Crystallography Open Database
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Searching journal of publication like 'Journal of applied crystallography'
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
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1000032 | CIF | Al2 O3 | R -3 c :H | 4.7605; 4.7605; 12.9956 90; 90; 120 | 255.1 | Lutterotti, L; Scardi, P Simultaneous structure and size-strain refinement by the Rietveld method Journal of Applied Crystallography, 1990, 23, 246-252 |
1001306 | CIF | Ge2 N2 O | C m c 21 | 9.317; 5.752; 5.105 90; 90; 90 | 273.6 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001307 | CIF | Ge2 N2 O | C m c 21 | 9.315; 5.747; 5.102 90; 90; 90 | 273.1 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001308 | CIF | Ge2 N2 O | C m c 21 | 9.306; 5.742; 5.097 90; 90; 90 | 272.4 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001309 | CIF | Ge2 N2 O | C m c 21 | 9.298; 5.736; 5.092 90; 90; 90 | 271.6 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001310 | CIF | Ge2 N2 O | C m c 21 | 9.287; 5.731; 5.089 90; 90; 90 | 270.9 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001311 | CIF | Ge2 N2 O | C m c 21 | 9.274; 5.727; 5.085 90; 90; 90 | 270.1 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001312 | CIF | Ge2 N2 O | C m c 21 | 9.266; 5.72; 5.08 90; 90; 90 | 269.2 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001313 | CIF | Ge2 N2 O | C m c 21 | 9.259; 5.714; 5.075 90; 90; 90 | 268.5 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001314 | CIF | Ge2 N2 O | C m c 21 | 9.261; 5.707; 5.074 90; 90; 90 | 268.2 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001315 | CIF | Ge2 N2 O | C m c 21 | 9.254; 5.699; 5.073 90; 90; 90 | 267.5 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1001316 | CIF | Ge2 N2 O | C m c 21 | 9.247; 5.689; 5.072 90; 90; 90 | 266.8 | Srinivasa, S R; Cartz, L; Jorgensen, J D; Labbe, J C Pressure-induced tetrahedral tilting and deformation in Ge~2~ N~2~ O Journal of Applied Crystallography, 1979, 12, 511-516 |
1004020 | CIF | Ca O3 Sn | R -3 :R | 6; 6; 6 54.42; 54.42; 54.42 | 132.9 | Durand, B; Loiseleur, H Crystal data for an ilmenite variety of calcium stannate Ca Sn O~3~ Journal of Applied Crystallography, 1978, 11, 289-290 |
1008036 | CIF | Cu O4 W | P -1 | 4.6964; 5.8287; 4.8736 91.63; 92.44; 82.79 | 132.2 | Klein, S; Weitzel, H Pernod - ein Programm zur Verfeinerung von Kristall-Strukturparametern aus Neutronenbeugungspulverdiagrammen Journal of Applied Crystallography, 1975, 8, 54-59 |
1100041 | CIF | N0.61 Ti | I 41/a m d :1 | 4.198; 4.198; 8.591 90; 90; 90 | 151.4 | Nagakura, S; Kusunoki, T Structure of Ti Nx studied by electron diffraction and microscopy Journal of Applied Crystallography, 1977, 10, 52-56 |
2300000 | CIF | C6 H6 B Br O2 | P 1 21/c 1 | 15.7797; 5.3085; 9.3757 90; 93.357; 90 | 784.02 | Nattamai S. P. Bhuvanesh; Joseph H. Reibenspies; Peter L. Lee; Yuegang Zhang A novel strategy for <i>ab initio</i> structure determination using micro-powder X-ray diffraction: structure solution and refinement of 3-bromophenylboronic acid and tris(4-bromophenyl)boroxine Journal of Applied Crystallography, 2005, 38, 632-638 |
2300001 | CIF | C18 H12 B3 Br3 O3 | P n m a | 18.9289; 21.8872; 4.8842 90; 90; 90 | 2023.53 | Nattamai S. P. Bhuvanesh; Joseph H. Reibenspies; Peter L. Lee; Yuegang Zhang A novel strategy for <i>ab initio</i> structure determination using micro-powder X-ray diffraction: structure solution and refinement of 3-bromophenylboronic acid and tris(4-bromophenyl)boroxine Journal of Applied Crystallography, 2005, 38, 632-638 |
2300002 | CIF | Ca0.816 Co0.28 Cu0.72 O2 | ?P? | 2.7954; 6.3078; 10.6017 90; 90; 90 | 186.938 | Dominique Grebille; Sebastien Lambert; Francoise Bouree; Vaclav Petricek Contribution of powder diffraction for structure refinements of aperiodic misfit cobalt oxides Journal of Applied Crystallography, 2004, 37, 823-831 |
2300003 | CIF HKL | H6 O9 P2 Sr | P -1 | 5.7491; 6.4104; 12.1002 93.56; 95.542; 114.013 | 402.91 | Bolte, Michael <i>TWINLAW</i> and <i>HKLF</i>5: two programs for the handling of non-merohedral twins Journal of Applied Crystallography, 2004, 37, 162-165 |
2300004 | CIF HKL | C2 H2 N4 O3 | P 1 21/c 1 | 9.3129; 5.4458; 9.0261 90; 101.464; 90 | 448.64 | Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structure of β-NTO Journal of Applied Crystallography, 2003, 36, 280-285 |
2300005 | CIF HKL | C2 H2 N4 O3 | P 1 21/c 1 | 9.3185; 5.4615; 9.0475 90; 101.332; 90 | 451.48 | Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structure of β-NTO Journal of Applied Crystallography, 2003, 36, 280-285 |
2300006 | CIF HKL | C2 H2 N4 O3 | P 1 21/c 1 | 9.322; 5.4791; 9.0685 90; 101.182; 90 | 454.39 | Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structure of β-NTO Journal of Applied Crystallography, 2003, 36, 280-285 |
2300007 | CIF HKL | C2 H2 N4 O3 | P 1 21/c 1 | 9.3233; 5.4977; 9.0885 90; 101.019; 90 | 457.26 | Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structure of β-NTO Journal of Applied Crystallography, 2003, 36, 280-285 |
2300008 | CIF HKL | C2 H2 N4 O3 | P 1 21/c 1 | 9.3207; 5.5215; 9.1102 90; 100.87; 90 | 460.44 | Bolotina, Nadezhda B.; Zhurova, Elizabeth; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structure of β-NTO Journal of Applied Crystallography, 2003, 36, 280-285 |
2300009 | CIF | C2 H8 N8 O4 | P -1 | 4.2928; 9.3043; 10.5438 85.236; 82.032; 81.19 | 411.326 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300010 | CIF | C2 H8 N8 O4 | P -1 | 4.3114; 9.3227; 10.5781 84.918; 81.686; 80.928 | 414.5 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300011 | CIF | C2 H8 N8 O4 | P -1 | 4.3312; 9.3456; 10.622 84.541; 81.285; 80.632 | 418.23 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300012 | CIF | C2 H8 N8 O4 | P -1 | 4.3535; 9.3742; 10.6783 84.072; 80.834; 80.273 | 422.73 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300013 | CIF | C2 H8 N8 O4 | P -1 | 4.3738; 9.4027; 10.7433 83.518; 80.343; 79.867 | 427.18 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300014 | CIF | C2 H9 N11 O8 | C 1 2/c 1 | 11.6824; 8.145; 13.0023 90; 117.407; 90 | 1098.34 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300015 | CIF | C2 H9 N11 O8 | C 1 2/c 1 | 11.7008; 8.1485; 13.0111 90; 117.337; 90 | 1101.99 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300016 | CIF | C2 H9 N11 O8 | C 1 2/c 1 | 11.7551; 8.1557; 13.0302 90; 117.005; 90 | 1113.01 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300017 | CIF | C2 H9 N11 O8 | C 1 2/c 1 | 11.7973; 8.1492; 13.0286 90; 116.639; 90 | 1119.59 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300018 | CIF | C2 H9 N11 O8 | C 1 2/c 1 | 11.8391; 8.1392; 13.0265 90; 116.225; 90 | 1126.04 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300019 | CIF | C4 H18 N22 O16 | C 1 2/c 1 | 11.8959; 8.1349; 13.0359 90; 115.806; 90 | 1135.7 | Bolotina, Nadezhda B.; Hardie, Michaele J.; Pinkerton, A. Alan Energetic materials: variable-temperature crystal structures of two biguanidinium dinitramides Journal of Applied Crystallography, 2003, 36, 1334-1341 |
2300020 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 13.2272; 8.1692; 14.892 90; 109.164; 90 | 1520 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300021 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 13.167; 8.1676; 14.8436 90; 109.001; 90 | 1509.34 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300022 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 13.1156; 8.1713; 14.8059 90; 108.841; 90 | 1501.75 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300023 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 13.0698; 8.1737; 14.7718 90; 108.696; 90 | 1494.78 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300024 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 13.0342; 8.1773; 14.7465 90; 108.566; 90 | 1489.95 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300025 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 8.8628; 12.5928; 13.3947 90; 106.92; 90 | 1430.2 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300026 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 8.8408; 12.5622; 13.3577 90; 106.82; 90 | 1420 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300027 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 8.8212; 12.5368; 13.333 90; 106.74; 90 | 1412 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300028 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 8.8004; 12.4992; 13.2985 90; 106.622; 90 | 1401.7 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300029 | CIF | C6 H6 N12 O12 | P 1 21/n 1 | 8.791; 12.481; 13.285 90; 106.55; 90 | 1397.2 | Journal of Applied Crystallography, 2004, 37, 791-797 |
2300030 | CIF | Fe Ni0.5 O4 P | P 1 21/c 1 | 5.98709; 4.72008; 10.357 90; 90.8913; 90 | 292.649 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300031 | CIF | Fe Ni0.5 O4 P | P 1 21/c 1 | 5.987146; 4.720383; 10.35681 90; 90.8902; 90 | 292.665 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300032 | CIF | Fe Ni0.5 O4 P | P 1 21/c 1 | 5.98729; 4.71923; 10.35671 90; 90.8886; 90 | 292.598 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300033 | CIF | Fe3 O8 P2 | P 1 21/c 1 | 8.8828; 11.1738; 6.14402 90; 99.348; 90 | 601.72 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300034 | CIF | Fe2 O7 P2 | C -1 | 6.643; 8.447; 4.495 90.43; 103.8; 92.49 | 244.7 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300035 | CIF | Fe Ni0.5 O4 P | P 1 21/c 1 | 5.98701; 4.719891; 10.35657 90; 90.8909; 90 | 292.621 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300036 | CIF | Co0.5 Fe O4 P | P 1 21/c 1 | 5.98701; 4.719891; 10.35657 90; 90.8909; 90 | 292.621 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300037 | CIF | Cu0.5 Fe O4 P | P 1 21/c 1 | 5.98701; 4.719891; 10.35657 90; 90.8909; 90 | 292.621 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300038 | CIF | Ni3 O8 P2 | P 1 21/c 1 | 5.83104; 4.69778; 10.1098 90; 91.1288; 90 | 276.883 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300039 | CIF | Ni2 O7 P2 | B 21/c | 13.1459; 8.2711; 8.9714 90; 104.949; 90 | 942.5 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300040 | CIF | Fe Ni0.5 O4 P | P 1 21/c 1 | 5.994351; 4.724935; 10.369383 90; 90.891; 90 | 293.656 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Determination of the cation distribution in Fe~2~Ni(PO~4~)~2~ using isotopic substitution and powder neutron diffraction Journal of Applied Crystallography, 2003, 36, 1361-1367 |
2300041 | CIF | Ag7 Cl O12 | F m -3 m | 9.955; 9.955; 9.955 90; 90; 90 | 986.5 | Journal of Applied Crystallography, 2004, 37, 318-324 |
2300042 | CIF | C2 H4 O2 | P 1 21/n 1 | 3.9447; 13.028; 5.6407 90; 93.177; 90 | 289.44 | Dawson, Alice; Allan, David R.; Parsons, Simon; Ruf, Michael Use of a CCD diffractometer in crystal structure determinations at high pressure Journal of Applied Crystallography, 2004, 37, 410-416 |
2300043 | CIF | C19 H13 N5 O5 | P 1 21 1 | 11.72; 6.831; 11.045 90; 94.38; 90 | 881.7 | Chernyshev, Vladimir V.; Yatsenko, Alexandr V.; Kuvshinov, Alexandr M.; Shevelev, Svyatoslav A. Unexpected molecular structure from laboratory powder diffraction data Journal of Applied Crystallography, 2002, 35, 669-673 |
2300044 | CIF | C21 H17 N5 O7 | P 21 21 21 | 22.788; 13.018; 6.92 90; 90; 90 | 2052.8 | Chernyshev, Vladimir V.; Yatsenko, Alexandr V.; Kuvshinov, Alexandr M.; Shevelev, Svyatoslav A. Unexpected molecular structure from laboratory powder diffraction data Journal of Applied Crystallography, 2002, 35, 669-673 |
2300045 | CIF | C20 H15 N5 O5 | P 1 21/c 1 | 8.676; 18.56; 12.098 90; 90.38; 90 | 1948.1 | Chernyshev, Vladimir V.; Yatsenko, Alexandr V.; Kuvshinov, Alexandr M.; Shevelev, Svyatoslav A. Unexpected molecular structure from laboratory powder diffraction data Journal of Applied Crystallography, 2002, 35, 669-673 |
2300046 | CIF | C6 H14 O6 | P 21 21 2 | 24.30122; 20.57261; 4.86719 90; 90; 90 | 2433.3 | Rukiah, Mwaffak; Lefebvre, Jacques; Hernandez, Olivier; van Beek, Wouter; Serpelloni, Michel Ab initiostructure determination of the Γ form of D-sorbitol (D-glucitol) by powder synchrotron X-ray diffraction Journal of Applied Crystallography, 2004, 37, 766-772 |
2300047 | CIF HKL | C18 H18 Fe O | C 1 2 1 | 29.033; 5.943; 16.753 90; 90.562; 90 | 2890.5 | T. Koganezawa; K. Uno; H. Iwasaki; N. Nakamura; Y. Yoshimura; T. Shoji A wide-bandpass multilayer monochromator and its application to the determination of absolute structure Journal of Applied Crystallography, 2004, 37, 136-142 |
2300048 | CIF HKL | C18 H18 Fe O | C 1 2 1 | 29.042; 5.946; 16.753 90; 90.587; 90 | 2892.8 | T. Koganezawa; K. Uno; H. Iwasaki; N. Nakamura; Y. Yoshimura; T. Shoji A wide-bandpass multilayer monochromator and its application to the determination of absolute structure Journal of Applied Crystallography, 2004, 37, 136-142 |
2300049 | CIF | Ce0.4 Gd0.6 O1.7 | I a -3 | 10.8542; 10.8542; 10.8542 90; 90; 90 | 1278.77 | V. Grover; S. N. Achary; A. K. Tyagi Structural analysis of excess-anion C-type rare earth oxide: a case study with Gd~1{-~<i>x</i>}Ce~<i>x~</i>O~1.5+<i>x~/2</i> (<i>x</i> = 0.20 and 0.40) Journal of Applied Crystallography, 2003, 36, 1082-1084 |
