Crystallography Open Database

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1000032 CIFAl2 O3R -3 c :H4.7605; 4.7605; 12.9956
90; 90; 120
255.1Lutterotti, L; Scardi, P
Simultaneous structure and size-strain refinement by the Rietveld method
Journal of Applied Crystallography, 1990, 23, 246-252
1001306 CIFGe2 N2 OC m c 219.317; 5.752; 5.105
90; 90; 90
273.6Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001307 CIFGe2 N2 OC m c 219.315; 5.747; 5.102
90; 90; 90
273.1Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001308 CIFGe2 N2 OC m c 219.306; 5.742; 5.097
90; 90; 90
272.4Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001309 CIFGe2 N2 OC m c 219.298; 5.736; 5.092
90; 90; 90
271.6Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001310 CIFGe2 N2 OC m c 219.287; 5.731; 5.089
90; 90; 90
270.9Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001311 CIFGe2 N2 OC m c 219.274; 5.727; 5.085
90; 90; 90
270.1Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001312 CIFGe2 N2 OC m c 219.266; 5.72; 5.08
90; 90; 90
269.2Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001313 CIFGe2 N2 OC m c 219.259; 5.714; 5.075
90; 90; 90
268.5Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001314 CIFGe2 N2 OC m c 219.261; 5.707; 5.074
90; 90; 90
268.2Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001315 CIFGe2 N2 OC m c 219.254; 5.699; 5.073
90; 90; 90
267.5Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1001316 CIFGe2 N2 OC m c 219.247; 5.689; 5.072
90; 90; 90
266.8Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C
Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O
Journal of Applied Crystallography, 1979, 12, 511-516
1004020 CIFCa O3 SnR -3 :R6; 6; 6
54.42; 54.42; 54.42
132.9Durand, B; Loiseleur, H
Crystal data for an ilmenite variety of calcium stannate Ca Sn O~3~
Journal of Applied Crystallography, 1978, 11, 289-290
1008036 CIFCu O4 WP -14.6964; 5.8287; 4.8736
91.63; 92.44; 82.79
132.2Klein, S; Weitzel, H
Pernod - ein Programm zur Verfeinerung von Kristall-Strukturparametern aus Neutronenbeugungspulverdiagrammen
Journal of Applied Crystallography, 1975, 8, 54-59
1100041 CIFN0.61 TiI 41/a m d :14.198; 4.198; 8.591
90; 90; 90
151.4Nagakura, S; Kusunoki, T
Structure of Ti Nx studied by electron diffraction and microscopy
Journal of Applied Crystallography, 1977, 10, 52-56
2300000 CIFC6 H6 B Br O2P 1 21/c 115.7797; 5.3085; 9.3757
90; 93.357; 90
784.02Nattamai S. P. Bhuvanesh; Joseph H. Reibenspies; Peter L. Lee; Yuegang Zhang
A novel strategy for <i>ab initio</i> structure determination using micro-powder X-ray diffraction: structure solution and refinement of 3-bromophenylboronic acid and tris(4-bromophenyl)boroxine
Journal of Applied Crystallography, 2005, 38, 632-638
2300001 CIFC18 H12 B3 Br3 O3P n m a18.9289; 21.8872; 4.8842
90; 90; 90
2023.53Nattamai S. P. Bhuvanesh; Joseph H. Reibenspies; Peter L. Lee; Yuegang Zhang
A novel strategy for <i>ab initio</i> structure determination using micro-powder X-ray diffraction: structure solution and refinement of 3-bromophenylboronic acid and tris(4-bromophenyl)boroxine
Journal of Applied Crystallography, 2005, 38, 632-638
2300002 CIFCa0.816 Co0.28 Cu0.72 O2?P?2.7954; 6.3078; 10.6017
90; 90; 90
186.938Dominique Grebille; Sebastien Lambert; Francoise Bouree; Vaclav Petricek
Contribution of powder diffraction for structure refinements of aperiodic misfit cobalt oxides
Journal of Applied Crystallography, 2004, 37, 823-831
2300003 CIF
HKL
H6 O9 P2 SrP -15.7491; 6.4104; 12.1002
93.56; 95.542; 114.013
402.91Bolte, Michael
<i>TWINLAW</i> and <i>HKLF</i>5: two programs for the handling of non-merohedral twins
Journal of Applied Crystallography, 2004, 37, 162-165
2300004 CIF
HKL
C2 H2 N4 O3P 1 21/c 19.3129; 5.4458; 9.0261
90; 101.464; 90
448.64Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structure of β-NTO
Journal of Applied Crystallography, 2003, 36, 280-285
2300005 CIF
HKL
C2 H2 N4 O3P 1 21/c 19.3185; 5.4615; 9.0475
90; 101.332; 90
451.48Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structure of β-NTO
Journal of Applied Crystallography, 2003, 36, 280-285
2300006 CIF
HKL
C2 H2 N4 O3P 1 21/c 19.322; 5.4791; 9.0685
90; 101.182; 90
454.39Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structure of β-NTO
Journal of Applied Crystallography, 2003, 36, 280-285
2300007 CIF
HKL
C2 H2 N4 O3P 1 21/c 19.3233; 5.4977; 9.0885
90; 101.019; 90
457.26Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structure of β-NTO
Journal of Applied Crystallography, 2003, 36, 280-285
2300008 CIF
HKL
C2 H2 N4 O3P 1 21/c 19.3207; 5.5215; 9.1102
90; 100.87; 90
460.44Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structure of β-NTO
Journal of Applied Crystallography, 2003, 36, 280-285
2300009 CIFC2 H8 N8 O4P -14.2928; 9.3043; 10.5438
85.236; 82.032; 81.19
411.326Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300010 CIFC2 H8 N8 O4P -14.3114; 9.3227; 10.5781
84.918; 81.686; 80.928
414.5Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300011 CIFC2 H8 N8 O4P -14.3312; 9.3456; 10.622
84.541; 81.285; 80.632
418.23Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300012 CIFC2 H8 N8 O4P -14.3535; 9.3742; 10.6783
84.072; 80.834; 80.273
422.73Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300013 CIFC2 H8 N8 O4P -14.3738; 9.4027; 10.7433
83.518; 80.343; 79.867
427.18Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300014 CIFC2 H9 N11 O8C 1 2/c 111.6824; 8.145; 13.0023
90; 117.407; 90
1098.34Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300015 CIFC2 H9 N11 O8C 1 2/c 111.7008; 8.1485; 13.0111
90; 117.337; 90
1101.99Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300016 CIFC2 H9 N11 O8C 1 2/c 111.7551; 8.1557; 13.0302
90; 117.005; 90
1113.01Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300017 CIFC2 H9 N11 O8C 1 2/c 111.7973; 8.1492; 13.0286
90; 116.639; 90
1119.59Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300018 CIFC2 H9 N11 O8C 1 2/c 111.8391; 8.1392; 13.0265
90; 116.225; 90
1126.04Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300019 CIFC4 H18 N22 O16C 1 2/c 111.8959; 8.1349; 13.0359
90; 115.806; 90
1135.7Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan
Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides
Journal of Applied Crystallography, 2003, 36, 1334-1341
2300020 CIFC6 H6 N12 O12P 1 21/n 113.2272; 8.1692; 14.892
90; 109.164; 90
1520Journal of Applied Crystallography, 2004, 37, 791-797
2300021 CIFC6 H6 N12 O12P 1 21/n 113.167; 8.1676; 14.8436
90; 109.001; 90
1509.34Journal of Applied Crystallography, 2004, 37, 791-797
2300022 CIFC6 H6 N12 O12P 1 21/n 113.1156; 8.1713; 14.8059
90; 108.841; 90
1501.75Journal of Applied Crystallography, 2004, 37, 791-797
2300023 CIFC6 H6 N12 O12P 1 21/n 113.0698; 8.1737; 14.7718
90; 108.696; 90
1494.78Journal of Applied Crystallography, 2004, 37, 791-797
2300024 CIFC6 H6 N12 O12P 1 21/n 113.0342; 8.1773; 14.7465
90; 108.566; 90
1489.95Journal of Applied Crystallography, 2004, 37, 791-797
2300025 CIFC6 H6 N12 O12P 1 21/n 18.8628; 12.5928; 13.3947
90; 106.92; 90
1430.2Journal of Applied Crystallography, 2004, 37, 791-797
2300026 CIFC6 H6 N12 O12P 1 21/n 18.8408; 12.5622; 13.3577
90; 106.82; 90
1420Journal of Applied Crystallography, 2004, 37, 791-797
2300027 CIFC6 H6 N12 O12P 1 21/n 18.8212; 12.5368; 13.333
90; 106.74; 90
1412Journal of Applied Crystallography, 2004, 37, 791-797
2300028 CIFC6 H6 N12 O12P 1 21/n 18.8004; 12.4992; 13.2985
90; 106.622; 90
1401.7Journal of Applied Crystallography, 2004, 37, 791-797
2300029 CIFC6 H6 N12 O12P 1 21/n 18.791; 12.481; 13.285
90; 106.55; 90
1397.2Journal of Applied Crystallography, 2004, 37, 791-797
2300030 CIFFe Ni0.5 O4 PP 1 21/c 15.98709; 4.72008; 10.357
90; 90.8913; 90
292.649Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300031 CIFFe Ni0.5 O4 PP 1 21/c 15.987146; 4.720383; 10.35681
90; 90.8902; 90
292.665Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300032 CIFFe Ni0.5 O4 PP 1 21/c 15.98729; 4.71923; 10.35671
90; 90.8886; 90
292.598Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300033 CIFFe3 O8 P2P 1 21/c 18.8828; 11.1738; 6.14402
90; 99.348; 90
601.72Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300034 CIFFe2 O7 P2C -16.643; 8.447; 4.495
90.43; 103.8; 92.49
244.7Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300035 CIFFe Ni0.5 O4 PP 1 21/c 15.98701; 4.719891; 10.35657
90; 90.8909; 90
292.621Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300036 CIFCo0.5 Fe O4 PP 1 21/c 15.98701; 4.719891; 10.35657
90; 90.8909; 90
292.621Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300037 CIFCu0.5 Fe O4 PP 1 21/c 15.98701; 4.719891; 10.35657
90; 90.8909; 90
292.621Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300038 CIFNi3 O8 P2P 1 21/c 15.83104; 4.69778; 10.1098
90; 91.1288; 90
276.883Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300039 CIFNi2 O7 P2B 21/c13.1459; 8.2711; 8.9714
90; 104.949; 90
942.5Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300040 CIFFe Ni0.5 O4 PP 1 21/c 15.994351; 4.724935; 10.369383
90; 90.891; 90
293.656Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction
Journal of Applied Crystallography, 2003, 36, 1361-1367
2300041 CIFAg7 Cl O12F m -3 m9.955; 9.955; 9.955
90; 90; 90
986.5Journal of Applied Crystallography, 2004, 37, 318-324
2300042 CIFC2 H4 O2P 1 21/n 13.9447; 13.028; 5.6407
90; 93.177; 90
289.44Dawson, Alice; Allan, David R.; Parsons, Simon; Ruf, Michael
Use of a CCD diffractometer in crystal structure determinations at high pressure
Journal of Applied Crystallography, 2004, 37, 410-416
2300043 CIFC19 H13 N5 O5P 1 21 111.72; 6.831; 11.045
90; 94.38; 90
881.7Chernyshev, Vladimir V.; Yatsenko, Alexandr V.; Kuvshinov, Alexandr M.; Shevelev, Svyatoslav A.
Unexpected molecular structure from laboratory powder diffraction data
Journal of Applied Crystallography, 2002, 35, 669-673
2300044 CIFC21 H17 N5 O7P 21 21 2122.788; 13.018; 6.92
90; 90; 90
2052.8Chernyshev, Vladimir V.; Yatsenko, Alexandr V.; Kuvshinov, Alexandr M.; Shevelev, Svyatoslav A.
Unexpected molecular structure from laboratory powder diffraction data
Journal of Applied Crystallography, 2002, 35, 669-673
2300045 CIFC20 H15 N5 O5P 1 21/c 18.676; 18.56; 12.098
90; 90.38; 90
1948.1Chernyshev, Vladimir V.; Yatsenko, Alexandr V.; Kuvshinov, Alexandr M.; Shevelev, Svyatoslav A.
