong; Zhang, Huaijin; Yu, Wentao; Yu, Haohai; Wang, Jiyang; Jiang, Minhua A Yb^3+^-doped NaY(WO~4~)~2~ crystal grown by the Czochralski technique Journal of Applied Crystallography, 2008, 41, 584-591 |
| 2300197 | CIF HKL Paper | F7 K2 Ta | P n m a | 10.0731; 5.9456; 12.1527 90; 90; 90 | 727.83 | Smrčok, Ľubomír; Brunelli, Michela; Boča, Miroslav; Kucharík, Marian Structure of K~2~TaF~7~ at 993K: the combined use of synchrotron powder data and solid-state DFT calculations Journal of Applied Crystallography, 2008, 41, 634-636 |
| 2300198 | CIF Paper | ? | P -1 | 6.217; 6.985; 10.506 94.686; 100.568; 98.884 | 440.26 | Morgenroth, Wolfgang; Overgaard, Jacob; Clausen, Henrik F.; Svendsen, Helle; Jørgensen, Mads R. V.; Larsen, Finn K.; Iversen, Bo B. Helium cryostat synchrotron charge densities determined using a large CCD detector ‒ the upgraded beamline D3 at DESY Journal of Applied Crystallography, 2008, 41, 846-853 |
| 2300199 | CIF | Fe0.2 Mg0.8 O | F m -3 m | 4.19971; 4.19971; 4.19971 90; 90; 90 | 74.073 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
| 2300200 | CIF | Fe | I m -3 m | 2.8403; 2.84034; 2.84034 90; 90; 90 | 22.914 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
| 2300201 | CIF | Fe0.3 Mg0.7 O | F m -3 m | 4.1896; 4.18955; 4.18955 90; 90; 90 | 73.537 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
| 2300202 | CIF | Fe | I m -3 m | 2.8274; 2.8274; 2.8274 90; 90; 90 | 22.603 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
| 2300203 | CIF | O2 Zr | P 1 21/c 1 | 5.213; 4.967; 5.318 90; 100.16; 90 | 135.5 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
| 2300204 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8481; 6.359; 8.9 74.49; 83.9; 80.53 | 260.22 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
| 2300205 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8619; 6.377; 8.926 74.4; 83.93; 80.56 | 262.39 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
| 2300206 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8707; 6.3951; 8.9448 74.368; 83.786; 80.459 | 264.01 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
| 2300207 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8737; 6.4046; 8.9548 74.324; 83.751; 80.449 | 264.79 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
| 2300208 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8786; 6.4126; 8.9665 74.266; 83.693; 80.445 | 265.63 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
| 2300209 | CIF Paper | C46 H42 Fe O12 | P 1 21 1 | 5.857; 24.105; 14.069 90; 93.15; 90 | 1983.3 | Okabe, Takashi; Nakazaki, Keisuke; Igaue, Tsuyoshi; Nakamura, Naotake; Donnio, Bertrand; Guillon, Daniel; Gallani, Jean-Louis Synthesis and physical properties of ferrocene derivatives. XXI. Crystal structure of a liquid crystalline ferrocene derivative, 1,1'-bis[3-[4-(4-methoxyphenoxycarbonyl)phenoxy]propyloxycarbonyl]ferrocene Journal of Applied Crystallography, 2009, 42, 63-68 |
| 2300210 | CIF HKL Paper | C2 H2 Ca O5 | P 1 21/c 1 | 6.316; 14.541; 10.116 90; 109; 90 | 878.4 | Daudon, Michel; Bazin, Dominique; André, Gilles; Jungers, Paul; Cousson, Alain; Chevallier, Pierre; Véron, Emmanuel; Matzen, Guy Examination of whewellite kidney stones by scanning electron microscopy and powder neutron diffraction techniques Journal of Applied Crystallography, 2009, 42, 109-115 |
| 2300211 | CIF Paper | Lu2 O5 Si | I 1 2/a 1 | 10.255; 6.6465; 12.3626 90; 102.422; 90 | 822.91 | Cong, Hengjiang; Zhang, Huaijin; Wang, Jiyang; Yu, Wentao; Fan, Jiandong; Cheng, Xiufeng; Sun, Shangqian; Zhang, Jian; Lu, Qingming; Jiang, Chunjian; Boughton, Robert I. Structural and thermal properties of the monoclinic Lu~2~SiO~5~ single crystal: evaluation as a new laser matrix Journal of Applied Crystallography, 2009, 42, 284-294 |
| 2300212 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6696; 7.889; 10.7287 90; 99.427; 90 | 1224.85 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300213 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6712; 7.8893; 10.7288 90; 99.428; 90 | 1225.05 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300214 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6662; 7.8879; 10.7275 90; 99.432; 90 | 1224.23 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300215 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6689; 7.8884; 10.728 90; 99.429; 90 | 1224.61 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300216 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6682; 7.8889; 10.7276 90; 99.437; 90 | 1224.55 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300217 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6636; 7.8871; 10.7244 90; 99.417; 90 | 