2300050 | CIF | Ce0.2 Gd0.8 O1.6 | I a -3 | 10.8488; 10.8488; 10.8488 90; 90; 90 | 1276.87 | V. Grover; S. N. Achary; A. K. Tyagi Structural analysis of excess-anion C-type rare earth oxide: a case study with Gd~1{-~<i>x</i>}Ce~<i>x~</i>O~1.5+<i>x~/2</i> (<i>x</i> = 0.20 and 0.40) Journal of Applied Crystallography, 2003, 36, 1082-1084 |
2300051 | CIF | C24 H48 B2 F8 N24 Zn | R -3 :H | 10.8429; 10.8429; 31.607 90; 90; 120 | 3218.1 | Hartmunt Spiering; Philipp Gutlich The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~ Journal of Applied Crystallography, 2004, 37, 589-595 |
2300052 | CIF | C24 H48 B2 F8 Fe N24 | R -3 :H | 10.881; 10.881; 31.48 90; 90; 120 | 3227.8 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~ Journal of Applied Crystallography, 2004, 37, 589-595 |
2300053 | CIF | C24 H48 B2 F8 Fe N24 | R -3 :H | 10.701; 10.701; 31.9 90; 90; 120 | 3163.5 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~ Journal of Applied Crystallography, 2004, 37, 589-595 |
2300054 | CIF | C24 H48 B2 F8 Fe0.46 N24 Zn0.54 | R -3 :H | 10.8575; 10.8575; 31.56 90; 90; 120 | 3222 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~ Journal of Applied Crystallography, 2004, 37, 589-595 |
2300055 | CIF | C24 H48 B2 F8 Fe0.46 N24 Zn0.54 | R -3 :H | 10.7719; 10.7719; 31.763 90; 90; 120 | 3191.8 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp The deformation tensor ε of the spin transition in the mixed crystal [Fe~0.46~Zn~0.54~(ptz)~6~](BF~4~)~2~ Journal of Applied Crystallography, 2004, 37, 589-595 |
2300056 | CIF | O Pb Sc Ta | F m -3 m | 8.15231; 8.15231; 8.15231 90; 90; 90 | 541.804 | Woodward, P. M.; Baba-Kishi, K. Z. Crystal structures of the relaxor oxide Pb~2~(ScTa)O~6~ in the paraelectric and ferroelectric states Journal of Applied Crystallography, 2002, 35, 233-242 |
2300057 | CIF | C32 H53 N3 O6 | ?P? | 61.0155; 11.1836; 5.0827 90; 90; 90 | 3468.3 | Brenner, Simon; McCusker, Lynne B.; Baerlocher, Christian The application of structure envelopes in structure determination from powder diffraction data Journal of Applied Crystallography, 2002, 35, 243-252 |
2300058 | CIF | C8 H15 N7 O2 S3 | P 1 21/c 1 | 17.6547; 5.2932; 18.259 90; 123.558; 90 | 1421.91 | Shankland, Kenneth; McBride, Lorraine; David, William I. F.; Shankland, Norman; Steele, Gerald Molecular, crystallographic and algorithmic factors in structure determination from powder diffraction data by simulated annealing Journal of Applied Crystallography, 2002, 35, 443-454 |
2300059 | CIF | C14 H11 Cl2 N O2 | C 1 2/c 1 | 20.2906; 6.9952; 20.1137 90; 109.663; 90 | 2688.4 | Muangsin, Nongnuj; Prajuabsook, Malee; Chimsook, Pitiporn; Chantarasiri, Nuanphun; Siraleartmukul, Krisana; Chaichit, Narongsak; Hannongbua, Supot Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data Journal of Applied Crystallography, 2004, 37, 288-294 |
2300060 | CIF | C14 H11 Cl2 N O2 | C 1 2/c 1 | 20.298; 6.993; 20.107 90; 109.6; 90 | 2688.7 | Muangsin, Nongnuj; Prajuabsook, Malee; Chimsook, Pitiporn; Chantarasiri, Nuanphun; Siraleartmukul, Krisana; Chaichit, Narongsak; Hannongbua, Supot Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data Journal of Applied Crystallography, 2004, 37, 288-294 |
2300061 | CIF | C Fe3 | P n m a | 5.08493; 6.73631; 4.514 90; 90; 90 | 154.621 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600 K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300062 | CIF | C Fe3 | P n m a | 5.08524; 6.7362; 4.51431 90; 90; 90 | 154.638 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600 K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300063 | CIF | C Fe3 | P n m a | 5.08475; 6.7367; 4.51394 90; 90; 90 | 154.622 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600 K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300064 | CIF | C Fe3 | P n m a | 5.08442; 6.7376; 4.51384 90; 90; 90 | 154.63 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300065 | CIF | C Fe3 | P n m a | 5.08429; 6.7387; 4.51363 90; 90; 90 | 154.644 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300066 | CIF | C Fe3 | P n m a | 5.08412; 6.7404; 4.51364 90; 90; 90 | 154.678 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300067 | CIF | C Fe3 | P n m a | 5.08394; 6.7418; 4.51359 90; 90; 90 | 154.703 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300068 | CIF | C Fe3 | P n m a | 5.08396; 6.7433; 4.51368 90; 90; 90 | 154.741 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300069 | CIF | C Fe3 | P n m a | 5.08416; 6.7453; 4.51394 90; 90; 90 | 154.802 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300070 | CIF | C Fe3 | P n m a | 5.084; 6.7469; 4.51405 90; 90; 90 | 154.838 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300071 | CIF | C Fe3 | P n m a | 5.08411; 6.7483; 4.51457 90; 90; 90 | 154.891 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300072 | CIF | C Fe3 | P n m a | 5.08426; 6.7498; 4.51509 90; 90; 90 | 154.948 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300073 | CIF | C Fe3 | P n m a | 5.0843; 6.7513; 4.51556 90; 90; 90 | 154.999 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300074 | CIF | C Fe3 | P n m a | 5.0842; 6.753; 4.51621 90; 90; 90 | 155.058 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300075 | CIF | C Fe3 | P n m a | 5.08398; 6.7547; 4.5165 90; 90; 90 | 155.1 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300076 | CIF | C Fe3 | P n m a | 5.08395; 6.7558; 4.51728 90; 90; 90 | 155.151 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300077 | CIF | C Fe3 | P n m a | 5.08369; 6.7574; 4.51789 90; 90; 90 | 155.201 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300078 | CIF | C Fe3 | P n m a | 5.0837; 6.7589; 4.51839 90; 90; 90 | 155.253 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300079 | CIF | C Fe3 | P n m a | 5.08334; 6.7599; 4.51926 90; 90; 90 | 155.295 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300080 | CIF | C Fe3 | P n m a | 5.08324; 6.7615; 4.51937 90; 90; 90 | 155.332 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300081 | CIF | C Fe3 | P n m a | 5.08247; 6.7626; 4.52013 90; 90; 90 | 155.36 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300082 | CIF | C Fe3 | P n m a | 5.08223; 6.7638; 4.52058 90; 90; 90 | 155.396 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300083 | CIF | C Fe3 | P n m a | 5.08134; 6.7655; 4.52039 90; 90; 90 | 155.401 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300084 | CIF | C Fe3 | P n m a | 5.08071; 6.767; 4.52047 90; 90; 90 | 155.419 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300085 | CIF | C Fe3 | P n m a | 5.08104; 6.7689; 4.52139 90; 90; 90 | 155.504 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300086 | CIF | C Fe3 | P n m a | 5.08233; 6.7704; 4.52219 90; 90; 90 | 155.606 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300087 | CIF | C Fe3 | P n m a | 5.08326; 6.7732; 4.52326 90; 90; 90 | 155.736 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300088 | CIF | C Fe3 | P n m a | 5.08468; 6.7749; 4.52433 90; 90; 90 | 155.855 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300089 | CIF | C Fe3 | P n m a | 5.08644; 6.7772; 4.52559 90; 90; 90 | 156.005 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300090 | CIF | C Fe3 | P n m a | 5.08801; 6.7791; 4.52694 90; 90; 90 | 156.144 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300091 | CIF | C Fe3 | P n m a | 5.0899; 6.781; 4.52797 90; 90; 90 | 156.281 | Wood, I. G.; Vočadlo, Lidunka; Knight, K. S.; Dobson, David P.; Marshall, W. G.; Price, G. David; Brodholt, John Thermal expansion and crystal structure of cementite, Fe~3~C, between 4 and 600K determined by time-of-flight neutron powder diffraction Journal of Applied Crystallography, 2004, 37, 82-90 |
2300092 | CIF | Al Ca O5 Ta | P 1 21/n 1 | 6.6298; 8.9515; 7.3502 90; 113.792; 90 | 399.139 | Malcherek, Thomas; Borowski, Markus; Bosenick, Anne Structure and phase transitions of CaTaOAlO~4~ Journal of Applied Crystallography, 2004, 37, 117-122 |
2300093 | CIF | C20 H30 Cl2 Fe N6 O | P 1 21/c 1 | 10.8041; 21.6945; 11.395 90; 117.33; 90 | 2372.7 | Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation Journal of Applied Crystallography, 2005, 38, 528-536 |
2300094 | CIF | C20 H30 Cl2 Fe N6 O | P 1 21/c 1 | 10.7098; 21.5711; 11.356 90; 116.62; 90 | 2345.4 | Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation Journal of Applied Crystallography, 2005, 38, 528-536 |
2300095 | CIF | C20 H30 Cl2 Fe N6 O | P 1 21/c 1 | 10.9348; 21.9329; 11.484 90; 117.59; 90 | 2441 | Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation Journal of Applied Crystallography, 2005, 38, 528-536 |
2300096 | CIF | C20 H30 Cl2 Fe N6 O | P 1 21/c 1 | 10.7322; 21.5055; 11.323 90; 117.184; 90 | 2324.7 | Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation Journal of Applied Crystallography, 2005, 38, 528-536 |
2300097 | CIF | C40 H60 Cl4 Fe2 N12 O2 | P 1 21/n 1 | 21.608; 21.6945; 11.395 90; 117.33; 90 | 4745 | Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation Journal of Applied Crystallography, 2005, 38, 528-536 |
2300098 | CIF | C20 H30 Cl2 Fe N6 O | P 1 21/c 1 | 10.949; 21.825; 11.37 90; 118.85; 90 | 2379.8 | Kusz, Joachim; Schollmeyer, Dieter; Spiering, Hartmunt; Gütlich, Philipp The LIESST state of [Fe(pic)~3~]Cl~2~.EtOH ‒ the superstructure under continuous irradiation Journal of Applied Crystallography, 2005, 38, 528-536 |
2300099 | CIF | K O8 W2 Yb | C 1 2/c 1 | 10.59; 10.29; 7.478 90; 130.7; 90 | 617.8 | M.C. Pujol; X. Mateos; R. Solé; J. Massons; Jna. Gavaldà; X. Solans; F. Diaz; M. Aguiló Structure, crystal growth and physical anisotropy of KYb(WO~4~)~2~, a new laser matrix Journal of Applied Crystallography, 2002, 35, 108-112 |
2300100 | CIF | C7 H9 N | P 1 21/c 1 | 24.8727; 5.80729; 8.7615 90; 100.062; 90 | 1246.07 | Lefebvre, Jacques; Descamps, Marc; Hemon, Stephanie; Dzyabchenko, Alexander Ab initio structure determination of meta-toluidine by powder X-ray diffraction Journal of Applied Crystallography, 2004, 37, 464-471 |
2300101 | CIF | Al2 Eu0.136 O4 Sr0.864 | P 63 2 2 | 5.11635; 5.11635; 8.3673 90; 90; 120 | 189.687 | Chao-Nan, Xu; Wen-Sheng Shi Observation of orientational disorder in the hexagonal stuffed tridymite Sr~0.864~Eu~0.136~Al~2~O~4~ by the maximum-entropy method Journal of Applied Crystallography, 2004, 37, 698-702 |
2300102 | CIF | C18 H15 O3 P | R -3 :H | 37.766; 37.766; 5.7286 90; 90; 120 | 7075.9 | Hernandez, Olivier; Hédoux, Alain; Lefebvre, Jacques; Guinet, Yannick; Descamps, Marc; Papoular, Robert; Masson, Olivier <i>Ab</i> <i>initio</i> structure determination of triphenyl phosphite by powder synchrotron X-ray diffraction Journal of Applied Crystallography, 2002, 35, 212-219 |
2300103 | CIF | C18 H22 Cu N8 O6 S2 | P 1 21/n 1 | 20.695; 8.054; 15.157 90; 112.09; 90 | 2340.9 | García-Cuesta, M. C.; Lozano, A. M.; Meléndez-Martínez, J. J.; Luna-Giles, F.; Ortiz, A. L.; González-Méndez, L. M.; Cumbrera, F. L. Structure determination of nitrato-κ<i>O</i>-bis[2-(2-pyridyl-κ<i>N</i>)amino-5,6-dihydro-4<i>H</i>-1,3-thiazine-κ<i>N</i>]copper(II) nitrate <i>via</i> molecular modelling coupled with X-ray powder diffractometry Journal of Applied Crystallography, 2004, 37, 993-999 |
2300110 | CIF Paper | ? | P 6/m m m | 30.960745; 30.960745; 7.519782 90; 90; 120 | 6242.5 | Foster, M. D.; Treacy, M. M. J.; Higgins, J. B.; Rivin, I.; Balkovsky, E.; Randall, K. H. A systematic topological search for the framework of ZSM-10 Journal of Applied Crystallography, 2005, 38, 1028-1030 |
2300111 | CIF | In2 Mn0.4 S4 Zn0.6 | R 3 m :H | 3.875218; 3.875218; 37.20846 90; 90; 120 | 483.91 | Ávila-Godoy, Rosario; Mora, Asiloé J.; Acosta-Najarro, Dwight R.; Delgado, Gerzon E.; López-Rivera, Santos A.; Fitch, Andrew N.; Mora, Andrés E.; Steeds, John W. Structure of the quaternary alloy Zn~0.6~Mn~0.4~In~2~S~4~ from synchrotron powder diffraction and electron transmission microscopy Journal of Applied Crystallography, 2006, 39, 1-5 |
2300112 | CIF Paper | O Zn | P 63 m c | 3.2494; 3.2494; 5.2054 90; 90; 120 | 47.598 | Sowa, Heidrun; Ahsbahs, Hans High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape Journal of Applied Crystallography, 2006, 39, 169-175 |
2300113 | CIF Paper | O Zn | P 63 m c | 3.2342; 3.2342; 5.1772 90; 90; 120 | 46.899 | Sowa, Heidrun; Ahsbahs, Hans High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape Journal of Applied Crystallography, 2006, 39, 169-175 |
2300114 | CIF Paper | O Zn | P 63 m c | 3.219; 3.219; 5.1489 90; 90; 120 | 46.205 | Sowa, Heidrun; Ahsbahs, Hans High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape Journal of Applied Crystallography, 2006, 39, 169-175 |
2300115 | CIF Paper | O Zn | P 63 m c | 3.2049; 3.2049; 5.1216 90; 90; 120 | 45.558 | Sowa, Heidrun; Ahsbahs, Hans High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape Journal of Applied Crystallography, 2006, 39, 169-175 |
2300116 | CIF Paper | O Zn | P 63 m c | 3.195; 3.195; 5.1027 90; 90; 120 | 45.11 | Sowa, Heidrun; Ahsbahs, Hans High-pressure X-ray investigation of zincite ZnO single crystals using diamond anvils with an improved shape Journal of Applied Crystallography, 2006, 39, 169-175 |