Unexpected molecular structure from laboratory powder diffraction data
Journal of Applied Crystallography, 2002, 35, 669-673
2300046 CIFC6 H14 O6P 21 21 224.30122; 20.57261; 4.86719
90; 90; 90
2433.3Rukiah, Mwaffak; Lefebvre, Jacques; Hernandez, Olivier; van Beek, Wouter; Serpelloni, Michel
Ab initiostructure determination of the Γ form of D-sorbitol (D-glucitol) by powder synchrotron X-ray diffraction
Journal of Applied Crystallography, 2004, 37, 766-772
2300047 CIF
HKL
C18 H18 Fe OC 1 2 129.033; 5.943; 16.753
90; 90.562; 90
2890.5T. Koganezawa; K. Uno; H. Iwasaki; N. Nakamura; Y. Yoshimura; T. Shoji
A wide-bandpass multilayer monochromator and its application to the determination of absolute structure
Journal of Applied Crystallography, 2004, 37, 136-142
2300048 CIF
HKL
C18 H18 Fe OC 1 2 129.042; 5.946; 16.753
90; 90.587; 90
2892.8T. Koganezawa; K. Uno; H. Iwasaki; N. Nakamura; Y. Yoshimura; T. Shoji
A wide-bandpass multilayer monochromator and its application to the determination of absolute structure
Journal of Applied Crystallography, 2004, 37, 136-142
2300049 CIFCe0.4 Gd0.6 O1.7I a -310.8542; 10.8542; 10.8542
90; 90; 90
1278.77V. Grover; S. N. Achary; A. K. Tyagi
Structural analysis of excess-anion C-type rare earth oxide: a case study with Gd~1{-~<i>x</i>}Ce~<i>x~</i>O~1.5+<i>x~/2</i> (<i>x</i> = 0.20 and 0.40)
Journal of Applied Crystallography, 2003, 36, 1082-1084
2300050 CIFCe0.2 Gd0.8 O1.6I a -310.8488; 10.8488; 10.8488
90; 90; 90
1276.87V. Grover; S. N. Achary; A. K. Tyagi
Structural analysis of excess-anion C-type rare earth oxide: a case study with Gd~1{-~<i>x</i>}Ce~<i>x~</i>O~1.5+<i>x~/2</i> (<i>x</i> = 0.20 and 0.40)
Journal of Applied Crystallography, 2003, 36, 1082-1084
2300051 CIFC24 H48 B2 F8 N24 ZnR -3 :H10.8429; 10.8429; 31.607
90; 90; 120
3218.1Hartmunt Spiering; Philipp Gutlich
The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~
Journal of Applied Crystallography, 2004, 37, 589-595
2300052 CIFC24 H48 B2 F8 Fe N24R -3 :H10.881; 10.881; 31.48
90; 90; 120
3227.8Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~
Journal of Applied Crystallography, 2004, 37, 589-595
2300053 CIFC24 H48 B2 F8 Fe N24R -3 :H10.701; 10.701; 31.9
90; 90; 120
3163.5Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~
Journal of Applied Crystallography, 2004, 37, 589-595
2300054 CIFC24 H48 B2 F8 Fe0.46 N24 Zn0.54R -3 :H10.8575; 10.8575; 31.56
90; 90; 120
3222Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~
Journal of Applied Crystallography, 2004, 37, 589-595
2300055 CIFC24 H48 B2 F8 Fe0.46 N24 Zn0.54R -3 :H10.7719; 10.7719; 31.763
90; 90; 120
3191.8Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~
Journal of Applied Crystallography, 2004, 37, 589-595
2300056 CIFO Pb Sc TaF m -3 m8.15231; 8.15231; 8.15231
90; 90; 90
541.804Woodward, P. M.; Baba-Kishi, K. Z.
Crystal structures of the relaxor oxide Pb~2~(ScTa)O~6~ in the paraelectric and ferroelectric states
Journal of Applied Crystallography, 2002, 35, 233-242
2300057 CIFC32 H53 N3 O6?P?61.0155; 11.1836; 5.0827
90; 90; 90
3468.3Brenner, Simon; McCusker, Lynne B.; Baerlocher, Christian
The application of structure envelopes in structure determination from powder diffraction data
Journal of Applied Crystallography, 2002, 35, 243-252
2300058 CIFC8 H15 N7 O2 S3P 1 21/c 117.6547; 5.2932; 18.259
90; 123.558; 90
1421.91Shankland, Kenneth; McBride, Lorraine; David, William I. F.; Shankland, Norman; Steele, Gerald
Molecular, crystallographic and algorithmic factors in structure determination from powder diffraction data by simulated annealing
Journal of Applied Crystallography, 2002, 35, 443-454
2300059 CIFC14 H11 Cl2 N O2C 1 2/c 120.2906; 6.9952; 20.1137
90; 109.663; 90
2688.4Muangsin, Nongnuj; Prajuabsook, Malee; Chimsook, Pitiporn; Chantarasiri, Nuanphun; Siraleartmukul, Krisana; Chaichit, Narongsak; Hannongbua, Supot
Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data
Journal of Applied Crystallography, 2004, 37, 288-294
2300060 CIFC14 H11 Cl2 N O2C 1 2/c 120.298; 6.993; 20.107
90; 109.6; 90
2688.7Muangsin, Nongnuj; Prajuabsook, Malee; Chimsook, Pitiporn; Chantarasiri, Nuanphun; Siraleartmukul, Krisana; Chaichit, Narongsak; Hannongbua, Supot
Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data
Journal of Applied Crystallography, 2004, 37, 288-294
2300061 CIFC Fe3P n m a5.08493; 6.73631; 4.514
90; 90; 90
154.621Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600 K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300062 CIFC Fe3P n m a5.08524; 6.7362; 4.51431
90; 90; 90
154.638Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600 K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300063 CIFC Fe3P n m a5.08475; 6.7367; 4.51394
90; 90; 90
154.622Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600 K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300064 CIFC Fe3P n m a5.08442; 6.7376; 4.51384
90; 90; 90
154.63Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300065 CIFC Fe3P n m a5.08429; 6.7387; 4.51363
90; 90; 90
154.644Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300066 CIFC Fe3P n m a5.08412; 6.7404; 4.51364
90; 90; 90
154.678Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300067 CIFC Fe3P n m a5.08394; 6.7418; 4.51359
90; 90; 90
154.703Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300068 CIFC Fe3P n m a5.08396; 6.7433; 4.51368
90; 90; 90
154.741Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300069 CIFC Fe3P n m a5.08416; 6.7453; 4.51394
90; 90; 90
154.802Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300070 CIFC Fe3P n m a5.084; 6.7469; 4.51405
90; 90; 90
154.838Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300071 CIFC Fe3P n m a5.08411; 6.7483; 4.51457
90; 90; 90
154.891Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300072 CIFC Fe3P n m a5.08426; 6.7498; 4.51509
90; 90; 90
154.948Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300073 CIFC Fe3P n m a5.0843; 6.7513; 4.51556
90; 90; 90
154.999Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300074 CIFC Fe3P n m a5.0842; 6.753; 4.51621
90; 90; 90
155.058Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300075 CIFC Fe3P n m a5.08398; 6.7547; 4.5165
90; 90; 90
155.1Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300076 CIFC Fe3P n m a5.08395; 6.7558; 4.51728
90; 90; 90
155.151Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300077 CIFC Fe3P n m a5.08369; 6.7574; 4.51789
90; 90; 90
155.201Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300078 CIFC Fe3P n m a5.0837; 6.7589; 4.51839
90; 90; 90
155.253Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300079 CIFC Fe3P n m a5.08334; 6.7599; 4.51926
90; 90; 90
155.295Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300080 CIFC Fe3P n m a5.08324; 6.7615; 4.51937
90; 90; 90
155.332Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300081 CIFC Fe3P n m a5.08247; 6.7626; 4.52013
90; 90; 90
155.36Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300082 CIFC Fe3P n m a5.08223; 6.7638; 4.52058
90; 90; 90
155.396Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300083 CIFC Fe3P n m a5.08134; 6.7655; 4.52039
90; 90; 90
155.401Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300084 CIFC Fe3P n m a5.08071; 6.767; 4.52047
90; 90; 90
155.419Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300085 CIFC Fe3P n m a5.08104; 6.7689; 4.52139
90; 90; 90
155.504Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300086 CIFC Fe3P n m a5.08233; 6.7704; 4.52219
90; 90; 90
155.606Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300087 CIFC Fe3P n m a5.08326; 6.7732; 4.52326
90; 90; 90
155.736Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300088 CIFC Fe3P n m a5.08468; 6.7749; 4.52433
90; 90; 90
155.855Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300089 CIFC Fe3P n m a5.08644; 6.7772; 4.52559
90; 90; 90
156.005Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300090 CIFC Fe3P n m a5.08801; 6.7791; 4.52694
90; 90; 90
156.144Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300091 CIFC Fe3P n m a5.0899; 6.781; 4.52797
90; 90; 90
156.281Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John
Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction
Journal of Applied Crystallography, 2004, 37, 82-90
2300092 CIFAl Ca O5 TaP 1 21/n 16.6298; 8.9515; 7.3502
90; 113.792; 90
399.139Malcherek, Thomas; Borowski, Markus; Bosenick, Anne
Structure and phase transitions of CaTaOAlO~4~
Journal of Applied Crystallography, 2004, 37, 117-122
2300093 CIFC20 H30 Cl2 Fe N6 OP 1 21/c 110.8041; 21.6945; 11.395
90; 117.33; 90
2372.7Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp
The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation
Journal of Applied Crystallography, 2005, 38, 528-536
2300094 CIFC20 H30 Cl2 Fe N6 OP 1 21/c 110.7098; 21.5711; 11.356
90; 116.62; 90
2345.4Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp
The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation
Journal of Applied Crystallography, 2005, 38, 528-536
2300095 CIFC20 H30 Cl2 Fe N6 OP 1 21/c 110.9348; 21.9329; 11.484
90; 117.59; 90
2441Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp
The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation
Journal of Applied Crystallography, 2005, 38, 528-536
2300096 CIFC20 H30 Cl2 Fe N6 OP 1 21/c 110.7322; 21.5055; 11.323
90; 117.184; 90
2324.7Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp
The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation
Journal of Applied Crystallography, 2005, 38, 528-536
2300097 CIFC40 H60 Cl4 Fe2 N12 O2P 1 21/n 121.608; 21.6945; 11.395
90; 117.33; 90
4745Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp
The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation
Journal of Applied Crystallography, 2005, 38, 528-536
2300098 CIFC20 H30 Cl2 Fe N6 OP 1 21/c 110.949; 21.825; 11.37
90; 118.85; 90
2379.8Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp
The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation
Journal of Applied Crystallography, 2005, 38, 528-536
2300099 CIFK O8 W2 YbC 1 2/c 110.59; 10.29; 7.478
90; 130.7; 90
617.8M.C. Pujol; X. Mateos; R. Solé; J. Massons; Jna. Gavaldà; X. Solans; F. Diaz; M. Aguiló
Structure, crystal growth and physical anisotropy of KYb(WO~4~)~2~, a new laser matrix
Journal of Applied Crystallography, 2002, 35, 108-112
2300100 CIFC7 H9 NP 1 21/c 124.8727; 5.80729; 8.7615
90; 100.062; 90
1246.07Lefebvre, Jacques; Descamps, Marc; Hemon, Stephanie; Dzyabchenko, Alexander
Ab initio structure determination of meta-toluidine by powder X-ray diffraction
Journal of Applied Crystallography, 2004, 37, 464-471
2300101 CIFAl2 Eu0.136 O4 Sr0.864P 63 2 25.11635; 5.11635; 8.3673
90; 90; 120
189.687Chao-Nan, Xu; Wen-Sheng Shi
Observation of orientational disorder in the hexagonal stuffed tridymite Sr~0.864~Eu~0.136~Al~2~O~4~ by the maximum-entropy method
Journal of Applied Crystallography, 2004, 37, 698-702
2300102 CIFC18 H15 O3 PR -3 :H37.766; 37.766; 5.7286
90; 90; 120
7075.9Hernandez, Olivier; Hédoux, Alain; Lefebvre, Jacques; Guinet, Yannick; Descamps, Marc; Papoular, Robert; Masson, Olivier
<i>Ab</i> <i>initio</i> structure determination of triphenyl phosphite by powder synchrotron X-ray diffraction
Journal of Applied Crystallography, 2002, 35, 212-219
2300103 CIFC18 H22 Cu N8 O6 S2P 1 21/n 120.695; 8.054; 15.157
90; 112.09; 90
2340.9García-Cuesta, M. C.; Lozano, A. M.; Meléndez-Martínez, J. J.; Luna-Giles, F.; Ortiz, A. L.; González-Méndez, L. M.; Cumbrera, F. L.
Structure determination of nitrato-κ<i>O</i>-bis[2-(2-pyridyl-κ<i>N</i>)amino-5,6-dihydro-4<i>H</i>-1,3-thiazine-κ<i>N</i>]copper(II) nitrate <i>via</i> molecular modelling coupled with X-ray powder diffractometry
Journal of Applied Crystallography, 2004, 37, 993-999
2300110 CIF
Paper
?P 6/m m m30.960745; 30.960745; 7.519782
90; 90; 120
6242.5Foster, M. D.; Treacy, M. M. J.; Higgins, J. B.; Rivin, I.; Balkovsky, E.; Randall, K. H.
A systematic topological search for the framework of ZSM-10
Journal of Applied Crystallography, 2005, 38, 1028-1030
2300111 CIFIn2 Mn0.4 S4 Zn0.6R 3 m :H3.875218; 3.875218; 37.20846
90; 90; 120
483.91Ávila-Godoy, Rosario; Mora, Asiloé J.; Acosta-Najarro, Dwight R.; Delgado, Gerzon E.; López-Rivera, Santos A.; Fitch, Andrew N.; Mora, Andrés E.; Steeds, John W.
Structure of the quaternary alloy Zn~0.6~Mn~0.4~In~2~S~4~ from synchrotron powder diffraction and electron transmission microscopy
Journal of Applied Crystallography, 2006, 39, 1-5
2300112 CIF
Paper
O ZnP 63 m c3.2494; 3.2494; 5.2054
90; 90; 120
47.598Sowa, Heidrun; Ahsbahs, Hans
High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape
Journal of Applied Crystallography, 2006, 39, 169-175
2300113 CIF
Paper
O ZnP 63 m c3.2342; 3.2342; 5.1772
90; 90; 120
46.899Sowa, Heidrun; Ahsbahs, Hans
High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape
Journal of Applied Crystallography, 2006, 39, 169-175
2300114 CIF
Paper
O ZnP 63 m c3.219; 3.219; 5.1489
90; 90; 120
46.205Sowa, Heidrun; Ahsbahs, Hans
High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape
Journal of Applied Crystallography, 2006, 39, 169-175
2300115 CIF
Paper
O ZnP 63 m c3.2049; 3.2049; 5.1216
90; 90; 120
45.558Sowa, Heidrun; Ahsbahs, Hans
High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape
Journal of Applied Crystallography, 2006, 39, 169-175
2300116 CIF
Paper
O ZnP 63 m c3.195; 3.195; 5.1027
90; 90; 120
45.11Sowa, Heidrun; Ahsbahs, Hans
High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape
Journal of Applied Crystallography, 2006, 39, 169-175
2300117 CIF
Paper
K Lu O8 W2C 1 2/c 110.576; 10.214; 7.487
90; 130.68; 90
613.3Pujol, M. C.; Mateos, X.; Aznar, A.; Solans, X.; Suriñach, S.; Massons, J.; Díaz, F.; Aguiló, M.