1223.6 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300218 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6703; 7.889; 10.7282 90; 99.429; 90 | 1224.84 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300219 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6698; 7.8878; 10.7265 90; 99.432; 90 | 1224.41 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300220 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.499; 7.7576; 10.6203 90; 99.741; 90 | 1177.3 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300221 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6706; 7.8885; 10.7284 90; 99.426; 90 | 1224.81 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300222 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6655; 7.8817; 10.724 90; 99.427; 90 | 1222.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300223 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.494; 7.7528; 10.6655 90; 99.875; 90 | 1180.7 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300224 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.673; 7.8892; 10.7316 90; 99.436; 90 | 1225.45 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300225 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.669; 7.8804; 10.7272 90; 99.439; 90 | 1223.3 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300226 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.528; 7.7695; 10.691 90; 99.89; 90 | 1188.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300227 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.67; 7.8886; 10.7304 90; 99.43; 90 | 1225 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300228 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.683; 7.86; 10.729 90; 99.456; 90 | 1221.4 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300229 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.88606; 9.38115; 7.10099 90; 115.701; 90 | 773.484 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300230 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.88559; 9.38013; 7.10096 90; 115.7; 90 | 773.38 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300231 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8865; 9.3822; 7.10147 90; 115.702; 90 | 773.65 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300232 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.89; 9.38466; 7.10325 90; 115.702; 90 | 774.26 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300233 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8863; 9.38162; 7.10158 90; 115.701; 90 | 773.61 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300234 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8871; 9.3824; 7.1018 90; 115.703; 90 | 773.73 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300235 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8905; 9.38488; 7.10342 90; 115.701; 90 | 774.32 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300236 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.887; 9.3819; 7.1015 90; 115.701; 90 | 773.66 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300237 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8858; 9.3812; 7.1013 90; 115.703; 90 | 773.5 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300238 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.889; 9.38347; 7.10271 90; 115.702; 90 | 774.04 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300239 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8856; 9.3812; 7.10114 90; 115.697; 90 | 773.5 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300240 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8844; 9.3824; 7.1025 90; 115.709; 90 | 773.6 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300241 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8887; 9.384; 7.1025 90; 115.702; 90 | 774.05 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300242 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8869; 9.3833; 7.1022 90; 115.706; 90 | 773.82 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300243 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.656; 9.564; 7.236 90; 117.1; 90 | 779.7 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300244 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.885; 9.3862; 7.1008 90; 115.714; 90 | 773.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300245 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.864; 9.354; 7.104 90; 115.83; 90 | 769.4 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
| 2300246 | CIF | Co Li O4 P | P n m a | 10.202; 5.918; 4.709 90; 90; 90 | 284.3 | Kimura, Tsunehisa; Chang, Chengkang; Kimura, Fumiko; Maeyama, Masataka The pseudo-single-crystal method: a third approach to crystal structure determination Journal of Applied Crystallography, 2009, 42, 535-537 |