2300117 | CIF Paper | K Lu O8 W2 | C 1 2/c 1 | 10.576; 10.214; 7.487 90; 130.68; 90 | 613.3 | Pujol, M. C.; Mateos, X.; Aznar, A.; Solans, X.; Suriñach, S.; Massons, J.; Díaz, F.; Aguiló, M. Structural redetermination, thermal expansion and refractive indices of KLu(WO~4~)~2~ Journal of Applied Crystallography, 2006, 39, 230-236 |
2300118 | CIF Paper | C H5 Cl Mg2 O6 | R 3 c :H | 23.14422; 23.14422; 7.22333 90; 90; 120 | 3350.84 | Sugimoto, Kunihisa; Dinnebier, Robert E.; Schlecht, Thomas Chlorartinite, a volcanic exhalation product also found in industrial magnesia screed Journal of Applied Crystallography, 2006, 39, 739-744 |
2300119 | CIF Paper | ? | P 21 21 21 | 6.88; 11.91; 18.6 90; 90; 90 | 1524.1 | Immirzi, Attilio; Alfano, Davide; Tedesco, Consiglia New solutions to the problems of chain orientation and chain continuity in structure analysis of fibrous polymers. A reconsideration of the structure of polyisobutene Journal of Applied Crystallography, 2007, 40, 10-15 |
2300120 | CIF HKL Paper | C24 H22 Fe2 N12 S8 | P -1 | 8.446; 9.123; 11.779 72.26; 80.94; 67.33 | 796.8 | Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches Journal of Applied Crystallography, 2007, 40, 158-164 |
2300121 | CIF HKL Paper | C24 H22 Fe2 N12 S8 | P -1 | 8.6103; 9.2628; 11.9305 72.903; 80.057; 66.911 | 834.84 | Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches Journal of Applied Crystallography, 2007, 40, 158-164 |
2300122 | CIF HKL Paper | C24 H22 Fe2 N12 S8 | P -1 | 8.727; 9.385; 12.041 73.04; 79.43; 66.6 | 863.1 | Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches Journal of Applied Crystallography, 2007, 40, 158-164 |
2300123 | CIF HKL Paper | C24 H22 Fe2 N12 S8 | P -1 | 8.581; 9.196; 11.948 73.34; 80.53; 67.24 | 831.4 | Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches Journal of Applied Crystallography, 2007, 40, 158-164 |
2300124 | CIF HKL Paper | C24 H22 Fe2 N12 S8 | P -1 | 8.642; 9.224; 12.05 73.63; 80.29; 67.25 | 848 | Trzop, Elzbieta; Buron-Le Cointe, Marylise; Cailleau, Hervé; Toupet, Loïc; Molnar, Gabor; Bousseksou, Azzedine; Gaspar, Ana B.; Real, José Antonio; Collet, Eric Structural investigation of the photoinduced spin conversion in the dinuclear compound {[Fe(bt)(NCS)~2~]~2~(bpym)}: toward controlled multi-stepped molecular switches Journal of Applied Crystallography, 2007, 40, 158-164 |
2300125 | CIF HKL | C20 H17 F O3 S | P 1 21/c 1 | 12.68581; 8.18939; 17.7934 90; 106.011; 90 | 1776.83 | Llinàs, Antonio; Box, Karl J.; Burley, Jonathan C.; Glen, Robert C.; Goodman, Jonathan M. A new method for the reproducible generation of polymorphs: two forms of sulindac with very different solubilities Journal of Applied Crystallography, 2007, 40, 379-381 |
2300126 | CIF HKL Paper | C20 H14 N2 O | I 41/a :2 | 21.5111; 21.5111; 13.2377 90; 90; 90 | 6125.4 | Zeng, He-Ping; Wang, Ting-Ting; Xu, Dan-Feng; Cai, Yue-Peng; Chen, Dong-Feng Synthesis, crystal structure and biological activity of 2-[2-(quinolin-2-yl)vinyl]-8-hydroxyquinoline and 2-[2-(quinolin-4-yl)vinyl]-8-hydroxyquinoline Journal of Applied Crystallography, 2007, 40, 471-475 |
2300127 | CIF HKL Paper | C20 H14 N2 O | P 1 21/n 1 | 10.724; 8.9019; 16.1894 90; 102.039; 90 | 1511.51 | Zeng, He-Ping; Wang, Ting-Ting; Xu, Dan-Feng; Cai, Yue-Peng; Chen, Dong-Feng Synthesis, crystal structure and biological activity of 2-[2-(quinolin-2-yl)vinyl]-8-hydroxyquinoline and 2-[2-(quinolin-4-yl)vinyl]-8-hydroxyquinoline Journal of Applied Crystallography, 2007, 40, 471-475 |
2300128 | CIF Paper | Mg O4 S | C m c m | 5.174713; 7.87563; 6.49517 90; 90; 90 | 264.705 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S. Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction Journal of Applied Crystallography, 2007, 40, 761-770 |
2300129 | CIF Paper | Mg O4 S | C m c m | 5.168629; 7.86781; 6.46674 90; 90; 90 | 262.975 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S. Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction Journal of Applied Crystallography, 2007, 40, 761-770 |
2300130 | CIF Paper | Mg O4 S | P b n m | 4.74599; 8.5831; 6.70934 90; 90; 90 | 273.307 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S. Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction Journal of Applied Crystallography, 2007, 40, 761-770 |
2300131 | CIF Paper | Mg O4 S | P b n m | 4.73431; 8.58171; 6.67266 90; 90; 90 | 271.1 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Brand, H. E. A.; Knight, K. S. Crystal structures and thermal expansion of α-MgSO~4~ and β-MgSO~4~ from 4.2 to 300K by neutron powder diffraction Journal of Applied Crystallography, 2007, 40, 761-770 |
2300132 | CIF Paper | C40 H48 O8 | P 41 21 2 | 6.8558; 6.8558; 16.9375 90; 90; 90 | 796.096 | Brunelli, Michela; Neumann, Marcus A.; Fitch, Andrew N.; Mora, Asiloé J. Temperature phase changes in solid bicyclo[3.3.1]nonane-2,6-dione and bicyclo[3.3.1]nonane-3,7-dione from powder X-ray diffraction data Journal of Applied Crystallography, 2007, 40, 702-709 |
2300133 | CIF Paper | C34 H48 O8 | C 1 2/c 1 | 7.3803; 10.382; 9.7508 90; 95.359; 90 | 743.863 | Brunelli, Michela; Neumann, Marcus A.; Fitch, Andrew N.; Mora, Asiloé J. Temperature phase changes in solid bicyclo[3.3.1]nonane-2,6-dione and bicyclo[3.3.1]nonane-3,7-dione from powder X-ray diffraction data Journal of Applied Crystallography, 2007, 40, 702-709 |
2300134 | CIF Paper | ? | P -3 m 1 | 5.7523; 5.7523; 7.0634 90; 90; 120 | 202.408 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300135 | CIF | ? | P m -3 m | 4.07307; 4.07307; 4.07307 90; 90; 90 | 67.572 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300136 | CIF | ? | P -3 m 1 | 5.7657; 5.7657; 7.0444 90; 90; 120 | 202.81 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300137 | CIF | ? | P m -3 m | 4.07013; 4.07013; 4.07013 90; 90; 90 | 67.426 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300138 | CIF | ? | P -3 m 1 | 5.7532; 5.7532; 7.0641 90; 90; 120 | 202.491 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300139 | CIF | ? | P m -3 m | 4.07348; 4.07348; 4.07348 90; 90; 90 | 67.592 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300140 | CIF | ? | P -3 m 1 | 5.7675; 5.7675; 7.0567 90; 90; 120 | 203.29 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300141 | CIF | ? | P m -3 m | 4.0712; 4.0712; 4.0712 90; 90; 90 | 67.479 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300142 | CIF | ? | P -3 m 1 | 5.7893; 5.7893; 7.1158 90; 90; 120 | 206.54 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300143 | CIF | ? | P m -3 m | 4.07045; 4.07045; 4.07045 90; 90; 90 | 67.442 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300144 | CIF | ? | P -3 m 1 | 5.7665; 5.7665; 7.058 90; 90; 120 | 203.25 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300145 | CIF | ? | P m -3 m | 4.093113; 4.093113; 4.093113 90; 90; 90 | 68.5743 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300146 | CIF | ? | P m -3 m | 4.09518; 4.09518; 4.09518 90; 90; 90 | 68.678 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300147 | CIF | ? | P m -3 m | 4.07207; 4.07207; 4.07207 90; 90; 90 | 67.5221 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300148 | CIF | ? | P -3 m 1 | 5.74601; 5.74601; 7.06047 90; 90; 120 | 201.882 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300149 | CIF | ? | P -3 m 1 | 5.762; 5.762; 7.0764 90; 90; 120 | 203.46 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300150 | CIF | ? | P -3 m 1 | 5.7645; 5.7645; 7.092 90; 90; 120 | 204.09 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300151 | CIF | ? | P m -3 m | 4.06541; 4.06541; 4.06541 90; 90; 90 | 67.1913 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300152 | CIF | ? | P m -3 m | 4.06857; 4.06857; 4.06857 90; 90; 90 | 67.348 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300153 | CIF | ? | P m -3 m | 4.07191; 4.07191; 4.07191 90; 90; 90 | 67.514 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300154 | CIF | ? | P -3 m 1 | 5.7654; 5.7654; 7.091 90; 90; 120 | 204.13 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300155 | CIF | ? | P -3 m 1 | 5.74666; 5.74666; 7.05943 90; 90; 120 | 201.898 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300156 | CIF | ? | P -3 m 1 | 5.7462; 5.7462; 7.05894 90; 90; 120 | 201.851 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300158 | CIF | ? | P m -3 m | 4.06839634; 4.06839634; 4.06839634 90; 90; 90 | 67.339 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300159 | CIF | ? | P m -3 m | 4.066; 4.066; 4.066 90; 90; 90 | 67.2206 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300160 | CIF | ? | P -3 m 1 | 5.7981; 5.7981; 11.7947 90; 90; 120 | 343.39 | Cernik, R. J.; Barwick, M.; Azough, F.; Freer, R. A synchrotron X-ray study of structural ordering in~the microwave dielectric ceramic system: Ba(Ni~1/3~Nb~2/3~)O~3~‒Ba(Zn~1/3~Nb~2/3~)O~3~ Journal of Applied Crystallography, 2007, 40, 749-755 |
2300161 | CIF Paper | Mn O3 Y | P 63 c m | 6.22215; 6.22215; 11.37072 90; 90; 120 | 381.241 | Jeong, Il-Kyoung; Hur, N.; Proffen, Th. High-temperature structural evolution of hexagonal multiferroic YMnO~3~ and YbMnO~3~ Journal of Applied Crystallography, 2007, 40, 730-734 |
2300162 | CIF Paper | Mn O3 Y | P 63/m m c | 3.63011; 3.63011; 11.3535 90; 90; 120 | 129.569 | Jeong, Il-Kyoung; Hur, N.; Proffen, Th. High-temperature structural evolution of hexagonal multiferroic YMnO~3~ and YbMnO~3~ Journal of Applied Crystallography, 2007, 40, 730-734 |
2300163 | CIF Paper | Mn O3 Yb | P 63 c m | 6.132019; 6.132019; 11.38556 90; 90; 120 | 370.759 | Jeong, Il-Kyoung; Hur, N.; Proffen, Th. High-temperature structural evolution of hexagonal multiferroic YMnO~3~ and YbMnO~3~ Journal of Applied Crystallography, 2007, 40, 730-734 |
2300164 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.1545; 19.0923; 15.0033 90; 91.566; 90 | 2907.64 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300165 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.1834; 19.072; 15.0304 90; 91.467; 90 | 2918.21 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300166 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.1952; 19.0901; 15.0429 90; 91.451; 90 | 2926.8 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300167 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.2122; 19.1179; 15.0573 90; 91.42; 90 | 2938.82 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300168 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.2327; 19.1464; 15.0753 90; 91.402; 90 | 2952.7 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300169 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.2747; 19.2019; 15.1011 90; 91.399; 90 | 2978.46 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300170 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.3663; 19.2603; 15.1373 90; 91.432; 90 | 3021.34 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300171 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.4678; 19.3228; 15.1695 90; 91.501; 90 | 3067.2 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300172 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.529; 19.3683; 15.1933 90; 91.541; 90 | 3097.2 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300173 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.5677; 19.4022; 15.2137 90; 91.564; 90 | 3118.2 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300174 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.6005; 19.4289; 15.2382 90; 91.595; 90 | 3137.2 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300175 | CIF | C27 H33 Cl2 Fe N7 O8 | P 1 21/c 1 | 10.6286; 19.4535; 15.2589 90; 91.626; 90 | 3153.7 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300176 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.3736; 19.1884; 15.1122 90; 91.885; 90 | 3006.5 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300177 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.4189; 19.2284; 15.1216 90; 91.726; 90 | 3028.07 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300178 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.4611; 19.2701; 15.132 90; 91.596; 90 | 3049.22 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300179 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.507; 19.3169; 15.1467 90; 91.492; 90 | 3073.2 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300180 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.5321; 19.3391; 15.1543 90; 91.468; 90 | 3085.63 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300181 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.5561; 19.3641; 15.1621 90; 91.441; 90 | 3098.3 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300182 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.5813; 19.3933; 15.1756 90; 91.429; 90 | 3113.16 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300183 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.625; 19.456; 15.22 90; 91.5; 90 | 3145.2 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300184 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.6308; 19.4519; 15.213 90; 91.451; 90 | 3144.9 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300185 | CIF | C27 H33 Cl2 N7 O8 Zn | P 1 21/c 1 | 10.6541; 19.4812; 15.2306 90; 91.478; 90 | 3160.1 | Seredyuk, Maksym; Gaspar, Ana B.; Kusz, Joachim; Bednarek, Gabriela; Gütlich, Philipp Variable-temperature X-ray crystal structure determinations of {Fe[tren(6-Mepy)~3~]}(ClO~4~)~2~ and {Zn[tren(6-Mepy)~3~]}(ClO~4~)~2~ compounds: correlation of the structural data with magnetic and Mössbauer spectroscopy data Journal of Applied Crystallography, 2007, 40, 1135-1145 |