Structural redetermination, thermal expansion and refractive indices of KLu(WO~4~)~2~
Journal of Applied Crystallography, 2006, 39, 230-236
2300118 CIF
Paper
C H5 Cl Mg2 O6R 3 c :H23.14422; 23.14422; 7.22333
90; 90; 120
3350.84Sugimoto, Kunihisa; Dinnebier, Robert E.; Schlecht, Thomas
Chlorartinite, a volcanic exhalation product also found in industrial magnesia screed
Journal of Applied Crystallography, 2006, 39, 739-744
2300119 CIF
Paper
?P 21 21 216.88; 11.91; 18.6
90; 90; 90
1524.1Immirzi, Attilio; Alfano, Davide; Tedesco, Consiglia
New solutions to the problems of chain orientation and chain continuity in structure analysis of fibrous polymers. A reconsideration of the structure of polyisobutene
Journal of Applied Crystallography, 2007, 40, 10-15
2300120 CIF
HKL
Paper
C24 H22 Fe2 N12 S8P -18.446; 9.123; 11.779
72.26; 80.94; 67.33
796.8Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric
Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches
Journal of Applied Crystallography, 2007, 40, 158-164
2300121 CIF
HKL
Paper
C24 H22 Fe2 N12 S8P -18.6103; 9.2628; 11.9305
72.903; 80.057; 66.911
834.84Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric
Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches
Journal of Applied Crystallography, 2007, 40, 158-164
2300122 CIF
HKL
Paper
C24 H22 Fe2 N12 S8P -18.727; 9.385; 12.041
73.04; 79.43; 66.6
863.1Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric
Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches
Journal of Applied Crystallography, 2007, 40, 158-164
2300123 CIF
HKL
Paper
C24 H22 Fe2 N12 S8P -18.581; 9.196; 11.948
73.34; 80.53; 67.24
831.4Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric
Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches
Journal of Applied Crystallography, 2007, 40, 158-164
2300124 CIF
HKL
Paper
C24 H22 Fe2 N12 S8P -18.642; 9.224; 12.05
73.63; 80.29; 67.25
848Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric
Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches
Journal of Applied Crystallography, 2007, 40, 158-164
2300125 CIF
HKL
C20 H17 F O3 SP 1 21/c 112.68581; 8.18939; 17.7934
90; 106.011; 90
1776.83Llinàs, Antonio; Box, Karl J.; Burley, Jonathan C.; Glen, Robert C.; Goodman, Jonathan M.
A new method for the reproducible generation of polymorphs: two forms of sulindac with very different solubilities
Journal of Applied Crystallography, 2007, 40, 379-381
2300126 CIF
HKL
Paper
C20 H14 N2 OI 41/a :221.5111; 21.5111; 13.2377
90; 90; 90
6125.4Zeng, He-Ping; Wang, Ting-Ting; Xu, Dan-Feng; Cai, Yue-Peng; Chen, Dong-Feng
Synthesis, crystal structure and biological activity of 2-[2-(quinolin-2-yl)vinyl]-8-hydroxyquinoline and 2-[2-(quinolin-4-yl)vinyl]-8-hydroxyquinoline
Journal of Applied Crystallography, 2007, 40, 471-475
2300127 CIF
HKL
Paper
C20 H14 N2 OP 1 21/n 110.724; 8.9019; 16.1894
90; 102.039; 90
1511.51Zeng, He-Ping; Wang, Ting-Ting; Xu, Dan-Feng; Cai, Yue-Peng; Chen, Dong-Feng
Synthesis, crystal structure and biological activity of 2-[2-(quinolin-2-yl)vinyl]-8-hydroxyquinoline and 2-[2-(quinolin-4-yl)vinyl]-8-hydroxyquinoline
Journal of Applied Crystallography, 2007, 40, 471-475
2300128 CIF
Paper
Mg O4 SC m c m5.174713; 7.87563; 6.49517
90; 90; 90
264.705Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S.
Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction
Journal of Applied Crystallography, 2007, 40, 761-770
2300129 CIF
Paper
Mg O4 SC m c m5.168629; 7.86781; 6.46674
90; 90; 90
262.975Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S.
Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction
Journal of Applied Crystallography, 2007, 40, 761-770
2300130 CIF
Paper
Mg O4 SP b n m4.74599; 8.5831; 6.70934
90; 90; 90
273.307Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S.
Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction
Journal of Applied Crystallography, 2007, 40, 761-770
2300131 CIF
Paper
Mg O4 SP b n m4.73431; 8.58171; 6.67266
90; 90; 90
271.1Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S.
Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction
Journal of Applied Crystallography, 2007, 40, 761-770
2300132 CIF
Paper
C40 H48 O8P 41 21 26.8558; 6.8558; 16.9375
90; 90; 90
796.096Brunelli, Michela; Neumann, Marcus A.; Fitch, Andrew N.; Mora, Asiloé J.
Temperature phase changes in solid bicyclo[3.3.1]nonane-2,6-dione and bicyclo[3.3.1]nonane-3,7-dione from powder X-ray diffraction data
Journal of Applied Crystallography, 2007, 40, 702-709
2300133 CIF
Paper
C34 H48 O8C 1 2/c 17.3803; 10.382; 9.7508
90; 95.359; 90
743.863Brunelli, Michela; Neumann, Marcus A.; Fitch, Andrew N.; Mora, Asiloé J.
Temperature phase changes in solid bicyclo[3.3.1]nonane-2,6-dione and bicyclo[3.3.1]nonane-3,7-dione from powder X-ray diffraction data
Journal of Applied Crystallography, 2007, 40, 702-709
2300134 CIF
Paper
?P -3 m 15.7523; 5.7523; 7.0634
90; 90; 120
202.408Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300135 CIF?P m -3 m4.07307; 4.07307; 4.07307
90; 90; 90
67.572Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300136 CIF?P -3 m 15.7657; 5.7657; 7.0444
90; 90; 120
202.81Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300137 CIF?P m -3 m4.07013; 4.07013; 4.07013
90; 90; 90
67.426Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300138 CIF?P -3 m 15.7532; 5.7532; 7.0641
90; 90; 120
202.491Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300139 CIF?P m -3 m4.07348; 4.07348; 4.07348
90; 90; 90
67.592Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300140 CIF?P -3 m 15.7675; 5.7675; 7.0567
90; 90; 120
203.29Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300141 CIF?P m -3 m4.0712; 4.0712; 4.0712
90; 90; 90
67.479Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300142 CIF?P -3 m 15.7893; 5.7893; 7.1158
90; 90; 120
206.54Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300143 CIF?P m -3 m4.07045; 4.07045; 4.07045
90; 90; 90
67.442Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300144 CIF?P -3 m 15.7665; 5.7665; 7.058
90; 90; 120
203.25Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300145 CIF?P m -3 m4.093113; 4.093113; 4.093113
90; 90; 90
68.5743Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300146 CIF?P m -3 m4.09518; 4.09518; 4.09518
90; 90; 90
68.678Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300147 CIF?P m -3 m4.07207; 4.07207; 4.07207
90; 90; 90
67.5221Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300148 CIF?P -3 m 15.74601; 5.74601; 7.06047
90; 90; 120
201.882Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300149 CIF?P -3 m 15.762; 5.762; 7.0764
90; 90; 120
203.46Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300150 CIF?P -3 m 15.7645; 5.7645; 7.092
90; 90; 120
204.09Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300151 CIF?P m -3 m4.06541; 4.06541; 4.06541
90; 90; 90
67.1913Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300152 CIF?P m -3 m4.06857; 4.06857; 4.06857
90; 90; 90
67.348Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300153 CIF?P m -3 m4.07191; 4.07191; 4.07191
90; 90; 90
67.514Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300154 CIF?P -3 m 15.7654; 5.7654; 7.091
90; 90; 120
204.13Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300155 CIF?P -3 m 15.74666; 5.74666; 7.05943
90; 90; 120
201.898Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300156 CIF?P -3 m 15.7462; 5.7462; 7.05894
90; 90; 120
201.851Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300158 CIF?P m -3 m4.06839634; 4.06839634; 4.06839634
90; 90; 90
67.339Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300159 CIF?P m -3 m4.066; 4.066; 4.066
90; 90; 90
67.2206Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300160 CIF?P -3 m 15.7981; 5.7981; 11.7947
90; 90; 120
343.39Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R.
A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~
Journal of Applied Crystallography, 2007, 40, 749-755
2300161 CIF
Paper
Mn O3 YP 63 c m6.22215; 6.22215; 11.37072
90; 90; 120
381.241Jeong, Il-Kyoung; Hur, N.; Proffen, Th.
High-temperature structural evolution of hexagonal multiferroic YMnO~3~ and YbMnO~3~
Journal of Applied Crystallography, 2007, 40, 730-734
2300162 CIF
Paper
Mn O3 YP 63/m m c3.63011; 3.63011; 11.3535
90; 90; 120
129.569Jeong, Il-Kyoung; Hur, N.; Proffen, Th.
High-temperature structural evolution of hexagonal multiferroic YMnO~3~ and YbMnO~3~
Journal of Applied Crystallography, 2007, 40, 730-734
2300163 CIF
Paper
Mn O3 YbP 63 c m6.132019; 6.132019; 11.38556
90; 90; 120
370.759Jeong, Il-Kyoung; Hur, N.; Proffen, Th.
High-temperature structural evolution of hexagonal multiferroic YMnO~3~ and YbMnO~3~
Journal of Applied Crystallography, 2007, 40, 730-734
2300164 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.1545; 19.0923; 15.0033
90; 91.566; 90
2907.64Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300165 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.1834; 19.072; 15.0304
90; 91.467; 90
2918.21Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300166 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.1952; 19.0901; 15.0429
90; 91.451; 90
2926.8Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300167 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.2122; 19.1179; 15.0573
90; 91.42; 90
2938.82Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300168 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.2327; 19.1464; 15.0753
90; 91.402; 90
2952.7Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300169 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.2747; 19.2019; 15.1011
90; 91.399; 90
2978.46Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300170 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.3663; 19.2603; 15.1373
90; 91.432; 90
3021.34Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300171 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.4678; 19.3228; 15.1695
90; 91.501; 90
3067.2Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300172 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.529; 19.3683; 15.1933
90; 91.541; 90
3097.2Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300173 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.5677; 19.4022; 15.2137
90; 91.564; 90
3118.2Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300174 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.6005; 19.4289; 15.2382
90; 91.595; 90
3137.2Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300175 CIFC27 H33 Cl2 Fe N7 O8P 1 21/c 110.6286; 19.4535; 15.2589
90; 91.626; 90
3153.7Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300176 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.3736; 19.1884; 15.1122
90; 91.885; 90
3006.5Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300177 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.4189; 19.2284; 15.1216
90; 91.726; 90
3028.07Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300178 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.4611; 19.2701; 15.132
90; 91.596; 90
3049.22Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300179 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.507; 19.3169; 15.1467
90; 91.492; 90
3073.2Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300180 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.5321; 19.3391; 15.1543
90; 91.468; 90
3085.63Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300181 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.5561; 19.3641; 15.1621
90; 91.441; 90
3098.3Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300182 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.5813; 19.3933; 15.1756
90; 91.429; 90
3113.16Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300183 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.625; 19.456; 15.22
90; 91.5; 90
3145.2Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300184 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.6308; 19.4519; 15.213
90; 91.451; 90
3144.9Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300185 CIFC27 H33 Cl2 N7 O8 ZnP 1 21/c 110.6541; 19.4812; 15.2306
90; 91.478; 90
3160.1Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp
Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data
Journal of Applied Crystallography, 2007, 40, 1135-1145
2300186 CIF
HKL
Paper
C26 H16 Fe N6 S2P b c n13.1928; 9.9503; 17.1498
90; 90; 90
2251.29Legrand, Vincent; Pillet, Sébastien; Weber, Hans-Peter; Souhassou, Mohamed; Létard, Jean-François; Guionneau, Philippe; Lecomte, Claude
On the precision and accuracy of structural analysis of light-induced metastable states
Journal of Applied Crystallography, 2007, 40, 1076-1088
2300187 CIF
HKL
C26 H16 Fe N6 S2P b c n13.185; 9.948; 17.135
90; 90; 90
2247.5Legrand, Vincent; Pillet, Sébastien; Weber, Hans-Peter; Souhassou, Mohamed; Létard, Jean-François; Guionneau, Philippe; Lecomte, Claude
On the precision and accuracy of structural analysis of light-induced metastable states
Journal of Applied Crystallography, 2007, 40, 1076-1088
2300188 CIF
HKL
C26 H16 Fe N6 S2P b c n12.762; 10.024; 17.09
90; 90; 90
2186.3Legrand, Vincent; Pillet, Sébastien; Weber, Hans-Peter; Souhassou, Mohamed; Létard, Jean-François; Guionneau, Philippe; Lecomte, Claude
On the precision and accuracy of structural analysis of light-induced metastable states
Journal of Applied Crystallography, 2007, 40, 1076-1088
2300189 CIFAl2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35C 1 2/m 15.189; 8.953; 10.129
90; 101.11; 90
461.796Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon
Structural characterization of the clay mineral illite-1M
Journal of Applied Crystallography, 2008, 41, 402-415
2300190 CIFAl2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35C 1 2/m 15.197; 8.961; 10.159
90; 100.97; 90
464.5Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon
Structural characterization of the clay mineral illite-1M
Journal of Applied Crystallography, 2008, 41, 402-415
2300191 CIFAl2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35C 1 2/m 15.1977; 9.014; 9.99
90; 100.95; 90
459.5Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon
Structural characterization of the clay mineral illite-1M
Journal of Applied Crystallography, 2008, 41, 402-415
2300192 CIFAl2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35C 1 2/m 15.167; 8.983; 10.01
90; 100.5; 90
456.8Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon
Structural characterization of the clay mineral illite-1M
Journal of Applied Crystallography, 2008, 41, 402-415
2300193 CIF
Paper
C50 H64 O16I 1 2 121.1388; 9.1628; 24.5916
90; 98.1462; 90
4715.1Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto
<i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method
Journal of Applied Crystallography, 2008, 41, 292-301
2300194 CIF
Paper
C50 H64 O16I 1 2 121.0262; 9.1138; 24.3796
90; 98.3396; 90
4622.43Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto
<i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method
Journal of Applied Crystallography, 2008, 41, 292-301
2300195 CIF
Paper
C50 H64 O16I 1 2 120.9107; 9.0536; 24.2008
90; 98.9412; 90
4525.95Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto
<i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method
Journal of Applied Crystallography, 2008, 41, 292-301
2300196 CIF
HKL
Paper
Na O8 W2 Y0.95 Yb0.05I 41/a :25.2039; 5.2039; 11.2838
90; 90; 90
305.57Fan, Jiandong; Zhang, Huaijin; Yu, Wentao; Yu, Haohai; Wang, Jiyang; Jiang, Minhua
A Yb^3+^-doped NaY(WO~4~)~2~ crystal grown by the Czochralski technique
Journal of Applied Crystallography, 2008, 41, 584-591
2300197 CIF
HKL
Paper
F7 K2 TaP n m a10.0731; 5.9456; 12.1527
90; 90; 90
727.83Smrčok, Ľubomír; Brunelli, Michela; Boča, Miroslav; Kucharík, Marian
Structure of K~2~TaF~7~ at 993K: the combined use of synchrotron powder data and solid-state DFT calculations
Journal of Applied Crystallography, 2008, 41, 634-636
2300198 CIF
Paper
?P -16.217; 6.985; 10.506
94.686; 100.568; 98.884
440.26Morgenroth, Wolfgang; Overgaard, Jacob; Clausen, Henrik F.; Svendsen, Helle; Jørgensen, Mads R. V.; Larsen, Finn K.; Iversen, Bo B.