| 2300247 | CIF | D | P 1 21/n 1 | 7.78366; 6.72568; 6.07443 90; 102.104; 90 | 310.929 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300248 | CIF | D | P b c a | 18.8679; 6.94772; 6.85885 90; 90; 90 | 899.12 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300249 | CIF | D2 O | R -3 :H | 12.87078; 12.87078; 6.1827 90; 90; 120 | 886.99 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300250 | CIF | Al | F m -3 m | 4.03702; 4.03702; 4.03702 90; 90; 90 | 65.793 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300251 | CIF | D2 O | P 41 21 2 | 6.6748; 6.67484; 6.6838 90; 90; 90 | 297.78 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300252 | CIF | C W | P -6 m 2 | 2.9016; 2.90156; 2.83867 90; 90; 120 | 20.697 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300253 | CIF | D | P n c n | 12.5626; 6.6513; 6.3788 90; 90; 90 | 533 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300254 | CIF | D2 O | R -3 :H | 12.8396; 12.8396; 6.1628 90; 90; 120 | 879.86 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300255 | CIF | D10 O5 | P 42/n m c :2 | 6.186; 6.186; 5.7157 90; 90; 90 | 218.72 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300256 | CIF | Pb | F m -3 m | 4.9108; 4.91075; 4.91075 90; 90; 90 | 118.426 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300257 | CIF | D | I -4 2 d | 8.15; 8.15; 4 90; 90; 90 | 265.69 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
| 2300258 | CIF | Ca H4 O6 S | C 1 2/c 1 | 6.28689; 15.2131; 6.52996 90; 127.43; 90 | 495.95 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum Journal of Applied Crystallography, 2009, 42, 1176-1188 |
| 2300259 | CIF | Ca H4 O6 S | I 1 2/c 1 | 5.68021; 15.2139; 6.53032 90; 118.484; 90 | 496.03 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum Journal of Applied Crystallography, 2009, 42, 1176-1188 |
| 2300260 | CIF | C D7 N O | P b c a | 11.0232; 7.66076; 7.59127 90; 90; 90 | 641.053 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol monoammoniate (CD~3~OD·ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2009, 42, 1054-1061 |
| 2300261 | CIF | C D7 N O | P b c a | 11.21169; 7.74663; 7.68077 90; 90; 90 | 667.096 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol monoammoniate (CD~3~OD·ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2009, 42, 1054-1061 |
| 2300262 | CIF HKL Paper | C17 H30 F N3 O9 | P -1 | 9.507; 9.9649; 11.0233 94.182; 100.118; 91.432 | 1024.57 | Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A. Towards extracting the charge density from normal-resolution data Journal of Applied Crystallography, 2009, 42, 1110-1121 |
| 2300263 | CIF Paper | C17 H21.8 Cl F N3 O4.4 | P 1 21/c 1 | 12.872; 19.576; 6.948 90; 90.55; 90 | 1750.7 | Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A. Towards extracting the charge density from normal-resolution data Journal of Applied Crystallography, 2009, 42, 1110-1121 |
| 2300264 | CIF | C12 H22 O11 | P 1 21 1 | 7.7735; 8.7169; 10.8765 90; 102.936; 90 | 718.3 | Kimura, Fumiko; Kimura, Tsunehisa; Oshima, Wataru; Maeyama, Masataka; Aburaya, Kazuaki X-ray diffraction study of a pseudo single crystal prepared from a crystal belonging to point group 2 Journal of Applied Crystallography, 2010, 43, 151-153 |
| 2300265 | CIF Paper | C15 H14 Br N5 O2 | P -1 | 11.479; 14.738; 4.476 93.65; 94.16; 93.71 | 751.9 | Lasocha, W.; Gaweł, B.; Rafalska-Lasocha, A.; Pawłowski, M.; Talik, P.; Paszkowicz, W. Crystal structure study of selected xanthine derivatives Journal of Applied Crystallography, 2010, 43, 163-167 |
| 2300266 | CIF | C D7 N O | P b c a | 11.0386; 7.65471; 7.58467 90; 90; 90 | 640.88 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
| 2300267 | CIF | C2 D11 N O2 | P n 21 a | 12.70615; 8.84589; 4.73876 90; 90; 90 | 532.623 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
| 2300268 | CIF | C D7 N O | P b c a | 11.20962; 7.74564; 7.6781 90; 90; 90 | 666.66 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
| 2300269 | CIF | C2 D11 N O2 | P n 21 a | 12.90413; 8.96975; 4.79198 90; 90; 90 | 554.656 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
| 2300270 | CIF | C10 H13 N O3 | P 1 21/n 1 | 13.00247; 6.86966; 11.51889 90; 108.329; 90 | 976.695 | Pagola, Silvina; Stephens, Peter W. <i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data Journal of Applied Crystallography, 2010, 43, 370-376 |
| 2300271 | CIF | C8 H10 O2 | P 1 21/n 1 | 9.8417; 15.4813; 4.8422 90; 101.258; 90 | 723.57 | Pagola, Silvina; Stephens, Peter W. <i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data Journal of Applied Crystallography, 2010, 43, 370-376 |