2300186 | CIF HKL Paper | C26 H16 Fe N6 S2 | P b c n | 13.1928; 9.9503; 17.1498 90; 90; 90 | 2251.29 | Legrand, Vincent; Pillet, Sébastien; Weber, Hans-Peter; Souhassou, Mohamed; Létard, Jean-François; Guionneau, Philippe; Lecomte, Claude On the precision and accuracy of structural analysis of light-induced metastable states Journal of Applied Crystallography, 2007, 40, 1076-1088 |
2300187 | CIF HKL | C26 H16 Fe N6 S2 | P b c n | 13.185; 9.948; 17.135 90; 90; 90 | 2247.5 | Legrand, Vincent; Pillet, Sébastien; Weber, Hans-Peter; Souhassou, Mohamed; Létard, Jean-François; Guionneau, Philippe; Lecomte, Claude On the precision and accuracy of structural analysis of light-induced metastable states Journal of Applied Crystallography, 2007, 40, 1076-1088 |
2300188 | CIF HKL | C26 H16 Fe N6 S2 | P b c n | 12.762; 10.024; 17.09 90; 90; 90 | 2186.3 | Legrand, Vincent; Pillet, Sébastien; Weber, Hans-Peter; Souhassou, Mohamed; Létard, Jean-François; Guionneau, Philippe; Lecomte, Claude On the precision and accuracy of structural analysis of light-induced metastable states Journal of Applied Crystallography, 2007, 40, 1076-1088 |
2300189 | CIF | Al2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35 | C 1 2/m 1 | 5.189; 8.953; 10.129 90; 101.11; 90 | 461.796 | Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon Structural characterization of the clay mineral illite-1M Journal of Applied Crystallography, 2008, 41, 402-415 |
2300190 | CIF | Al2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35 | C 1 2/m 1 | 5.197; 8.961; 10.159 90; 100.97; 90 | 464.5 | Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon Structural characterization of the clay mineral illite-1M Journal of Applied Crystallography, 2008, 41, 402-415 |
2300191 | CIF | Al2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35 | C 1 2/m 1 | 5.1977; 9.014; 9.99 90; 100.95; 90 | 459.5 | Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon Structural characterization of the clay mineral illite-1M Journal of Applied Crystallography, 2008, 41, 402-415 |
2300192 | CIF | Al2.34 Ca0.02 Fe0.02 H4 K0.78 Mg0.34 Na0.02 O12 On Si3.35 | C 1 2/m 1 | 5.167; 8.983; 10.01 90; 100.5; 90 | 456.8 | Gualtieri, Alessandro F.; Ferrari, Simone; Leoni, Matteo; Grathoff, Georg; Hugo, Richard; Shatnawi, Mouath; Paglia, Gianluca; Billinge, Simon Structural characterization of the clay mineral illite-1M Journal of Applied Crystallography, 2008, 41, 402-415 |
2300193 | CIF Paper | C50 H64 O16 | I 1 2 1 | 21.1388; 9.1628; 24.5916 90; 98.1462; 90 | 4715.1 | Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto <i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method Journal of Applied Crystallography, 2008, 41, 292-301 |
2300194 | CIF Paper | C50 H64 O16 | I 1 2 1 | 21.0262; 9.1138; 24.3796 90; 98.3396; 90 | 4622.43 | Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto <i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method Journal of Applied Crystallography, 2008, 41, 292-301 |
2300195 | CIF Paper | C50 H64 O16 | I 1 2 1 | 20.9107; 9.0536; 24.2008 90; 98.9412; 90 | 4525.95 | Nishibori, Eiji; Ogura, Tadakatsu; Aoyagi, Shinobu; Sakata, Makoto <i>Ab initio</i> structure determination of a pharmaceutical compound, prednisolone succinate, from synchrotron powder data by combination of a genetic algorithm and the maximum entropy method Journal of Applied Crystallography, 2008, 41, 292-301 |
2300196 | CIF HKL Paper | Na O8 W2 Y0.95 Yb0.05 | I 41/a :2 | 5.2039; 5.2039; 11.2838 90; 90; 90 | 305.57 | Fan, Jiandong; Zhang, Huaijin; Yu, Wentao; Yu, Haohai; Wang, Jiyang; Jiang, Minhua A Yb^3+^-doped NaY(WO~4~)~2~ crystal grown by the Czochralski technique Journal of Applied Crystallography, 2008, 41, 584-591 |
2300197 | CIF HKL Paper | F7 K2 Ta | P n m a | 10.0731; 5.9456; 12.1527 90; 90; 90 | 727.83 | Smrčok, Ľubomír; Brunelli, Michela; Boča, Miroslav; Kucharík, Marian Structure of K~2~TaF~7~ at 993K: the combined use of synchrotron powder data and solid-state DFT calculations Journal of Applied Crystallography, 2008, 41, 634-636 |
2300198 | CIF Paper | ? | P -1 | 6.217; 6.985; 10.506 94.686; 100.568; 98.884 | 440.26 | Morgenroth, Wolfgang; Overgaard, Jacob; Clausen, Henrik F.; Svendsen, Helle; Jørgensen, Mads R. V.; Larsen, Finn K.; Iversen, Bo B. Helium cryostat synchrotron charge densities determined using a large CCD detector ‒ the upgraded beamline D3 at DESY Journal of Applied Crystallography, 2008, 41, 846-853 |
2300199 | CIF | Fe0.2 Mg0.8 O | F m -3 m | 4.19971; 4.19971; 4.19971 90; 90; 90 | 74.073 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
2300200 | CIF | Fe | I m -3 m | 2.8403; 2.84034; 2.84034 90; 90; 90 | 22.914 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
2300201 | CIF | Fe0.3 Mg0.7 O | F m -3 m | 4.1896; 4.18955; 4.18955 90; 90; 90 | 73.537 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
2300202 | CIF | Fe | I m -3 m | 2.8274; 2.8274; 2.8274 90; 90; 90 | 22.603 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
2300203 | CIF | O2 Zr | P 1 21/c 1 | 5.213; 4.967; 5.318 90; 100.16; 90 | 135.5 | Wood, Ian G.; Vočadlo, Lidunka; Dobson, David P.; Price, G. David; Fortes, A. D.; Cooper, Frances J.; Neale, J. W.; Walker, Andrew M.; Marshall, W. G.; Tucker, M. G.; Francis, D. J.; Stone, H. J.; McCammon, C. A. Thermoelastic properties of magnesiowüstite, (Mg~1{-~<i>x</i>}Fe~<i>x~</i>)O: determination of the Anderson‒Grüneisen parameter by time-of-flight neutron powder diffraction at simultaneous high pressures and temperatures Journal of Applied Crystallography, 2008, 41, 886-896 |
2300204 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8481; 6.359; 8.9 74.49; 83.9; 80.53 | 260.22 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
2300205 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8619; 6.377; 8.926 74.4; 83.93; 80.56 | 262.39 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
2300206 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8707; 6.3951; 8.9448 74.368; 83.786; 80.459 | 264.01 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
2300207 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8737; 6.4046; 8.9548 74.324; 83.751; 80.449 | 264.79 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
2300208 | CIF Paper | C7 H6 Cl N3 O4 S2 | P 1 | 4.8786; 6.4126; 8.9665 74.266; 83.693; 80.445 | 265.63 | Fernandes, P.; Shankland, K.; David, W. I. F.; Markvardsen, A. J.; Florence, A. J.; Shankland, N.; Leech, C. K. A differential thermal expansion approach to crystal structure determination from powder diffraction data Journal of Applied Crystallography, 2008, 41, 1089-1094 |
2300209 | CIF Paper | C46 H42 Fe O12 | P 1 21 1 | 5.857; 24.105; 14.069 90; 93.15; 90 | 1983.3 | Okabe, Takashi; Nakazaki, Keisuke; Igaue, Tsuyoshi; Nakamura, Naotake; Donnio, Bertrand; Guillon, Daniel; Gallani, Jean-Louis Synthesis and physical properties of ferrocene derivatives. XXI. Crystal structure of a liquid crystalline ferrocene derivative, 1,1'-bis[3-[4-(4-methoxyphenoxycarbonyl)phenoxy]propyloxycarbonyl]ferrocene Journal of Applied Crystallography, 2009, 42, 63-68 |
2300210 | CIF HKL Paper | C2 H2 Ca O5 | P 1 21/c 1 | 6.316; 14.541; 10.116 90; 109; 90 | 878.4 | Daudon, Michel; Bazin, Dominique; André, Gilles; Jungers, Paul; Cousson, Alain; Chevallier, Pierre; Véron, Emmanuel; Matzen, Guy Examination of whewellite kidney stones by scanning electron microscopy and powder neutron diffraction techniques Journal of Applied Crystallography, 2009, 42, 109-115 |
2300211 | CIF Paper | Lu2 O5 Si | I 1 2/a 1 | 10.255; 6.6465; 12.3626 90; 102.422; 90 | 822.91 | Cong, Hengjiang; Zhang, Huaijin; Wang, Jiyang; Yu, Wentao; Fan, Jiandong; Cheng, Xiufeng; Sun, Shangqian; Zhang, Jian; Lu, Qingming; Jiang, Chunjian; Boughton, Robert I. Structural and thermal properties of the monoclinic Lu~2~SiO~5~ single crystal: evaluation as a new laser matrix Journal of Applied Crystallography, 2009, 42, 284-294 |
2300212 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6696; 7.889; 10.7287 90; 99.427; 90 | 1224.85 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300213 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6712; 7.8893; 10.7288 90; 99.428; 90 | 1225.05 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300214 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6662; 7.8879; 10.7275 90; 99.432; 90 | 1224.23 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300215 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6689; 7.8884; 10.728 90; 99.429; 90 | 1224.61 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300216 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6682; 7.8889; 10.7276 90; 99.437; 90 | 1224.55 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300217 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6636; 7.8871; 10.7244 90; 99.417; 90 | 1223.6 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300218 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6703; 7.889; 10.7282 90; 99.429; 90 | 1224.84 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300219 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6698; 7.8878; 10.7265 90; 99.432; 90 | 1224.41 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300220 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.499; 7.7576; 10.6203 90; 99.741; 90 | 1177.3 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300221 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6706; 7.8885; 10.7284 90; 99.426; 90 | 1224.81 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300222 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6655; 7.8817; 10.724 90; 99.427; 90 | 1222.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300223 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.494; 7.7528; 10.6655 90; 99.875; 90 | 1180.7 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300224 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.673; 7.8892; 10.7316 90; 99.436; 90 | 1225.45 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300225 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.669; 7.8804; 10.7272 90; 99.439; 90 | 1223.3 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300226 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.528; 7.7695; 10.691 90; 99.89; 90 | 1188.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300227 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.67; 7.8886; 10.7304 90; 99.43; 90 | 1225 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300228 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.683; 7.86; 10.729 90; 99.456; 90 | 1221.4 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300229 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.88606; 9.38115; 7.10099 90; 115.701; 90 | 773.484 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300230 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.88559; 9.38013; 7.10096 90; 115.7; 90 | 773.38 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300231 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8865; 9.3822; 7.10147 90; 115.702; 90 | 773.65 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300232 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.89; 9.38466; 7.10325 90; 115.702; 90 | 774.26 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300233 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8863; 9.38162; 7.10158 90; 115.701; 90 | 773.61 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300234 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8871; 9.3824; 7.1018 90; 115.703; 90 | 773.73 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300235 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8905; 9.38488; 7.10342 90; 115.701; 90 | 774.32 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300236 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.887; 9.3819; 7.1015 90; 115.701; 90 | 773.66 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300237 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8858; 9.3812; 7.1013 90; 115.703; 90 | 773.5 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300238 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.889; 9.38347; 7.10271 90; 115.702; 90 | 774.04 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300239 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8856; 9.3812; 7.10114 90; 115.697; 90 | 773.5 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300240 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8844; 9.3824; 7.1025 90; 115.709; 90 | 773.6 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300241 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8887; 9.384; 7.1025 90; 115.702; 90 | 774.05 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300242 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.8869; 9.3833; 7.1022 90; 115.706; 90 | 773.82 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300243 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.656; 9.564; 7.236 90; 117.1; 90 | 779.7 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300244 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.885; 9.3862; 7.1008 90; 115.714; 90 | 773.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300245 | CIF Paper | C8 H9 N O2 | P 1 21/a 1 | 12.864; 9.354; 7.104 90; 115.83; 90 | 769.4 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300246 | CIF | Co Li O4 P | P n m a | 10.202; 5.918; 4.709 90; 90; 90 | 284.3 | Kimura, Tsunehisa; Chang, Chengkang; Kimura, Fumiko; Maeyama, Masataka The pseudo-single-crystal method: a third approach to crystal structure determination Journal of Applied Crystallography, 2009, 42, 535-537 |