Helium cryostat synchrotron charge densities determined using a large CCD detector ‒ the upgraded beamline D3 at DESY
Journal of Applied Crystallography, 2008, 41, 846-853
2300199 CIFFe0.2 Mg0.8 OF m -3 m4.19971; 4.19971; 4.19971
90; 90; 90
74.073Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A.
Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures
Journal of Applied Crystallography, 2008, 41, 886-896
2300200 CIFFeI m -3 m2.8403; 2.84034; 2.84034
90; 90; 90
22.914Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A.
Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures
Journal of Applied Crystallography, 2008, 41, 886-896
2300201 CIFFe0.3 Mg0.7 OF m -3 m4.1896; 4.18955; 4.18955
90; 90; 90
73.537Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A.
Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures
Journal of Applied Crystallography, 2008, 41, 886-896
2300202 CIFFeI m -3 m2.8274; 2.8274; 2.8274
90; 90; 90
22.603Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A.
Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures
Journal of Applied Crystallography, 2008, 41, 886-896
2300203 CIFO2 ZrP 1 21/c 15.213; 4.967; 5.318
90; 100.16; 90
135.5Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A.
Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures
Journal of Applied Crystallography, 2008, 41, 886-896
2300204 CIF
Paper
C7 H6 Cl N3 O4 S2P 14.8481; 6.359; 8.9
74.49; 83.9; 80.53
260.22Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K.
A differential thermal expansion approach to crystal structure determination from powder diffraction data
Journal of Applied Crystallography, 2008, 41, 1089-1094
2300205 CIF
Paper
C7 H6 Cl N3 O4 S2P 14.8619; 6.377; 8.926
74.4; 83.93; 80.56
262.39Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K.
A differential thermal expansion approach to crystal structure determination from powder diffraction data
Journal of Applied Crystallography, 2008, 41, 1089-1094
2300206 CIF
Paper
C7 H6 Cl N3 O4 S2P 14.8707; 6.3951; 8.9448
74.368; 83.786; 80.459
264.01Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K.
A differential thermal expansion approach to crystal structure determination from powder diffraction data
Journal of Applied Crystallography, 2008, 41, 1089-1094
2300207 CIF
Paper
C7 H6 Cl N3 O4 S2P 14.8737; 6.4046; 8.9548
74.324; 83.751; 80.449
264.79Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K.
A differential thermal expansion approach to crystal structure determination from powder diffraction data
Journal of Applied Crystallography, 2008, 41, 1089-1094
2300208 CIF
Paper
C7 H6 Cl N3 O4 S2P 14.8786; 6.4126; 8.9665
74.266; 83.693; 80.445
265.63Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K.
A differential thermal expansion approach to crystal structure determination from powder diffraction data
Journal of Applied Crystallography, 2008, 41, 1089-1094
2300209 CIF
Paper
C46 H42 Fe O12P 1 21 15.857; 24.105; 14.069
90; 93.15; 90
1983.3Okabe, Takashi; Nakazaki, Keisuke; Igaue, Tsuyoshi; Nakamura, Naotake; Donnio, Bertrand; Guillon, Daniel; Gallani, Jean-Louis
Synthesis and physical properties of ferrocene derivatives. XXI. Crystal structure of a liquid crystalline ferrocene derivative, 1,1'-bis[3-[4-(4-methoxyphenoxycarbonyl)phenoxy]propyloxycarbonyl]ferrocene
Journal of Applied Crystallography, 2009, 42, 63-68
2300210 CIF
HKL
Paper
C2 H2 Ca O5P 1 21/c 16.316; 14.541; 10.116
90; 109; 90
878.4Daudon, Michel; Bazin, Dominique; André, Gilles; Jungers, Paul; Cousson, Alain; Chevallier, Pierre; Véron, Emmanuel; Matzen, Guy
Examination of whewellite kidney stones by scanning electron microscopy and powder neutron diffraction techniques
Journal of Applied Crystallography, 2009, 42, 109-115
2300211 CIF
Paper
Lu2 O5 SiI 1 2/a 110.255; 6.6465; 12.3626
90; 102.422; 90
822.91Cong, Hengjiang; Zhang, Huaijin; Wang, Jiyang; Yu, Wentao; Fan, Jiandong; Cheng, Xiufeng; Sun, Shangqian; Zhang, Jian; Lu, Qingming; Jiang, Chunjian; Boughton, Robert I.
Structural and thermal properties of the monoclinic Lu~2~SiO~5~ single crystal: evaluation as a new laser matrix
Journal of Applied Crystallography, 2009, 42, 284-294
2300212 CIF
Paper
C13 H18 O2P 1 21/c 114.6696; 7.889; 10.7287
90; 99.427; 90
1224.85Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300213 CIF
Paper
C13 H18 O2P 1 21/c 114.6712; 7.8893; 10.7288
90; 99.428; 90
1225.05Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300214 CIF
Paper
C13 H18 O2P 1 21/c 114.6662; 7.8879; 10.7275
90; 99.432; 90
1224.23Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300215 CIF
Paper
C13 H18 O2P 1 21/c 114.6689; 7.8884; 10.728
90; 99.429; 90
1224.61Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300216 CIF
Paper
C13 H18 O2P 1 21/c 114.6682; 7.8889; 10.7276
90; 99.437; 90
1224.55Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300217 CIF
Paper
C13 H18 O2P 1 21/c 114.6636; 7.8871; 10.7244
90; 99.417; 90
1223.6Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300218 CIF
Paper
C13 H18 O2P 1 21/c 114.6703; 7.889; 10.7282
90; 99.429; 90
1224.84Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300219 CIF
Paper
C13 H18 O2P 1 21/c 114.6698; 7.8878; 10.7265
90; 99.432; 90
1224.41Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300220 CIF
Paper
C13 H18 O2P 1 21/c 114.499; 7.7576; 10.6203
90; 99.741; 90
1177.3Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300221 CIF
Paper
C13 H18 O2P 1 21/c 114.6706; 7.8885; 10.7284
90; 99.426; 90
1224.81Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300222 CIF
Paper
C13 H18 O2P 1 21/c 114.6655; 7.8817; 10.724
90; 99.427; 90
1222.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300223 CIF
Paper
C13 H18 O2P 1 21/c 114.494; 7.7528; 10.6655
90; 99.875; 90
1180.7Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300224 CIF
Paper
C13 H18 O2P 1 21/c 114.673; 7.8892; 10.7316
90; 99.436; 90
1225.45Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300225 CIF
Paper
C13 H18 O2P 1 21/c 114.669; 7.8804; 10.7272
90; 99.439; 90
1223.3Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300226 CIF
Paper
C13 H18 O2P 1 21/c 114.528; 7.7695; 10.691
90; 99.89; 90
1188.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300227 CIF
Paper
C13 H18 O2P 1 21/c 114.67; 7.8886; 10.7304
90; 99.43; 90
1225Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300228 CIF
Paper
C13 H18 O2P 1 21/c 114.683; 7.86; 10.729
90; 99.456; 90
1221.4Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300229 CIF
Paper
C8 H9 N O2P 1 21/a 112.88606; 9.38115; 7.10099
90; 115.701; 90
773.484Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300230 CIF
Paper
C8 H9 N O2P 1 21/a 112.88559; 9.38013; 7.10096
90; 115.7; 90
773.38Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300231 CIF
Paper
C8 H9 N O2P 1 21/a 112.8865; 9.3822; 7.10147
90; 115.702; 90
773.65Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300232 CIF
Paper
C8 H9 N O2P 1 21/a 112.89; 9.38466; 7.10325
90; 115.702; 90
774.26Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300233 CIF
Paper
C8 H9 N O2P 1 21/a 112.8863; 9.38162; 7.10158
90; 115.701; 90
773.61Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300234 CIF
Paper
C8 H9 N O2P 1 21/a 112.8871; 9.3824; 7.1018
90; 115.703; 90
773.73Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300235 CIF
Paper
C8 H9 N O2P 1 21/a 112.8905; 9.38488; 7.10342
90; 115.701; 90
774.32Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300236 CIF
Paper
C8 H9 N O2P 1 21/a 112.887; 9.3819; 7.1015
90; 115.701; 90
773.66Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300237 CIF
Paper
C8 H9 N O2P 1 21/a 112.8858; 9.3812; 7.1013
90; 115.703; 90
773.5Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300238 CIF
Paper
C8 H9 N O2P 1 21/a 112.889; 9.38347; 7.10271
90; 115.702; 90
774.04Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300239 CIF
Paper
C8 H9 N O2P 1 21/a 112.8856; 9.3812; 7.10114
90; 115.697; 90
773.5Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300240 CIF
Paper
C8 H9 N O2P 1 21/a 112.8844; 9.3824; 7.1025
90; 115.709; 90
773.6Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300241 CIF
Paper
C8 H9 N O2P 1 21/a 112.8887; 9.384; 7.1025
90; 115.702; 90
774.05Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300242 CIF
Paper
C8 H9 N O2P 1 21/a 112.8869; 9.3833; 7.1022
90; 115.706; 90
773.82Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300243 CIF
Paper
C8 H9 N O2P 1 21/a 112.656; 9.564; 7.236
90; 117.1; 90
779.7Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300244 CIF
Paper
C8 H9 N O2P 1 21/a 112.885; 9.3862; 7.1008
90; 115.714; 90
773.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300245 CIF
Paper
C8 H9 N O2P 1 21/a 112.864; 9.354; 7.104
90; 115.83; 90
769.4Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300246 CIFCo Li O4 PP n m a10.202; 5.918; 4.709
90; 90; 90
284.3Kimura, Tsunehisa; Chang, Chengkang; Kimura, Fumiko; Maeyama, Masataka
The pseudo-single-crystal method: a third approach to crystal structure determination
Journal of Applied Crystallography, 2009, 42, 535-537
2300247 CIFDP 1 21/n 17.78366; 6.72568; 6.07443
90; 102.104; 90
310.929Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300248 CIFDP b c a18.8679; 6.94772; 6.85885
90; 90; 90
899.12Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300249 CIFD2 OR -3 :H12.87078; 12.87078; 6.1827
90; 90; 120
886.99Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300250 CIFAlF m -3 m4.03702; 4.03702; 4.03702
90; 90; 90
65.793Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300251 CIFD2 OP 41 21 26.6748; 6.67484; 6.6838
90; 90; 90
297.78Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300252 CIFC WP -6 m 22.9016; 2.90156; 2.83867
90; 90; 120
20.697Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300253 CIFDP n c n12.5626; 6.6513; 6.3788
90; 90; 90
533Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300254 CIFD2 OR -3 :H12.8396; 12.8396; 6.1628
90; 90; 120
879.86Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300255 CIFD10 O5P 42/n m c :26.186; 6.186; 5.7157
90; 90; 90
218.72Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300256 CIFPbF m -3 m4.9108; 4.91075; 4.91075
90; 90; 90
118.426Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300257 CIFDI -4 2 d8.15; 8.15; 4
90; 90; 90
265.69Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300258 CIFCa H4 O6 SC 1 2/c 16.28689; 15.2131; 6.52996
90; 127.43; 90
495.95Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum
Journal of Applied Crystallography, 2009, 42, 1176-1188
2300259 CIFCa H4 O6 SI 1 2/c 15.68021; 15.2139; 6.53032
90; 118.484; 90
496.03Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum
Journal of Applied Crystallography, 2009, 42, 1176-1188
2300260 CIFC D7 N OP b c a11.0232; 7.66076; 7.59127
90; 90; 90
641.053Fortes, A. D.; Wood, I. G.; Knight, K. S.
The crystal structure of perdeuterated methanol monoammoniate (CD~3~OD·ND~3~) determined from neutron powder diffraction data at 4.2 and 180K
Journal of Applied Crystallography, 2009, 42, 1054-1061
2300261 CIFC D7 N OP b c a11.21169; 7.74663; 7.68077
90; 90; 90
667.096Fortes, A. D.; Wood, I. G.; Knight, K. S.