| 2300272 | CIF | C2 H4 N4 S | P 1 21/a 1 | 9.849; 12.3828; 3.99952 90; 102.126; 90 | 476.891 | Pagola, Silvina; Stephens, Peter W. <i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data Journal of Applied Crystallography, 2010, 43, 370-376 |
| 2300273 | CIF Paper | Ca5 H O13 P3 | P 63/m | 9.421; 9.421; 6.88 90; 90; 120 | 528.826 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
| 2300274 | CIF Paper | ? | P 63/m | 9.417; 9.417; 6.867 90; 90; 120 | 527.38 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
| 2300275 | CIF Paper | ? | P 63/m | 9.4039; 9.4039; 6.8526 90; 90; 120 | 524.81 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
| 2300276 | CIF Paper | ? | P 63/m | 9.4109; 9.4109; 6.8456 90; 90; 120 | 525.05 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
| 2300277 | CIF Paper | ? | P 63/m | 9.4072; 9.4072; 6.84 90; 90; 120 | 524.21 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
| 2300278 | CIF Paper | La O4 V | P 1 21/n 1 | 7.0492; 7.2827; 6.725 90; 104.901; 90 | 333.63 | Cong, Hengjiang; Zhang, Huaijin; Sun, Shangqian; Yu, Yonggui; Yu, Wentao; Yu, Haohai; Zhang, Jian; Wang, Jiyang; Boughton, Robert I. Morphological study of Czochralski-grown lanthanide orthovanadate single crystals and implications on the mechanism of bulk spiral formation Journal of Applied Crystallography, 2010, 43, 308-319 |
| 2300279 | CIF | Co0.15 Cr0.42 Mn0.19 O | F d -3 m :2 | 8.3777; 8.3777; 8.3777 90; 90; 90 | 588 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
| 2300280 | CIF | Co0.43 Mn0.32 O | F d -3 m :2 | 8.2685; 8.2685; 8.2685 90; 90; 90 | 565.3 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
| 2300281 | CIF | Co0.23 Mn0.52 O | I 41/a m d :2 | 5.7184; 5.7184; 9.2079 90; 90; 90 | 301.1 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
| 2300282 | CIF | Co0.33 Mn0.42 O | F d -3 m :2 | 8.3015; 8.3015; 8.3015 90; 90; 90 | 572.1 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
| 2300283 | CIF Paper | F2 O Ti | R -3 c :H | 5.3325; 5.3325; 13.2321 90; 90; 120 | 325.853 | Shian, Samuel; Sandhage, Kenneth H. Hexagonal and cubic TiOF~2~ Journal of Applied Crystallography, 2010, 43, 757-761 |
| 2300284 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.18564; 4.18564; 4.18564 90; 90; 90 | 73.3307 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300285 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.18419; 4.18419; 4.18419 90; 90; 90 | 73.2545 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300286 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.18455; 4.18455; 4.18455 90; 90; 90 | 73.2734 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300287 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.188219; 4.188219; 4.188219 90; 90; 90 | 73.4663 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300288 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.188195; 4.188195; 4.188195 90; 90; 90 | 73.465 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300289 | CIF Paper | Fe2 Ni O4 | F d -3 m :2 | 8.35966; 8.35966; 8.35966 90; 90; 90 | 584.206 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300290 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.95403; 2.95403; 7.2801 90; 90; 120 | 55.017 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300291 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.95557; 2.95557; 7.2626 90; 90; 120 | 54.942 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300292 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.95546; 2.95546; 7.2665 90; 90; 120 | 54.968 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300293 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.96064; 2.96064; 7.2592 90; 90; 120 | 55.105 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300294 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.9607; 2.9607; 7.25817 90; 90; 120 | 55.0994 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300295 | CIF Paper | Fe2 Ni O4 | F d -3 m :2 | 8.35966; 8.35966; 8.35966 90; 90; 90 | 584.206 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
| 2300296 | CIF Paper | O2 Zr | P 1 21/c 1 | 5.1477; 5.2096; 5.3164 90; 99.215; 90 | 140.732 | Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B. Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles Journal of Applied Crystallography, 2010, 43, 1092-1099 |
| 2300297 | CIF Paper | O1.985 Y0.03 Zr0.97 | P 42/n m c S | 3.6244; 3.6244; 5.156 90; 90; 90 | 67.731 | Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B. Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles Journal of Applied Crystallography, 2010, 43, 1092-1099 |