2300247 | CIF | D | P 1 21/n 1 | 7.78366; 6.72568; 6.07443 90; 102.104; 90 | 310.929 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300248 | CIF | D | P b c a | 18.8679; 6.94772; 6.85885 90; 90; 90 | 899.12 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300249 | CIF | D2 O | R -3 :H | 12.87078; 12.87078; 6.1827 90; 90; 120 | 886.99 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300250 | CIF | Al | F m -3 m | 4.03702; 4.03702; 4.03702 90; 90; 90 | 65.793 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300251 | CIF | D2 O | P 41 21 2 | 6.6748; 6.67484; 6.6838 90; 90; 90 | 297.78 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300252 | CIF | C W | P -6 m 2 | 2.9016; 2.90156; 2.83867 90; 90; 120 | 20.697 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300253 | CIF | D | P n c n | 12.5626; 6.6513; 6.3788 90; 90; 90 | 533 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300254 | CIF | D2 O | R -3 :H | 12.8396; 12.8396; 6.1628 90; 90; 120 | 879.86 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300255 | CIF | D10 O5 | P 42/n m c :2 | 6.186; 6.186; 5.7157 90; 90; 90 | 218.72 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300256 | CIF | Pb | F m -3 m | 4.9108; 4.91075; 4.91075 90; 90; 90 | 118.426 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300257 | CIF | D | I -4 2 d | 8.15; 8.15; 4 90; 90; 90 | 265.69 | Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F. Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa Journal of Applied Crystallography, 2009, 42, 846-866 |
2300258 | CIF | Ca H4 O6 S | C 1 2/c 1 | 6.28689; 15.2131; 6.52996 90; 127.43; 90 | 495.95 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum Journal of Applied Crystallography, 2009, 42, 1176-1188 |
2300259 | CIF | Ca H4 O6 S | I 1 2/c 1 | 5.68021; 15.2139; 6.53032 90; 118.484; 90 | 496.03 | Henry, Paul F.; Weller, Mark T.; Wilson, Chick C. Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum Journal of Applied Crystallography, 2009, 42, 1176-1188 |
2300260 | CIF | C D7 N O | P b c a | 11.0232; 7.66076; 7.59127 90; 90; 90 | 641.053 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol monoammoniate (CD~3~OD·ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2009, 42, 1054-1061 |
2300261 | CIF | C D7 N O | P b c a | 11.21169; 7.74663; 7.68077 90; 90; 90 | 667.096 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol monoammoniate (CD~3~OD·ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2009, 42, 1054-1061 |
2300262 | CIF HKL Paper | C17 H30 F N3 O9 | P -1 | 9.507; 9.9649; 11.0233 94.182; 100.118; 91.432 | 1024.57 | Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A. Towards extracting the charge density from normal-resolution data Journal of Applied Crystallography, 2009, 42, 1110-1121 |
2300263 | CIF Paper | C17 H21.8 Cl F N3 O4.4 | P 1 21/c 1 | 12.872; 19.576; 6.948 90; 90.55; 90 | 1750.7 | Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A. Towards extracting the charge density from normal-resolution data Journal of Applied Crystallography, 2009, 42, 1110-1121 |
2300264 | CIF | C12 H22 O11 | P 1 21 1 | 7.7735; 8.7169; 10.8765 90; 102.936; 90 | 718.3 | Kimura, Fumiko; Kimura, Tsunehisa; Oshima, Wataru; Maeyama, Masataka; Aburaya, Kazuaki X-ray diffraction study of a pseudo single crystal prepared from a crystal belonging to point group 2 Journal of Applied Crystallography, 2010, 43, 151-153 |
2300265 | CIF Paper | C15 H14 Br N5 O2 | P -1 | 11.479; 14.738; 4.476 93.65; 94.16; 93.71 | 751.9 | Lasocha, W.; Gaweł, B.; Rafalska-Lasocha, A.; Pawłowski, M.; Talik, P.; Paszkowicz, W. Crystal structure study of selected xanthine derivatives Journal of Applied Crystallography, 2010, 43, 163-167 |
2300266 | CIF | C D7 N O | P b c a | 11.0386; 7.65471; 7.58467 90; 90; 90 | 640.88 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
2300267 | CIF | C2 D11 N O2 | P n 21 a | 12.70615; 8.84589; 4.73876 90; 90; 90 | 532.623 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
2300268 | CIF | C D7 N O | P b c a | 11.20962; 7.74564; 7.6781 90; 90; 90 | 666.66 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
2300269 | CIF | C2 D11 N O2 | P n 21 a | 12.90413; 8.96975; 4.79198 90; 90; 90 | 554.656 | Fortes, A. D.; Wood, I. G.; Knight, K. S. The crystal structure of perdeuterated methanol hemiammoniate (CD~3~OD·0.5ND~3~) determined from neutron powder diffraction data at 4.2 and 180K Journal of Applied Crystallography, 2010, 43, 328-336 |
2300270 | CIF | C10 H13 N O3 | P 1 21/n 1 | 13.00247; 6.86966; 11.51889 90; 108.329; 90 | 976.695 | Pagola, Silvina; Stephens, Peter W. <i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data Journal of Applied Crystallography, 2010, 43, 370-376 |
2300271 | CIF | C8 H10 O2 | P 1 21/n 1 | 9.8417; 15.4813; 4.8422 90; 101.258; 90 | 723.57 | Pagola, Silvina; Stephens, Peter W. <i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data Journal of Applied Crystallography, 2010, 43, 370-376 |
2300272 | CIF | C2 H4 N4 S | P 1 21/a 1 | 9.849; 12.3828; 3.99952 90; 102.126; 90 | 476.891 | Pagola, Silvina; Stephens, Peter W. <i>PSSP</i>, a computer program for the crystal structure solution of molecular materials from X-ray powder diffraction data Journal of Applied Crystallography, 2010, 43, 370-376 |
2300273 | CIF Paper | Ca5 H O13 P3 | P 63/m | 9.421; 9.421; 6.88 90; 90; 120 | 528.826 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
2300274 | CIF Paper | ? | P 63/m | 9.417; 9.417; 6.867 90; 90; 120 | 527.38 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
2300275 | CIF Paper | ? | P 63/m | 9.4039; 9.4039; 6.8526 90; 90; 120 | 524.81 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
2300276 | CIF Paper | ? | P 63/m | 9.4109; 9.4109; 6.8456 90; 90; 120 | 525.05 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
2300277 | CIF Paper | ? | P 63/m | 9.4072; 9.4072; 6.84 90; 90; 120 | 524.21 | Veselinović, Ljiljana; Karanović, Ljiljana; Stojanović, Zoran; Bračko, Ines; Marković, Smilja; Ignjatović, Nenad; Uskoković, Dragan Crystal structure of cobalt-substituted calcium hydroxyapatite nanopowders prepared by hydrothermal processing Journal of Applied Crystallography, 2010, 43, 320-327 |
2300278 | CIF Paper | La O4 V | P 1 21/n 1 | 7.0492; 7.2827; 6.725 90; 104.901; 90 | 333.63 | Cong, Hengjiang; Zhang, Huaijin; Sun, Shangqian; Yu, Yonggui; Yu, Wentao; Yu, Haohai; Zhang, Jian; Wang, Jiyang; Boughton, Robert I. Morphological study of Czochralski-grown lanthanide orthovanadate single crystals and implications on the mechanism of bulk spiral formation Journal of Applied Crystallography, 2010, 43, 308-319 |
2300279 | CIF | Co0.15 Cr0.42 Mn0.19 O | F d -3 m :2 | 8.3777; 8.3777; 8.3777 90; 90; 90 | 588 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
2300280 | CIF | Co0.43 Mn0.32 O | F d -3 m :2 | 8.2685; 8.2685; 8.2685 90; 90; 90 | 565.3 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
2300281 | CIF | Co0.23 Mn0.52 O | I 41/a m d :2 | 5.7184; 5.7184; 9.2079 90; 90; 90 | 301.1 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
2300282 | CIF | Co0.33 Mn0.42 O | F d -3 m :2 | 8.3015; 8.3015; 8.3015 90; 90; 90 | 572.1 | Purwanto, A.; Fajar, A.; Mugirahardjo, H.; Fergus, J. W.; Wang, K. Cation distribution in spinel (Mn,Co,Cr)~3~O~4~ at room temperature Journal of Applied Crystallography, 2010, 43, 394-400 |
2300283 | CIF Paper | F2 O Ti | R -3 c :H | 5.3325; 5.3325; 13.2321 90; 90; 120 | 325.853 | Shian, Samuel; Sandhage, Kenneth H. Hexagonal and cubic TiOF~2~ Journal of Applied Crystallography, 2010, 43, 757-761 |
2300284 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.18564; 4.18564; 4.18564 90; 90; 90 | 73.3307 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300285 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.18419; 4.18419; 4.18419 90; 90; 90 | 73.2545 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300286 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.18455; 4.18455; 4.18455 90; 90; 90 | 73.2734 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300287 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.188219; 4.188219; 4.188219 90; 90; 90 | 73.4663 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300288 | CIF Paper | Ni0.9 O Zn0.1 | F m -3 m | 4.188195; 4.188195; 4.188195 90; 90; 90 | 73.465 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300289 | CIF Paper | Fe2 Ni O4 | F d -3 m :2 | 8.35966; 8.35966; 8.35966 90; 90; 90 | 584.206 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300290 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.95403; 2.95403; 7.2801 90; 90; 120 | 55.017 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300291 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.95557; 2.95557; 7.2626 90; 90; 120 | 54.942 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300292 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.95546; 2.95546; 7.2665 90; 90; 120 | 54.968 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300293 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.96064; 2.96064; 7.2592 90; 90; 120 | 55.105 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300294 | CIF Paper | Ni0.9 O Zn0.1 | R -3 m :H | 2.9607; 2.9607; 7.25817 90; 90; 120 | 55.0994 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300295 | CIF Paper | Fe2 Ni O4 | F d -3 m :2 | 8.35966; 8.35966; 8.35966 90; 90; 90 | 584.206 | Kremenović, Aleksandar; Antić, Bratislav; Vučinić-Vasić, Milica; Colomban, Philippe; Jovalekić, Čedomir; Bibić, Nataša; Kahlenberg, Volker; Leoni, Matteo Temperature-induced structure and microstructure evolution of nanostructured Ni~0.9~Zn~0.1~O Journal of Applied Crystallography, 2010, 43, 699-709 |
2300296 | CIF Paper | O2 Zr | P 1 21/c 1 | 5.1477; 5.2096; 5.3164 90; 99.215; 90 | 140.732 | Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B. Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles Journal of Applied Crystallography, 2010, 43, 1092-1099 |
2300297 | CIF Paper | O1.985 Y0.03 Zr0.97 | P 42/n m c S | 3.6244; 3.6244; 5.156 90; 90; 90 | 67.731 | Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B. Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles Journal of Applied Crystallography, 2010, 43, 1092-1099 |
2300298 | CIF Paper | O1.985 Y0.03 Zr0.97 | P 42/n m c S | 3.6132; 3.6132; 5.1649 90; 90; 90 | 67.429 | Suzuki-Muresan, T.; Deniard, P.; Gautron, E.; Petříček, V.; Jobic, S.; Grambow, B. Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO~2~ nanoparticles Journal of Applied Crystallography, 2010, 43, 1092-1099 |
2300299 | CIF Paper | Sb10 Te3 | R -3 m :H | 4.289; 4.289; 75.51 90; 90; 120 | 1202.9 | Schneider, Matthias N.; Seibald, Markus; Lagally, Patrick; Oeckler, Oliver Ambiguities in the structure determination of antimony tellurides arising from almost homometric structure models and stacking disorder Journal of Applied Crystallography, 2010, 43, 1012-1020 |
2300300 | CIF | Pb0.18 Sb7.82 Te3 | R -3 m :H | 4.2874; 4.2874; 64.3 90; 90; 120 | 1023.6 | Schneider, Matthias N.; Seibald, Markus; Lagally, Patrick; Oeckler, Oliver Ambiguities in the structure determination of antimony tellurides arising from almost homometric structure models and stacking disorder Journal of Applied Crystallography, 2010, 43, 1012-1020 |
2300301 | CIF | C6 H6 Cl N O6 | P 1 21/c 1 | 5.5046; 13.574; 17.423 90; 137.919; 90 | 872.5 | Ye, Heng-Yun; Cai, Hong-Ling; Ge, Jia-Zeng; Xiong, Ren-Gen Reversible structural phase transition of pyridinium-4-carboxylic acid perchlorate Journal of Applied Crystallography, 2010, 43, 1031-1035 |
2300302 | CIF | C6 H6 Cl N O6 | P 1 21/c 1 | 17.356; 13.241; 16.161 90; 138.055; 90 | 2482.5 | Ye, Heng-Yun; Cai, Hong-Ling; Ge, Jia-Zeng; Xiong, Ren-Gen Reversible structural phase transition of pyridinium-4-carboxylic acid perchlorate Journal of Applied Crystallography, 2010, 43, 1031-1035 |
2300303 | CIF Paper | C6 H6 N2 O2 | P c a 21 | 18.7169; 6.5215; 5.0014 90; 90; 90 | 610.48 | Probert, Michael R.; Robertson, Craig M.; Coome, Jonathan A.; Howard, Judith A. K.; Michell, Brian C.; Goeta, Andrés E. The XIPHOS diffraction facility for extreme sample conditions Journal of Applied Crystallography, 2010, 43, 1415-1418 |