The crystal structure of perdeuterated methanol monoammoniate (CD~3~OD·ND~3~) determined from neutron powder diffraction data at 4.2 and 180K
Journal of Applied Crystallography, 2009, 42, 1054-1061
2300262 CIF
HKL
Paper
C17 H30 F N3 O9P -19.507; 9.9649; 11.0233
94.182; 100.118; 91.432
1024.57Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A.
Towards extracting the charge density from normal-resolution data
Journal of Applied Crystallography, 2009, 42, 1110-1121
2300263 CIF
Paper
C17 H21.8 Cl F N3 O4.4P 1 21/c 112.872; 19.576; 6.948
90; 90.55; 90
1750.7Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A.
Towards extracting the charge density from normal-resolution data
Journal of Applied Crystallography, 2009, 42, 1110-1121
2300264 CIFC12 H22 O11P 1 21 17.7735; 8.7169; 10.8765
90; 102.936; 90
718.3Kimura, Fumiko; Kimura, Tsunehisa; Oshima, Wataru; Maeyama, Masataka; Aburaya, Kazuaki
X-ray diffraction study of a pseudo single crystal prepared from a crystal belonging to point group 2
Journal of Applied Crystallography, 2010, 43, 151-153
2300265 CIF
Paper
C15 H14 Br N5 O2P -111.479; 14.738; 4.476
93.65; 94.16; 93.71
751.9Lasocha, W.; Gaweł, B.; Rafalska-Lasocha, A.; Pawłowski, M.; Talik, P.; Paszkowicz, W.
Crystal structure study of selected xanthine derivatives
Journal of Applied Crystallography, 2010, 43, 163-167
2300266 CIFC D7 N OP b c a11.0386; 7.65471; 7.58467
90; 90; 90
640.88Fortes, A. D.; Wood, I. G.; Knight, K. S.
The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K
Journal of Applied Crystallography, 2010, 43, 328-336
2300267 CIFC2 D11 N O2P n 21 a12.70615; 8.84589; 4.73876
90; 90; 90
532.623Fortes, A. D.; Wood, I. G.; Knight, K. S.
The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K
Journal of Applied Crystallography, 2010, 43, 328-336
2300268 CIFC D7 N OP b c a11.20962; 7.74564; 7.6781
90; 90; 90
666.66Fortes, A. D.; Wood, I. G.; Knight, K. S.
The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K
Journal of Applied Crystallography, 2010, 43, 328-336
2300269 CIFC2 D11 N O2P n 21 a12.90413; 8.96975; 4.79198
90; 90; 90
554.656Fortes, A. D.; Wood, I. G.; Knight, K. S.
The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K
Journal of Applied Crystallography, 2010, 43, 328-336
2300270 CIFC10 H13 N O3P 1 21/n 113.00247; 6.86966; 11.51889
90; 108.329; 90
976.695Pagola, Silvina; Stephens, Peter W.
<i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data
Journal of Applied Crystallography, 2010, 43, 370-376
2300271 CIFC8 H10 O2P 1 21/n 19.8417; 15.4813; 4.8422
90; 101.258; 90
723.57Pagola, Silvina; Stephens, Peter W.
<i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data
Journal of Applied Crystallography, 2010, 43, 370-376
2300272 CIFC2 H4 N4 SP 1 21/a 19.849; 12.3828; 3.99952
90; 102.126; 90
476.891Pagola, Silvina; Stephens, Peter W.
<i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data
Journal of Applied Crystallography, 2010, 43, 370-376
2300273 CIF
Paper
Ca5 H O13 P3P 63/m9.421; 9.421; 6.88
90; 90; 120
528.826Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan
Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing
Journal of Applied Crystallography, 2010, 43, 320-327
2300274 CIF
Paper
?P 63/m9.417; 9.417; 6.867
90; 90; 120
527.38Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan
Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing
Journal of Applied Crystallography, 2010, 43, 320-327
2300275 CIF
Paper
?P 63/m9.4039; 9.4039; 6.8526
90; 90; 120
524.81Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan
Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing
Journal of Applied Crystallography, 2010, 43, 320-327
2300276 CIF
Paper
?P 63/m9.4109; 9.4109; 6.8456
90; 90; 120
525.05Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan
Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing
Journal of Applied Crystallography, 2010, 43, 320-327
2300277 CIF
Paper
?P 63/m9.4072; 9.4072; 6.84
90; 90; 120
524.21Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan
Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing
Journal of Applied Crystallography, 2010, 43, 320-327
2300278 CIF
Paper
La O4 VP 1 21/n 17.0492; 7.2827; 6.725
90; 104.901; 90
333.63Cong, Hengjiang; Zhang, Huaijin; Sun, Shangqian; Yu, Yonggui; Yu, Wentao; Yu, Haohai; Zhang, Jian; Wang, Jiyang; Boughton, Robert I.
Morphological study of Czochralski-grown lanthanide orthovanadate single crystals and implications on the mechanism of bulk spiral formation
Journal of Applied Crystallography, 2010, 43, 308-319
2300279 CIFCo0.15 Cr0.42 Mn0.19 OF d -3 m :28.3777; 8.3777; 8.3777
90; 90; 90
588Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K.
Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature
Journal of Applied Crystallography, 2010, 43, 394-400
2300280 CIFCo0.43 Mn0.32 OF d -3 m :28.2685; 8.2685; 8.2685
90; 90; 90
565.3Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K.
Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature
Journal of Applied Crystallography, 2010, 43, 394-400
2300281 CIFCo0.23 Mn0.52 OI 41/a m d :25.7184; 5.7184; 9.2079
90; 90; 90
301.1Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K.
Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature
Journal of Applied Crystallography, 2010, 43, 394-400
2300282 CIFCo0.33 Mn0.42 OF d -3 m :28.3015; 8.3015; 8.3015
90; 90; 90
572.1Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K.
Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature
Journal of Applied Crystallography, 2010, 43, 394-400
2300283 CIF
Paper
F2 O TiR -3 c :H5.3325; 5.3325; 13.2321
90; 90; 120
325.853Shian, Samuel; Sandhage, Kenneth H.
Hexagonal and cubic TiOF~2~
Journal of Applied Crystallography, 2010, 43, 757-761
2300284 CIF
Paper
Ni0.9 O Zn0.1F m -3 m4.18564; 4.18564; 4.18564
90; 90; 90
73.3307Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300285 CIF
Paper
Ni0.9 O Zn0.1F m -3 m4.18419; 4.18419; 4.18419
90; 90; 90
73.2545Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300286 CIF
Paper
Ni0.9 O Zn0.1F m -3 m4.18455; 4.18455; 4.18455
90; 90; 90
73.2734Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300287 CIF
Paper
Ni0.9 O Zn0.1F m -3 m4.188219; 4.188219; 4.188219
90; 90; 90
73.4663Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300288 CIF
Paper
Ni0.9 O Zn0.1F m -3 m4.188195; 4.188195; 4.188195
90; 90; 90
73.465Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300289 CIF
Paper
Fe2 Ni O4F d -3 m :28.35966; 8.35966; 8.35966
90; 90; 90
584.206Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300290 CIF
Paper
Ni0.9 O Zn0.1R -3 m :H2.95403; 2.95403; 7.2801
90; 90; 120
55.017Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300291 CIF
Paper
Ni0.9 O Zn0.1R -3 m :H2.95557; 2.95557; 7.2626
90; 90; 120
54.942Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300292 CIF
Paper
Ni0.9 O Zn0.1R -3 m :H2.95546; 2.95546; 7.2665
90; 90; 120
54.968Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300293 CIF
Paper
Ni0.9 O Zn0.1R -3 m :H2.96064; 2.96064; 7.2592
90; 90; 120
55.105Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300294 CIF
Paper
Ni0.9 O Zn0.1R -3 m :H2.9607; 2.9607; 7.25817
90; 90; 120
55.0994Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300295 CIF
Paper
Fe2 Ni O4F d -3 m :28.35966; 8.35966; 8.35966
90; 90; 90
584.206Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo
Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O
Journal of Applied Crystallography, 2010, 43, 699-709
2300296 CIF
Paper
O2 ZrP 1 21/c 15.1477; 5.2096; 5.3164
90; 99.215; 90
140.732Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B.
Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles
Journal of Applied Crystallography, 2010, 43, 1092-1099
2300297 CIF
Paper
O1.985 Y0.03 Zr0.97P 42/n m c S3.6244; 3.6244; 5.156
90; 90; 90
67.731Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B.
Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles
Journal of Applied Crystallography, 2010, 43, 1092-1099
2300298 CIF
Paper
O1.985 Y0.03 Zr0.97P 42/n m c S3.6132; 3.6132; 5.1649
90; 90; 90
67.429Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B.
Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles
Journal of Applied Crystallography, 2010, 43, 1092-1099
2300299 CIF
Paper
Sb10 Te3R -3 m :H4.289; 4.289; 75.51
90; 90; 120
1202.9Schneider, Matthias N.; Seibald, Markus; Lagally, Patrick; Oeckler, Oliver
Ambiguities in the structure determination of antimony tellurides arising from almost homometric structure models and stacking disorder
Journal of Applied Crystallography, 2010, 43, 1012-1020
2300300 CIFPb0.18 Sb7.82 Te3R -3 m :H4.2874; 4.2874; 64.3
90; 90; 120
1023.6Schneider, Matthias N.; Seibald, Markus; Lagally, Patrick; Oeckler, Oliver
Ambiguities in the structure determination of antimony tellurides arising from almost homometric structure models and stacking disorder
Journal of Applied Crystallography, 2010, 43, 1012-1020
2300301 CIFC6 H6 Cl N O6P 1 21/c 15.5046; 13.574; 17.423
90; 137.919; 90
872.5Ye, Heng-Yun; Cai, Hong-Ling; Ge, Jia-Zeng; Xiong, Ren-Gen
Reversible structural phase transition of pyridinium-4-carboxylic acid perchlorate
Journal of Applied Crystallography, 2010, 43, 1031-1035
2300302 CIFC6 H6 Cl N O6P 1 21/c 117.356; 13.241; 16.161
90; 138.055; 90
2482.5Ye, Heng-Yun; Cai, Hong-Ling; Ge, Jia-Zeng; Xiong, Ren-Gen
Reversible structural phase transition of pyridinium-4-carboxylic acid perchlorate
Journal of Applied Crystallography, 2010, 43, 1031-1035
2300303 CIF
Paper
C6 H6 N2 O2P c a 2118.7169; 6.5215; 5.0014
90; 90; 90
610.48Probert, Michael R.; Robertson, Craig M.; Coome, Jonathan A.; Howard, Judith A. K.; Michell, Brian C.; Goeta, Andrés E.