| 2300298 | CIF Paper | O1.985 Y0.03 Zr0.97 | P 42/n m c S | 3.6132; 3.6132; 5.1649 90; 90; 90 | 67.429 | Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B. Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles Journal of Applied Crystallography, 2010, 43, 1092-1099 |
| 2300299 | CIF Paper | Sb10 Te3 | R -3 m :H | 4.289; 4.289; 75.51 90; 90; 120 | 1202.9 | Schneider, Matthias N.; Seibald, Markus; Lagally, Patrick; Oeckler, Oliver Ambiguities in the structure determination of antimony tellurides arising from almost homometric structure models and stacking disorder Journal of Applied Crystallography, 2010, 43, 1012-1020 |
| 2300300 | CIF | Pb0.18 Sb7.82 Te3 | R -3 m :H | 4.2874; 4.2874; 64.3 90; 90; 120 | 1023.6 | Schneider, Matthias N.; Seibald, Markus; Lagally, Patrick; Oeckler, Oliver Ambiguities in the structure determination of antimony tellurides arising from almost homometric structure models and stacking disorder Journal of Applied Crystallography, 2010, 43, 1012-1020 |
| 2300301 | CIF | C6 H6 Cl N O6 | P 1 21/c 1 | 5.5046; 13.574; 17.423 90; 137.919; 90 | 872.5 | Ye, Heng-Yun; Cai, Hong-Ling; Ge, Jia-Zeng; Xiong, Ren-Gen Reversible structural phase transition of pyridinium-4-carboxylic acid perchlorate Journal of Applied Crystallography, 2010, 43, 1031-1035 |
| 2300302 | CIF | C6 H6 Cl N O6 | P 1 21/c 1 | 17.356; 13.241; 16.161 90; 138.055; 90 | 2482.5 | Ye, Heng-Yun; Cai, Hong-Ling; Ge, Jia-Zeng; Xiong, Ren-Gen Reversible structural phase transition of pyridinium-4-carboxylic acid perchlorate Journal of Applied Crystallography, 2010, 43, 1031-1035 |
| 2300303 | CIF Paper | C6 H6 N2 O2 | P c a 21 | 18.7169; 6.5215; 5.0014 90; 90; 90 | 610.48 | Probert, Michael R.; Robertson, Craig M.; Coome, Jonathan A.; Howard, Judith A. K.; Michell, Brian C.; Goeta, Andrés E. The XIPHOS diffraction facility for extreme sample conditions Journal of Applied Crystallography, 2010, 43, 1415-1418 |
| 2300304 | CIF Paper | C14 H14 O2 S | P -1 | 4.736; 10.819; 12.206 89.727; 78.904; 89.977 | 613.7 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300305 | CIF Paper | C14 H14 O2 S | C 1 2/c 1 | 24.003; 4.7435; 10.8255 90; 90.185; 90 | 1232.6 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300306 | CIF Paper | C14 H14 O2 S | C 1 2/c 1 | 24.012; 4.7429; 10.8321 90; 90.197; 90 | 1233.6 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300307 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1; 11.365; 11.3 90; 97.464; 90 | 1286.1 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300309 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1414; 11.3865; 11.3289 90; 97.4; 90 | 1297.31 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300310 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1385; 11.3898; 11.3325 90; 97.467; 90 | 1297.5 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300311 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1375; 11.3871; 11.3412 90; 97.482; 90 | 1298 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300312 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.137; 11.413; 11.345 90; 97.465; 90 | 1301.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300313 | CIF Paper | C17 H20 Cl2 N2 Pd | P 1 21/c 1 | 9.356; 9.9295; 19.357 90; 90.47; 90 | 1798.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300314 | CIF Paper | C17 H20 Cl2 N2 Pd | P 1 21/c 1 | 9.356; 9.9295; 19.357 90; 90.47; 90 | 1798.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300315 | CIF Paper | C16 H18 Cl2 N2 Pd | P -1 | 8.5305; 9.6211; 10.988 72.593; 78.78; 83.039 | 842.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300316 | CIF Paper | C16 H18 Cl2 N2 Pd | P -1 | 8.5305; 9.6211; 10.988 72.593; 78.78; 83.039 | 842.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300317 | CIF Paper | C13 H10 O S | P 1 21/n 1 | 8.007; 16.958; 8.031 90; 95.097; 90 | 1086.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300318 | CIF Paper | C13 H10 O S | P 1 21/n 1 | 8.007; 16.958; 8.031 90; 95.097; 90 | 1086.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300319 | CIF Paper | C12 H16 O3 | P 1 21/c 1 | 8.894; 16.22; 7.742 90; 90.214; 90 | 1116.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300320 | CIF Paper | C12 H16 O3 | P 1 21/c 1 | 8.894; 16.22; 7.742 90; 90.214; 90 | 1116.