2300304 | CIF Paper | C14 H14 O2 S | P -1 | 4.736; 10.819; 12.206 89.727; 78.904; 89.977 | 613.7 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300305 | CIF Paper | C14 H14 O2 S | C 1 2/c 1 | 24.003; 4.7435; 10.8255 90; 90.185; 90 | 1232.6 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300306 | CIF Paper | C14 H14 O2 S | C 1 2/c 1 | 24.012; 4.7429; 10.8321 90; 90.197; 90 | 1233.6 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300307 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1; 11.365; 11.3 90; 97.464; 90 | 1286.1 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300309 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1414; 11.3865; 11.3289 90; 97.4; 90 | 1297.31 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300310 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1385; 11.3898; 11.3325 90; 97.467; 90 | 1297.5 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300311 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.1375; 11.3871; 11.3412 90; 97.482; 90 | 1298 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300312 | CIF Paper | C14 H11 F N2 S | P 1 21/c 1 | 10.137; 11.413; 11.345 90; 97.465; 90 | 1301.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300313 | CIF Paper | C17 H20 Cl2 N2 Pd | P 1 21/c 1 | 9.356; 9.9295; 19.357 90; 90.47; 90 | 1798.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300314 | CIF Paper | C17 H20 Cl2 N2 Pd | P 1 21/c 1 | 9.356; 9.9295; 19.357 90; 90.47; 90 | 1798.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300315 | CIF Paper | C16 H18 Cl2 N2 Pd | P -1 | 8.5305; 9.6211; 10.988 72.593; 78.78; 83.039 | 842.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300316 | CIF Paper | C16 H18 Cl2 N2 Pd | P -1 | 8.5305; 9.6211; 10.988 72.593; 78.78; 83.039 | 842.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300317 | CIF Paper | C13 H10 O S | P 1 21/n 1 | 8.007; 16.958; 8.031 90; 95.097; 90 | 1086.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300318 | CIF Paper | C13 H10 O S | P 1 21/n 1 | 8.007; 16.958; 8.031 90; 95.097; 90 | 1086.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300319 | CIF Paper | C12 H16 O3 | P 1 21/c 1 | 8.894; 16.22; 7.742 90; 90.214; 90 | 1116.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300320 | CIF Paper | C12 H16 O3 | P 1 21/c 1 | 8.894; 16.22; 7.742 90; 90.214; 90 | 1116.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300321 | CIF Paper | C13 H18 N2 O3 S | P 1 21/c 1 | 12.8651; 15.3291; 7.1435 90; 93.379; 90 | 1406.3 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300322 | CIF Paper | C13 H18 N2 O3 S | P 1 21/c 1 | 12.8651; 15.3291; 7.1435 90; 93.379; 90 | 1406.3 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300323 | CIF Paper | C21 H21 N O3 S2 | P 1 21/c 1 | 11.7771; 11.4544; 14.9031 90; 95.945; 90 | 1999.6 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300324 | CIF Paper | C21 H21 N O3 S2 | P 1 21/c 1 | 11.7937; 11.4816; 14.9358 90; 95.972; 90 | 2011.5 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300325 | CIF Paper | C21 H21 N O3 S2 | P 1 21/c 1 | 11.7937; 11.4816; 14.9358 90; 95.972; 90 | 2011.5 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300326 | CIF Paper | C13 H10 F2 O S | P c a 21 | 8.3649; 5.5063; 25.129 90; 90; 90 | 1157.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300327 | CIF Paper | C15 H12 N2 O | P 1 21/n 1 | 7.55; 11.186; 13.954 90; 92.938; 90 | 1176.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300328 | CIF Paper | C13 H10 I N O2 S | P -1 | 7.4946; 7.7421; 11.4816 95.418; 103.879; 96.985 | 636.65 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300329 | CIF Paper | C13 H10 I N O2 S | P -1 | 7.5076; 7.76; 11.507 95.317; 103.999; 97.013 | 640.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300330 | CIF Paper | C13 H10 I N O2 S | P -1 | 7.5076; 7.76; 11.507 95.317; 103.999; 97.013 | 640.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300331 | CIF Paper | C7 H5 N O3 S | P 1 21/c 1 | 9.583; 6.9252; 11.8518 90; 103.815; 90 | 763.78 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300332 | CIF Paper | C7 H5 N O3 S | P 1 21/c 1 | 9.6083; 6.9347; 11.882 90; 103.834; 90 | 768.7 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300333 | CIF Paper | C7 H0 N O3 S | P 1 21/c 1 | 9.6083; 6.9347; 11.882 90; 103.834; 90 | 768.7 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300334 | CIF Paper | C6 H5 I N2 O2 | P 1 21/c 1 | 7.7617; 12.912; 15.663 90; 95.141; 90 | 1563.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300335 | CIF Paper | C12 H6 I2 N4 O4 | P 1 21/c 1 | 7.7617; 12.912; 15.663 90; 95.141; 90 | 1563.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300336 | CIF Paper | C15 H14 N2 O2 S | P 21 21 21 | 7.7598; 9.9684; 18.231 90; 90; 90 | 1410.2 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300338 | CIF Paper | C15 H14 N2 O2 S | P 21 21 21 | 7.7592; 9.9677; 18.23 90; 90; 90 | 1409.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300339 | CIF Paper | C17 H23 N3 O5 S2 | P 1 21/n 1 | 7.811; 17.503; 15.892 90; 103.305; 90 | 2114 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300341 | CIF Paper | C17 H23 N3 O5 S2 | P 1 21/n 1 | 7.811; 17.503; 15.892 90; 103.305; 90 | 2114 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300342 | CIF Paper | C7 H12 N4 O3 S | P 1 21 1 | 5.6095; 7.3299; 12.491 90; 93.297; 90 | 512.74 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300344 | CIF Paper | C7 H12 N4 O3 S | P 1 21 1 | 5.6245; 7.354; 12.521 90; 93.445; 90 | 517 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300345 | CIF Paper | C7 H8 N4 O S | P 1 21 1 | 5.6245; 7.354; 12.521 90; 93.445; 90 | 517 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300346 | CIF Paper | C25 H22 N O P S | P -1 | 10.2699; 11.1605; 11.1911 85.945; 67.75; 70.671 | 1118.07 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300347 | CIF Paper | C25 H22 N O P S | P -1 | 10.2699; 11.1605; 11.1911 85.945; 67.75; 70.671 | 1118.07 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300348 | CIF Paper | C13 H13 N O2 S | P -1 | 10.259; 11.05; 13.38 67.808; 87.291; 67.435 | 1288.4 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300349 | CIF Paper | C13 H13 N O2 S | P -1 | 10.289; 11.0563; 13.4402 67.823; 87.573; 67.616 | 1299.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300351 | CIF Paper | C13 H12 N O2 S | P -1 | 10.289; 11.0563; 13.4402 67.823; 87.573; 67.616 | 1299.9 | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? Journal of Applied Crystallography, 2011, 44, 213-215 |
2300352 | CIF Paper | Fe Li O4 P | P n m a | 10.4008; 6.0523; 4.7324 90; 90; 90 | 297.91 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
2300353 | CIF Paper | Fe0.75 Li Mn0.25 O4 P | P n m a | 10.3789; 6.0394; 4.7211 90; 90; 90 | 295.931 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
2300354 | CIF Paper | Fe0.5 Li Mn0.5 O4 P | P n m a | 10.4072; 6.06188; 4.73357 90; 90; 90 | 298.628 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
2300355 | CIF Paper | Fe0.25 Li Mn0.75 O4 P | P n m a | 10.4303; 6.08084; 4.74531 90; 90; 90 | 300.971 | Jensen, Kirsten; Christensen, Mogens; Tyrsted, Christoffer; Brummerstedt Iversen, Bo Real-time synchrotron powder X-ray diffraction study of the antisite defect formation during sub- and supercritical synthesis of LiFePO~4~ and LiFe~1{-~<i>x</i>}Mn~<i>x~</i>PO~4~ nanoparticles Journal of Applied Crystallography, 2011, 44, 287-294 |
2300356 | CIF Paper | C2 H6 O6 | P 1 21/n 1 | 6.0514; 3.5482; 11.996 90; 106.26; 90 | 247.27 | Chakoumakos, Bryan C.; Cao, Huibo; Ye, Feng; Stoica, Alexandru D.; Popovici, Mihai; Sundaram, Madhan; Zhou, Wenduo; Hicks, J. Steve; Lynn, Gary W.; Riedel, Richard A. Four-circle single-crystal neutron diffractometer at the High Flux Isotope Reactor Journal of Applied Crystallography, 2011, 44, 655-658 |
2300357 | CIF Paper | C6 H24 N8 Ni O6 | P 63 2 2 | 8.8647; 8.8647; 11.3595 90; 90; 120 | 773.07 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300358 | CIF Paper | C6 H24 N8 Ni O6 | P 63 2 2 | 8.8647; 8.8647; 11.3595 90; 90; 120 | 773.07 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300359 | CIF Paper | C6 H24 N8 Ni O6 | P 61 2 2 | 8.806; 8.806; 33.147 90; 90; 120 | 2226 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300360 | CIF Paper | C6 H24 N8 Ni O6 | P 61 2 2 | 8.806; 8.806; 33.147 90; 90; 120 | 2226 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300361 | CIF Paper | C6 H24 N8 Ni O6 | P 63 2 2 | 8.8647; 8.8647; 11.3595 90; 90; 120 | 773.07 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300362 | CIF Paper | C8 H14 N2 O8 | C 1 2/c 1 | 15.805; 5.6535; 12.126 90; 107.55; 90 | 1033.1 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300363 | CIF Paper | C8 H14 N2 O8 | C 1 2/c 1 | 15.8205; 5.68202; 12.09246 90; 107.333; 90 | 1037.66 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300364 | CIF Paper | C8 H14 N2 O8 | C 1 2/c 1 | 15.82035; 5.68088; 12.09343 90; 107.332; 90 | 1037.53 | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem Journal of Applied Crystallography, 2011, 44, 763-771 |
2300365 | CIF HKL | Ge O2 | P 31 2 1 | 4.989; 4.989; 5.6527 90; 90; 120 | 121.847 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
2300366 | CIF | Ge0.97 O2 Si0.03 | P 32 2 1 | 4.983; 4.983; 5.6339 90; 90; 120 | 121.149 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
2300367 | CIF | Ge0.96 O2 Si0.04 | P 31 2 1 | 4.9805; 4.9805; 5.627 90; 90; 120 | 120.88 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
2300368 | CIF HKL | Ge0.9 O2 Si0.1 | P 32 2 1 | 4.97517; 4.97517; 5.60565 90; 90; 120 | 120.163 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
2300369 | CIF HKL | Ge0.83 O2 Si0.17 | P 31 2 1 | 4.9707; 4.9707; 5.5873 90; 90; 120 | 119.555 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
2300370 | CIF | O2 Si | P 32 2 1 | 4.91636; 4.91636; 5.4084 90; 90; 120 | 113.211 | Lignie, Adrien; Granier, Dominique; Armand, Pascale; Haines, Julien; Papet, Philippe Modulation of quartz-like GeO~2~ structure by Si substitution: an X-ray diffraction study of Ge~1{-~<i>x</i>}Si<i>~x~</i>O~2~ (0 {łeq} <i>x</i> < 0.2) flux-grown single crystals Journal of Applied Crystallography, 2012, 45, 272-278 |
2300371 | CIF HKL Paper | C9 H13 N3 O5 | P 21 21 21 | 5.0784; 13.9046; 14.6992 90; 90; 90 | 1037.96 | Coome, J. A.; Goeta, A. E.; Howard, J. A. K.; Probert, M. R. <i>Masquerade</i>: removing non-sample scattering from integrated reflection intensities Journal of Applied Crystallography, 2012, 45, 292-298 |
2300372 | CIF HKL Paper | C17 H14 O | P b c a | 15.4307; 10.2659; 16.4124 90; 90; 90 | 2599.9 | Rajasekar, M.; Muthu, K.; Bhagavannarayana, G.; Meenakshisundaram, S. P. Synthesis, structure, growth and characterization of an organic crystal: 1,5-diphenylpenta-2,4-dien-1-one Journal of Applied Crystallography, 2012, 45, 914-920 |
2300373 | CIF Paper | H18 O12 S | I 1 2 1 | 7.44247; 7.445; 26.1168 90; 125.043; 90 | 1184.78 | Maynard-Casely, Helen E.; Brand, Helen E. A.; Wallwork, Kia S. Structure and thermal expansion of sulfuric acid octahydrate Journal of Applied Crystallography, 2012, 45, 1198-1207 |
2300374 | CIF Paper | C25 H30 N4 O3 | P 21 21 21 | 35.9422; 12.91819; 4.99532 90; 90; 90 | 2319.37 | Bushmarinov, Ivan S.; Dmitrienko, Artem O.; Korlyukov, Alexander A.; Antipin, Mikhail Yu. Rietveld refinement and structure verification using `Morse' restraints Journal of Applied Crystallography, 2012, 45, 1187-1197 |
2300375 | CIF Paper | Al2 O3 | R -3 c :H | 4.76029; 4.76029; 12.992 90; 90; 120 | 254.96 | Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi Journal of Applied Crystallography, 2013, 46, 14-24 |
2300376 | CIF Paper | Ni Si | P 21 3 | 4.49678; 4.49678; 4.49678 90; 90; 90 | 90.9295 | Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi Journal of Applied Crystallography, 2013, 46, 14-24 |
2300377 | CIF Paper | Ni Si | P m m n :2 | 3.2735; 3.02662; 4.69776 90; 90; 90 | 46.544 | Wood, Ian G.; Ahmed, Jabraan; Dobson, David P.; Vočadlo, Lidunka High-pressure phase transitions and equations of state in NiSi. III. A new high-pressure phase of NiSi Journal of Applied Crystallography, 2013, 46, 14-24 |
2300378 | CIF | Ag3 Mg | F m -3 m | 4.1526; 4.1526; 4.1526 90; 90; 90 | 71.608 | Laine, E.; Tarne, T.; Haemaelaeinen, M. Thermal expansion of the Ag3 Mg alloy in the ordered and disordered states Journal of Applied Crystallography, 1969, 2, 95-101 |
2300379 | CIF | B Lu O3 | R -3 c :H | 4.9153; 4.9153; 16.212 90; 90; 120 | 339.209 | Bernstein, J.L.; Keve, E.T.; Abrahams, S.C. Application of Normal Probability Plot Analysis to Lutetium Orthoborate Structure Factors and Parameters Journal of Applied Crystallography, 1971, 4, 284-290 |
2300380 | CIF Paper | C15 H4 Cu2 O10 | F m -3 m | 26.3034; 26.3034; 26.3034 90; 90; 90 | 18198.5 | Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai Generation and applications of structure envelopes for porous metal‒organic frameworks Journal of Applied Crystallography, 2013, 46, 346-353 |
2300381 | CIF Paper | C33 H4 Cu2 O10 | F m -3 m | 26.3167; 26.3167; 26.3167 90; 90; 90 | 18226.1 | Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai Generation and applications of structure envelopes for porous metal‒organic frameworks Journal of Applied Crystallography, 2013, 46, 346-353 |