The XIPHOS diffraction facility for extreme sample conditions
Journal of Applied Crystallography, 2010, 43, 1415-1418
2300304 CIF
Paper
C14 H14 O2 SP -14.736; 10.819; 12.206
89.727; 78.904; 89.977
613.7Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300305 CIF
Paper
C14 H14 O2 SC 1 2/c 124.003; 4.7435; 10.8255
90; 90.185; 90
1232.6Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300306 CIF
Paper
C14 H14 O2 SC 1 2/c 124.012; 4.7429; 10.8321
90; 90.197; 90
1233.6Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300307 CIF
Paper
C14 H11 F N2 SP 1 21/c 110.1; 11.365; 11.3
90; 97.464; 90
1286.1Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300309 CIF
Paper
C14 H11 F N2 SP 1 21/c 110.1414; 11.3865; 11.3289
90; 97.4; 90
1297.31Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300310 CIF
Paper
C14 H11 F N2 SP 1 21/c 110.1385; 11.3898; 11.3325
90; 97.467; 90
1297.5Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300311 CIF
Paper
C14 H11 F N2 SP 1 21/c 110.1375; 11.3871; 11.3412
90; 97.482; 90
1298Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300312 CIF
Paper
C14 H11 F N2 SP 1 21/c 110.137; 11.413; 11.345
90; 97.465; 90
1301.4Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300313 CIF
Paper
C17 H20 Cl2 N2 PdP 1 21/c 19.356; 9.9295; 19.357
90; 90.47; 90
1798.2Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300314 CIF
Paper
C17 H20 Cl2 N2 PdP 1 21/c 19.356; 9.9295; 19.357
90; 90.47; 90
1798.2Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300315 CIF
Paper
C16 H18 Cl2 N2 PdP -18.5305; 9.6211; 10.988
72.593; 78.78; 83.039
842.2Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300316 CIF
Paper
C16 H18 Cl2 N2 PdP -18.5305; 9.6211; 10.988
72.593; 78.78; 83.039
842.2Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300317 CIF
Paper
C13 H10 O SP 1 21/n 18.007; 16.958; 8.031
90; 95.097; 90
1086.2Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300318 CIF
Paper
C13 H10 O SP 1 21/n 18.007; 16.958; 8.031
90; 95.097; 90
1086.2Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300319 CIF
Paper
C12 H16 O3P 1 21/c 18.894; 16.22; 7.742
90; 90.214; 90
1116.9Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300320 CIF
Paper
C12 H16 O3P 1 21/c 18.894; 16.22; 7.742
90; 90.214; 90
1116.9Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300321 CIF
Paper
C13 H18 N2 O3 SP 1 21/c 112.8651; 15.3291; 7.1435
90; 93.379; 90
1406.3Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300322 CIF
Paper
C13 H18 N2 O3 SP 1 21/c 112.8651; 15.3291; 7.1435
90; 93.379; 90
1406.3Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300323 CIF
Paper
C21 H21 N O3 S2P 1 21/c 111.7771; 11.4544; 14.9031
90; 95.945; 90
1999.6Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300324 CIF
Paper
C21 H21 N O3 S2P 1 21/c 111.7937; 11.4816; 14.9358
90; 95.972; 90
2011.5Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300325 CIF
Paper
C21 H21 N O3 S2P 1 21/c 111.7937; 11.4816; 14.9358
90; 95.972; 90
2011.5Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300326 CIF
Paper
C13 H10 F2 O SP c a 218.3649; 5.5063; 25.129
90; 90; 90
1157.4Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300327 CIF
Paper
C15 H12 N2 OP 1 21/n 17.55; 11.186; 13.954
90; 92.938; 90
1176.9Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300328 CIF
Paper
C13 H10 I N O2 SP -17.4946; 7.7421; 11.4816
95.418; 103.879; 96.985
636.65Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300329 CIF
Paper
C13 H10 I N O2 SP -17.5076; 7.76; 11.507
95.317; 103.999; 97.013
640.4Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300330 CIF
Paper
C13 H10 I N O2 SP -17.5076; 7.76; 11.507
95.317; 103.999; 97.013
640.4Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300331 CIF
Paper
C7 H5 N O3 SP 1 21/c 19.583; 6.9252; 11.8518
90; 103.815; 90
763.78Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300332 CIF
Paper
C7 H5 N O3 SP 1 21/c 19.6083; 6.9347; 11.882
90; 103.834; 90
768.7Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300333 CIF
Paper
C7 H0 N O3 SP 1 21/c 19.6083; 6.9347; 11.882
90; 103.834; 90
768.7Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300334 CIF
Paper
C6 H5 I N2 O2P 1 21/c 17.7617; 12.912; 15.663
90; 95.141; 90
1563.4Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300335 CIF
Paper
C12 H6 I2 N4 O4P 1 21/c 17.7617; 12.912; 15.663
90; 95.141; 90
1563.4Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300336 CIF
Paper
C15 H14 N2 O2 SP 21 21 217.7598; 9.9684; 18.231
90; 90; 90
1410.2Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300338 CIF
Paper
C15 H14 N2 O2 SP 21 21 217.7592; 9.9677; 18.23
90; 90; 90
1409.9Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300339 CIF
Paper
C17 H23 N3 O5 S2P 1 21/n 17.811; 17.503; 15.892
90; 103.305; 90
2114Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300341 CIF
Paper
C17 H23 N3 O5 S2P 1 21/n 17.811; 17.503; 15.892
90; 103.305; 90
2114Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300342 CIF
Paper
C7 H12 N4 O3 SP 1 21 15.6095; 7.3299; 12.491
90; 93.297; 90
512.74Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300344 CIF
Paper
C7 H12 N4 O3 SP 1 21 15.6245; 7.354; 12.521
90; 93.445; 90
517Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300345 CIF
Paper
C7 H8 N4 O SP 1 21 15.6245; 7.354; 12.521
90; 93.445; 90
517Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300346 CIF
Paper
C25 H22 N O P SP -110.2699; 11.1605; 11.1911
85.945; 67.75; 70.671
1118.07Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300347 CIF
Paper
C25 H22 N O P SP -110.2699; 11.1605; 11.1911
85.945; 67.75; 70.671
1118.07Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300348 CIF
Paper
C13 H13 N O2 SP -110.259; 11.05; 13.38
67.808; 87.291; 67.435
1288.4Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300349 CIF
Paper
C13 H13 N O2 SP -110.289; 11.0563; 13.4402
67.823; 87.573; 67.616
1299.9Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300351 CIF
Paper
C13 H12 N O2 SP -110.289; 11.0563; 13.4402
67.823; 87.573; 67.616
1299.9Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Journal of Applied Crystallography, 2011, 44, 213-215
2300352 CIF
Paper
Fe Li O4 PP n m a10.4008; 6.0523; 4.7324
90; 90; 90
297.91Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo
Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles
Journal of Applied Crystallography, 2011, 44, 287-294
2300353 CIF
Paper
Fe0.75 Li Mn0.25 O4 PP n m a10.3789; 6.0394; 4.7211
90; 90; 90
295.931Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo
Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles
Journal of Applied Crystallography, 2011, 44, 287-294
2300354 CIF
Paper
Fe0.5 Li Mn0.5 O4 PP n m a10.4072; 6.06188; 4.73357
90; 90; 90
298.628Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo
Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles
Journal of Applied Crystallography, 2011, 44, 287-294
2300355 CIF
Paper
Fe0.25 Li Mn0.75 O4 PP n m a10.4303; 6.08084; 4.74531
90; 90; 90
300.971Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo
Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles
Journal of Applied Crystallography, 2011, 44, 287-294
2300356 CIF
Paper
C2 H6 O6P 1 21/n 16.0514; 3.5482; 11.996
90; 106.26; 90
247.27Chakoumakos, Bryan C.; Cao, Huibo; Ye, Feng; Stoica, Alexandru D.; Popovici, Mihai; Sundaram, Madhan; Zhou, Wenduo; Hicks, J. Steve; Lynn, Gary W.; Riedel, Richard A.
Four-circle single-crystal neutron diffractometer at the High Flux Isotope Reactor
Journal of Applied Crystallography, 2011, 44, 655-658
2300357 CIF
Paper
C6 H24 N8 Ni O6P 63 2 28.8647; 8.8647; 11.3595
90; 90; 120
773.07Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300358 CIF
Paper
C6 H24 N8 Ni O6P 63 2 28.8647; 8.8647; 11.3595
90; 90; 120
773.07Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300359 CIF
Paper
C6 H24 N8 Ni O6P 61 2 28.806; 8.806; 33.147
90; 90; 120
2226Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300360 CIF
Paper
C6 H24 N8 Ni O6P 61 2 28.806; 8.806; 33.147
90; 90; 120
2226Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300361 CIF
Paper
C6 H24 N8 Ni O6P 63 2 28.8647; 8.8647; 11.3595
90; 90; 120
773.07Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300362 CIF
Paper
C8 H14 N2 O8C 1 2/c 115.805; 5.6535; 12.126
90; 107.55; 90
1033.1Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300363 CIF
Paper
C8 H14 N2 O8C 1 2/c 115.8205; 5.68202; 12.09246
90; 107.333; 90
1037.66Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300364 CIF
Paper
C8 H14 N2 O8C 1 2/c 115.82035; 5.68088; 12.09343
90; 107.332; 90
1037.53Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán
Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem
Journal of Applied Crystallography, 2011, 44, 763-771
2300365 CIF
HKL
Ge O2P 31 2 14.989; 4.989; 5.6527
90; 90; 120
121.847Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300366 CIFGe0.97 O2 Si0.03P 32 2 14.983; 4.983; 5.6339
90; 90; 120
121.149Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300367 CIFGe0.96 O2 Si0.04P 31 2 14.9805; 4.9805; 5.627
90; 90; 120
120.88Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300368 CIF
HKL
Ge0.9 O2 Si0.1P 32 2 14.97517; 4.97517; 5.60565
90; 90; 120
120.163Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300369 CIF
HKL
Ge0.83 O2 Si0.17P 31 2 14.9707; 4.9707; 5.5873
90; 90; 120
119.555Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300370 CIFO2 SiP 32 2 14.91636; 4.91636; 5.4084
90; 90; 120
113.211Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe
Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals
Journal of Applied Crystallography, 2012, 45, 272-278
2300371 CIF
HKL
Paper
C9 H13 N3 O5P 21 21 215.0784; 13.9046; 14.6992
90; 90; 90
1037.96Coome, J. A.; Goeta, A. E.; Howard, J. A. K.; Probert, M. R.
<i>Masquerade</i>: removing non-sample scattering from integrated reflection intensities
Journal of Applied Crystallography, 2012, 45, 292-298
2300372 CIF
HKL
Paper
C17 H14 OP b c a15.4307; 10.2659; 16.4124
90; 90; 90
2599.9Rajasekar, M.; Muthu, K.; Bhagavannarayana, G.; Meenakshisundaram, S. P.
Synthesis, structure, growth and characterization of an organic crystal: 1,5-diphenylpenta-2,4-dien-1-one
Journal of Applied Crystallography, 2012, 45, 914-920
2300373 CIF
Paper
H18 O12 SI 1 2 17.44247; 7.445; 26.1168
90; 125.043; 90
1184.78Maynard-Casely, Helen E.; Brand, Helen E. A.; Wallwork, Kia S.
Structure and thermal expansion of sulfuric acid octahydrate
Journal of Applied Crystallography, 2012, 45, 1198-1207
2300374 CIF
Paper
C25 H30 N4 O3P 21 21 2135.9422; 12.91819; 4.99532
90; 90; 90
2319.37Bushmarinov, Ivan S.; Dmitrienko, Artem O.; Korlyukov, Alexander A.; Antipin, Mikhail Yu.
Rietveld refinement and structure verification using `Morse' restraints
Journal of Applied Crystallography, 2012, 45, 1187-1197
2300375 CIF
Paper
Al2 O3R -3 c :H4.76029; 4.76029; 12.992
90; 90; 120
254.96Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka
High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi
Journal of Applied Crystallography, 2013, 46, 14-24
2300376 CIF
Paper
Ni SiP 21 34.49678; 4.49678; 4.49678
90; 90; 90
90.9295Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka
High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi
Journal of Applied Crystallography, 2013, 46, 14-24
2300377 CIF
Paper
Ni SiP m m n :23.2735; 3.02662; 4.69776
90; 90; 90
46.544Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka
High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi
Journal of Applied Crystallography, 2013, 46, 14-24
2300378 CIFAg3 MgF m -3 m4.1526; 4.1526; 4.1526
90; 90; 90
71.608Laine, E.; Tarne, T.; Haemaelaeinen, M.
Thermal expansion of the Ag3 Mg alloy in the ordered and disordered states
Journal of Applied Crystallography, 1969, 2, 95-101
2300379 CIFB Lu O3R -3 c :H4.9153; 4.9153; 16.212
90; 90; 120
339.209Bernstein, J.L.; Keve, E.T.; Abrahams, S.C.
Application of Normal Probability Plot Analysis to Lutetium Orthoborate Structure Factors and Parameters
Journal of Applied Crystallography, 1971, 4, 284-290
2300380 CIF
Paper
C15 H4 Cu2 O10F m -3 m26.3034; 26.3034; 26.3034
90; 90; 90
18198.5Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai
Generation and applications of structure envelopes for porous metal‒organic frameworks
Journal of Applied Crystallography, 2013, 46, 346-353
2300381 CIF
Paper
C33 H4 Cu2 O10F m -3 m26.3167; 26.3167; 26.3167
90; 90; 90
18226.1Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai
Generation and applications of structure envelopes for porous metal‒organic frameworks
Journal of Applied Crystallography, 2013, 46, 346-353
2300382 CIF
Paper
C8.5 H7 Cu N5 O2C 1 2/c 128.697; 9.2637; 9.3223
90; 116.087; 90
2225.8Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai
Generation and applications of structure envelopes for porous metal‒organic frameworks
Journal of Applied Crystallography, 2013, 46, 346-353
2300383 CIF
Paper
C356 H32 Y4C m c 2111.22205; 34.8174; 11.22569
90; 90; 90
4386.13Maki, Sachiko; Nishibori, Eiji; Kawaguchi, Daisuke; Sakata, Makoto; Takata, Masaki; Inoue, Takashi; Shinohara, Hisanori
Element-selective charge density visualization of endohedral metallofullerenes using synchrotron X-ray multi-wavelength anomalous powder diffraction data
Journal of Applied Crystallography, 2013, 46, 649-655
2300384 CIF
HKL
C13 H10 OP 21 21 217.979; 10.274; 12.103
90; 90; 90
992.2Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H.
Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone
Journal of Applied Crystallography, 2013, 46, 656-662
2300385 CIF
HKL
C13 H10 OP 21 21 217.7145; 10.2301; 12.0269
90; 90; 90
949.2Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H.
Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone
Journal of Applied Crystallography, 2013, 46, 656-662
2300386 CIFC13 H10 OP 21 21 217.9958; 10.2907; 12.174
90; 90; 90
1001.7Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H.
Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone
Journal of Applied Crystallography, 2013, 46, 656-662
2300387 CIF
HKL
Paper
B3 Ba5 F O9P n m a7.60788; 14.8299; 10.2865
90; 90; 90
1160.57Rashchenko, Sergey V.; Bekker, Tatyana B.; Bakakin, Vladimir V.; Seryotkin, Yurii V.; Kokh, Alexander E.; Gille, Peter; Popov, Arthur I.; Fedorov, Pavel P.
A new mechanism of anionic substitution in fluoride borates
Journal of Applied Crystallography, 2013, 46, 1081-1084
2300388 CIF
Paper
As0.84 Cu1.08 Mn0.94P 4/n m m :23.82; 3.82; 6.318
90; 90; 90
92.2Wadley, P.; Crespi, A.; Gázquez, J.; Roldán, M.A.; García, P.; Novak, V.; Campion, R.; Jungwirth, T.; Rinaldi, C.; Martí, X.; Holy, V.; Frontera, C.; Rius, J.
Obtaining the structure factors for an epitaxial film using Cu X-ray radiation
Journal of Applied Crystallography, 2013, 46, 1749-1754
2300389 CIFC33 H33 N3 O6 Pd S3P 1 21/c 18.5627; 10.4508; 35.5429
90; 94.294; 90
3171.7Coles, Simon J.; Hursthouse, Michael B.
Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography
Journal of Applied Crystallography, 2004, 37, 988
2300390 CIFC33 H33 N3 O6 Pd S3P 1 21/c 18.5467; 10.4343; 35.4794
90; 94.325; 90
3155Coles, Simon J.; Hursthouse, Michael B.
Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography
Journal of Applied Crystallography, 2004, 37, 988
2300391 CIFB12 Cs2 Li2 O20I -4 2 d10.467; 10.467; 8.922
90; 90; 90
977.48Herreros-Cedrés, Javier; Hernández-Rodriguez, Cecilio; Kaminsky, Werner
Absolute optical rotation of CsLiB6O10
Journal of Applied Crystallography, 2005, 38, 544
2300392 CIFC10 H16 N O1.5P 21 21 217.3188; 11.2018; 24.0156
90; 90; 90
1968.89Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla
A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate
Journal of Applied Crystallography, 2001, 34, 203
2300393 CIFC10 H16 N O1.5P 21 21 217.3105; 11.1878; 23.979
90; 90; 90
1961.2Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla
A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate
Journal of Applied Crystallography, 2001, 34, 203
2300442 CIFGd K O8 W2C 1 2/c 110.652; 10.374; 7.582
90; 130.8; 90
634.2Pujol, M. C.; Solé, R.; Massons, J.; Gavaldà, Jna.; Solans, X.; Zaldo, C.; Díaz, F.; Aguiló, M.
Structural study of monoclinic KGd(WO4)2and effects of lanthanide substitution
Journal of Applied Crystallography, 2001, 34, 1
2300443 CIFC12 H24 B2 F8 Fe N24P 1 21/n 117.566; 10.0964; 18.696
90; 114.458; 90
3018.3Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2
Journal of Applied Crystallography, 2001, 34, 229
2300444 CIFC12 H24 B2 F8 Fe N24P 1 21/n 117.4887; 10.0914; 18.517
90; 115.243; 90
2955.9Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2
Journal of Applied Crystallography, 2001, 34, 229
2300445 CIFC12 H24 B2 F8 Fe N24P 1 21/n 117.207; 10.214; 18.406
90; 113.912; 90
2957.2Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2
Journal of Applied Crystallography, 2001, 34, 229
2300446 CIF
Paper
Al18.5 Co7.75 Ni0P n m m :223.201; 32.31; 4.103
90; 90; 90
3075.7Singh, Devinder; Yun, Yifeng; Wan, Wei; Grushko, Benjamin; Zou, Xiaodong; Hovmöller, Sven
A complex pseudo-decagonal quasicrystal approximant, Al~37~(Co,Ni)~15.5~, solved by rotation electron diffraction
Journal of Applied Crystallography, 2014, 47, 215-221
2300447 CIFLi1.99 Mn1.01 O3C 1 2/m 14.9246; 8.5216; 5.0245
90; 109.398; 90
198.886Massarotti, V.; Bini, M.; Capsoni, D.; Altomare, A.; Moliterni, A. G. G.
Ab initio structure determination of Li~2~MnO~3~ from X-ray powder diffraction data
Journal of Applied Crystallography, 1997, 30, 123-127
2300448 CIF
HKL
Paper
Al2 O3R -3 c :H4.758152; 4.758152; 12.9897
90; 90; 120
254.687Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300449 CIF
HKL
Paper
Ca F2F m -3 m5.463209; 5.463209; 5.463209
90; 90; 90
163.059Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300450 CIF
HKL
Paper
O ZnP 63 m c3.249308; 3.249308; 5.205709
90; 90; 120
47.5984Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300451 CIF
Paper
C12 H18 N2 O3 SP n a 2120.31875; 7.84999; 9.10539
90; 90; 90
1452.33Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300452 CIF
Paper
C12 H18 N2 O3 SP 1 c 19.16849; 17.181; 18.1517
90; 96.6067; 90
2840.3Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300453 CIF
HKL
Paper
C12 H18 N2 O3 SP 1 21/n 111.80943; 9.06147; 13.99082
90; 104.584; 90
1448.93Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300454 CIF
HKL
Paper
C2 H5 N O2P 1 21/c 15.10422; 11.97177; 5.93652
90; 121.264; 90
310.081Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300455 CIF
Paper
C8 H9 N O2P 1 21/n 111.71439; 9.38544; 7.10166
90; 82.5879; 90
774.27Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300456 CIF
HKL
Paper
C12 H24 O12P 1 21 17.77208; 21.58192; 4.8172
90; 74.0609; 90
776.95Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300457 CIF
Paper
Ba0.41 Mo O4 Sr0.59I 41/a :25.50729; 5.50729; 12.4789
90; 90; 90
378.488Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E.
Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals
Journal of Applied Crystallography, 2013, 46, 1434-1446
2300458 CIF
Paper
Ba0.73 Mo O4 Sr0.27I 41/a :25.54906; 5.54906; 12.66803
90; 90; 90
390.075Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E.
Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals
Journal of Applied Crystallography, 2013, 46, 1434-1446
2300459 CIF
Paper
Ba Mo O4I 41/a :25.584828; 5.584828; 12.82922
90; 90; 90
400.147Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E.
Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals
Journal of Applied Crystallography, 2013, 46, 1434-1446
2300460 CIF
Paper
Mo O4 SrI 41/a :25.402647; 5.402647; 12.04112
90; 90; 90
351.463Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E.
Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals
Journal of Applied Crystallography, 2013, 46, 1434-1446
2300461 CIF
Paper
Ba0.19 Mo O4 Sr0.81I 41/a :25.45711; 5.45711; 12.25476
90; 90; 90
364.947Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E.
Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals
Journal of Applied Crystallography, 2013, 46, 1434-1446
2300462 CIF
HKL
Ag5 Mg33P b c m8.87; 16.48; 19.48
90; 90; 90
2847.54Samuha, Shmuel; Krimer, Yaakov; Meshi, Louisa
Strategies for full structure solution of intermetallic compounds using precession electron diffraction zonal data
Journal of Applied Crystallography, 2014, 47, 1032-1041
2300463 CIF
HKL
Paper
C7 H8 F N3 SP 1 21/c 111.947; 5.5093; 12.4564
90; 91.712; 90
819.51Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300464 CIF
HKL
Paper
C7 H8 F N3 SP 1 21/c 111.9525; 5.5111; 12.4566
90; 91.699; 90
820.17Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300465 CIF
HKL
Paper
C7 H8 F N3 SP 1 21/c 111.9359; 5.5005; 12.4375
90; 91.776; 90
816.17Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300466 CIF
HKL
Paper
C7 H8 F N3 SP 1 21/c 111.9533; 5.5087; 12.4688
90; 91.699; 90
820.67Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300467 CIF
HKL
Paper
C20 H15 BrP 21 21 215.613; 8.5301; 31.4348
90; 90; 90
1505.08Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300468 CIF
HKL
Paper
C20 H15 BrP 21 21 215.6011; 8.5219; 31.4741
90; 90; 90
1502.32Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300469 CIF
HKL
Paper
C20 H15 BrP 21 21 215.6104; 8.5238; 31.496
90; 90; 90
1506.2Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300470 CIF
HKL
Paper
C20 H15 BrP 21 21 215.6112; 8.5333; 31.4392
90; 90; 90
1505.37Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300471 CIF
HKL
Paper
C20 H26 Cu N8 O16C 1 2/c 123.0024; 8.9753; 12.3386
90; 98.041; 90
2522.3Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300472 CIF
HKL
Paper
C20 H26 Cu N8 O16C 1 2/c 123.0151; 8.9752; 12.3404
90; 98.108; 90
2523.62Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300473 CIF
HKL
Paper
C20 H26 Cu N8 O16C 1 2/c 123.0144; 8.9745; 12.3423
90; 98.069; 90
2524Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300474 CIF
HKL
Paper
C20 H26 Cu N8 O16C 1 2/c 123.0253; 8.9728; 12.3325
90; 98.12; 90
2522.4Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300475 CIF
HKL
Paper
C28 H25 Cl N2 O SnC 1 2/c 115.5966; 16.1294; 20.4387
90; 108.891; 90
4864.7Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300476 CIF
HKL
Paper
C28 H25 Cl N2 O SnC 1 2/c 115.5993; 16.1284; 20.4476
90; 108.849; 90
4868.6Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300477 CIF
HKL
Paper
C28 H25 Cl N2 O SnC 1 2/c 115.5742; 16.1161; 20.4181
90; 108.879; 90
4849.2Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300478 CIF
HKL
Paper
C28 H25 Cl N2 O SnC 1 2/c 115.5844; 16.112; 20.4375
90; 108.872; 90
4855.9Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300479 CIF
HKL
Paper
C3 H9 N5 O6 Pb SP 1 21/n 15.3641; 13.8966; 14.2315
90; 100.132; 90
1044.31Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300480 CIF
HKL
Paper
C3 H9 N5 O6 Pb SP 1 21/n 15.346; 13.8593; 14.1995
90; 100.138; 90
1035.64Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300481 CIF
HKL
Paper
C3 H9 N5 O6 Pb SP 1 21/n 15.3522; 13.8783; 14.2186
90; 100.048; 90
1039.95Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300482 CIF
HKL
Paper
C3 H9 N5 O6 Pb SP 1 21/n 15.3522; 13.8826; 14.2217
90; 100.075; 90
1040.41Tan, Seng Lim; Ng, Seik Weng
Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule?
Journal of Applied Crystallography, 2014, 47, 1443-1444
2300483 CIF
HKL
Paper
C34 H34 Cl2 F12 N4 O3P 42/n :224.5663; 24.5663; 6.38601
90; 90; 90
3853.98Mendes do Prado, Vânia; Cardoso Seiceira, Rafael; Pitaluga Jr, Altivo; Andrade-Filho, Tarciso; Andrade Alves, Wendel; Reily Rocha, Alexandre; Furlan Ferreira, Fabio
Elucidating the crystal structure of the antimalarial drug (±)-mefloquine hydrochloride: a tetragonal hydrated species
Journal of Applied Crystallography, 2014, 47, 1380-1386
2300484 CIF
HKL
Paper
F3 Na NiC m c m3.0294; 10.0534; 7.3938
90; 90; 90
225.18Lindsay-Scott, Alex; Dobson, David; Nestola, Fabrizio; Alvaro, Matteo; Casati, Nicola; Liebske, Christian; Knight, Kevin S.; Smith, Ronald I.; Wood, Ian G.
Time-of-flight neutron powder diffraction with milligram samples: the crystal structures of NaCoF~3~ and NaNiF~3~ post-perovskites
Journal of Applied Crystallography, 2014, 47, 1939-1947
2300485 CIF
HKL
Paper
Pt7 Sc4 Si2P b a m6.462; 16.147; 3.988
90; 90; 90
416.1Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300486 CIF
HKL
Paper
Pt7 Sc4 Si2P b a m6.447; 16.121; 3.982
90; 90; 90
413.9Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300487 CIF
HKL
Paper
Br0.09 Cl0.91 Cu6 O8 PbF m -3 m9.216; 9.216; 9.216
90; 90; 90
782.8Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300488 CIF
Paper
Br0.1 Cl0.9 Cu6 O8 PbF m -3 m9.2164; 9.2164; 9.2164
90; 90; 90
782.86Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300489 CIF
HKL
Paper
H4 Na2 O6 WP b c a8.439; 10.559; 13.807
90; 90; 90
1230.3Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300490 CIF
HKL
Paper
H4 Na2 O6 WP b c a8.442; 10.569; 13.816
90; 90; 90
1232.7Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300491 CIF
HKL
Paper
C4 Co Sc3I m m m3.394; 4.374; 11.995
90; 90; 90
178.07Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300492 CIF
HKL
Paper
C4 Co Sc3I m m m3.398; 4.377; 12.003
90; 90; 90
178.52Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300493 CIF
HKL
Paper
C16 H13 Br2 NP 1 21/n 19.601; 8.377; 17.201
90; 97.35; 90
1372.1Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300494 CIF
Paper
C16 H13 Br2 NP 1 21/n 19.599; 8.378; 17.194
90; 97.32; 90
1371.5Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300495 CIF
HKL
Paper
C30 H46 Br2 Cl2 Co N4 Si2P 1 21/n 118.568; 9.504; 21.378
90; 102.95; 90
3676.6Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300496 CIF
HKL
Paper
C30 H46 Br2 Cl2 Co N4 Si2P 1 21/n 118.588; 9.518; 21.403
90; 102.95; 90
3690.3Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar
Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination
Journal of Applied Crystallography, 2015, 48
2300497 CIF
HKL
Bi1.09 Ge2.37 Te4F m -3 m6.055; 6.055; 6.055
90; 90; 90
221.99Urban, Philipp; Simonov, Arkadiy; Weber, Thomas; Oeckler, Oliver
Real structure of Ge4Bi2Te7: refinement on diffuse scattering data with the 3D-ΔPDF method
Journal of Applied Crystallography, 2015, 48, 200
2300498 CIF
Paper
K0.5 Na0.5 Nb O3R 3 m :H5.6085; 5.6085; 6.9183
90; 90; 120
188.46Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M.
Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~
Journal of Applied Crystallography, 2015, 48
2300499 CIF
Paper
K0.5 Na0.5 Nb O3A m m 23.9443; 5.6425; 5.6763
90; 90; 90
126.33Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M.
Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~
Journal of Applied Crystallography, 2015, 48
2300500 CIF
HKL
Paper
C10 H16 N6 SC 1 2/c 182.904; 4.85; 18.76
90; 74.34; 90
7263Arakcheeva, Alla; Pattison, Philip; Bauer-Brandl, Annette; Birkedal, Henrik; Chapuis, Gervais
Cimetidine, C~10~H~16~N~6~S, form C: crystal structure and modelling of polytypes using the superspace approach
Journal of Applied Crystallography, 2013, 46, 99-107
2300501 CIF
HKL
C7 H10 N2 O2C 1 2/c 117.822; 4.85; 19.783
90; 102.37; 90
1670.3Graiff, Claudia; Pontiroli, Daniele; Bergamonti, Laura; Cavallari, Chiara; Lottici, Pier Paolo; Predieri, Giovanni
Structural investigation of <i>N</i>,<i>N</i>'-methylenebisacrylamide <i>via</i> X-ray diffraction assisted by crystal structure prediction
Journal of Applied Crystallography, 2015, 48, 550-557
2300502 CIFC13 H15 Co N2 O7P 1 21/c 112.6105; 7.6858; 15.9256
90; 106.541; 90
1479.66Cox, Jordan M.; Walton, Ian M.; Benson, Cassidy A.; Chen, Yu-Sheng; Benedict, Jason B.