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300321 | CIF Paper | C13 H18 N2 O3 S | P 1 21/c 1 | 12.8651; 15.3291; 7.1435 90; 93.379; 90 | 1406.3 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300322 | CIF Paper | C13 H18 N2 O3 S | P 1 21/c 1 | 12.8651; 15.3291; 7.1435 90; 93.379; 90 | 1406.3 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300323 | CIF Paper | C21 H21 N O3 S2 | P 1 21/c 1 | 11.7771; 11.4544; 14.9031 90; 95.945; 90 | 1999.6 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300324 | CIF Paper | C21 H21 N O3 S2 | P 1 21/c 1 | 11.7937; 11.4816; 14.9358 90; 95.972; 90 | 2011.5 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300325 | CIF Paper | C21 H21 N O3 S2 | P 1 21/c 1 | 11.7937; 11.4816; 14.9358 90; 95.972; 90 | 2011.5 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300326 | CIF Paper | C13 H10 F2 O S | P c a 21 | 8.3649; 5.5063; 25.129 90; 90; 90 | 1157.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300327 | CIF Paper | C15 H12 N2 O | P 1 21/n 1 | 7.55; 11.186; 13.954 90; 92.938; 90 | 1176.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300328 | CIF Paper | C13 H10 I N O2 S | P -1 | 7.4946; 7.7421; 11.4816 95.418; 103.879; 96.985 | 636.65 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300329 | CIF Paper | C13 H10 I N O2 S | P -1 | 7.5076; 7.76; 11.507 95.317; 103.999; 97.013 | 640.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300330 | CIF Paper | C13 H10 I N O2 S | P -1 | 7.5076; 7.76; 11.507 95.317; 103.999; 97.013 | 640.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300331 | CIF Paper | C7 H5 N O3 S | P 1 21/c 1 | 9.583; 6.9252; 11.8518 90; 103.815; 90 | 763.78 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300332 | CIF Paper | C7 H5 N O3 S | P 1 21/c 1 | 9.6083; 6.9347; 11.882 90; 103.834; 90 | 768.7 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300333 | CIF Paper | C7 H0 N O3 S | P 1 21/c 1 | 9.6083; 6.9347; 11.882 90; 103.834; 90 | 768.7 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300334 | CIF Paper | C6 H5 I N2 O2 | P 1 21/c 1 | 7.7617; 12.912; 15.663 90; 95.141; 90 | 1563.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300335 | CIF Paper | C12 H6 I2 N4 O4 | P 1 21/c 1 | 7.7617; 12.912; 15.663 90; 95.141; 90 | 1563.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300336 | CIF Paper | C15 H14 N2 O2 S | P 21 21 21 | 7.7598; 9.9684; 18.231 90; 90; 90 | 1410.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300338 | CIF Paper | C15 H14 N2 O2 S | P 21 21 21 | 7.7592; 9.9677; 18.23 90; 90; 90 | 1409.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300339 | CIF Paper | C17 H23 N3 O5 S2 | P 1 21/n 1 | 7.811; 17.503; 15.892 90; 103.305; 90 | 2114 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300341 | CIF Paper | C17 H23 N3 O5 S2 | P 1 21/n 1 | 7.811; 17.503; 15.892 90; 103.305; 90 | 2114 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300342 | CIF Paper | C7 H12 N4 O3 S | P 1 21 1 | 5.6095; 7.3299; 12.491 90; 93.297; 90 | 512.74 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300344 | CIF Paper | C7 H12 N4 O3 S | P 1 21 1 | 5.6245; 7.354; 12.521 90; 93.445; 90 | 517 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300345 | CIF Paper | C7 H8 N4 O S | P 1 21 1 | 5.6245; 7.354; 12.521 90; 93.445; 90 | 517 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300346 | CIF Paper | C25 H22 N O P S | P -1 | 10.2699; 11.1605; 11.1911 85.945; 67.75; 70.671 | 1118.07 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300347 | CIF Paper | C25 H22 N O P S | P -1 | 10.2699; 11.1605; 11.1911 85.945; 67.75; 70.671 | 1118.07 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300348 | CIF Paper | C13 H13 N O2 S | P -1 | 10.259; 11.05; 13.38 67.808; 87.291; 67.435 | 1288.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300349 | CIF Paper | C13 H13 N O2 S | P -1 | 10.289; 11.0563; 13.4402 67.823; 87.573; 67.616 | 1299.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300351 | CIF Paper | C13 H12 N O2 S | P -1 | 10.289; 11.0563; 13.4402 67.823; 87.573; 67.616 | 1299.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
| 2300352 | CIF Paper | Fe Li O4 P | P n m a | 10.4008; 6.0523; 4.7324 90; 90; 90 | 297.91 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
| 2300353 | CIF Paper | Fe0.75 Li Mn0.25 O4 P | P n m a | 10.3789; 6.0394; 4.7211 90; 90; 90 | 295.931 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
| 2300354 | CIF Paper | Fe0.5 Li Mn0.5 O4 P | P n m a | 10.4072; 6.06188; 4.73357 90; 90; 90 | 298.628 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
| 2300355 | CIF Paper | Fe0.25 Li Mn0.75 O4 P | P n m a | 10.4303; 6.08084; 4.74531 90; 90; 90 | 300.971 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
| 2300356 | CIF Paper | C2 H6 O6 | P 1 21/n 1 | 6.0514; 3.5482; 11.996 90; 106.26; 90 | 247.27 | Chakoumakos, Bryan C.; Cao, Huibo; Ye, Feng; Stoica, Alexandru D.; Popovici, Mihai; Sundaram, Madhan; Zhou, Wenduo; Hicks, J. Steve; Lynn, Gary W.; Riedel, Richard A. Four-circle single-crystal neutron diffractometer at the High Flux Isotope Reactor Journal of Applied Crystallography, 2011, 44, 655-658 |