2300382 | CIF Paper | C8.5 H7 Cu N5 O2 | C 1 2/c 1 | 28.697; 9.2637; 9.3223 90; 116.087; 90 | 2225.8 | Yakovenko, Andrey A.; Reibenspies, Joseph H.; Bhuvanesh, Nattamai; Zhou, Hong-Cai Generation and applications of structure envelopes for porous metal‒organic frameworks Journal of Applied Crystallography, 2013, 46, 346-353 |
2300383 | CIF Paper | C356 H32 Y4 | C m c 21 | 11.22205; 34.8174; 11.22569 90; 90; 90 | 4386.13 | Maki, Sachiko; Nishibori, Eiji; Kawaguchi, Daisuke; Sakata, Makoto; Takata, Masaki; Inoue, Takashi; Shinohara, Hisanori Element-selective charge density visualization of endohedral metallofullerenes using synchrotron X-ray multi-wavelength anomalous powder diffraction data Journal of Applied Crystallography, 2013, 46, 649-655 |
2300384 | CIF HKL | C13 H10 O | P 21 21 21 | 7.979; 10.274; 12.103 90; 90; 90 | 992.2 | Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H. Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone Journal of Applied Crystallography, 2013, 46, 656-662 |
2300385 | CIF HKL | C13 H10 O | P 21 21 21 | 7.7145; 10.2301; 12.0269 90; 90; 90 | 949.2 | Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H. Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone Journal of Applied Crystallography, 2013, 46, 656-662 |
2300386 | CIF | C13 H10 O | P 21 21 21 | 7.9958; 10.2907; 12.174 90; 90; 90 | 1001.7 | Reilly, Anthony M.; Wann, Derek A.; Gutmann, Matthias J.; Jura, Marek; Morrison, Carole A.; Rankin, David W. H. Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone Journal of Applied Crystallography, 2013, 46, 656-662 |
2300387 | CIF HKL Paper | B3 Ba5 F O9 | P n m a | 7.60788; 14.8299; 10.2865 90; 90; 90 | 1160.57 | Rashchenko, Sergey V.; Bekker, Tatyana B.; Bakakin, Vladimir V.; Seryotkin, Yurii V.; Kokh, Alexander E.; Gille, Peter; Popov, Arthur I.; Fedorov, Pavel P. A new mechanism of anionic substitution in fluoride borates Journal of Applied Crystallography, 2013, 46, 1081-1084 |
2300388 | CIF Paper | As0.84 Cu1.08 Mn0.94 | P 4/n m m :2 | 3.82; 3.82; 6.318 90; 90; 90 | 92.2 | Wadley, P.; Crespi, A.; Gázquez, J.; Roldán, M.A.; García, P.; Novak, V.; Campion, R.; Jungwirth, T.; Rinaldi, C.; Martí, X.; Holy, V.; Frontera, C.; Rius, J. Obtaining the structure factors for an epitaxial film using Cu X-ray radiation Journal of Applied Crystallography, 2013, 46, 1749-1754 |
2300389 | CIF | C33 H33 N3 O6 Pd S3 | P 1 21/c 1 | 8.5627; 10.4508; 35.5429 90; 94.294; 90 | 3171.7 | Coles, Simon J.; Hursthouse, Michael B. Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography Journal of Applied Crystallography, 2004, 37, 988 |
2300390 | CIF | C33 H33 N3 O6 Pd S3 | P 1 21/c 1 | 8.5467; 10.4343; 35.4794 90; 94.325; 90 | 3155 | Coles, Simon J.; Hursthouse, Michael B. Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography Journal of Applied Crystallography, 2004, 37, 988 |
2300391 | CIF | B12 Cs2 Li2 O20 | I -4 2 d | 10.467; 10.467; 8.922 90; 90; 90 | 977.48 | Herreros-Cedrés, Javier; Hernández-Rodriguez, Cecilio; Kaminsky, Werner Absolute optical rotation of CsLiB6O10 Journal of Applied Crystallography, 2005, 38, 544 |
2300392 | CIF | C10 H16 N O1.5 | P 21 21 21 | 7.3188; 11.2018; 24.0156 90; 90; 90 | 1968.89 | Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate Journal of Applied Crystallography, 2001, 34, 203 |
2300393 | CIF | C10 H16 N O1.5 | P 21 21 21 | 7.3105; 11.1878; 23.979 90; 90; 90 | 1961.2 | Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate Journal of Applied Crystallography, 2001, 34, 203 |
2300442 | CIF | Gd K O8 W2 | C 1 2/c 1 | 10.652; 10.374; 7.582 90; 130.8; 90 | 634.2 | Pujol, M. C.; Solé, R.; Massons, J.; Gavaldà, Jna.; Solans, X.; Zaldo, C.; Díaz, F.; Aguiló, M. Structural study of monoclinic KGd(WO4)2and effects of lanthanide substitution Journal of Applied Crystallography, 2001, 34, 1 |
2300443 | CIF | C12 H24 B2 F8 Fe N24 | P 1 21/n 1 | 17.566; 10.0964; 18.696 90; 114.458; 90 | 3018.3 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2 Journal of Applied Crystallography, 2001, 34, 229 |
2300444 | CIF | C12 H24 B2 F8 Fe N24 | P 1 21/n 1 | 17.4887; 10.0914; 18.517 90; 115.243; 90 | 2955.9 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2 Journal of Applied Crystallography, 2001, 34, 229 |
2300445 | CIF | C12 H24 B2 F8 Fe N24 | P 1 21/n 1 | 17.207; 10.214; 18.406 90; 113.912; 90 | 2957.2 | Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2 Journal of Applied Crystallography, 2001, 34, 229 |
2300446 | CIF Paper | Al18.5 Co7.75 Ni0 | P n m m :2 | 23.201; 32.31; 4.103 90; 90; 90 | 3075.7 | Singh, Devinder; Yun, Yifeng; Wan, Wei; Grushko, Benjamin; Zou, Xiaodong; Hovmöller, Sven A complex pseudo-decagonal quasicrystal approximant, Al~37~(Co,Ni)~15.5~, solved by rotation electron diffraction Journal of Applied Crystallography, 2014, 47, 215-221 |
2300447 | CIF | Li1.99 Mn1.01 O3 | C 1 2/m 1 | 4.9246; 8.5216; 5.0245 90; 109.398; 90 | 198.886 | Massarotti, V.; Bini, M.; Capsoni, D.; Altomare, A.; Moliterni, A. G. G. Ab initio structure determination of Li~2~MnO~3~ from X-ray powder diffraction data Journal of Applied Crystallography, 1997, 30, 123-127 |
2300448 | CIF HKL Paper | Al2 O3 | R -3 c :H | 4.758152; 4.758152; 12.9897 90; 90; 120 | 254.687 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300449 | CIF HKL Paper | Ca F2 | F m -3 m | 5.463209; 5.463209; 5.463209 90; 90; 90 | 163.059 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300450 | CIF HKL Paper | O Zn | P 63 m c | 3.249308; 3.249308; 5.205709 90; 90; 120 | 47.5984 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300451 | CIF Paper | C12 H18 N2 O3 S | P n a 21 | 20.31875; 7.84999; 9.10539 90; 90; 90 | 1452.33 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300452 | CIF Paper | C12 H18 N2 O3 S | P 1 c 1 | 9.16849; 17.181; 18.1517 90; 96.6067; 90 | 2840.3 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300453 | CIF HKL Paper | C12 H18 N2 O3 S | P 1 21/n 1 | 11.80943; 9.06147; 13.99082 90; 104.584; 90 | 1448.93 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300454 | CIF HKL Paper | C2 H5 N O2 | P 1 21/c 1 | 5.10422; 11.97177; 5.93652 90; 121.264; 90 | 310.081 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300455 | CIF Paper | C8 H9 N O2 | P 1 21/n 1 | 11.71439; 9.38544; 7.10166 90; 82.5879; 90 | 774.27 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300456 | CIF HKL Paper | C12 H24 O12 | P 1 21 1 | 7.77208; 21.58192; 4.8172 90; 74.0609; 90 | 776.95 | Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods Journal of Applied Crystallography, 2014, 47, 659-667 |
2300457 | CIF Paper | Ba0.41 Mo O4 Sr0.59 | I 41/a :2 | 5.50729; 5.50729; 12.4789 90; 90; 90 | 378.488 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
2300458 | CIF Paper | Ba0.73 Mo O4 Sr0.27 | I 41/a :2 | 5.54906; 5.54906; 12.66803 90; 90; 90 | 390.075 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
2300459 | CIF Paper | Ba Mo O4 | I 41/a :2 | 5.584828; 5.584828; 12.82922 90; 90; 90 | 400.147 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
2300460 | CIF Paper | Mo O4 Sr | I 41/a :2 | 5.402647; 5.402647; 12.04112 90; 90; 90 | 351.463 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
2300461 | CIF Paper | Ba0.19 Mo O4 Sr0.81 | I 41/a :2 | 5.45711; 5.45711; 12.25476 90; 90; 90 | 364.947 | Nogueira, I. C.; Cavalcante, L. S.; Pereira, P. F. S.; de Jesus, M. M.; Rivas Mercury, J. M.; Batista, N. C.; Li, M. Siu; Longo, E. Rietveld refinement, morphology and optical properties of (Ba~1{-~<i>x</i>}Sr<i>~x~</i>)MoO~4~ crystals Journal of Applied Crystallography, 2013, 46, 1434-1446 |
2300462 | CIF HKL | Ag5 Mg33 | P b c m | 8.87; 16.48; 19.48 90; 90; 90 | 2847.54 | Samuha, Shmuel; Krimer, Yaakov; Meshi, Louisa Strategies for full structure solution of intermetallic compounds using precession electron diffraction zonal data Journal of Applied Crystallography, 2014, 47, 1032-1041 |
2300463 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.947; 5.5093; 12.4564 90; 91.712; 90 | 819.51 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300464 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.9525; 5.5111; 12.4566 90; 91.699; 90 | 820.17 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300465 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.9359; 5.5005; 12.4375 90; 91.776; 90 | 816.17 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300466 | CIF HKL Paper | C7 H8 F N3 S | P 1 21/c 1 | 11.9533; 5.5087; 12.4688 90; 91.699; 90 | 820.67 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300467 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.613; 8.5301; 31.4348 90; 90; 90 | 1505.08 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300468 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.6011; 8.5219; 31.4741 90; 90; 90 | 1502.32 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300469 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.6104; 8.5238; 31.496 90; 90; 90 | 1506.2 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300470 | CIF HKL Paper | C20 H15 Br | P 21 21 21 | 5.6112; 8.5333; 31.4392 90; 90; 90 | 1505.37 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300471 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0024; 8.9753; 12.3386 90; 98.041; 90 | 2522.3 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300472 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0151; 8.9752; 12.3404 90; 98.108; 90 | 2523.62 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300473 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0144; 8.9745; 12.3423 90; 98.069; 90 | 2524 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300474 | CIF HKL Paper | C20 H26 Cu N8 O16 | C 1 2/c 1 | 23.0253; 8.9728; 12.3325 90; 98.12; 90 | 2522.4 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300475 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5966; 16.1294; 20.4387 90; 108.891; 90 | 4864.7 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300476 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5993; 16.1284; 20.4476 90; 108.849; 90 | 4868.6 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300477 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5742; 16.1161; 20.4181 90; 108.879; 90 | 4849.2 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300478 | CIF HKL Paper | C28 H25 Cl N2 O Sn | C 1 2/c 1 | 15.5844; 16.112; 20.4375 90; 108.872; 90 | 4855.9 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300479 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.3641; 13.8966; 14.2315 90; 100.132; 90 | 1044.31 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300480 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.346; 13.8593; 14.1995 90; 100.138; 90 | 1035.64 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300481 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.3522; 13.8783; 14.2186 90; 100.048; 90 | 1039.95 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300482 | CIF HKL Paper | C3 H9 N5 O6 Pb S | P 1 21/n 1 | 5.3522; 13.8826; 14.2217 90; 100.075; 90 | 1040.41 | Tan, Seng Lim; Ng, Seik Weng Does the size of a crystal matter in an X-ray crystal structure analysis of a small molecule? Journal of Applied Crystallography, 2014, 47, 1443-1444 |
2300483 | CIF HKL Paper | C34 H34 Cl2 F12 N4 O3 | P 42/n :2 | 24.5663; 24.5663; 6.38601 90; 90; 90 | 3853.98 | Mendes do Prado, Vânia; Cardoso Seiceira, Rafael; Pitaluga Jr, Altivo; Andrade-Filho, Tarciso; Andrade Alves, Wendel; Reily Rocha, Alexandre; Furlan Ferreira, Fabio Elucidating the crystal structure of the antimalarial drug (±)-mefloquine hydrochloride: a tetragonal hydrated species Journal of Applied Crystallography, 2014, 47, 1380-1386 |
2300484 | CIF HKL Paper | F3 Na Ni | C m c m | 3.0294; 10.0534; 7.3938 90; 90; 90 | 225.18 | Lindsay-Scott, Alex; Dobson, David; Nestola, Fabrizio; Alvaro, Matteo; Casati, Nicola; Liebske, Christian; Knight, Kevin S.; Smith, Ronald I.; Wood, Ian G. Time-of-flight neutron powder diffraction with milligram samples: the crystal structures of NaCoF~3~ and NaNiF~3~ post-perovskites Journal of Applied Crystallography, 2014, 47, 1939-1947 |
2300485 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.462; 16.147; 3.988 90; 90; 90 | 416.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300486 | CIF HKL Paper | Pt7 Sc4 Si2 | P b a m | 6.447; 16.121; 3.982 90; 90; 90 | 413.9 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300487 | CIF HKL Paper | Br0.09 Cl0.91 Cu6 O8 Pb | F m -3 m | 9.216; 9.216; 9.216 90; 90; 90 | 782.8 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300488 | CIF Paper | Br0.1 Cl0.9 Cu6 O8 Pb | F m -3 m | 9.2164; 9.2164; 9.2164 90; 90; 90 | 782.86 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300489 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.439; 10.559; 13.807 90; 90; 90 | 1230.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300490 | CIF HKL Paper | H4 Na2 O6 W | P b c a | 8.442; 10.569; 13.816 90; 90; 90 | 1232.7 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300491 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.394; 4.374; 11.995 90; 90; 90 | 178.07 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300492 | CIF HKL Paper | C4 Co Sc3 | I m m m | 3.398; 4.377; 12.003 90; 90; 90 | 178.52 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300493 | CIF HKL Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.601; 8.377; 17.201 90; 97.35; 90 | 1372.1 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300494 | CIF Paper | C16 H13 Br2 N | P 1 21/n 1 | 9.599; 8.378; 17.194 90; 97.32; 90 | 1371.5 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300495 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.568; 9.504; 21.378 90; 102.95; 90 | 3676.6 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300496 | CIF HKL Paper | C30 H46 Br2 Cl2 Co N4 Si2 | P 1 21/n 1 | 18.588; 9.518; 21.403 90; 102.95; 90 | 3690.3 | Krause, Lennard; Herbst-Irmer, Regine; Sheldrick, George M.; Stalke, Dietmar Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination Journal of Applied Crystallography, 2015, 48 |