A versatile environmental control cell for <i>in situ</i> guest exchange single-crystal diffraction
Journal of Applied Crystallography, 2015, 48, 578-581
2300503 CIF
HKL
C42 H80 Br2 N2 O3C 1 2/c 154.695; 9.8891; 16.877
90; 92.628; 90
9118.9Chen, Qibin; Yao, Junyao; Hu, Xin; Shen, Jincheng; Sheng, Yujie; Liu, Honglai
Monolayer effect of a gemini surfactant with a rigid biphenyl spacer on its self-crystallization at the air/liquid interface
Journal of Applied Crystallography, 2015, 48
2300504 CIF
HKL
Mg Mo O4C 1 2/m 110.157; 9.246; 7.03
90; 105.9; 90
634.94Gemmi, Mauro; La Placa, Maria G. I.; Galanis, Athanassios S.; Rauch, Edgar F.; Nicolopoulos, Stavros
Fast electron diffraction tomography
Journal of Applied Crystallography, 2015, 48
2300505 CIF
HKL
C28 H26 N2 O4P 1 21/n 15.9038; 10.7455; 19.4895
90; 90.263; 90
1236.39Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng
Supramolecular organic frameworks of a Schiff base showing selective guest adsorption
Journal of Applied Crystallography, 2015, 48
2300506 CIF
HKL
C24 H22 Cl6 N2 O4P 1 21/n 16.8524; 11.9655; 17.3274
90; 99.678; 90
1400.5Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng
Supramolecular organic frameworks of a Schiff base showing selective guest adsorption
Journal of Applied Crystallography, 2015, 48
2300507 CIF
HKL
C26 H28 N2 O5P 1 21/c 113.2363; 11.765; 17.6353
90; 103.281; 90
2672.8Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng
Supramolecular organic frameworks of a Schiff base showing selective guest adsorption
Journal of Applied Crystallography, 2015, 48
2300508 CIF
HKL
C32 H28 N4 O4P 1 2/c 112.8209; 7.0395; 14.7623
90; 96.82; 90
1322.91Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng
Supramolecular organic frameworks of a Schiff base showing selective guest adsorption
Journal of Applied Crystallography, 2015, 48
2300509 CIF
HKL
C6 H9 N3 O6P n a 219.0136; 21.5; 4.7005
90; 90; 90
910.9Prasad, A. Aditya; Meenakshisundaram, S. P.
Hydrogen-bonded supramolecular architecture in nonlinear optical ammonium 2,4-dinitrophenolate hydrate
Journal of Applied Crystallography, 2015, 48
2300510 CIFF2 O2 OsC 1 2/c 19.42; 4.491; 8.6
90; 117.5; 90
322.717Burbank, R.D.
X-Ray Study of an Osmium Oxyfluoride of Unknown Composition
Journal of Applied Crystallography, 1974, 7, 41-44
2300511 CIFK2.92 Li2 O30 Pb2.41 Ta10P 4/m b m12.5488; 12.5488; 3.9129
90; 90; 90
616.174Hornebecq, V.; Weill, F.; Elissalde, C.; Villesuzanne, A.; Menetrier, M.; Ravez, J.
Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach
Journal of Applied Crystallography, 2000, 33, 1037-1045
2300512 CIFK1.46 Li O30 Pb3.67 Ta10P 4/m b m12.5159; 12.5159; 3.8947
90; 90; 90
610.096Hornebecq, V.; Elissalde, C.; Weill, F.; Villesuzanne, A.; Menetrier, M.; Ravez, J.
Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach
Journal of Applied Crystallography, 2000, 33, 1037-1045
2300513 CIF
HKL
C32 H39 N O2P 1 21/c 116.589; 10.9575; 16.6795
90; 113.623; 90
2777.8Sharma, Ranjana; Prasher, Dixit; Tiwari, R. K.
Crystal structure analysis of ebastine [4-(4-benzhydryloxy-1-piperidyl)-1-(4-<i>tert</i>-butylphenyl) butan-1-one]: an oral histamine antagonist
Journal of Applied Crystallography, 2015, 48
2300514 CIFTe UP m -3 m3.765; 3.765; 3.765
90; 90; 90
53.37Gerward, L.; Olsen, J.S.; Dabos-Seignon, S.; Benedict, U.; Steenstrup, S.
The pressure-induced transformation B1 to B2 in actinide compounds
Journal of Applied Crystallography, 1990, 23, 515-519
2300515 CIFIr0.94 Mo3.06P m -3 n4.958; 4.958; 4.958
90; 90; 90
121.876Koksbang, R.; Rasmussen, S.E.; Hazell, R.G.
Critical temperatures of superconductivity and neutron diffraction studies at 293 and at 10 K of Mo-Ir single crystal of A15 structure
Journal of Applied Crystallography, 1989, 22, 23-25
2300516 CIFD15 Th4I -4 3 d9.11; 9.11; 9.11
90; 90; 90
756.058Mueller, M.H.; Caton, R.; Beyerlein, R.A.; Brun, T.O.; Jorgensen, J.D.; Satterthwaite, C.B.
Structure of Th4 D15 from measurement at the argonne ZING-P pulsed neutron source
Journal of Applied Crystallography, 1977, 10, 79-83
2300517 CIFTlF m -3 m4.33; 4.33; 4.33
90; 90; 90
81.183Olsen, J.S.; Steenstrup, S.; Geward, L.; Johnson, E.
A high-pressure study of thallium
Journal of Applied Crystallography, 1994, 27, 1002-1005
2300518 CIFTlP 63/m m c3.463; 3.463; 5.539
90; 90; 120
57.526Olsen, J.S.; Johnson, E.; Geward, L.; Steenstrup, S.
A high-pressure study of thallium
Journal of Applied Crystallography, 1994, 27, 1002-1005
2300519 CIFAg0.842 Al0.158F m -3 m4.0692; 4.0692; 4.0692
90; 90; 90
67.379Pradhan, S.K.; De, M.
An X-ray determination of the thermal expansion of alpha-phase Ag-Al alloys at high temperatures
Journal of Applied Crystallography, 1986, 19, 484-485
2300520 CIFOs2 PuF d -3 m :17.53; 7.53; 7.53
90; 90; 90
426.958Roof, R.B.jr.
Crystal data of two polymorphic forms of Pu Os2
Journal of Applied Crystallography, 1975, 8, 687-688
2300521 CIFCu2 Mn SnF m -3 m6.176; 6.176; 6.176
90; 90; 90
235.571Meyers, M.A.; Ruud, C.O.; Barrett, C.S.
Observations on the ferromagnetic beta-phase of the Cu - Mn - Sn system
Journal of Applied Crystallography, 1973, 6, 39-41
2300522 CIFNb Te4P 4/m c c6.3616; 6.3616; 6.837
90; 90; 90
276.693Dusek, M.; Petricek, V.; Dinnebier, R.E.; Wunschel, M.; van Smaalen, S.
Refinement of modulated structures against X-ray powder diffraction data with JANA2000
Journal of Applied Crystallography, 2001, 34, 398-404
2300523 CIFTi0.04 U0.96C m c m2.861; 5.8234; 4.9736
90; 90; 90
82.864Choi, C.S.; Prask, H.J.
Neutron difraction studies of two uranium-0.75 wt.% titanium alloys
Journal of Applied Crystallography, 1985, 18, 141-144
2300524 CIFCl O4 P Sn2A m a 213.52; 8.673; 4.74
90; 90; 90
555.807Berndt, A.F.; Sylvester, J.M.
Crystal data on tin(II) phosphate chloride, Sn2 P O4 Cl
Journal of Applied Crystallography, 1972, 5, 248-249
2300525 CIFNi2.62 O4 Ti0.69F d -3 m :28.3416; 8.3416; 8.3416
90; 90; 90
580.428Lager, G.A.; Armbruster, T.; Rotella, F.J.; Ross, F.K.; Jorgensen, J.D.
Neutron poeder diffraction study of defect spinel structures: Tetrahedrally coordinated Ti4+ in Ni2.62 Ti0.69 O4 and Ni2.42 Ti0.74 Si0.05 O4
Journal of Applied Crystallography, 1981, 14, 261-264
2300526 CIFNi2.42 O4 Si0.05 Ti0.65F d -3 m :28.3222; 8.3222; 8.3222
90; 90; 90
576.387Lager, G.A.; Rotella, F.J.; Ross, F.K.; Armbruster, T.; Jorgensen, J.D.
Neutron powder diffraction study of defect spinel structures: Tetrahedrally coordinated Ti4+ in Ni2.62 Ti0.69 O4 and Ni2.42 Ti0.74 Si0.05 O4
Journal of Applied Crystallography, 1981, 14, 261-264
2300527 CIFFe0.9 O8 P2 Zn2.1P 1 21/n 17.558; 8.536; 5.042
90; 95.4; 90
323.841Nord, A.G.
Use of the Rietveld technique for estimating cation distributions
Journal of Applied Crystallography, 1984, 17, 55-60
2300528 CIFC Ag N SP m n n4.083; 7.043; 11.219
90; 90; 90
322.62Smith, D.L.; Maskasky, J.E.; Spaulding, L.R.
Polymorphism in silver thiocyanate. Preparation of a new phase and its characterization by X-ray powder diffraction
Journal of Applied Crystallography, 1982, 15, 488-492
2300529 CIFN2 O Si2C m c 218.847; 5.452; 4.824
90; 90; 90
232.68Srinivasa, S.R.; Jorgensen, J.D.; Cartz, L.; Worlton, T.G.; Beyerlein, R.A.; Billy, M.
High-pressure neutron diffraction study of Si2 N2 O
Journal of Applied Crystallography, 1977, 10, 167-171
2300530 CIFP3 Ta5P n m a25.321; 3.4013; 11.4614
90; 90; 90
987.105Thomas, J.O.; Ersson, N.O.; Andersson, Y.
An X-Ray film powder profile refinement of the crystal structure of Ta5 P3
Journal of Applied Crystallography, 1980, 13, 605-607
2300531 CIFEr2 O3I a -310.54504; 10.54504; 10.54504
90; 90; 90
1172.59Heiba, Z.; Okuyucu, H.; Hascicek, Y.S.
X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method
Journal of Applied Crystallography, 2002, 35, 577-580
2300532 CIFEr1.6 Gd0.4 O3I a -310.6511; 10.6511; 10.6511
90; 90; 90
1208.32Heiba, Z.; Okuyucu, H.; Hascicek, Y.S.
X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method
Journal of Applied Crystallography, 2002, 35, 577-580
2300533 CIFEr Gd O3I a -310.73652; 10.73652; 10.73652
90; 90; 90
1237.63Heiba, Z.; Okuyucu, H.; Hascicek, Y.S.
X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method
Journal of Applied Crystallography, 2002, 35, 577-580
2300534 CIFEr0.4 Gd1.6 O3I a -310.7911; 10.7911; 10.7911
90; 90; 90
1256.6Heiba, Z.; Okuyucu, H.; Hascicek, Y.S.
X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method
Journal of Applied Crystallography, 2002, 35, 577-580
2300535 CIFLi2 O3 ZrC 1 2/c 15.4089; 9.0309; 5.4144
90; 112.498; 90
244.35Heiba, Z.K.; El Sayed, K.
Structural and anisotropic thermal expansion correlation of Li2 Zr O3 at different temperatures
Journal of Applied Crystallography, 2002, 35, 634-636
2300536 CIFEu2 O3I a -310.86831; 10.86831; 10.86831
90; 90; 90
1283.77Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S.
X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process
Journal of Applied Crystallography, 2003, 36, 1411-1416
2300537 CIFEu1.8 O3 Yb0.2I a -310.81718; 10.81718; 10.81718
90; 90; 90
1265.73Heiba, Z.K.; Akin, Y.; Hascicek, Y.S.; Sigmund, W.
X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process
Journal of Applied Crystallography, 2003, 36, 1411-1416
2300538 CIFEu1.6 O3 Yb0.4I a -310.76778; 10.76778; 10.76778
90; 90; 90
1248.47Heiba, Z.K.; Akin, Y.; Hascicek, Y.S.; Sigmund, W.
X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process
Journal of Applied Crystallography, 2003, 36, 1411-1416
2300539 CIFEu O3 YbI a -310.62842; 10.62842; 10.62842
90; 90; 90
1200.62Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S.
X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process
Journal of Applied Crystallography, 2003, 36, 1411-1416
2300540 CIFEu0.4 O3 Yb1.6I a -310.49964; 10.49964; 10.49964
90; 90; 90
1157.51Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S.
X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process
Journal of Applied Crystallography, 2003, 36, 1411-1416
2300541 CIFEu0.2 O3 Yb1.8I a -310.46596; 10.46596; 10.46596
90; 90; 90
1146.4Heiba, Z.K.; Hascicek, Y.S.; Akin, Y.; Sigmund, W.
X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process
Journal of Applied Crystallography, 2003, 36, 1411-1416
2300542 CIFO3 Yb2I a -310.42828; 10.42828; 10.42828
90; 90; 90
1134.06Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S.
X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process
Journal of Applied Crystallography, 2003, 36, 1411-1416
2300543 CIFBi2 O9 Sr Ta2A 21 a m5.5186; 5.52; 25.0485
90; 90; 90
763.044Muller, C.; Jacob, F.; Gagou, Y.; Elkaim, E.
Cationic disorder, microstructure and dielectric response of ferroelectric SBT ceramics
Journal of Applied Crystallography, 2003, 36, 880-889
2300544 CIFO2 ZrP 1 21/c 15.1487; 5.2023; 5.3231
90; 99.164; 90
140.76Winterer, M.; Delaplane, R.; McGreevy, R.
X-ray diffraction, neutron scattering and EXAFS spectroscopy of monoclinic zirconia: analysis by Rietveld refinement and reverse Monte Carlo simulations
Journal of Applied Crystallography, 2002, 35, 434-442

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