| 2300357 | CIF Paper | C6 H24 N8 Ni O6 | P 63 2 2 | 8.8647; 8.8647; 11.3595 90; 90; 120 | 773.07 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300358 | CIF Paper | C6 H24 N8 Ni O6 | P 63 2 2 | 8.8647; 8.8647; 11.3595 90; 90; 120 | 773.07 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300359 | CIF Paper | C6 H24 N8 Ni O6 | P 61 2 2 | 8.806; 8.806; 33.147 90; 90; 120 | 2226 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300360 | CIF Paper | C6 H24 N8 Ni O6 | P 61 2 2 | 8.806; 8.806; 33.147 90; 90; 120 | 2226 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300361 | CIF Paper | C6 H24 N8 Ni O6 | P 63 2 2 | 8.8647; 8.8647; 11.3595 90; 90; 120 | 773.07 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300362 | CIF Paper | C8 H14 N2 O8 | C 1 2/c 1 | 15.805; 5.6535; 12.126 90; 107.55; 90 | 1033.1 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300363 | CIF Paper | C8 H14 N2 O8 | C 1 2/c 1 | 15.8205; 5.68202; 12.09246 90; 107.333; 90 | 1037.66 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300364 | CIF Paper | C8 H14 N2 O8 | C 1 2/c 1 | 15.82035; 5.68088; 12.09343 90; 107.332; 90 | 1037.53 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
| 2300365 | CIF HKL | Ge O2 | P 31 2 1 | 4.989; 4.989; 5.6527 90; 90; 120 | 121.847 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
| 2300366 | CIF | Ge0.97 O2 Si0.03 | P 32 2 1 | 4.983; 4.983; 5.6339 90; 90; 120 | 121.149 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
| 2300367 | CIF | Ge0.96 O2 Si0.04 | P 31 2 1 | 4.9805; 4.9805; 5.627 90; 90; 120 | 120.88 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
| 2300368 | CIF HKL | Ge0.9 O2 Si0.1 | P 32 2 1 | 4.97517; 4.97517; 5.60565 90; 90; 120 | 120.163 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
| 2300369 | CIF HKL | Ge0.83 O2 Si0.17 | P 31 2 1 | 4.9707; 4.9707; 5.5873 90; 90; 120 | 119.555 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
| 2300370 | CIF | O2 Si | P 32 2 1 | 4.91636; 4.91636; 5.4084 90; 90; 120 | 113.211 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
| 2300371 | CIF HKL Paper | C9 H13 N3 O5 | P 21 21 21 | 5.0784; 13.9046; 14.6992 90; 90; 90 | 1037.96 | Coome, J. A.; Goeta, A. E.; Howard, J. A. K.; Probert, M. R. <i>Masquerade</i>: removing non-sample scattering from integrated reflection intensities Journal of Applied Crystallography, 2012, 45, 292-298 |
| 2300372 | CIF HKL Paper | C17 H14 O | P b c a | 15.4307; 10.2659; 16.4124 90; 90; 90 | 2599.9 | Rajasekar, M.; Muthu, K.; Bhagavannarayana, G.; Meenakshisundaram, S. P. Synthesis, structure, growth and characterization of an organic crystal: 1,5-diphenylpenta-2,4-dien-1-one Journal of Applied Crystallography, 2012, 45, 914-920 |
| 2300373 | CIF Paper | H18 O12 S | I 1 2 1 | 7.44247; 7.445; 26.1168 90; 125.043; 90 | 1184.78 | Maynard-Casely, Helen E.; Brand, Helen E. A.; Wallwork, Kia S. Structure and thermal expansion of sulfuric acid octahydrate Journal of Applied Crystallography, 2012, 45, 1198-1207 |
| 2300374 | CIF Paper | C25 H30 N4 O3 | P 21 21 21 | 35.9422; 12.91819; 4.99532 90; 90; 90 | 2319.37 | Bushmarinov, Ivan S.; Dmitrienko, Artem O.; Korlyukov, Alexander A.; Antipin, Mikhail Yu. Rietveld refinement and structure verification using `Morse' restraints Journal of Applied Crystallography, 2012, 45, 1187-1197 |
| 2300375 | CIF Paper | Al2 O3 | R -3 c :H | 4.76029; 4.76029; 12.992 90; 90; 120 | 254.96 | Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi Journal of Applied Crystallography, 2013, 46, 14-24 |
| 2300376 | CIF Paper | Ni Si | P 21 3 | 4.49678; 4.49678; 4.49678 90; 90; 90 | 90.9295 | Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi Journal of Applied Crystallography, 2013, 46, 14-24 |
| 2300377 | CIF Paper | Ni Si | P m m n :2 | 3.2735; 3.02662; 4.69776 90; 90; 90 | 46.544 | Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi Journal of Applied Crystallography, 2013, 46, 14-24 |
| 2300378 | CIF | Ag3 Mg | F m -3 m | 4.1526; 4.1526; 4.1526 90; 90; 90 | 71.608 | Laine, E.; Tarne, T.; Haemaelaeinen, M. Thermal expansion of the Ag3 Mg alloy in the ordered and disordered states Journal of Applied Crystallography, 1969, 2, 95-101 |
| 2300379 | CIF | B Lu O3 | R -3 c :H | 4.9153; 4.9153; 16.212 90; 90; 120 | 339.209 | Bernstein, J.L.; Keve, E.T.; Abrahams, S.C. Application of Normal Probability Plot Analysis to Lutetium Orthoborate Structure Factors and Parameters Journal of Applied Crystallography, 1971, 4, 284-290 |
| 2300380 | CIF Paper | C15 H4 Cu2 O10 | F m -3 m | 26.3034; 26.3034; 26.3034 90; 90; 90 | 18198.5 | Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai Generation and applications of structure envelopes for porous metal‒organic frameworks Journal of Applied Crystallography, 2013, 46, 346-353 |