2300497 | CIF HKL | Bi1.09 Ge2.37 Te4 | F m -3 m | 6.055; 6.055; 6.055 90; 90; 90 | 221.99 | Urban, Philipp; Simonov, Arkadiy; Weber, Thomas; Oeckler, Oliver Real structure of Ge4Bi2Te7: refinement on diffuse scattering data with the 3D-ΔPDF method Journal of Applied Crystallography, 2015, 48, 200 |
2300498 | CIF Paper | K0.5 Na0.5 Nb O3 | R 3 m :H | 5.6085; 5.6085; 6.9183 90; 90; 120 | 188.46 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
2300499 | CIF Paper | K0.5 Na0.5 Nb O3 | A m m 2 | 3.9443; 5.6425; 5.6763 90; 90; 90 | 126.33 | Orayech, B.; Faik, A.; López, G. A.; Fabelo, O.; Igartua, J. M. Mode-crystallography analysis of the crystal structures and the low- and high-temperature phase transitions in Na~0.5~K~0.5~NbO~3~ Journal of Applied Crystallography, 2015, 48 |
2300500 | CIF HKL Paper | C10 H16 N6 S | C 1 2/c 1 | 82.904; 4.85; 18.76 90; 74.34; 90 | 7263 | Arakcheeva, Alla; Pattison, Philip; Bauer-Brandl, Annette; Birkedal, Henrik; Chapuis, Gervais Cimetidine, C~10~H~16~N~6~S, form C: crystal structure and modelling of polytypes using the superspace approach Journal of Applied Crystallography, 2013, 46, 99-107 |
2300501 | CIF HKL | C7 H10 N2 O2 | C 1 2/c 1 | 17.822; 4.85; 19.783 90; 102.37; 90 | 1670.3 | Graiff, Claudia; Pontiroli, Daniele; Bergamonti, Laura; Cavallari, Chiara; Lottici, Pier Paolo; Predieri, Giovanni Structural investigation of <i>N</i>,<i>N</i>'-methylenebisacrylamide <i>via</i> X-ray diffraction assisted by crystal structure prediction Journal of Applied Crystallography, 2015, 48, 550-557 |
2300502 | CIF | C13 H15 Co N2 O7 | P 1 21/c 1 | 12.6105; 7.6858; 15.9256 90; 106.541; 90 | 1479.66 | Cox, Jordan M.; Walton, Ian M.; Benson, Cassidy A.; Chen, Yu-Sheng; Benedict, Jason B. A versatile environmental control cell for <i>in situ</i> guest exchange single-crystal diffraction Journal of Applied Crystallography, 2015, 48, 578-581 |
2300503 | CIF HKL | C42 H80 Br2 N2 O3 | C 1 2/c 1 | 54.695; 9.8891; 16.877 90; 92.628; 90 | 9118.9 | Chen, Qibin; Yao, Junyao; Hu, Xin; Shen, Jincheng; Sheng, Yujie; Liu, Honglai Monolayer effect of a gemini surfactant with a rigid biphenyl spacer on its self-crystallization at the air/liquid interface Journal of Applied Crystallography, 2015, 48 |
2300504 | CIF HKL | Mg Mo O4 | C 1 2/m 1 | 10.157; 9.246; 7.03 90; 105.9; 90 | 634.94 | Gemmi, Mauro; La Placa, Maria G. I.; Galanis, Athanassios S.; Rauch, Edgar F.; Nicolopoulos, Stavros Fast electron diffraction tomography Journal of Applied Crystallography, 2015, 48 |
2300505 | CIF HKL | C28 H26 N2 O4 | P 1 21/n 1 | 5.9038; 10.7455; 19.4895 90; 90.263; 90 | 1236.39 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
2300506 | CIF HKL | C24 H22 Cl6 N2 O4 | P 1 21/n 1 | 6.8524; 11.9655; 17.3274 90; 99.678; 90 | 1400.5 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
2300507 | CIF HKL | C26 H28 N2 O5 | P 1 21/c 1 | 13.2363; 11.765; 17.6353 90; 103.281; 90 | 2672.8 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
2300508 | CIF HKL | C32 H28 N4 O4 | P 1 2/c 1 | 12.8209; 7.0395; 14.7623 90; 96.82; 90 | 1322.91 | Kong, Jianfei; Du, Jialei; Wang, Jiren; Chen, Zuofeng Supramolecular organic frameworks of a Schiff base showing selective guest adsorption Journal of Applied Crystallography, 2015, 48 |
2300509 | CIF HKL | C6 H9 N3 O6 | P n a 21 | 9.0136; 21.5; 4.7005 90; 90; 90 | 910.9 | Prasad, A. Aditya; Meenakshisundaram, S. P. Hydrogen-bonded supramolecular architecture in nonlinear optical ammonium 2,4-dinitrophenolate hydrate Journal of Applied Crystallography, 2015, 48 |
2300510 | CIF | F2 O2 Os | C 1 2/c 1 | 9.42; 4.491; 8.6 90; 117.5; 90 | 322.717 | Burbank, R.D. X-Ray Study of an Osmium Oxyfluoride of Unknown Composition Journal of Applied Crystallography, 1974, 7, 41-44 |
2300511 | CIF | K2.92 Li2 O30 Pb2.41 Ta10 | P 4/m b m | 12.5488; 12.5488; 3.9129 90; 90; 90 | 616.174 | Hornebecq, V.; Weill, F.; Elissalde, C.; Villesuzanne, A.; Menetrier, M.; Ravez, J. Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach Journal of Applied Crystallography, 2000, 33, 1037-1045 |
2300512 | CIF | K1.46 Li O30 Pb3.67 Ta10 | P 4/m b m | 12.5159; 12.5159; 3.8947 90; 90; 90 | 610.096 | Hornebecq, V.; Elissalde, C.; Weill, F.; Villesuzanne, A.; Menetrier, M.; Ravez, J. Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach Journal of Applied Crystallography, 2000, 33, 1037-1045 |
2300513 | CIF HKL | C32 H39 N O2 | P 1 21/c 1 | 16.589; 10.9575; 16.6795 90; 113.623; 90 | 2777.8 | Sharma, Ranjana; Prasher, Dixit; Tiwari, R. K. Crystal structure analysis of ebastine [4-(4-benzhydryloxy-1-piperidyl)-1-(4-<i>tert</i>-butylphenyl) butan-1-one]: an oral histamine antagonist Journal of Applied Crystallography, 2015, 48 |
2300514 | CIF | Te U | P m -3 m | 3.765; 3.765; 3.765 90; 90; 90 | 53.37 | Gerward, L.; Olsen, J.S.; Dabos-Seignon, S.; Benedict, U.; Steenstrup, S. The pressure-induced transformation B1 to B2 in actinide compounds Journal of Applied Crystallography, 1990, 23, 515-519 |
2300515 | CIF | Ir0.94 Mo3.06 | P m -3 n | 4.958; 4.958; 4.958 90; 90; 90 | 121.876 | Koksbang, R.; Rasmussen, S.E.; Hazell, R.G. Critical temperatures of superconductivity and neutron diffraction studies at 293 and at 10 K of Mo-Ir single crystal of A15 structure Journal of Applied Crystallography, 1989, 22, 23-25 |
2300516 | CIF | D15 Th4 | I -4 3 d | 9.11; 9.11; 9.11 90; 90; 90 | 756.058 | Mueller, M.H.; Caton, R.; Beyerlein, R.A.; Brun, T.O.; Jorgensen, J.D.; Satterthwaite, C.B. Structure of Th4 D15 from measurement at the argonne ZING-P pulsed neutron source Journal of Applied Crystallography, 1977, 10, 79-83 |
2300517 | CIF | Tl | F m -3 m | 4.33; 4.33; 4.33 90; 90; 90 | 81.183 | Olsen, J.S.; Steenstrup, S.; Geward, L.; Johnson, E. A high-pressure study of thallium Journal of Applied Crystallography, 1994, 27, 1002-1005 |
2300518 | CIF | Tl | P 63/m m c | 3.463; 3.463; 5.539 90; 90; 120 | 57.526 | Olsen, J.S.; Johnson, E.; Geward, L.; Steenstrup, S. A high-pressure study of thallium Journal of Applied Crystallography, 1994, 27, 1002-1005 |
2300519 | CIF | Ag0.842 Al0.158 | F m -3 m | 4.0692; 4.0692; 4.0692 90; 90; 90 | 67.379 | Pradhan, S.K.; De, M. An X-ray determination of the thermal expansion of alpha-phase Ag-Al alloys at high temperatures Journal of Applied Crystallography, 1986, 19, 484-485 |
2300520 | CIF | Os2 Pu | F d -3 m :1 | 7.53; 7.53; 7.53 90; 90; 90 | 426.958 | Roof, R.B.jr. Crystal data of two polymorphic forms of Pu Os2 Journal of Applied Crystallography, 1975, 8, 687-688 |
2300521 | CIF | Cu2 Mn Sn | F m -3 m | 6.176; 6.176; 6.176 90; 90; 90 | 235.571 | Meyers, M.A.; Ruud, C.O.; Barrett, C.S. Observations on the ferromagnetic beta-phase of the Cu - Mn - Sn system Journal of Applied Crystallography, 1973, 6, 39-41 |
2300522 | CIF | Nb Te4 | P 4/m c c | 6.3616; 6.3616; 6.837 90; 90; 90 | 276.693 | Dusek, M.; Petricek, V.; Dinnebier, R.E.; Wunschel, M.; van Smaalen, S. Refinement of modulated structures against X-ray powder diffraction data with JANA2000 Journal of Applied Crystallography, 2001, 34, 398-404 |
2300523 | CIF | Ti0.04 U0.96 | C m c m | 2.861; 5.8234; 4.9736 90; 90; 90 | 82.864 | Choi, C.S.; Prask, H.J. Neutron difraction studies of two uranium-0.75 wt.% titanium alloys Journal of Applied Crystallography, 1985, 18, 141-144 |
2300524 | CIF | Cl O4 P Sn2 | A m a 2 | 13.52; 8.673; 4.74 90; 90; 90 | 555.807 | Berndt, A.F.; Sylvester, J.M. Crystal data on tin(II) phosphate chloride, Sn2 P O4 Cl Journal of Applied Crystallography, 1972, 5, 248-249 |
2300525 | CIF | Ni2.62 O4 Ti0.69 | F d -3 m :2 | 8.3416; 8.3416; 8.3416 90; 90; 90 | 580.428 | Lager, G.A.; Armbruster, T.; Rotella, F.J.; Ross, F.K.; Jorgensen, J.D. Neutron poeder diffraction study of defect spinel structures: Tetrahedrally coordinated Ti4+ in Ni2.62 Ti0.69 O4 and Ni2.42 Ti0.74 Si0.05 O4 Journal of Applied Crystallography, 1981, 14, 261-264 |
2300526 | CIF | Ni2.42 O4 Si0.05 Ti0.65 | F d -3 m :2 | 8.3222; 8.3222; 8.3222 90; 90; 90 | 576.387 | Lager, G.A.; Rotella, F.J.; Ross, F.K.; Armbruster, T.; Jorgensen, J.D. Neutron powder diffraction study of defect spinel structures: Tetrahedrally coordinated Ti4+ in Ni2.62 Ti0.69 O4 and Ni2.42 Ti0.74 Si0.05 O4 Journal of Applied Crystallography, 1981, 14, 261-264 |
2300527 | CIF | Fe0.9 O8 P2 Zn2.1 | P 1 21/n 1 | 7.558; 8.536; 5.042 90; 95.4; 90 | 323.841 | Nord, A.G. Use of the Rietveld technique for estimating cation distributions Journal of Applied Crystallography, 1984, 17, 55-60 |
2300528 | CIF | C Ag N S | P m n n | 4.083; 7.043; 11.219 90; 90; 90 | 322.62 | Smith, D.L.; Maskasky, J.E.; Spaulding, L.R. Polymorphism in silver thiocyanate. Preparation of a new phase and its characterization by X-ray powder diffraction Journal of Applied Crystallography, 1982, 15, 488-492 |
2300529 | CIF | N2 O Si2 | C m c 21 | 8.847; 5.452; 4.824 90; 90; 90 | 232.68 | Srinivasa, S.R.; Jorgensen, J.D.; Cartz, L.; Worlton, T.G.; Beyerlein, R.A.; Billy, M. High-pressure neutron diffraction study of Si2 N2 O Journal of Applied Crystallography, 1977, 10, 167-171 |
2300530 | CIF | P3 Ta5 | P n m a | 25.321; 3.4013; 11.4614 90; 90; 90 | 987.105 | Thomas, J.O.; Ersson, N.O.; Andersson, Y. An X-Ray film powder profile refinement of the crystal structure of Ta5 P3 Journal of Applied Crystallography, 1980, 13, 605-607 |
2300531 | CIF | Er2 O3 | I a -3 | 10.54504; 10.54504; 10.54504 90; 90; 90 | 1172.59 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
2300532 | CIF | Er1.6 Gd0.4 O3 | I a -3 | 10.6511; 10.6511; 10.6511 90; 90; 90 | 1208.32 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
2300533 | CIF | Er Gd O3 | I a -3 | 10.73652; 10.73652; 10.73652 90; 90; 90 | 1237.63 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
2300534 | CIF | Er0.4 Gd1.6 O3 | I a -3 | 10.7911; 10.7911; 10.7911 90; 90; 90 | 1256.6 | Heiba, Z.; Okuyucu, H.; Hascicek, Y.S. X-ray structure determination of the rare earth oxides (Er1-u Gdu)2 O3 applying the Rietveld method Journal of Applied Crystallography, 2002, 35, 577-580 |
2300535 | CIF | Li2 O3 Zr | C 1 2/c 1 | 5.4089; 9.0309; 5.4144 90; 112.498; 90 | 244.35 | Heiba, Z.K.; El Sayed, K. Structural and anisotropic thermal expansion correlation of Li2 Zr O3 at different temperatures Journal of Applied Crystallography, 2002, 35, 634-636 |
2300536 | CIF | Eu2 O3 | I a -3 | 10.86831; 10.86831; 10.86831 90; 90; 90 | 1283.77 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
2300537 | CIF | Eu1.8 O3 Yb0.2 | I a -3 | 10.81718; 10.81718; 10.81718 90; 90; 90 | 1265.73 | Heiba, Z.K.; Akin, Y.; Hascicek, Y.S.; Sigmund, W. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
2300538 | CIF | Eu1.6 O3 Yb0.4 | I a -3 | 10.76778; 10.76778; 10.76778 90; 90; 90 | 1248.47 | Heiba, Z.K.; Akin, Y.; Hascicek, Y.S.; Sigmund, W. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
2300539 | CIF | Eu O3 Yb | I a -3 | 10.62842; 10.62842; 10.62842 90; 90; 90 | 1200.62 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
2300540 | CIF | Eu0.4 O3 Yb1.6 | I a -3 | 10.49964; 10.49964; 10.49964 90; 90; 90 | 1157.51 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
2300541 | CIF | Eu0.2 O3 Yb1.8 | I a -3 | 10.46596; 10.46596; 10.46596 90; 90; 90 | 1146.4 | Heiba, Z.K.; Hascicek, Y.S.; Akin, Y.; Sigmund, W. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
2300542 | CIF | O3 Yb2 | I a -3 | 10.42828; 10.42828; 10.42828 90; 90; 90 | 1134.06 | Heiba, Z.K.; Akin, Y.; Sigmund, W.; Hascicek, Y.S. X-ray structure and microstructure determination of the mixed sesquioxides (Eu1-x Ybx)2 O3 prepared by a sol-gel process Journal of Applied Crystallography, 2003, 36, 1411-1416 |
2300543 | CIF | Bi2 O9 Sr Ta2 | A 21 a m | 5.5186; 5.52; 25.0485 90; 90; 90 | 763.044 | Muller, C.; Jacob, F.; Gagou, Y.; Elkaim, E. Cationic disorder, microstructure and dielectric response of ferroelectric SBT ceramics Journal of Applied Crystallography, 2003, 36, 880-889 |
2300544 | CIF | O2 Zr | P 1 21/c 1 | 5.1487; 5.2023; 5.3231 90; 99.164; 90 | 140.76 | Winterer, M.; Delaplane, R.; McGreevy, R. X-ray diffraction, neutron scattering and EXAFS spectroscopy of monoclinic zirconia: analysis by Rietveld refinement and reverse Monte Carlo simulations Journal of Applied Crystallography, 2002, 35, 434-442 |
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