| 2300381 | CIF Paper | C33 H4 Cu2 O10 | F m -3 m | 26.3167; 26.3167; 26.3167 90; 90; 90 | 18226.1 | Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai Generation and applications of structure envelopes for porous metal‒organic frameworks Journal of Applied Crystallography, 2013, 46, 346-353 |
| 2300382 | CIF Paper | C8.5 H7 Cu N5 O2 | C 1 2/c 1 | 28.697; 9.2637; 9.3223 90; 116.087; 90 | 2225.8 | Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai Generation and applications of structure envelopes for porous metal‒organic frameworks Journal of Applied Crystallography, 2013, 46, 346-353 |
| 2300383 | CIF Paper | C356 H32 Y4 | C m c 21 | 11.22205; 34.8174; 11.22569 90; 90; 90 | 4386.13 | Maki, Sachiko; Nishibori, Eiji; Kawaguchi, Daisuke; Sakata, Makoto; Takata, Masaki; Inoue, Takashi; Shinohara, Hisanori Element-selective charge density visualization of endohedral metallofullerenes using synchrotron X-ray multi-wavelength anomalous powder diffraction data Journal of Applied Crystallography, 2013, 46, 649-655 |
| 2300384 | CIF HKL | C13 H10 O | P 21 21 21 | 7.979; 10.274; 12.103 90; 90; 90 | 992.2 | Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H. Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone Journal of Applied Crystallography, 2013, 46, 656-662 |
| 2300385 | CIF HKL | C13 H10 O | P 21 21 21 | 7.7145; 10.2301; 12.0269 90; 90; 90 | 949.2 | Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H. Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone Journal of Applied Crystallography, 2013, 46, 656-662 |
| 2300386 | CIF | C13 H10 O | P 21 21 21 | 7.9958; 10.2907; 12.174 90; 90; 90 | 1001.7 | Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H. Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone Journal of Applied Crystallography, 2013, 46, 656-662 |
| 2300387 | CIF HKL Paper | B3 Ba5 F O9 | P n m a | 7.60788; 14.8299; 10.2865 90; 90; 90 | 1160.57 | Rashchenko, Sergey V.; Bekker, Tatyana B.; Bakakin, Vladimir V.; Seryotkin, Yurii V.; Kokh, Alexander E.; Gille, Peter; Popov, Arthur I.; Fedorov, Pavel P. A new mechanism of anionic substitution in fluoride borates Journal of Applied Crystallography, 2013, 46, 1081-1084 |
| 2300388 | CIF Paper | As0.84 Cu1.08 Mn0.94 | P 4/n m m :2 | 3.82; 3.82; 6.318 90; 90; 90 | 92.2 | Wadley, P.; Crespi, A.; Gázquez, J.; Roldán, M.A.; García, P.; Novak, V.; Campion, R.; Jungwirth, T.; Rinaldi, C.; Martí, X.; Holy, V.; Frontera, C.; Rius, J. Obtaining the structure factors for an epitaxial film using Cu X-ray radiation Journal of Applied Crystallography, 2013, 46, 1749-1754 |
| 2300389 | CIF | C33 H33 N3 O6 Pd S3 | P 1 21/c 1 | 8.5627; 10.4508; 35.5429 90; 94.294; 90 | 3171.7 | Coles, Simon J.; Hursthouse, Michael B. Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography Journal of Applied Crystallography, 2004, 37, 988 |
| 2300390 | CIF | C33 H33 N3 O6 Pd S3 | P 1 21/c 1 | 8.5467; 10.4343; 35.4794 90; 94.325; 90 | 3155 | Coles, Simon J.; Hursthouse, Michael B. Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography Journal of Applied Crystallography, 2004, 37, 988 |
| 2300391 | CIF | B12 Cs2 Li2 O20 | I -4 2 d | 10.467; 10.467; 8.922 90; 90; 90 | 977.48 | Herreros-Cedrés, Javier; Hernández-Rodriguez, Cecilio; Kaminsky, Werner Absolute optical rotation of CsLiB6O10 Journal of Applied Crystallography, 2005, 38, 544 |
| 2300392 | CIF | C10 H16 N O1.5 | P 21 21 21 | 7.3188; 11.2018; 24.0156 90; 90; 90 | 1968.89 | Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate Journal of Applied Crystallography, 2001, 34, 203 |
| 2300393 | CIF | C10 H16 N O1.5 | P 21 21 21 | 7.3105; 11.1878; 23.979 90; 90; 90 | 1961.2 | Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate Journal of Applied Crystallography, 2001, 34, 203 |
| 2300442 | CIF | Gd K O8 W2 | C 1 2/c 1 | 10.652; 10.374; 7.582 90; 130.8; 90 | 634.2 | Pujol, M. C.; Solé, R.; Massons, J.; Gavaldà, Jna.; Solans, X.; Zaldo, C.; Díaz, F.; Aguiló, M. Structural study of monoclinic KGd(WO4)2and effects of lanthanide substitution Journal of Applied Crystallography, 2001, 34, 1 |
| 2300443 | CIF | C12 H24 B2 F8 Fe N24 | P 1 21/n 1 | 17.566; 10.0964; 18.696 90; 114.458; 90 | 3018.3 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2 Journal of Applied Crystallography, 2001, 34, 229 |
| 2300444 | CIF | C12 H24 B2 F8 Fe N24 | P 1 21/n 1 | 17.4887; 10.0914; 18.517 90; 115.243; 90 | 2955.9 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2 Journal of Applied Crystallography, 2001, 34, 229 |
Back to the search form
Your own data is not in the COD? Deposit it, thanks!